EP1429332A2 - Appareil et méthode de gestion des rayures non ordonnées dans une disque dur - Google Patents

Appareil et méthode de gestion des rayures non ordonnées dans une disque dur Download PDF

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Publication number
EP1429332A2
EP1429332A2 EP03028483A EP03028483A EP1429332A2 EP 1429332 A2 EP1429332 A2 EP 1429332A2 EP 03028483 A EP03028483 A EP 03028483A EP 03028483 A EP03028483 A EP 03028483A EP 1429332 A2 EP1429332 A2 EP 1429332A2
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EP
European Patent Office
Prior art keywords
sectors
scratch
alleged
sector
track
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP03028483A
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German (de)
English (en)
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EP1429332A3 (fr
Inventor
Moon-Chol Park
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Samsung Electronics Co Ltd
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Samsung Electronics Co Ltd
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Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of EP1429332A2 publication Critical patent/EP1429332A2/fr
Publication of EP1429332A3 publication Critical patent/EP1429332A3/fr
Withdrawn legal-status Critical Current

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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B21/00—Head arrangements not specific to the method of recording or reproducing
    • G11B21/02—Driving or moving of heads
    • G11B21/10—Track finding or aligning by moving the head ; Provisions for maintaining alignment of the head relative to the track during transducing operation, i.e. track following
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
    • G11B20/10—Digital recording or reproducing
    • G11B20/18—Error detection or correction; Testing, e.g. of drop-outs
    • G11B20/1883—Methods for assignment of alternate areas for defective areas
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B2220/00—Record carriers by type
    • G11B2220/20—Disc-shaped record carriers

Definitions

  • the present invention relates to an apparatus and method for managing a defect caused by scratches on a hard disk, and more particularly, to a hard disk drive defect-free algorithm which makes it possible to record user data on normal sectors rather than defective sectors by putting alleged defects on a defect list.
  • FIG. 1 is a diagram illustrating a first operation of a method of managing vertical scratches using a conventional algorithm.
  • information indicating that an n-th track has a defective sector is read from a defect list (11).
  • the next ten vertically adjacent tracks, ranging from the n-th track to an n+9-th track, are checked for a defective sector.
  • the n+8-th track also has a defective sector. Because there is another track having a defective sector other than the n-th track among the ten vertically adjacent sectors, sectors of the ten vertically adjacent tracks are all set as alleged defective sectors and then treated as a scratch.
  • a defective sector of the track that is farthest away from the n-th track among those having a defective sector is set as a target sector.
  • a defective sector of an n+8-th track could be the target sector.
  • all sectors of the ten vertically adjacent tracks from the n-th track to the n+9-th track are set as alleged defective sectors and then treated as a scratch.
  • FIG. 2 is a diagram illustrating a second operation of the method of managing a vertical scratch using the conventional algorithm.
  • lower tracks of the n-th track are checked for a defective sector. For example, if there is a track having a defective sector among 24 lower tracks of the n-th track, all sectors between the defective track of the corresponding track and the defective sector of the n-th track are set as alleged defective sectors and then treated as including a scratch. Likewise, upper tracks of the n-th track are checked for a defective sector.
  • all sectors between the defective track of the corresponding track and the defective sector of the n-th track are set as alleged defective sectors and then treated as a scratch.
  • FIG. 3 is a diagram illustrating a third operation of the method of managing a vertical scratch using the conventional algorithm.
  • a hard disk As a part of a device, a hard disk seldom includes scratches on the surface until it is assembled into a device along with other parts.
  • a hard disk and a head/disk assembly are jig-assembled by moving a head along a pivot of the hard disk with the hard disk at a standstill, an arc-shaped scratch can be formed along the trajectory of the head.
  • the arc-shaped scratch can be seen as being perpendicular to a track direction of the hard disk from a microscopic point of view.
  • scratch filling has been generally performed in expectation of only vertical scratches.
  • hard disk drives are manufactured to be capable of rotating at higher revolutions-per-minute (RPM) and to have higher track-per-inch (TPI) and higher bits-per-inch (BPI) as a result of increasing storage capacities. Accordingly, it becomes more likely that scratches will be more easily formed on the surface of hard disks in random directions, particularly, in a slant-line direction or a horizontal direction with respect to the track direction of the hard disks, because of physical impact on the hard disks or because of a head moving back and forth over a hard disk while the hard disk rotates.
