EP1658624A2 - Integrierte schaltung und verfahren zur herstellung einer integrierten schaltung - Google Patents
Integrierte schaltung und verfahren zur herstellung einer integrierten schaltungInfo
- Publication number
- EP1658624A2 EP1658624A2 EP04786186A EP04786186A EP1658624A2 EP 1658624 A2 EP1658624 A2 EP 1658624A2 EP 04786186 A EP04786186 A EP 04786186A EP 04786186 A EP04786186 A EP 04786186A EP 1658624 A2 EP1658624 A2 EP 1658624A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- integrated circuit
- polymer
- layer
- dielectric layer
- parts
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 13
- 238000000034 method Methods 0.000 title claims description 22
- 239000000203 mixture Substances 0.000 claims abstract description 32
- 229920000642 polymer Polymers 0.000 claims abstract description 29
- 238000009472 formulation Methods 0.000 claims abstract description 27
- 238000004132 cross linking Methods 0.000 claims abstract description 17
- 239000002904 solvent Substances 0.000 claims abstract description 10
- 239000004065 semiconductor Substances 0.000 claims abstract description 7
- 239000003377 acid catalyst Substances 0.000 claims abstract description 6
- 230000005669 field effect Effects 0.000 claims abstract description 5
- 230000003213 activating effect Effects 0.000 claims abstract description 4
- 239000000758 substrate Substances 0.000 claims description 17
- 239000004971 Cross linker Substances 0.000 claims description 15
- 229920005601 base polymer Polymers 0.000 claims description 13
- -1 4-hydroxymethyl-benzyl Chemical group 0.000 claims description 12
- 229920001665 Poly-4-vinylphenol Polymers 0.000 claims description 10
- 238000006243 chemical reaction Methods 0.000 claims description 10
- LLHKCFNBLRBOGN-UHFFFAOYSA-N propylene glycol methyl ether acetate Chemical compound COCC(C)OC(C)=O LLHKCFNBLRBOGN-UHFFFAOYSA-N 0.000 claims description 10
- 239000002253 acid Substances 0.000 claims description 8
- WVDDGKGOMKODPV-UHFFFAOYSA-N benzyl alcohol Substances OCC1=CC=CC=C1 WVDDGKGOMKODPV-UHFFFAOYSA-N 0.000 claims description 6
- 238000002161 passivation Methods 0.000 claims description 5
- JOXIMZWYDAKGHI-UHFFFAOYSA-N toluene-4-sulfonic acid Chemical compound CC1=CC=C(S(O)(=O)=O)C=C1 JOXIMZWYDAKGHI-UHFFFAOYSA-N 0.000 claims description 5
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 claims description 4
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 claims description 4
- SLIUAWYAILUBJU-UHFFFAOYSA-N pentacene Chemical compound C1=CC=CC2=CC3=CC4=CC5=CC=CC=C5C=C4C=C3C=C21 SLIUAWYAILUBJU-UHFFFAOYSA-N 0.000 claims description 4
- 229920001577 copolymer Polymers 0.000 claims description 3
- 238000001035 drying Methods 0.000 claims description 3
- 239000012299 nitrogen atmosphere Substances 0.000 claims description 3
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N phenol group Chemical group C1(=CC=CC=C1)O ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 claims description 3
- 238000007639 printing Methods 0.000 claims description 3
- 238000004528 spin coating Methods 0.000 claims description 3
- RYHBNJHYFVUHQT-UHFFFAOYSA-N 1,4-Dioxane Chemical compound C1COCCO1 RYHBNJHYFVUHQT-UHFFFAOYSA-N 0.000 claims description 2
- FUGYGGDSWSUORM-UHFFFAOYSA-N 4-hydroxystyrene Chemical compound OC1=CC=C(C=C)C=C1 FUGYGGDSWSUORM-UHFFFAOYSA-N 0.000 claims description 2
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 claims description 2
- 125000003118 aryl group Chemical group 0.000 claims description 2
- 239000011261 inert gas Substances 0.000 claims description 2
- 238000005507 spraying Methods 0.000 claims description 2
- 239000008096 xylene Substances 0.000 claims description 2
- 125000003158 alcohol group Chemical group 0.000 claims 1
- 239000012298 atmosphere Substances 0.000 claims 1
- 125000004432 carbon atom Chemical group C* 0.000 claims 1
- 238000010276 construction Methods 0.000 claims 1
- 125000000542 sulfonic acid group Chemical group 0.000 claims 1
- 239000010410 layer Substances 0.000 description 48
- 239000000126 substance Substances 0.000 description 5
- 238000002360 preparation method Methods 0.000 description 4
- 238000000151 deposition Methods 0.000 description 3
- 230000008021 deposition Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 239000011112 polyethylene naphthalate Substances 0.000 description 3
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 description 2
- 239000004642 Polyimide Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 230000000977 initiatory effect Effects 0.000 description 2
- 150000004767 nitrides Chemical class 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 229920003207 poly(ethylene-2,6-naphthalate) Polymers 0.000 description 2
- 229920000139 polyethylene terephthalate Polymers 0.000 description 2
- 239000005020 polyethylene terephthalate Substances 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- LSNNMFCWUKXFEE-UHFFFAOYSA-M Bisulfite Chemical compound OS([O-])=O LSNNMFCWUKXFEE-UHFFFAOYSA-M 0.000 description 1
