EP1638070B1 - Méthode et circuit pour la compensation d'effets de vieillissement dans une diode électroluminescente organique - Google Patents

Méthode et circuit pour la compensation d'effets de vieillissement dans une diode électroluminescente organique Download PDF

Info

Publication number
EP1638070B1
EP1638070B1 EP05020442A EP05020442A EP1638070B1 EP 1638070 B1 EP1638070 B1 EP 1638070B1 EP 05020442 A EP05020442 A EP 05020442A EP 05020442 A EP05020442 A EP 05020442A EP 1638070 B1 EP1638070 B1 EP 1638070B1
Authority
EP
European Patent Office
Prior art keywords
current
light
voltage
emitting diode
oled
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
EP05020442A
Other languages
German (de)
English (en)
Other versions
EP1638070A2 (fr
EP1638070A3 (fr
Inventor
Oliver Schneider
Jan Birnstock
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NovaLED GmbH
Original Assignee
NovaLED GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NovaLED GmbH filed Critical NovaLED GmbH
Publication of EP1638070A2 publication Critical patent/EP1638070A2/fr
Publication of EP1638070A3 publication Critical patent/EP1638070A3/fr
Application granted granted Critical
Publication of EP1638070B1 publication Critical patent/EP1638070B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G09G3/3225—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
    • G09G3/3233—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix with pixel circuitry controlling the current through the light-emitting element
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/08—Active matrix structure, i.e. with use of active elements, inclusive of non-linear two terminal elements, in the pixels together with light emitting or modulating elements
    • G09G2300/0809—Several active elements per pixel in active matrix panels
    • G09G2300/0842—Several active elements per pixel in active matrix panels forming a memory circuit, e.g. a dynamic memory with one capacitor
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/02—Improving the quality of display appearance
    • G09G2320/029—Improving the quality of display appearance by monitoring one or more pixels in the display panel, e.g. by monitoring a fixed reference pixel
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/04—Maintaining the quality of display appearance
    • G09G2320/043—Preventing or counteracting the effects of ageing