  • conventional vertical scratch filling is not efficient enough to treat such random-directional scratches, and thus a brand-new technique of managing random-directional scratches on a hard disk is necessary.
  • an apparatus for managing random-directional scratches on a hard disk includes a scratch determination unit and an alleged defect setting unit.
  • the scratch determination unit determines that predetermined sectors are affected by a single continuous scratch if the predetermined sectors are defective and a distance therebetween is not larger than a predetermined scratch length.
  • the alleged defect setting unit sets sectors between the predetermined sectors and around each of the predetermined sectors as alleged defective sectors if the defective sectors are determined to be affected by the single continuous scratch.
  • an apparatus for managing random-directional scratches on a hard disk includes a scratch determination unit, an in-between alleged defect setting unit, and an either-end alleged defect setting unit.
  • the scratch determination unit determines an m-th sector of an M-th track and an n-th sector of an N-th track to be affected by a single continuous scratch if the m-th sector of the M-th track and the n-th sector of the N-th track are defective, a difference between M and N is equal to a predetermined scratch treatment conditional value, and a difference between m and n is not larger than a predetermined scratch-treatment critical value.
  • the in-between alleged defect setting unit sets sectors between the m-th sector of the M-th track and the n-th sector of the N-th track as alleged defective sectors if the m-th sector of the M-th track and the n-th sector of the N-th track are determined to be affected by the single continuous scratch and the difference between m and n is larger than 1.
  • the either-end alleged defect setting unit sets predetermined sectors around the m-th sector of the M-th track and the n-th sector of the N-th track as alleged defective sectors if the m-th sector of the M-th track and the n-th sector of the N-th track are determined to be affected by the single continuous scratch and the difference between m and n is smaller than the scratch-treatment critical value.
  • an apparatus for managing random-directional scratches on a hard disk includes a scratch determination unit and an alleged defect setting unit.
  • the scratch determination unit determines an m-th sector of an M-th track and an n-th sector of an N-th track to be affected by a single continuous scratch if the m-th sector of the M-th track and the n-th sector of the N-th track are defective, a difference between M and N is equal to a predetermined scratch treatment conditional value, and a difference between m and n is not larger than a predetermined scratch-treatment critical value.
  • the alleged defect setting unit sets sectors between the m-th sector of the M-th track and the n-th sector of the N-th track as alleged defective sectors, if the m-th sector of the M-th track and the n-th sector of the N-th track are determined to be affected by the single continuous scratch and the difference between m and n is larger than 1, and sets predetermined sectors around the m-th sector of the M-th track and the n-th sector of the N-th track as alleged defective sectors if the m-th sector of the M-th track and the n-th sector of the N-th track are determined to be affected by the single continuous scratch and the difference between m and n is smaller than the scratch-treatment critical value.
  • a method of managing random-directional scratches on a hard disk involves determining that predetermined sectors are affected by a single continuous scratch if the predetermined sectors are defective and a distance therebetween is not larger than a predetermined scratch length; and setting sectors between the predetermined sectors and around each of the predetermined sectors as alleged defective sectors if the defective sectors are determined to be affected by the single continuous scratch.
  • a method of managing random-directional scratches on a hard disk involves determining an m-th sector of an M-th track and an n-th sector of an N-th track to be affected by a single continuous scratch if the m-th sector of the M-th track and the n-th sector of the N-th track are defective, a difference between M and N is equal to a predetermined scratch treatment conditional value, and a difference between m and n is not larger than a predetermined scratch-treatment critical value; setting sectors between the m-th sector of the M-th track and the n-th sector of the N-th track as alleged defective sectors if the m-th sector of the M-th track and the n-th sector of the N-th track are determined to be affected by the single continuous scratch and the difference between m and n is larger than 1; and setting predetermined sectors around the m-th sector of the M-th track and the n-th sector of the N-th track
  • a method of managing random-directional scratches on a hard disk involves determining an m-th sector of an M-th track and an n-th sector of an N-th track to be affected by a single continuous scratch if the m-th sector of the M-th track and the n-th sector of the N-th track are defective, a difference between M and N is equal to a predetermined scratch treatment conditional value, and a difference between m and n is not larger than a predetermined scratch-treatment critical value; and setting sectors between the m-th sector of the M-th track and the n-th sector of the N-th track as alleged defective sectors, if the m-th sector of the M-th track and the n-th sector of the N-th track are determined to be affected by the single continuous scratch and the difference between m and n is larger than 1, and sets predetermined sectors around the m-th sector of the M-th track and the n-th sector of the N-th
  • FIG. 4A is a block diagram of an apparatus for managing random-directional scratches on a hard disk according to an embodiment of the present invention.
