EP1969343A4 - OBLIQUE TRANSMISSION LIGHTING INSPECTION SYSTEM AND METHOD FOR INSPECTING A GLASS SHEET - Google Patents

OBLIQUE TRANSMISSION LIGHTING INSPECTION SYSTEM AND METHOD FOR INSPECTING A GLASS SHEET

Info

Publication number
EP1969343A4
EP1969343A4 EP06826561A EP06826561A EP1969343A4 EP 1969343 A4 EP1969343 A4 EP 1969343A4 EP 06826561 A EP06826561 A EP 06826561A EP 06826561 A EP06826561 A EP 06826561A EP 1969343 A4 EP1969343 A4 EP 1969343A4
Authority
EP
European Patent Office
Prior art keywords
inspecting
glass sheet
inspection system
transmission illumination
oblique transmission
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP06826561A
Other languages
German (de)
English (en)
French (fr)
Other versions
EP1969343A2 (en
Inventor
Richard D Dureiko
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Corning Inc
Original Assignee
Corning Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Corning Inc filed Critical Corning Inc
Publication of EP1969343A2 publication Critical patent/EP1969343A2/en
Publication of EP1969343A4 publication Critical patent/EP1969343A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0608—Height gauges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4788—Diffraction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8822—Dark field detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
EP06826561A 2005-11-21 2006-10-24 OBLIQUE TRANSMISSION LIGHTING INSPECTION SYSTEM AND METHOD FOR INSPECTING A GLASS SHEET Withdrawn EP1969343A4 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/284,754 US7283227B2 (en) 2005-11-21 2005-11-21 Oblique transmission illumination inspection system and method for inspecting a glass sheet
PCT/US2006/041480 WO2007061557A2 (en) 2005-11-21 2006-10-24 Oblique transmission illumination inspection system and method for inspecting a glass sheet

Publications (2)

Publication Number Publication Date
EP1969343A2 EP1969343A2 (en) 2008-09-17
EP1969343A4 true EP1969343A4 (en) 2010-01-13

Family

ID=38053124

Family Applications (1)

Application Number Title Priority Date Filing Date
EP06826561A Withdrawn EP1969343A4 (en) 2005-11-21 2006-10-24 OBLIQUE TRANSMISSION LIGHTING INSPECTION SYSTEM AND METHOD FOR INSPECTING A GLASS SHEET

Country Status (7)

Country Link
US (1) US7283227B2 (ja)
EP (1) EP1969343A4 (ja)
JP (1) JP4954217B2 (ja)
KR (1) KR101263973B1 (ja)
CN (1) CN101360985B (ja)
TW (1) TWI332574B (ja)
WO (1) WO2007061557A2 (ja)

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GB2415776B (en) * 2004-06-28 2009-01-28 Carglass Luxembourg Sarl Zug Investigation of vehicle glazing panels
US20060092276A1 (en) * 2004-10-28 2006-05-04 Ariglio James A Inspection system and method for identifying surface and body defects in a glass sheet
KR101068364B1 (ko) * 2007-07-11 2011-09-28 엘지디스플레이 주식회사 액정표시장치 검사장비 및 그 검사방법
GB0721060D0 (en) * 2007-10-29 2007-12-05 Pilkington Group Ltd Optical inspection
JP5200667B2 (ja) * 2007-11-13 2013-06-05 株式会社リコー 透過光量測定装置、媒体識別装置、媒体搬送装置及び画像形成装置
JP5521332B2 (ja) * 2009-01-21 2014-06-11 三星ダイヤモンド工業株式会社 観察装置、位置決め装置、レーザー加工装置および観察方法
US20100195096A1 (en) * 2009-02-04 2010-08-05 Applied Materials, Inc. High efficiency multi wavelength line light source
CN101887030A (zh) * 2009-05-15 2010-11-17 圣戈本玻璃法国公司 用于检测透明基板表面和/或其内部的缺陷的方法及系统
WO2012142967A1 (en) * 2011-04-21 2012-10-26 Ati-China Co., Ltd. Apparatus and method for photographing glass defects in multiple layers
JP5708385B2 (ja) * 2011-09-02 2015-04-30 富士通セミコンダクター株式会社 表面検査方法及び表面検査装置
JP5796430B2 (ja) * 2011-09-15 2015-10-21 日本電気硝子株式会社 板ガラス検査装置、板ガラス検査方法、板ガラス製造装置、及び板ガラス製造方法
JP5854370B2 (ja) * 2012-02-13 2016-02-09 日本電気硝子株式会社 蛍光体含有ガラス部材の検査装置及び検査方法
CN102944564A (zh) * 2012-11-26 2013-02-27 中国科学院长春光学精密机械与物理研究所 一种便携式双远心倾斜照明结构杂散光检测装置
TWI470210B (zh) * 2012-12-17 2015-01-21 Taiwan Power Testing Technology Co Ltd 顯示裝置之光學層件之缺陷檢測方法
US20140240489A1 (en) * 2013-02-26 2014-08-28 Corning Incorporated Optical inspection systems and methods for detecting surface discontinuity defects
CN104406988A (zh) * 2014-11-18 2015-03-11 浙江大学 一种玻璃内部缺陷的检测方法
EP3076164A1 (fr) * 2015-04-03 2016-10-05 AGC Glass Europe Procédé de contrôle de verre plat
US20170066673A1 (en) 2015-09-09 2017-03-09 Corning Incorporated Glass manufacturing apparatuses and methods for operating the same
TWI674475B (zh) * 2015-10-22 2019-10-11 特銓股份有限公司 微塵檢測機構
US10120111B2 (en) * 2016-12-14 2018-11-06 Google Llc Thin ceramic imaging screen for camera systems
TWI644098B (zh) * 2017-01-05 2018-12-11 國立臺灣師範大學 透明基板之瑕疵檢測方法與裝置
JP2020524123A (ja) * 2017-05-31 2020-08-13 ニプロ株式会社 ガラス容器の評価方法
KR102580389B1 (ko) * 2018-02-13 2023-09-19 코닝 인코포레이티드 유리 시트 검사 장치 및 방법
KR20210114542A (ko) 2019-02-06 2021-09-23 코닝 인코포레이티드 점성 리본을 처리하는 방법
KR20220110291A (ko) * 2019-12-13 2022-08-05 코닝 인코포레이티드 레이저 기반 내포물 검출 시스템 및 방법
KR20210111536A (ko) 2020-03-03 2021-09-13 휴비오 주식회사 디스플레이 패널의 다층 레이어 비전 검사 장치
US11386545B2 (en) * 2020-03-31 2022-07-12 The Boeing Company Surface crack detection
KR102540041B1 (ko) * 2020-05-25 2023-06-05 (주)피엔피 이미지센서를 이용한 초박형 유리의 검출방법