Definitions

  • the invention relates to a method for aging compensation of an organic light emitting diode (OLED) and a circuit arrangement.
  • OLED organic light emitting diode
  • OLEDs Organic light emitting diodes, so-called OLEDs, are traversed by a forward current in operation in the forward direction and show electroluminescence phenomena. The strength of the electroluminescence is dependent on the size of the forward current.
  • OLEDs usually have the disadvantage that an aging occurs in which the strength of the electroluminescence drops at the same forward current. This aging is accompanied by an increase in the on-resistance of the OLED. Accordingly, a forward voltage that drops across the OLED at the same current behaves. This increases with constant current flow with progressive aging of the OLED. More generally, the characteristic of an OLED changes with progressive aging.
  • the aging of the OLED can be considered as a condition that can give the same state of aging regardless of the type of current previously flowed. A short high current flow leads to the same state as a long low current flow. The same applies to the picture contents displayed on a display. A pixel that has been driven very bright for a short time reaches the same state as a pixel that has been operated at low brightness for a long time. Therefore, with knowledge of the aging state, the control can be corrected accordingly.
  • a display can be formed from many OLEDs which, depending on the information shown, have an individual aging behavior.
  • the display comprises an OLED reference pixel whose voltage drop is determined by means of a measuring circuit.
  • the measuring circuit is connected to an evaluation circuit, which in response to the behavior of the Reference pixels generates a feedback signal.
  • the feedback signal is supplied to the control circuit so that it can compensate for changes in the behavior of the OLED pixels.
  • the document EP 1 318 499 A2 discloses an OLED display having a current source for generating a reference current and a driver transistor for controlling the OLED pixels.
  • the power source generates a current in response to a luminance adjustment signal of the display to adjust the overall luminosity of the display.
  • a method for controlling an OLED display applies voltages to drive OLED pixels of the display.
  • the OLED pixels are individually controlled and the current flowing through them is measured and stored for each pixel. Subsequently, the voltages applied to the OLED pixels are controlled according to the stored current values.
  • the document US 2003/0146888 A1 describes an OLED display, which can be operated in two different modes. In a first mode, the OLED display is operated by means of a constant voltage, while in the second mode, a constant current is used for this purpose.
  • the column drivers of the display matrix are provided with measuring devices. This increases the hardware complexity of the arrangement in considerable extent. How the measurement of the current-voltage characteristics of the pixels takes place is not described and is not obvious to the person skilled in the art.
  • the invention is therefore based on the object to provide a method for the aging compensation of an organic light emitting diode and a circuit arrangement in which the effort, in particular the circuitry complexity, is minimized.
  • the invention includes the idea of storing at least one known current-voltage value pair of the OLED at a time of low aging.
  • the driver transistor is brought from the saturation mode in the linear mode.
  • the current current-voltage value pair of the OLED can be determined and compared with the known current-voltage value pair of the unaged OLED, which is also referred to as desired current-voltage value pair.
  • the control of the OLED is made taking into account the difference between current current-voltage value pair and known current-voltage value pair.
  • the OLED with its driver transistor is inserted into a display matrix in which a plurality of OLEDs are arranged and which is fed via a display supply line, so that the process for aging compensation is carried out in the display matrix.
  • the current parameters of each individual OLED can be determined for the entire display with a single current measuring circuit which measures the current through the supply voltage connection V DD of the display.
  • V DD supply voltage connection
  • the current flowing through that OLED and the associated driver transistor is equal to the current measured by the current sense circuit minus the dark current of the display measured when all the OLEDs are turned off are. This dark current is caused by the leakage currents of the transistors of the matrix.
  • the measured OLED current and the calculated OLED voltage are used to identify the characteristic of the OLED associated with the current state of aging and thus to determine the state of aging.
  • control parameters which were determined taking into account the difference between the current current-voltage value pair and known current-voltage value pair, are stored in a memory until a renewed determination of the aging.
  • different solutions are possible to keep the compensating settings.
  • the storage of the determined values represents a little expensive variant.
  • the supply voltage V DD of the display is lowered so far that the driver transistors no longer operate in saturation mode but in linear mode.
  • all other OLEDs are turned off and the source-drain current I D of the driver transistor of the OLED to be measured is measured via the display supply line.
  • the gate voltage and the measured source-drain current whose source-drain voltage is determined.
  • a forward voltage value of the OLED is calculated.
  • the characteristic change is determined from the comparison of the value pair of current OLED current and current OLED voltage with a desired current-voltage characteristic.
  • the supply voltage V DD is lowered so far that the driver transistor is brought from saturation mode to linear operation.
  • First all OLEDs of the matrix are switched off and a dark current I Doff is measured by the display supply connection.
  • a current I Don is measured, and the difference between I Don and I Doff is used to calculate the source-drain current of the driver transistor I D.
  • the gate voltage and the calculated source-drain current whose source-drain voltage is determined.
  • a forward voltage value of the OLED is calculated.
  • the characteristic change is determined from the comparison of the value pair of current OLED current and current OLED voltage with a desired current-voltage characteristic.