  • the apparatus includes a defect information reading unit 4A1, a scratch determination unit 4A2, an in-between alleged defect setting unit 4A3, an either-end alleged defect setting unit 4A4, and an alleged defect information writing unit 4A5.
  • the defect information reading unit 4A1 reads information on defects from memory where a predetermined defect list is stored.
  • a hard disk as a part of a device, seldom includes scratches on the surface until it is assembled into a hard disk drive along with other parts.
  • scratches are likely to be generated on the hard disk because of physical contacts between the hard disk and other parts.
  • the hard disk is supposed to undergo a couple of tests, i.e., a burn/in (B/I) test (which is performed for a predetermined amount of time under specific conditions to pre-screen all parts of a device to detect defects) and a function test.
  • B/I burn/in
  • the defect list can be made after inspecting the surface of the hard disk to detect defects and putting detected defects on a list.
  • the defect list is stored in nonvolatile memory in a hard disk drive.
  • the defect information reading unit 4A1 can identify which sectors are defective by reading the defect information from the memory where the defect list is stored.
  • all sectors that allegedly have defects are sorted out, and thus it looks, from a PC's point of view, as if there were no bad sectors on the hard disk. This type of technology is called defect management.
  • the scratch determining unit 4A2 determines that the m-th sector and the n-th sector are affected by a single continuous scratch, only when a difference between M and N is equal to a predetermined scratch treatment conditional value and a difference between m and n is not larger than a predetermined scratch-treatment critical value.
  • the scratch treatment conditional value is a benchmark value for determining whether the M-th track and the N-th track are affected by a single continuous scratch
  • the scratch-treatment critical value is a benchmark value for determining whether the m-th sector and the n-th sector are affected by a single continuous scratch.
  • the scratch-treatment critical value indicates the length of scratches that could be usually formed across or along tracks of hard disks during assembly or test processes.
  • the difference between m and n indicates the distance between the m-th sector and the n-th sector. If the distance between the m-th sector and the n-th sector is not larger than the length of usual scratches, the scratch determining unit 4A2 determines that the m-th sector and the n-th sector are affected by a single continuous scratch.
  • the in-between alleged defect setting unit 4A3 determines whether the difference between m and n is larger than 1 and then sets all sectors between the m-th and n-th sectors of each of the M-th and N-th tracks as alleged defective sectors if the difference between m and n is larger than 1.
  • the difference between m and n indicates the distance therebetween.
  • the in-between alleged defect setting unit 4A3 sets all sectors between the m-th sector and the n-th sector as alleged bad sectors, i.e., alleged defective sectors because they are alleged to be bad sectors.
  • the either-end alleged defect setting unit 4A4 sets predetermined sectors around the m-th and n-th sectors as alleged defective sectors. It is safe to say that it is unlikely that a scratch begins from the m-th sector and ends with the n-th sector because sectors are very minute areas on a hard disk and scratches are generally formed on a hard disk during manufacturing it or using it.
  • the either-end alleged defect setting unit 4A4 sets predetermined sectors around the m-th sector of the M-th track and predetermined sectors around the n-th sector of the N-th track as alleged defective sectors in consideration of an estimated length of the single continuous scratch.
  • the either-end alleged defective setting unit 4A4 sets as many sectors around the m-th sector of the M-th track as a difference between the scratch-treatment critical value and the difference between m and n as alleged defective sectors.
  • the either-end alleged defective setting unit 4A4 also sets as many sectors around the n-th sector of the N-th track as the difference between the scratch-treatment critical value and the difference between m and n as alleged defective sectors.
  • the alleged defective information writing unit 4A5 writes information on the alleged defective sectors set by the in-between alleged defect setting unit 4A3 and the either-end alleged defect setting unit 4A4 in the memory where the defect list is stored.