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 150000001298 alcohols Chemical class 0.000 description 1
- 125000000217 alkyl group Chemical group 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 235000019445 benzyl alcohol Nutrition 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 229920006037 cross link polymer Polymers 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 1
- 229910052809 inorganic oxide Inorganic materials 0.000 description 1
- 238000001659 ion-beam spectroscopy Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000012044 organic layer Substances 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 229920000620 organic polymer Polymers 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 229920006254 polymer film Polymers 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 238000010561 standard procedure Methods 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 238000009997 thermal pre-treatment Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 238000003631 wet chemical etching Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/468—Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics
- H10K10/471—Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics the gate dielectric comprising only organic materials
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L61/00—Compositions of condensation polymers of aldehydes or ketones; Compositions of derivatives of such polymers
- C08L61/04—Condensation polymers of aldehydes or ketones with phenols only
- C08L61/06—Condensation polymers of aldehydes or ketones with phenols only of aldehydes with phenols
- C08L61/14—Modified phenol-aldehyde condensates
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F8/00—Chemical modification by after-treatment
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D129/00—Coating compositions based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an alcohol, ether, aldehydo, ketonic, acetal, or ketal radical; Coating compositions based on hydrolysed polymers of esters of unsaturated alcohols with saturated carboxylic acids; Coating compositions based on derivatives of such polymers
- C09D129/02—Homopolymers or copolymers of unsaturated alcohols
- C09D129/04—Polyvinyl alcohol; Partially hydrolysed homopolymers or copolymers of esters of unsaturated alcohols with saturated carboxylic acids
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F2810/00—Chemical modification of a polymer
- C08F2810/20—Chemical modification of a polymer leading to a crosslinking, either explicitly or inherently
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G2261/00—Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
- C08G2261/10—Definition of the polymer structure
- C08G2261/14—Side-groups
- C08G2261/142—Side-chains containing oxygen
- C08G2261/1422—Side-chains containing oxygen containing OH groups
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G2261/00—Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
- C08G2261/30—Monomer units or repeat units incorporating structural elements in the main chain
- C08G2261/33—Monomer units or repeat units incorporating structural elements in the main chain incorporating non-aromatic structural elements in the main chain
- C08G2261/334—Monomer units or repeat units incorporating structural elements in the main chain incorporating non-aromatic structural elements in the main chain containing heteroatoms
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G2261/00—Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
- C08G2261/40—Polymerisation processes
- C08G2261/42—Non-organometallic coupling reactions, e.g. Gilch-type or Wessling-Zimmermann type
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G61/00—Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
- C08G61/02—Macromolecular compounds containing only carbon atoms in the main chain of the macromolecule, e.g. polyxylylenes
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/04—Oxygen-containing compounds
- C08K5/05—Alcohols; Metal alcoholates
- C08K5/053—Polyhydroxylic alcohols
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/36—Sulfur-, selenium-, or tellurium-containing compounds
- C08K5/41—Compounds containing sulfur bound to oxygen
- C08K5/42—Sulfonic acids; Derivatives thereof
Definitions
- the invention relates to an integrated circuit according to the preamble of claim 1 and a method for producing an integrated circuit with an organic semiconductor according to claim 8.
- a field-effect transistor is especially considered organic if the semiconductive layer is made of an organic material.
- RF-ID radio frequency identification
- thermo distortion of most eligible inexpensive substrates eg polyethylene terephthalate (PET), polyethylene naphthalate (PEN)
- PET polyethylene terephthalate
- PEN polyethylene naphthalate
- this temperature limit can be up to 200 ° C. increase, but with the restriction that the distortion of the substrate is indeed reduced, but not prevented.