  • a measurement cycle for an OLED then typically consists of a first measurement of the current with all OLEDs switched off and a second measurement in which only the respective OLED is switched on. From the difference so the current is obtained, which has flowed only through this OLED. Leakage currents of the other pixels no longer matter.
  • the source-drain voltage is calculated from the OLED current and the gate voltage at the driver transistor.
  • the voltage applied to the OLED is determined from the difference between the supply voltage and the source-drain voltage in the switched-on state.
  • a multiple application of the method wherein either a change in the gate voltage of the driver transistor, a characteristic section of the OLED characteristic is added and subsequently this characteristic section is used for more precise compensation of aging or changing the supply voltage of the display V DD Characteristic section of the OLED characteristic is recorded and subsequently this characteristic section is used for more precise compensation of aging.
  • the method described can be carried out for each OLED of the display and the current aging state can be stored in a memory.
  • the OLED display for OLED is scanned. This can e.g. be done at intervals or at each power.
  • the stored aging states are then used to compensate for the aging of the OLED, either by analog means, for example via an altered reference voltage from which the control voltage for the respective brightness values is generated, or digitally, by calculating a corrected brightness value.
  • a brightness compensation of the aged OLED and / or a gamma correction adaptation of the matrix can be performed.
  • the circuit arrangement according to the invention provides that a current measurement is connected in the current path.
  • the current measuring circuit is arranged between the connection of the supply voltage V DD and the OLED.
  • the invention can be used for aging compensation in various applications of OLEDs.
  • One possible use is a display matrix, within which a plurality of lighting or display elements are arranged, which consists of the circuit OLED, driver and drive transistor are formed. It is provided that the circuit is arranged several times in rows and columns of a display matrix, wherein all these circuits have a common connection to the supply voltage V DD . To use the method according to the invention it is provided that the current measuring circuit is in the common connection of the circuits to the supply voltage V DD .
  • Two mutually alternative, expedient embodiments of the circuit arrangement are in the spatial arrangement of the current measuring circuit, namely on the one hand in or on the drive circuit or on the substrate of the display matrix.
  • an OLED 1 is in a current path together with the drain-source path of a driver transistor 2 between a supply voltage V DD and ground.
  • the gate of the driver transistor 2 is connected to a drive transistor 3.
  • a data voltage V Data is applied to the data line 4 and a row voltage V Row to the row selection line 5, whereby the driver transistor 2 receives a gate voltage V GS .
  • Fig. 2 represents a section of an OLED display matrix. As an example, two times two OLEDs are shown, with the hatched area simplified for a circuit 6 after FIG. 1 stands. It is shown how the current measuring circuit 7 is integrated in the supply line of the display matrix and measures the total current of the display through all the pixels.
  • the supply voltage V DD is selected so that the driver transistor 2 operates in saturation mode, that is when driving a gate voltage V GS drives a current independent of the OLED voltage through this.
  • Fig. 3 is also the characteristic curve 9 of the OLED 1 in the less-aged state, preferably in the manufacturing state, also referred to above as the known or desired state, and the characteristic curve 10 of the OLED 1 in the aged state.
  • This state represents the current state in the intended aging compensation.
  • a current now sets through the drain-source path of the driver transistor 2 which is equal to the current I D through the OLED 1.
  • This stream is according to Fig. 3 in the aged as well as in the unaged state of the OLED 1 always the same, regardless of the voltage V DS across the transistor. It depends only on the voltage V GS .
  • V DD ⁇ ( V GS ; I D ).
  • V t represents the threshold voltage of the driver transistor 2.
  • V GS V GSmax .
  • V OLED V DD - V DS
  • V OLED V DD - V DS
  • the knowledge of the voltage across the OLED 1 is suitable to determine the current-voltage value pair, ie the operating point 11, which uniquely identifies the associated characteristic curve 10 and thus describes the aging state of the OLED1.
  • the characteristic curve 10 has been shown with the characteristic curve 10 by way of example a characteristic which corresponds to a specific aging state.
  • the measurements can typically only be performed separately for each OLED. In any case, only one current measuring circuit 7 is required for the entire display, but this does not have to be on the matrix, so that the circuit complexity of the matrix is not increased. However, it is also possible to make an average measurement of the current for all pixels at the same time, when all pixels have approximately the same aging state and all driver transistors of a matrix have the same characteristic. Then, with a current measurement for the entire matrix according to the same method as described above, the average aging state of all OLEDs is determined.
  • the threshold voltage of the driver transistor necessary for the calculation of the voltage V DS in linear operation can be determined by measuring the current through the OLED at two different gate voltages in the saturation mode of the transistor.
  • the currents I DSat1 and I Dsat2 are also referred to as I Don1 and I Don2 .
  • a simple and rapid determination of the aging state of the OLED can be carried out. If higher accuracy is needed, this can be done by measuring two or more value pairs per OLED. In this case, either the gate voltage of the driver transistor or the supply voltage V DD is to be changed, whereby in both cases the self-adjusting current I D is changed. For example, an adaptation of the gamma correction can be carried out with the thus measured characteristic section.
  • the disadvantage is the increased expenditure of time, which is why this multi-point method is less frequent.
  • the multipoint method can be used for additional quality enhancement and the simple one-point method for the main compensation.