  • the information on the alleged defective sectors i.e., addresses of the alleged defective sectors, are put on the defect list so that all the alleged defective sectors can be sorted out and a PC can manage the hard disk as if there were no defective sectors on the hard disk.
  • FIG. 4B is a block diagram of an apparatus for managing slant-line-directional scratches on a hard disk according to an embodiment of the present invention.
  • the apparatus includes a defect information reading unit 4B1, a scratch determination unit 4B2, an alleged defect setting unit 4B3, and an alleged defect information writing unit 4B4.
  • the defect information reading unit 4B1 reads information on defects on a hard disk from memory where a predetermined defect list is stored.
  • the scratch determining unit 4B2 determines that the m-th sector and the n-th sector are affected by a single continuous scratch, only when a difference between M and N is equal to a predetermined scratch treatment conditional value and a difference between m and n is not larger than a predetermined scratch-treatment critical value.
  • the scratch treatment conditional value is a benchmark value for determining whether the M-th track and the N-th track are affected by a single continuous scratch
  • the scratch-treatment critical value is a benchmark value for determining whether the m-th sector and the n-th sector are affected by a single continuous scratch.
  • the alleged defect setting unit 4B3 sets sectors between the m-th and n-th sectors of each of the M-th and N-th tracks and predetermined sectors around the m-th sector and the n-th sector as alleged defective sectors. More specifically, the alleged defect setting unit 4B3 sets sectors within as long a predetermined distance from the m-th sector and the n-th sector as a difference between the scratch-treatment critical value and the difference between m and n as alleged defective sectors.
  • the alleged defect information writing unit 4B4 writes information on the alleged defective sectors, set by setting unit 4B3, in the memory where the defect list is stored.
  • a straight line connecting the m-th sector of the M-th track and the n-th sector of the N-th track extends along a slant-line-direction with respect to a track direction of the hard disk. If m and n have fixed values, the gradient of the straight line increases in proportion to M and N.
  • FIG. 5 is a diagram illustrating a hard disk where every other track has a defective sector.
  • defect information indicating that an n+1-th sector of an N-th track and an n-3-th sector of an N+2-th track are defective is read from a defect list. Then, it is checked whether a difference between n+1 and n-3 or a distance between the n+1-th sector and n-3-th sector of each track is not larger than a predetermined scratch-treatment critical value.
  • sectors between the n+1-th sector of the N-th track and the n-3-th sector of the N+2-th track i.e., n-3-th, n-2-th, n-1-th, n-th, and n+1-th sectors of an N+1-th track, are set as alleged defective sectors and treated as a scratch.
  • sectors around the n-3-th sector of the N+2-th track i.e., n-5-th and n-4-th of the N+2-th track, n-5-th, n-4-th, and n-3-th sectors of an N+3-th track, and n-5-th, n-4-th, and n-3-th sectors of an N+4-th track, are also set as alleged defective sectors and then treated as a scratch.
  • sectors around the n+1-th sector of the N-th track i.e., n+2-th and n+3-th sectors of the N-th track, n+1-th, n+2-th, and n+3-th sectors of an N-1-th track, and n+1-th, n+2-th, and n+3-th sectors of an N-2-th track, are also set as alleged defective sectors and then treated as a scratch.
  • the scratch-treatment critical value is set to 1% through a considerable number of experiments so that scratches on the hard disk can be more efficiently treated.
  • the scratch-treatment critical value may also be set to a different value.
  • FIG. 6 is a diagram illustrating a hard disk where two adjacent tracks have a defective sector.
  • defect information indicating that an n+1-th sector of an N-th track and an n-2-th sector of an N+1-th track are defective is read from a defect list. Then, it is checked whether a difference between n+1 and n-2 or a distance between the n+1-th sector and n-2-th sector of each track is not larger than a predetermined scratch-treatment critical value.
  • sectors between the n+1-th sector of the N-th track and the n-2-th sector of the N+1-th track i.e., n-2-th, n-1-th, and n-th sectors of the N-th track and n-1-th, n-th, and n+1-th sectors of the N+1-th track, are set as alleged defective sectors and treated as a scratch.
  • sectors around the n-2-th sector of the N+1-th track i.e., n-4-th and n-3-th of the N+1-th track, n-4-th, n-3-th, and n-2-th sectors of an N+2-th track, and n-4-th, n-3-th, and n-2-th sectors of an N+3-th track, are also set as alleged defective sectors and then treated as a scratch.