- a critical process step in electronic components is the deposition of the dielectric layer, in particular the gate dielectric layer of an OFET.
- Very high demands are placed on the quality of dielectrics in OFETs in terms of thermal, chemical, mechanical and electrical properties.
- Silicon dioxide (Si0 2 ) is currently the most commonly used gate dielectric in OFETs, based on the broad availability in semiconductor technology. Thus, transistor structures are described in which a doped silicon wafer serves as the gate electrode, and thermal SiO 2 grown thereon forms the gate dielectric. This Si0 2 is prepared at temperatures of about 800 -1000 ° C. Other processes (eg CVD) for the deposition of Si0 2 on different substrates also work at temperatures above 400 ° C. A group at PennState University has developed a process (ion beam sputtering) that allows to deposit high quality Si0 2 at process temperatures of 80 ° C. This is illustrated in the articles by CD Sheraw, JA Nichols, DJ Gundlach, JR Huang, CC Kuo, H.
- inorganic nitrides such as SiN x .
- TaN x Similar to the preparation of inorganic oxides, the deposits require inorganic Nitrides high temperatures or high process costs. For example, see the article by BK Crone, A. Dodabalapur, R. Sarpeshkar, RW Filas, YY Lin, Z. Bao, JH O'Neill, W.Li, and HE Katz, J. Appl. Phys. 89, 512 (2001).
- organic polymers such as poly-4-vinylphenol (PVP), poly-4-vinylphenol-co-2-hydroxyethyl methacrylate or polyimide (PI) have been used. These polymers are characterized by their comparatively simple processability. So they are e.g. from the
- the present invention has for its object to provide an integrated circuit with an organic semiconductor and a method, wherein the production of dielectric layers of OEFT's at low temperatures is possible.
- the integrated circuit with an organic semiconductor is composed of a polymer formulation
- the integrated circuits according to the invention are, in particular, OFETs with organic layers which have outstanding dielectrical properties.
- the integrated circuits can be easily produced at low temperatures (up to 150 ° C) due to the specific polymer formulation used. In principle, this polymer formulation can also be used in conjunction with other electronic components.
- At least one base polymer is a phenol-containing polymer or copolymer, in particular poly-4-vinylphenol, poly-4-vinylphenol-co-methacrylic acid-2 - hydroxyethyl ester or poly-4-vinylphenol-co-methacrylic acid methyl ester.
- At least one electrophilic crosslinker component is a di- or tribenzyl alcohol compound, in particular 4-hydroxymethylbenzyl alcohol.
- the thermal acid catalyst used is at least one sulfonic acid, in particular 4-toluenesulfonic acid, since it is capable of transferring a proton to the hydroxy group of a benzyl alcohol below 150 ° C.
- Advantageous solvents are an alcohol, in particular n-butanol, propylene glycol monomethyl ether acetate (PGMEA), dioxane, N-methylpyrrolidone (NMP), ⁇ -butyrolactone, xylene or a mixture.
- PMEA propylene glycol monomethyl ether acetate
- NMP N-methylpyrrolidone
- ⁇ -butyrolactone xylene or a mixture.
- the proportion of base polymer, crosslinking component and acid generator has a proportion of between 5 and 20% by mass.
- the object is also achieved by a method for producing an integrated circuit, in particular an OFET with a dielectric layer, having the features of claim 1. According to the invention
- At least one further structuring of the OFET is then advantageously carried out.
- Polymer formulation by spin coating, printing or spraying.
- the crosslinking reaction is advantageously carried out under an inert gas, in particular a N 2 atmosphere.
- an active layer for forming an OFET in particular from the semiconducting pentacene, is applied to the source-drain layer.
- a passivation layer is arranged on the active layer.
- Fig. 1 is a schematic representation of an organic field effect transistor
- FIG. 2 shows an example of a crosslinking reaction of a polymeric gate dielectric with PVP and 4-hydroxymethylbenzyl alcohol as crosslinker
- FIG. 3a shows an output characteristic of an OFET with an electrophilically networked gate dielectric
- FIG. 3b shows a characteristic curve of an OFET with electrophilically networked gate dielectric
- OFETs are electronic components consisting of multiple layers (layers), all of which are structured to generate integrated circuits through interconnections of individual layers.
- 1 shows the basic structure of such a transistor in a bottom-contact architecture.