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Electroluminescent Light Sources (AREA)

Claims (15)

  1. Procédé pour la compensation des effets de vieillissement d'une diode électroluminescente organique (OLED) qui est alimenté d'une tension d'alimentation et est commutée via un transistor d'attaque exploité en mode de saturation au moyen d'une excitation de la diode électroluminescente, étant donné que le procédé comprend les étapes suivantes :
    - enregistrement d'au moins une paire de valeurs de consigne courant/tension d'une courbe caractéristique de valeurs de consigne courant/tension de la diode électroluminescente,
    - transition du transistor d'attaque pendant un cycle de mesure du mode de saturation en un mode linéaire,
    - mesure d'une valeur de courant pour le courant qui traverse la diode électroluminescente au moyen d'un circuit de mesure de courant dans le cycle de mesure,
    - Détermination d'au moins une paire de valeurs courant/tension actuelle d'une courbe caractéristique de valeurs courant/tension actuelle de la diode électroluminescente au moyen de la valeur de courant mesurée,
    - comparaison de la ou des paires de valeurs courant/tension actuelles de la diode électroluminescente avec la paire de valeurs de consigne courant/tension de la diode électroluminescente et
    - génération de paramètres d'excitation pour l'excitation de la diode électroluminescente en fonction du résultat de la comparaison.
  2. Procédé selon la revendication 1, caractérisé en ce que les paramètres d'excitation sont enregistrés dans une mémoire jusqu'à une nouvelle détermination des effets de vieillissement.
  3. Procédé selon la revendication 1 ou 2, caractérisé en ce que la compensation des effets de vieillissement est exécutée dans un afficheur avec une matrice de plusieurs diodes électroluminescentes (OLED), étant donné que
    - pendant le cycle de mesure, toutes les multiples diodes électroluminescentes de la matrice sont déconnectées,
    - un courant global IDoff de la matrice à travers une conduite d'alimentation de l'afficheur est mesuré,
    - par la suite, une des multiples diodes électroluminescentes à mesurer et un transistor d'attaque associé sont connectés,
    - pour la diode électroluminescente à mesurer et le transistor d'attaque associé, deux mesures du courant en mode de saturation du transistor d'attaque, IDon1 et IDON2, sont effectuées à deux tensions de gâchette différentes UGS1, UGS2, et
    - à partir du courant total IDoff, des courants IDON1, IDON2 et des tensions de gâchette UGS1, UGS2, on calcule une tension de seuil du transistor d'attaque associé pour la diode électroluminescente à mesurer.
  4. Procédé selon la revendication 1 ou 2, caractérisé en ce que la compensation des effets de vieillissement est exécutée dans un afficheur avec une matrice de plusieurs diodes électroluminescentes (OLED), étant donné que
    - une tension d'alimentation VDD est réduite de manière à ce que les transistors d'attaque des multiples diodes électroluminescentes soient commutées du mode de saturation en mode linéaire,
    - toutes les multiples diodes électroluminescentes sont tout d'abord déconnectées,
    - par la suite, une des multiples diodes électroluminescentes à mesurer est connectée et le courant Source-Drain IDonlinear à travers la conduite d'alimentation de l'afficheur est mesurée pour le transistor d'attaque associé de la diode électroluminescente à mesurer,
    - au moyen de la courbe caractéristique du transistor d'attaque associé, de la tension de gâchette et du courant source-drain à mesurer, on détermine la tension source-drain du transistor d'attaque associé pour la diode électroluminescente à mesurer,
    - à partir de la différence entre la tension d'alimentation et la tension source-drain calculée, on calcule une valeur de tension directe pour la diode électroluminescente à mesurer et
    - une variation de la courbe caractéristique est déterminée à partir de la comparaison de la paire de valeurs de consigne courant/tension avec la paire de valeurs courant/tension actuelles pour la diode électroluminescente à mesurer.
  5. Procédé selon la revendication 4, caractérisé en ce que, après la déconnexion des multiples diodes électroluminescentes, on mesure un courant d'obscurité IDofflinear à travers la conduite d'alimentation de l'afficheur.
  6. Procédé selon la revendication 4 ou 5, caractérisé en ce que, par l'application multiple du procédé en variant la tension de gâchette du transistor d'attaque associé, on enregistre une partie de courbe caractéristique de la courbe OLED et, par la suite, on utilise cette partie de courbe caractéristique pour une compensation plus précise des effets de vieillissement.
  7. Procédé selon la revendication 4 ou 5, caractérisé en ce que, par l'application multiple du procédé en variant la tension d'alimentation VDD, on enregistre une partie de courbe caractéristique de la courbe OLED et, par la suite, on utilise cette partie de courbe caractéristique pour une compensation plus précise des effets de vieillissement.
  8. Procédé selon l'une quelconque des revendications 1 à 7, caractérisé en ce que la compensation des effets de vieillissement est exécutée à chaque mise en marche.
  9. Procédé selon l'une quelconque des revendications 1 à 8, caractérisé en ce que la compensation des effets de vieillissement est exécutée à chaque mise en marche.
  10. Procédé selon l'une quelconque des revendications 3 à 7 ou l'une quelconque des revendications 8 et 9 en référence à la revendication 3 ou 4, caractérisé en ce qu'on procède à une adaptation de correction gamma des multiples diodes électroluminescentes de la matrice à l'aide de l'excitation.
  11. Ensemble de circuits pour l'exécution du procédé selon l'une quelconque des revendications 1 à 11 avec un circuit présentant une diode électroluminescente (OLED) qui, ensemble avec un trajet drain-source d'un transistor d'attaque dont la gâchette est reliée à un transistor d'excitation, est connecté dans un trajet de courant entre une tension d'alimentation VDD et la masse et est reliée à un circuit d'excitation relié au circuit, excitant ce dernier, caractérisé en ce qu'un circuit de mesure de courant (7) est connecté dans le trajet de courant.
  12. Ensemble de circuits selon la revendication 11, caractérisé en ce que le circuit de mesure de courant (7) est disposé entre un raccord de la tension d'alimentation VDD et la diode électroluminescente (1).
  13. Ensemble de circuits selon la revendication 11, caractérisé en ce que le circuit (6) est disposé plusieurs fois en séries et colonnes d'une matrice d'afficheur, étant donné que tous les circuits 86) présentent une liaison commune avec la tension d'alimentation VDD et en ce que le circuit de mesure de courant (7) se trouve dans la liaison commune des circuits (6) avec la tension d'alimentation VDD.
  14. Ensemble de circuits selon la revendication 13, caractérisé en ce que le circuit de mesure de courant est disposé spatialement dans ou au niveau du circuit d'excitation.
  15. Ensemble de circuits selon la revendication 13, caractérisé en ce que le circuit de mesure de courant est disposé spatialement sur un substrat de la matrice de l'afficheur.
EP05020442A 2004-09-20 2005-09-20 Méthode et circuit pour la compensation d'effets de vieillissement dans une diode électroluminescente organique Active EP1638070B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102004045871A DE102004045871B4 (de) 2004-09-20 2004-09-20 Verfahren und Schaltungsanordnung zur Alterungskompensation von organischen Lichtemitterdioden

Publications (3)

Publication Number Publication Date
EP1638070A2 EP1638070A2 (fr) 2006-03-22
EP1638070A3 EP1638070A3 (fr) 2006-10-18
EP1638070B1 true EP1638070B1 (fr) 2008-08-20

Family

ID=35539261

Family Applications (1)

Application Number Title Priority Date Filing Date
EP05020442A Active EP1638070B1 (fr) 2004-09-20 2005-09-20 Méthode et circuit pour la compensation d'effets de vieillissement dans une diode électroluminescente organique

Country Status (3)

Country Link
US (1) US7656370B2 (fr)
EP (1) EP1638070B1 (fr)
DE (1) DE102004045871B4 (fr)