  • sectors around the n+1-th sector of the N-th track i.e., n+2-th and n+3-th sectors of the N-th track, n+1-th, n+2-th, and n+3-th sectors of an N-1-th track, and n+1-th, n+2-th, and n+3-th sectors of an N-2-th track, are also set as alleged defective sectors and then treated as a scratch.
  • the scratch-treatment critical value is set to 3%, which is obtained through a considerable number of experiments, so that scratches on the hard disk can be more efficiently treated.
  • the scratch-treatment critical value may also be set to a different value.
  • FIG. 7 is a diagram illustrating a hard disk where a track has a plurality of defective sectors.
  • this case is very similar to the case of FIG. 5 or 6, and thus only the occasion when the defective sectors are horizontally arranged along the track direction of the hard disk will be described in greater detail in the following paragraphs.
  • n+5-th and n+6-th sectors of the first track 71 are defective is read from a defect list. Since the n+5-th and n+6-th sectors are adjacent to each other, i.e., since there is no in-between sector, only sectors around the n+5-th and n+6-th sectors need to be set as alleged defective sectors.
  • a scratch-treatment critical value is set to 3 (on the assumption that a usual scratch stretches over four sectors)
  • an n+4-th sector and an n+7-th sector are set as alleged defective sectors and then treated as a scratch.
  • n+4-th and n+7-th sectors of the second track 72 are defective is read from a defect list.
  • a scratch-treatment critical value is set to 3 (on the assumption that a usual scratch stretches over four sectors)
  • the n+4-th sector and the n+7-th sector supposedly correspond to both ends of a scratch. Accordingly, only sectors between the n+4-th sector and the n+7-th sector, i.e., n+5-th and n+6-th sectors, need to be set as alleged defective sectors.
  • n+5-th and n+7-th sectors of the third track 73 are defective is read from a defect list.
  • a scratch-treatment critical value is set to 3 (on the assumption that a usual scratch stretches over four sectors)
  • FIG. 8A and FIG. 8B illustrate flowcharts of a method of managing random-directional scratches on a hard disk according to an embodiment of the present invention.
  • defect information is read from memory where a predetermined defect list is stored. If an m-th sector of an M-th track and an n-th sector of an N-th track are defective (operation 8A2), it is determined in operation 8A3 whether a difference between M and N is equal to a predetermined scratch treatment conditional value. If the difference between M and N is equal to the predetermined scratch treatment conditional value, it is determined in operation 8A4 whether a difference between m and n is not larger than a predetermined scratch-treatment critical value.
  • the scratch treatment conditional value is a benchmark value for determining whether the M-th track and the N-th track are affected by a single continuous scratch
  • the scratch-treatment critical value is a benchmark value for determining whether the m-th sector and the n-th sector are affected by a single continuous scratch.
  • FIG. 8C and FIG. 8D illustrate flowcharts of a method of managing slant-line-directional scratches on a hard disk according to an embodiment of the present invention.
  • defect information is read from memory where a predetermined defect list is stored. If an m-th sector of an M-th track and an n-th sector of an N-th track are defective (operation 8C2), it is determined in operation 8C3 whether a difference between M and N is equal to a predetermined scratch treatment conditional value. If the difference between M and N is equal to the predetermined scratch treatment conditional value, it is determined in operation 8C4 whether a difference between m and n is not larger than a predetermined scratch-treatment critical value.
  • the scratch treatment conditional value is a benchmark value for determining whether the M-th track and the N-th track are affected by a single continuous scratch
  • the scratch-treatment critical value is a benchmark value for determining whether the m-th sector and the n-th sector are affected by a single continuous scratch.
  • FIG. 9 is a diagram illustrating a defect map of a hard disk to which the present invention is to be applied.
  • a defect map of a hard disk indicates defects on the hard disk.
  • the defect map is stored in a predetermined place, such as a maintenance cylinder of the hard disk, which can hardly be accessed by an ordinary user, and is referred to by a controller when operating a hard disk drive.
  • defects on a hard disk are illustrated as dots in encircled areas. Such defects or defective sectors are marked by dots in FIG. 9. However, given that scratches usually extend long and continuously, sectors between such dots could also be defective even though they are not marked by dots.
  • FIG. 10 is a diagram illustrating a defect map of a hard disk to which the present invention has already been applied.
