EP2061064A4 - Source d'électrons - Google Patents
Source d'électronsInfo
- Publication number
- EP2061064A4 EP2061064A4 EP07806481A EP07806481A EP2061064A4 EP 2061064 A4 EP2061064 A4 EP 2061064A4 EP 07806481 A EP07806481 A EP 07806481A EP 07806481 A EP07806481 A EP 07806481A EP 2061064 A4 EP2061064 A4 EP 2061064A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- electron source
- electron
- source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J1/00—Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
- H01J1/02—Main electrodes
- H01J1/13—Solid thermionic cathodes
- H01J1/14—Solid thermionic cathodes characterised by the material
- H01J1/144—Solid thermionic cathodes characterised by the material with other metal oxides as an emissive material
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/06—Electron sources; Electron guns
- H01J37/065—Construction of guns or parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3174—Particle-beam lithography, e.g. electron beam lithography
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/02—Details
- H01J2237/0216—Means for avoiding or correcting vibration effects
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
- H01J2237/063—Electron sources
- H01J2237/06308—Thermionic sources
- H01J2237/06316—Schottky emission
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/26—Electron or ion microscopes
- H01J2237/28—Scanning microscopes
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006240100 | 2006-09-05 | ||
PCT/JP2007/067008 WO2008029731A1 (fr) | 2006-09-05 | 2007-08-31 | Source d'électrons |
Publications (2)
Publication Number | Publication Date |
---|---|
EP2061064A1 EP2061064A1 (fr) | 2009-05-20 |
EP2061064A4 true EP2061064A4 (fr) | 2011-09-14 |
Family
ID=39157161
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP07806481A Withdrawn EP2061064A4 (fr) | 2006-09-05 | 2007-08-31 | Source d'électrons |
Country Status (4)
Country | Link |
---|---|
US (1) | US7969080B2 (fr) |
EP (1) | EP2061064A4 (fr) |
JP (1) | JP4789122B2 (fr) |
WO (1) | WO2008029731A1 (fr) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011076753A (ja) * | 2009-09-29 | 2011-04-14 | Denki Kagaku Kogyo Kk | 電子源及び電子機器 |
JP5363413B2 (ja) * | 2010-05-10 | 2013-12-11 | 電気化学工業株式会社 | 電子源 |
US8896195B2 (en) * | 2010-10-21 | 2014-11-25 | Hermes Microvision, Inc. | Filament for electron source |
JP6043476B2 (ja) * | 2011-10-12 | 2016-12-14 | 株式会社日立ハイテクノロジーズ | イオン源およびそれを用いたイオンビーム装置 |
US9847208B1 (en) * | 2016-08-10 | 2017-12-19 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Electron beam device, cold field emitter, and method for regeneration of a cold field emitter |
WO2019118489A1 (fr) * | 2017-12-13 | 2019-06-20 | Applied Materials Israel Ltd. | Source de faisceau de particules chargées et procédé d'assemblage d'une source de faisceau de particules chargées |
EP4057318A1 (fr) * | 2021-03-12 | 2022-09-14 | FEI Company | Source d'électrons mécaniquement stable |
CN117693802A (zh) * | 2021-07-22 | 2024-03-12 | Asml荷兰有限公司 | 用于稳定带电粒子系统中的电子源的系统和装置 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55109343A (en) * | 1979-02-16 | 1980-08-22 | Chiyou Lsi Gijutsu Kenkyu Kumiai | Cathode for electron gun |
WO2001015192A1 (fr) * | 1999-08-20 | 2001-03-01 | Fei Company | Emetteur schottky de longue duree |
EP1705684A1 (fr) * | 2005-03-22 | 2006-09-27 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Emetteur stabilisé et méthode pour le stabiliser |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0641007A3 (fr) * | 1993-08-31 | 1995-06-21 | Samsung Display Devices Co Ltd | Structure de cathode à réserve du type à chauffage direct. |
US5831379A (en) * | 1994-01-28 | 1998-11-03 | Samsung Display Devices Co., Ltd. | Directly heated cathode structure |
FR2795861B1 (fr) | 1999-06-29 | 2002-11-08 | Schlumberger Technologies Inc | Cathode emettrice de schottky possedant un reservoir de zro2 , stabilise et procede de stabilisation |
US6680562B1 (en) * | 1999-08-20 | 2004-01-20 | Fei Company | Schottky emitter having extended life |
JP4631475B2 (ja) | 2005-03-03 | 2011-02-16 | 富士ゼロックス株式会社 | 画像形成装置 |
-
2007
- 2007-08-31 EP EP07806481A patent/EP2061064A4/fr not_active Withdrawn
- 2007-08-31 JP JP2008533135A patent/JP4789122B2/ja not_active Expired - Fee Related
- 2007-08-31 US US12/439,413 patent/US7969080B2/en active Active
- 2007-08-31 WO PCT/JP2007/067008 patent/WO2008029731A1/fr active Application Filing
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55109343A (en) * | 1979-02-16 | 1980-08-22 | Chiyou Lsi Gijutsu Kenkyu Kumiai | Cathode for electron gun |
WO2001015192A1 (fr) * | 1999-08-20 | 2001-03-01 | Fei Company | Emetteur schottky de longue duree |
EP1705684A1 (fr) * | 2005-03-22 | 2006-09-27 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Emetteur stabilisé et méthode pour le stabiliser |
Non-Patent Citations (1)
Title |
---|
See also references of WO2008029731A1 * |
Also Published As
Publication number | Publication date |
---|---|
EP2061064A1 (fr) | 2009-05-20 |
US7969080B2 (en) | 2011-06-28 |
WO2008029731A1 (fr) | 2008-03-13 |
JPWO2008029731A1 (ja) | 2010-01-21 |
JP4789122B2 (ja) | 2011-10-12 |
US20100019649A1 (en) | 2010-01-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
17P | Request for examination filed |
Effective date: 20090217 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC MT NL PL PT RO SE SI SK TR |
|
AX | Request for extension of the european patent |
Extension state: AL BA HR MK RS |
|
RBV | Designated contracting states (corrected) |
Designated state(s): DE GB NL |
|
A4 | Supplementary search report drawn up and despatched |
Effective date: 20110811 |
|
RIC1 | Information provided on ipc code assigned before grant |
Ipc: H01J 37/073 20060101ALI20110805BHEP Ipc: H01J 1/304 20060101AFI20110805BHEP |
|
DAX | Request for extension of the european patent (deleted) | ||
17Q | First examination report despatched |
Effective date: 20130205 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
18D | Application deemed to be withdrawn |
Effective date: 20150602 |