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4492477A (en) * 1981-02-25 1985-01-08 Cem Cie Electro-Mecanique Process and apparatus for the detection of flaws in transparent sheets of glass
US4989973A (en) * 1988-10-03 1991-02-05 Nissan Motor Co., Ltd. Surface condition estimating apparatus
JPH08128968A (ja) * 1994-10-31 1996-05-21 Sumitomo Chem Co Ltd 透明シート状成形体の欠陥検査法
JPH08327561A (ja) * 1995-06-05 1996-12-13 Nippon Sheet Glass Co Ltd 連続シート状物体の欠点検査装置
US6437357B1 (en) * 1998-10-30 2002-08-20 Photon Dynamics Canada Inc. Glass inspection system including bright field and dark field illumination

Family Cites Families (12)

* Cited by examiner, † Cited by third party
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CH564786A5 (ja) * 1973-03-01 1975-07-31 Ciba Geigy Ag
US5305139A (en) * 1991-04-19 1994-04-19 Unimat (Usa) Corporation, Formerly United Holdings, Inc. Illumination system and method for a high definition 3-D light microscope
US5570228A (en) * 1991-04-19 1996-10-29 Edge Scientific Instrument Company Llc Fiber optic illumination system and method for a high definition light microscope
JP3314440B2 (ja) * 1993-02-26 2002-08-12 株式会社日立製作所 欠陥検査装置およびその方法
JPH09257642A (ja) * 1996-03-18 1997-10-03 Hitachi Electron Eng Co Ltd ガラス基板の欠陥種別判定方法
JPH11148807A (ja) * 1997-07-29 1999-06-02 Toshiba Corp バンプ高さ測定方法及びバンプ高さ測定装置
US6256091B1 (en) * 1997-08-25 2001-07-03 Nippon Maxis Co., Ltd. Transparent substrate mounting platform, transparent substrate scratch inspection device, transparent substrate bevelling inspection method and device, and transparent substrate inspection method
JPH11281584A (ja) * 1998-03-30 1999-10-15 Minolta Co Ltd 検査方法およびその装置
US6633377B1 (en) * 2000-04-20 2003-10-14 Image Processing Systems Inc. Dark view inspection system for transparent media
GB0202266D0 (en) * 2002-01-31 2002-03-20 Univ Aberdeen A method and device to ascertain physical characteristics of porous media
JP4154156B2 (ja) * 2002-02-08 2008-09-24 ソニーマニュファクチュアリングシステムズ株式会社 欠陥分類検査装置
JP2004309426A (ja) * 2003-04-10 2004-11-04 Denso Corp 透光性基板の評価方法及び透光性基板の評価装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4492477A (en) * 1981-02-25 1985-01-08 Cem Cie Electro-Mecanique Process and apparatus for the detection of flaws in transparent sheets of glass
US4989973A (en) * 1988-10-03 1991-02-05 Nissan Motor Co., Ltd. Surface condition estimating apparatus
JPH08128968A (ja) * 1994-10-31 1996-05-21 Sumitomo Chem Co Ltd 透明シート状成形体の欠陥検査法
JPH08327561A (ja) * 1995-06-05 1996-12-13 Nippon Sheet Glass Co Ltd 連続シート状物体の欠点検査装置
US6437357B1 (en) * 1998-10-30 2002-08-20 Photon Dynamics Canada Inc. Glass inspection system including bright field and dark field illumination

Also Published As

Publication number Publication date
KR101263973B1 (ko) 2013-05-13
KR20080075197A (ko) 2008-08-14
WO2007061557A2 (en) 2007-05-31
TW200732652A (en) 2007-09-01
EP1969343A2 (en) 2008-09-17
WO2007061557A3 (en) 2007-10-04
JP2009516852A (ja) 2009-04-23
TWI332574B (en) 2010-11-01
JP4954217B2 (ja) 2012-06-13
CN101360985A (zh) 2009-02-04
US7283227B2 (en) 2007-10-16
US20070115463A1 (en) 2007-05-24
CN101360985B (zh) 2011-05-11

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Legal Events

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PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

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Effective date: 20080605

AK Designated contracting states

Kind code of ref document: A2

Designated state(s): DE FR

RBV Designated contracting states (corrected)

Designated state(s): DE FR

A4 Supplementary search report drawn up and despatched

Effective date: 20091215

RIC1 Information provided on ipc code assigned before grant

Ipc: G01N 21/00 20060101AFI20070726BHEP

Ipc: G01N 21/47 20060101ALI20091209BHEP

Ipc: G01B 11/30 20060101ALI20091209BHEP

STAA Information on the status of an ep patent application or granted ep patent

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18W Application withdrawn

Effective date: 20100312