Families Citing this family (95)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100953637B1 (ko) * 2003-07-07 2010-04-20 엘지전자 주식회사 광디스크 및 광디스크의 디스크정보 기록방법
CA2443206A1 (fr) 2003-09-23 2005-03-23 Ignis Innovation Inc. Panneaux arriere d'ecran amoled - circuits de commande des pixels, architecture de reseau et compensation externe
CA2472671A1 (fr) 2004-06-29 2005-12-29 Ignis Innovation Inc. Procede de programmation par tensions pour affichages a del excitees par courant
US7252408B2 (en) * 2004-07-19 2007-08-07 Lamina Ceramics, Inc. LED array package with internal feedback and control
US7540978B2 (en) 2004-08-05 2009-06-02 Novaled Ag Use of an organic matrix material for producing an organic semiconductor material, organic semiconductor material and electronic component
CA2490858A1 (fr) 2004-12-07 2006-06-07 Ignis Innovation Inc. Methode d'attaque pour la programmation a tension compensee d'affichages del organiques a matrice active
US8576217B2 (en) 2011-05-20 2013-11-05 Ignis Innovation Inc. System and methods for extraction of threshold and mobility parameters in AMOLED displays
US20140111567A1 (en) 2005-04-12 2014-04-24 Ignis Innovation Inc. System and method for compensation of non-uniformities in light emitting device displays
US10013907B2 (en) 2004-12-15 2018-07-03 Ignis Innovation Inc. Method and system for programming, calibrating and/or compensating, and driving an LED display
US10012678B2 (en) 2004-12-15 2018-07-03 Ignis Innovation Inc. Method and system for programming, calibrating and/or compensating, and driving an LED display
US9280933B2 (en) 2004-12-15 2016-03-08 Ignis Innovation Inc. System and methods for extraction of threshold and mobility parameters in AMOLED displays
US9799246B2 (en) 2011-05-20 2017-10-24 Ignis Innovation Inc. System and methods for extraction of threshold and mobility parameters in AMOLED displays
EP2688058A3 (fr) 2004-12-15 2014-12-10 Ignis Innovation Inc. Procédé et système pour programmer, étalonner et commander un affichage de dispositif électroluminescent
US9171500B2 (en) 2011-05-20 2015-10-27 Ignis Innovation Inc. System and methods for extraction of parasitic parameters in AMOLED displays
US9275579B2 (en) 2004-12-15 2016-03-01 Ignis Innovation Inc. System and methods for extraction of threshold and mobility parameters in AMOLED displays
CA2496642A1 (fr) 2005-02-10 2006-08-10 Ignis Innovation Inc. Methode d'attaque a courte duree de stabilisation pour afficheurs a diodes organiques electroluminescentes (oled) programmes par courant
EP2045843B1 (fr) * 2005-06-01 2012-08-01 Novaled AG Composant émettant de la lumière à l'aide d'un agencement d'électrodes
TW200707376A (en) 2005-06-08 2007-02-16 Ignis Innovation Inc Method and system for driving a light emitting device display
EP1739765A1 (fr) * 2005-07-01 2007-01-03 Novaled AG Diode organoluminescent et empilement des OLEDs
CA2518276A1 (fr) 2005-09-13 2007-03-13 Ignis Innovation Inc. Technique de compensation de la degradation de luminance dans des dispositifs electroluminescents
US9269322B2 (en) 2006-01-09 2016-02-23 Ignis Innovation Inc. Method and system for driving an active matrix display circuit
US9489891B2 (en) 2006-01-09 2016-11-08 Ignis Innovation Inc. Method and system for driving an active matrix display circuit
JP5397219B2 (ja) 2006-04-19 2014-01-22 イグニス・イノベーション・インコーポレイテッド アクティブマトリックス表示装置用の安定な駆動スキーム
CA2556961A1 (fr) 2006-08-15 2008-02-15 Ignis Innovation Inc. Technique de compensation de diodes electroluminescentes organiques basee sur leur capacite
KR100872352B1 (ko) * 2006-11-28 2008-12-09 한국과학기술원 데이터 구동회로 및 이를 포함하는 유기발광표시장치
US8077123B2 (en) * 2007-03-20 2011-12-13 Leadis Technology, Inc. Emission control in aged active matrix OLED display using voltage ratio or current ratio with temperature compensation
US20080266214A1 (en) * 2007-04-24 2008-10-30 Leadis Technology, Inc. Sub-pixel current measurement for oled display
JP5466694B2 (ja) 2008-04-18 2014-04-09 イグニス・イノベーション・インコーポレイテッド 発光デバイス・ディスプレイのためのシステムおよび駆動方法
JP2009294376A (ja) * 2008-06-04 2009-12-17 Hitachi Displays Ltd 画像表示装置
JP5250493B2 (ja) * 2008-07-16 2013-07-31 株式会社半導体エネルギー研究所 発光装置
CA2637343A1 (fr) 2008-07-29 2010-01-29 Ignis Innovation Inc. Amelioration de pilote de source d'affichage
US9370075B2 (en) 2008-12-09 2016-06-14 Ignis Innovation Inc. System and method for fast compensation programming of pixels in a display
US8217928B2 (en) * 2009-03-03 2012-07-10 Global Oled Technology Llc Electroluminescent subpixel compensated drive signal
US8194063B2 (en) * 2009-03-04 2012-06-05 Global Oled Technology Llc Electroluminescent display compensated drive signal
US9311859B2 (en) 2009-11-30 2016-04-12 Ignis Innovation Inc. Resetting cycle for aging compensation in AMOLED displays
US9384698B2 (en) 2009-11-30 2016-07-05 Ignis Innovation Inc. System and methods for aging compensation in AMOLED displays
CA2669367A1 (fr) 2009-06-16 2010-12-16 Ignis Innovation Inc Technique de compensation pour la variation chromatique des ecrans d'affichage .
US10319307B2 (en) * 2009-06-16 2019-06-11 Ignis Innovation Inc. Display system with compensation techniques and/or shared level resources
CA2688870A1 (fr) 2009-11-30 2011-05-30 Ignis Innovation Inc. Procede et techniques pour ameliorer l'uniformite d'affichage
US10996258B2 (en) 2009-11-30 2021-05-04 Ignis Innovation Inc. Defect detection and correction of pixel circuits for AMOLED displays
US8803417B2 (en) 2009-12-01 2014-08-12 Ignis Innovation Inc. High resolution pixel architecture
CA2687631A1 (fr) 2009-12-06 2011-06-06 Ignis Innovation Inc Mecanisme de commande a faible puissance pour applications d'affichage
CA2692097A1 (fr) 2010-02-04 2011-08-04 Ignis Innovation Inc. Extraction de courbes de correlation pour des dispositifs luminescents
US10089921B2 (en) 2010-02-04 2018-10-02 Ignis Innovation Inc. System and methods for extracting correlation curves for an organic light emitting device
US9881532B2 (en) 2010-02-04 2018-01-30 Ignis Innovation Inc. System and method for extracting correlation curves for an organic light emitting device