- a gate electrode 2 is arranged, which is covered by a gate dielectric layer 3.
- the substrate 1 with the gate electrode 2 already arranged thereon is the starting material to which the gate dielectric layer 3 is applied.
- the gate dielectric layer 3 there are disposed a drain layer 4a and a source layer 4b, both connected to the active semiconducting layer 5 in FIG.
- a passivation layer 6 is arranged above the active layer 5.
- circuits according to the invention and their manufacture solve the problem of providing OFETs with gate dielectric layers, in particular with organic ICs having excellent mechanical, chemical and electrical properties at simultaneously low process temperatures.
- an OFET has a dielectric layer which can be produced from a mixture (polymer formulation) with basically four constituents: a base polymer, a crosslinking component, a thermal acid generator and a solvent.
- a mixture polymer formulation
- An embodiment of the circuit according to the invention cited here by way of example has a polymer formulation with the following constituents
- a solvent e.g. Alcohols, PGMEA.
- This polymer formulation is applied to a suitably prepared substrate 1 (gate structures 2 are already defined on the substrate 1).
- Polymer formulation may e.g. printed, spin-coated or sprayed on. By subsequent drying at moderate temperatures (about 100 ° C), the polymer formulation is fixed to the substrate and then converted into its final structure in a thermal crosslinking step.
- Fig. 2 is shown schematically how PVP is cross-linked with 4-hydroxymethylbenzyl alcohol at a temperature of 150 ° C with elimination of water.
- the compounds shown below can be used as electrophilic crosslinkers:
- R 2 alkyl having 1 to 10 Kohl ⁇ stoHatom ⁇ n or aryl
- the crucial step for the production of gate dielectric layers 3 with the required properties is this crosslinking reaction and its initiation at temperatures which are not critical for the substrate. These are temperatures from 20 ° C to a maximum of 150 ° C.
- the use of the method reduces the required crosslinking temperature by more than 50 ° C compared to the previously known methods (see article by Halik et al. (2002)).
- the base polymer determines the basic properties of the gate dielectric layer 3.
- the basic polymers are in principle suitable for all phenol-containing polymers and their copolymers, such as e.g. Poly-4-vinyl-phenol, poly-4-vinylphenol - co-methacrylic acid-2-hydroxyethyl ester or poly-4-vinylphenol-co-methacrylic acid methyl ester.
- the mechanical properties of the polymer layer and the resistance to chemicals can be significantly controlled.
- the temperature of the initiation of the crosslinking reaction can be controlled.
- the choice of solvent determines the film forming properties of the formulation.
- Formulation 1 is a 10% solution in
- PMEA Propylene glycol monomethyl ether acetate
- Formulation 2 is a 10% solution in PGMEA. There are 100 parts of base polymer, 20 parts of crosslinker and 2.5 parts of acid generator. The proportion of crosslinker is therefore twice as high as in Formulation 1.
- a photoresist is applied to the cross-linked polymer layer (gate dielectric layer 3) (S 1813, 3000 rpm, 30 seconds) and dried at 100 ° C. for 2 minutes. Subsequently, the later contact holes are defined by exposure and development of the photoresist. The Opening of the contact holes by means of oxygen plasma (2 times 45s at 100W).
- the source-drain layer 4 is deposited and patterned by standard methods (30 nm Au thermally evaporated, photolithographic structuring and wet-chemical etching with I / KI solution).
- the layer thickness of the gate dielectric layers 2 for formulation 1 210 nm.
- the roughness of the layer is 0.5 nm to 50 ⁇ m.
- the roughness of the layer is 0, 6 nm to 50 microns.
- the transistors or circuits are completed by the active component 5 (pentacene here) is thermally evaporated. Apart from the passivation layer 6, the structure of an OFET according to FIG. 1 is thus produced.
- FIG. 3 a shows an output characteristic family of a pentacene OFET with electrophilically crosslinked gate dielectric.
- Fig. 3b shows for the same structure
- FIG. 4 shows a drawing of an oscilloscope representation. The characteristic of a 5 Stages of the ring oscillator, wherein the ring oscillator operates with a signal delay of 120 microseconds per stage.
- the invention is not limited in its execution to the above-mentioned preferred embodiments. Rather, a number of variants are conceivable which make use of the device according to the invention and the method according to the invention even in fundamentally different embodiments.