US20140313111A1 (en) 2010-02-04 2014-10-23 Ignis Innovation Inc. System and methods for extracting correlation curves for an organic light emitting device
US10163401B2 (en) 2010-02-04 2018-12-25 Ignis Innovation Inc. System and methods for extracting correlation curves for an organic light emitting device
JP5443188B2 (ja) * 2010-02-04 2014-03-19 グローバル・オーエルイーディー・テクノロジー・リミテッド・ライアビリティ・カンパニー 表示装置
US10176736B2 (en) * 2010-02-04 2019-01-08 Ignis Innovation Inc. System and methods for extracting correlation curves for an organic light emitting device
CA2696778A1 (fr) 2010-03-17 2011-09-17 Ignis Innovation Inc. Procedes d'extraction des parametres d'uniformite de duree de vie
US8907991B2 (en) 2010-12-02 2014-12-09 Ignis Innovation Inc. System and methods for thermal compensation in AMOLED displays
US9886899B2 (en) 2011-05-17 2018-02-06 Ignis Innovation Inc. Pixel Circuits for AMOLED displays
US20140368491A1 (en) 2013-03-08 2014-12-18 Ignis Innovation Inc. Pixel circuits for amoled displays
US9351368B2 (en) 2013-03-08 2016-05-24 Ignis Innovation Inc. Pixel circuits for AMOLED displays
US9530349B2 (en) 2011-05-20 2016-12-27 Ignis Innovations Inc. Charged-based compensation and parameter extraction in AMOLED displays
US9466240B2 (en) 2011-05-26 2016-10-11 Ignis Innovation Inc. Adaptive feedback system for compensating for aging pixel areas with enhanced estimation speed
EP2715710B1 (fr) 2011-05-27 2017-10-18 Ignis Innovation Inc. Systèmes et procédés de compensation du vieillissement dans des écrans amoled
US9881587B2 (en) 2011-05-28 2018-01-30 Ignis Innovation Inc. Systems and methods for operating pixels in a display to mitigate image flicker
US9324268B2 (en) 2013-03-15 2016-04-26 Ignis Innovation Inc. Amoled displays with multiple readout circuits
US10089924B2 (en) 2011-11-29 2018-10-02 Ignis Innovation Inc. Structural and low-frequency non-uniformity compensation
US8937632B2 (en) 2012-02-03 2015-01-20 Ignis Innovation Inc. Driving system for active-matrix displays
US9747834B2 (en) 2012-05-11 2017-08-29 Ignis Innovation Inc. Pixel circuits including feedback capacitors and reset capacitors, and display systems therefore
US8922544B2 (en) 2012-05-23 2014-12-30 Ignis Innovation Inc. Display systems with compensation for line propagation delay
US9786223B2 (en) 2012-12-11 2017-10-10 Ignis Innovation Inc. Pixel circuits for AMOLED displays
US9336717B2 (en) 2012-12-11 2016-05-10 Ignis Innovation Inc. Pixel circuits for AMOLED displays
US9830857B2 (en) 2013-01-14 2017-11-28 Ignis Innovation Inc. Cleaning common unwanted signals from pixel measurements in emissive displays
US9171504B2 (en) 2013-01-14 2015-10-27 Ignis Innovation Inc. Driving scheme for emissive displays providing compensation for driving transistor variations
CA2894717A1 (fr) 2015-06-19 2016-12-19 Ignis Innovation Inc. Caracterisation d'un dispositif optoelectronique au moyen d'une ligne de sens partage
US9721505B2 (en) 2013-03-08 2017-08-01 Ignis Innovation Inc. Pixel circuits for AMOLED displays
EP2779147B1 (fr) 2013-03-14 2016-03-02 Ignis Innovation Inc. Re-interpolation avec détection de bord pour extraire un motif de vieillissement d'écrans AMOLED
DE112014002086T5 (de) 2013-04-22 2016-01-14 Ignis Innovation Inc. Prüfsystem für OLED-Anzeigebildschirme
DE112014003719T5 (de) 2013-08-12 2016-05-19 Ignis Innovation Inc. Kompensationsgenauigkeit
US9761170B2 (en) * 2013-12-06 2017-09-12 Ignis Innovation Inc. Correction for localized phenomena in an image array
US9741282B2 (en) 2013-12-06 2017-08-22 Ignis Innovation Inc. OLED display system and method
US9502653B2 (en) 2013-12-25 2016-11-22 Ignis Innovation Inc. Electrode contacts
US10192479B2 (en) 2014-04-08 2019-01-29 Ignis Innovation Inc. Display system using system level resources to calculate compensation parameters for a display module in a portable device
CA2873476A1 (fr) 2014-12-08 2016-06-08 Ignis Innovation Inc. Architecture d'affichage de pixels intelligents
CA2879462A1 (fr) 2015-01-23 2016-07-23 Ignis Innovation Inc. Compensation de la variation de couleur dans les dispositifs emetteurs
CA2886862A1 (fr) 2015-04-01 2016-10-01 Ignis Innovation Inc. Ajustement de la luminosite d'affichage en vue d'eviter la surchauffe ou le vieillissement accelere
CA2889870A1 (fr) 2015-05-04 2016-11-04 Ignis Innovation Inc. Systeme de retroaction optique
CA2892714A1 (fr) 2015-05-27 2016-11-27 Ignis Innovation Inc Reduction de largeur de bande de memoire dans un systeme de compensation
US10373554B2 (en) 2015-07-24 2019-08-06 Ignis Innovation Inc. Pixels and reference circuits and timing techniques
US10657895B2 (en) 2015-07-24 2020-05-19 Ignis Innovation Inc. Pixels and reference circuits and timing techniques
CA2898282A1 (fr) 2015-07-24 2017-01-24 Ignis Innovation Inc. Etalonnage hybride de sources de courant destine a des afficheurs a tension polarisee par courant programmes
CA2900170A1 (fr) 2015-08-07 2017-02-07 Gholamreza Chaji Etalonnage de pixel fonde sur des valeurs de reference ameliorees
CA2908285A1 (fr) 2015-10-14 2017-04-14 Ignis Innovation Inc. Pilote comportant une structure de pixel a plusieurs couleurs
US10102802B2 (en) * 2015-12-30 2018-10-16 Lg Display Co., Ltd. Organic light-emitting display device and method for driving the same
KR102563228B1 (ko) * 2015-12-30 2023-08-07 엘지디스플레이 주식회사 유기전계발광표시장치 및 이의 구동방법
US10755638B2 (en) * 2016-08-16 2020-08-25 Apple Inc. Organic light-emitting diode display with external compensation
US10310636B2 (en) * 2016-11-04 2019-06-04 Microsoft Technology Licensing, Llc Active stylus
CN109671396A (zh) 2017-10-17 2019-04-23 伊格尼斯创新公司 像素电路、显示装置和方法
CN108120915B (zh) * 2017-12-15 2020-05-05 京东方科技集团股份有限公司 应用于显示面板的老化处理方法及老化处理系统
EP3934383A4 (fr) * 2019-02-26 2022-11-23 Kyocera Corporation Substrat d'élément d'émission de lumière, dispositif d'affichage et procédé de réparation de dispositif d'affichage
CN112014712B (zh) * 2020-09-24 2023-03-31 中国振华集团永光电子有限公司（国营第八七三厂） 一种全数字型二极管全动态老化方法及老化装置
KR20230102885A (ko) * 2021-12-30 2023-07-07 엘지디스플레이 주식회사 발광표시장치 및 이의 구동방법

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1318499A (en) * 1919-10-14 Machine for mounting shoes on lasts
US1009204A (en) * 1911-05-23 1911-11-21 Andrew Winden Transmission apparatus.
DE1009204B (de) 1953-10-29 1957-05-29 Separator Ab Randdichtung fuer die Platten von Plattenwaermeaustauschern
WO2001027910A1 (fr) * 1999-10-12 2001-04-19 Koninklijke Philips Electronics N.V. Afficheur a diode electroluminescente
US6414661B1 (en) * 2000-02-22 2002-07-02 Sarnoff Corporation Method and apparatus for calibrating display devices and automatically compensating for loss in their efficiency over time
DE10009204A1 (de) * 2000-02-26 2001-08-30 Univ Stuttgart Verfahren zur Ansteuerung von aktiv adressierten OLED-Displays
EP1158483A3 (fr) * 2000-05-24 2003-02-05 Eastman Kodak Company Affichage à l'état solide avec pixel de référence
JP2003043998A (ja) 2001-07-30 2003-02-14 Pioneer Electronic Corp ディスプレイ装置
JP3852916B2 (ja) * 2001-11-27 2006-12-06 パイオニア株式会社 ディスプレイ装置
US7274363B2 (en) * 2001-12-28 2007-09-25 Pioneer Corporation Panel display driving device and driving method
US7224333B2 (en) * 2002-01-18 2007-05-29 Semiconductor Energy Laboratory Co. Ltd. Display device and driving method thereof
WO2004025615A1 (fr) 2002-09-16 2004-03-25 Koninklijke Philips Electronics N.V. Dispositif d'affichage
US20040070588A1 (en) * 2002-10-09 2004-04-15 Xerox Corporation Systems for spectral multiplexing of source images including a stereogram source image to provide a composite image, for rendering the composite image, and for spectral demultiplexing of the composite image
US20060044227A1 (en) * 2004-06-18 2006-03-02 Eastman Kodak Company Selecting adjustment for OLED drive voltage