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Wood Science & Technology (AREA)
- General Chemical & Material Sciences (AREA)
- Thin Film Transistor (AREA)
- Formation Of Insulating Films (AREA)
- Compositions Of Macromolecular Compounds (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10340609A DE10340609A1 (de) | 2003-08-29 | 2003-08-29 | Polymerformulierung und Verfahren zur Herstellung einer Dielektrikumsschicht |
PCT/DE2004/001904 WO2005023876A2 (de) | 2003-08-29 | 2004-08-24 | Integrierte schaltung und verfahren zur herstellung einer integrierten schaltung |
Publications (1)
Publication Number | Publication Date |
---|---|
EP1658624A2 true EP1658624A2 (de) | 2006-05-24 |
Family
ID=34258372
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP04786186A Withdrawn EP1658624A2 (de) | 2003-08-29 | 2004-08-24 | Integrierte schaltung und verfahren zur herstellung einer integrierten schaltung |
Country Status (7)
Country | Link |
---|---|
US (1) | US20060202198A1 (zh) |
EP (1) | EP1658624A2 (zh) |
JP (1) | JP2007504642A (zh) |
KR (1) | KR100718358B1 (zh) |
CN (1) | CN1875432A (zh) |
DE (1) | DE10340609A1 (zh) |
WO (1) | WO2005023876A2 (zh) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
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KR100606655B1 (ko) * | 2004-09-22 | 2006-08-01 | 한국전자통신연구원 | 광반응성 유기고분자 게이트 절연막 조성물 및 이를이용한 유기박막 트랜지스터 |
US20060113569A1 (en) * | 2004-11-03 | 2006-06-01 | Akinwande Akintunde I | Control of threshold voltage in organic field effect transistors |
US20060231829A1 (en) * | 2005-04-13 | 2006-10-19 | Xerox Corporation | TFT gate dielectric with crosslinked polymer |
KR100794720B1 (ko) * | 2006-08-28 | 2008-01-21 | 경희대학교 산학협력단 | 유기 박막 트랜지스터 표시판 및 그 제조 방법 |
TWI375119B (en) * | 2008-10-02 | 2012-10-21 | Ind Tech Res Inst | Composition for forming photosensitive dielectric material and application thereof |
US8623447B2 (en) | 2010-12-01 | 2014-01-07 | Xerox Corporation | Method for coating dielectric composition for fabricating thin-film transistors |
EP3198614B1 (en) * | 2014-09-25 | 2019-02-27 | Basf Se | Ether-based polymers as photo-crosslinkable dielectrics |
DE102021125407A1 (de) | 2021-09-30 | 2023-03-30 | Polymer Competence Center Leoben Gmbh | Verfahren zur Herstellung eines Dielektrikums für einen Kondensator und Verfahren zur Herstellung eines Kondensators und Kondensator |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
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DE3826363A1 (de) * | 1988-08-03 | 1990-02-08 | Merck Patent Gmbh | Saeurehaertbare bindemittelsysteme mit 1,2-disulfonen |
US5717003A (en) * | 1988-08-03 | 1998-02-10 | Ciba Specialty Chemicals Corporation | Acid-curable binder systems containing 1,2-disulfones |
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2003
- 2003-08-29 DE DE10340609A patent/DE10340609A1/de not_active Ceased
-
2004
- 2004-08-24 CN CNA2004800321045A patent/CN1875432A/zh active Pending
- 2004-08-24 JP JP2006524221A patent/JP2007504642A/ja not_active Abandoned
- 2004-08-24 EP EP04786186A patent/EP1658624A2/de not_active Withdrawn
- 2004-08-24 KR KR1020067004056A patent/KR100718358B1/ko not_active IP Right Cessation
- 2004-08-24 WO PCT/DE2004/001904 patent/WO2005023876A2/de active IP Right Grant
-
2006
- 2006-02-28 US US11/364,847 patent/US20060202198A1/en not_active Abandoned
Non-Patent Citations (1)
Title |
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See references of WO2005023876A2 * |
Also Published As
Publication number | Publication date |
---|---|
DE10340609A1 (de) | 2005-04-07 |
CN1875432A (zh) | 2006-12-06 |
WO2005023876A3 (de) | 2005-08-18 |
WO2005023876A2 (de) | 2005-03-17 |
US20060202198A1 (en) | 2006-09-14 |
JP2007504642A (ja) | 2007-03-01 |
KR20060069479A (ko) | 2006-06-21 |
KR100718358B1 (ko) | 2007-05-14 |
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