Also Published As

Publication number Publication date
DE102004045871B4 (de) 2006-11-23
US20060214888A1 (en) 2006-09-28
DE102004045871A1 (de) 2006-04-06
EP1638070A2 (fr) 2006-03-22
EP1638070A3 (fr) 2006-10-18
US7656370B2 (en) 2010-02-02

Similar Documents

Publication Publication Date Title
EP1638070B1 (fr) Méthode et circuit pour la compensation d'effets de vieillissement dans une diode électroluminescente organique
DE112006002427B4 (de) Steuersysteme für Aktiv-Matrix-Anzeige-Treiber
DE60110664T2 (de) Aktive Ansteuerungsschaltung für Anzeigefelder
DE60224640T2 (de) Anzeigevorrichtung mit aktiver Matrixanzeigetafel
DE602005004878T2 (de) Datentreiberschaltung, OLED (organische lichtemittierende Diode)-Anzeige mit der Datentreiberschaltung und Verfahren zur Ansteuerung der OLED-Anzeige
DE602005002777T2 (de) Lichtemittierende Anzeigevorrichtung
DE102013112721B4 (de) Verfahren zum Treiben einer organischen Licht emittierenden Anzeigevorrichtung
DE60308641T2 (de) Lichtemittierende Anzeige, Anzeigetafel und Verfahren zu ihrer Ansteuerung
DE102017117718A1 (de) Organische Licht emittierende Pixelansteuerungsschaltung, Ansteuerungsverfahren und organische Licht emittierende Anzeigevorrichtung
DE60211809T2 (de) Schaltkreis zur Versorgung der Pixel in einer lumineszierenden Anzeigevorrichtung mit einem vorgegebenen Strom
DE602004007739T2 (de) Pixelschaltung zur Zeitmultiplexansteuerung von Unterpixeln in einer OLED-Farbanzeige
DE112013005918T5 (de) Pixelschaltung für Amoled-Displays
DE60306107T2 (de) Lichtemittierende Anzeige, Anzeigetafel und Verfahren zu deren Ansteuerung
DE102016213263A1 (de) Pixelschaltung, Ansteuerverfahren und Anzeigetafel
DE102017115538A1 (de) Organisches Lichtanzeigefeld mit dazugehörigem Ansteuerungsverfahren und eine organische Lichtanzeigevorrichtung
DE102017129797A1 (de) Elektrolumineszenz-anzeigevorrichtung und ansteuerungsverfahren derselben
DE102012112534B4 (de) Lichtemittierende Anzeigevorrichtung
DE102005059542B4 (de) Organisches Elektrolumineszenzdisplay und Ansteuerungsverfahren für dieses
DE102004022424A1 (de) Schaltung und Ansteuerverfahren für eine Leuchtanzeige
DE102014118997A1 (de) Organische lichtemittierende Anzeigevorrichtung und Verfahren zum Ansteuern derselben
DE10254511A1 (de) Aktiv-Matrix-Ansteuerschaltung
DE102019125377A1 (de) Stromabtastvorrichtung und organische lichtemittierende Anzeigevorrichtung, die sie enthält
DE102015200022A1 (de) Pixel circuit, organic electroluminescent display panel and display device
DE102017115947A1 (de) Organisches Lichtanzeigefeld mit dazugehörigem Ansteuerungsverfahren und einer organischen Lichtanzeigevorrichtung
DE112016002765T5 (de) Pixelschaltungen für Amoled-Displays

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

AK Designated contracting states

Kind code of ref document: A2

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR

AX Request for extension of the european patent

Extension state: AL BA HR MK YU

PUAL Search report despatched

Free format text: ORIGINAL CODE: 0009013

RAP1 Party data changed (applicant data changed or rights of an application transferred)

Owner name: NOVALED AG

AK Designated contracting states

Kind code of ref document: A3

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR

AX Request for extension of the european patent

Extension state: AL BA HR MK YU

17P Request for examination filed

Effective date: 20061103

AKX Designation fees paid

Designated state(s): FR GB

REG Reference to a national code

Ref country code: DE

Ref legal event code: 8566

17Q First examination report despatched

Effective date: 20071001

GRAP Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOSNIGR1

GRAS Grant fee paid

Free format text: ORIGINAL CODE: EPIDOSNIGR3

GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): FR GB

REG Reference to a national code

Ref country code: GB

Ref legal event code: FG4D

Free format text: NOT ENGLISH

PLBE No opposition filed within time limit

Free format text: ORIGINAL CODE: 0009261

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT

26N No opposition filed

Effective date: 20090525

REG Reference to a national code

Ref country code: FR

Ref legal event code: PLFP

Year of fee payment: 12

REG Reference to a national code

Ref country code: FR

Ref legal event code: PLFP

Year of fee payment: 13

REG Reference to a national code

Ref country code: FR

Ref legal event code: PLFP

Year of fee payment: 14

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: GB

Payment date: 20220728

Year of fee payment: 18

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: FR

Payment date: 20220808

Year of fee payment: 18

P01 Opt-out of the competence of the unified patent court (upc) registered

Effective date: 20230515

GBPC Gb: european patent ceased through non-payment of renewal fee

Effective date: 20230920