  • the defect map of FIG. 10 can be obtained. While defects are marked by dots in FIG. 9, they are marked by single scratches because in the present invention, sectors between adjacent defective sectors are also treated as alleged defective sectors and then the defective sectors and the alleged defective sectors are treated alike. Therefore, according to the present invention, it is possible to improve the reliability of a hard disk in terms of recording data.
  • the above-described embodiments of the present invention can be realized as programs, which can be executed in a universal digital computer through a computer readable recording medium.
  • the computer readable recording medium may be a storage media, such as a magnetic storage medium (for example, a ROM, a floppy disc, or a hard disc), an optical readable medium (for example, a CD-ROM or DVD), or carrier waves (for example, transmitted through internet).
  • the present invention it is possible for a user to skip sectors that are alleged to be defective because of scratches on a hard disk and to write data on or read data from normal sectors by anticipating and appropriately managing the alleged defective sectors. Therefore, it is also possible to minimize defect errors that could occur at the hard disk and enhance the quality of the hard disk.

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  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Signal Processing For Digital Recording And Reproducing (AREA)
EP03028483A 2002-12-12 2003-12-12 Appareil et méthode de gestion des rayures non ordonnées dans une disque dur Withdrawn EP1429332A3 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR2002079269 2002-12-12
KR10-2002-0079269A KR100524937B1 (ko) 2002-12-12 2002-12-12 하드디스크상의 임의 방향 스크래치 처리 장치 및 방법

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EP1429332A2 true EP1429332A2 (fr) 2004-06-16
EP1429332A3 EP1429332A3 (fr) 2009-03-18

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1975936A2 (fr) * 2007-03-30 2008-10-01 Kabushiki Kaisha Toshiba Appareil et procédé de gestion d'enregistrement de disque

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050138464A1 (en) * 2003-11-21 2005-06-23 Chong Pohsoon Scratch fill using scratch tracking table
JP2006085789A (ja) * 2004-09-15 2006-03-30 Hitachi Global Storage Technologies Netherlands Bv 磁気ディスクの欠陥登録の方法及び磁気ディスク装置
JP2006318554A (ja) * 2005-05-11 2006-11-24 Hitachi Global Storage Technologies Netherlands Bv 磁気ディスク装置の製造方法及び磁気ディスク装置
JP2006331491A (ja) * 2005-05-24 2006-12-07 Hitachi Global Storage Technologies Netherlands Bv データ記憶装置及びその不使用セクタを登録する方法
JP2006351129A (ja) * 2005-06-17 2006-12-28 Hitachi Global Storage Technologies Netherlands Bv データ記憶装置における欠陥管理方法及びそのデータ記憶装置
KR100714876B1 (ko) * 2005-12-27 2007-05-07 삼성전자주식회사 하드디스크 드라이브, 하드디스크 드라이브의 스크래치처리방법 및 그 방법을 수행하는 컴퓨터 프로그램을 기록한기록매체
KR20120039985A (ko) 2010-10-18 2012-04-26 삼성전자주식회사 기록매체에 대한 리드 또는 라이트 처리 방법, 파라미터 조정 방법, 이를 적용한 저장 장치, 컴퓨터 시스템 및 저장매체
US8711500B1 (en) * 2011-06-24 2014-04-29 Western Digital Technologies, Inc. Disk drive to enable defect margining
US8711665B1 (en) 2011-10-26 2014-04-29 Western Digital Technologies, Inc. Method and apparatus for determining storage capacity error for a data storage device
US9368152B1 (en) 2014-11-25 2016-06-14 Seagate Technology Llc Flexible virtual defect padding

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07334933A (ja) * 1994-06-06 1995-12-22 Nec Eng Ltd ディスク記憶装置
US6223303B1 (en) * 1998-06-29 2001-04-24 Western Digital Corporation Disk drive having two tiered defect list comprising marginal and reserved data sectors
US20010055172A1 (en) * 2000-05-22 2001-12-27 Yip Ying Ee Pattern-based defect description method
US20020191319A1 (en) * 2001-04-12 2002-12-19 Seagate Technology Llc Merged defect entries for defects running in circumferential and radial directions on a disc
US20040100715A1 (en) * 2002-11-21 2004-05-27 International Business Machines Corporation Accommodation of media defect growth on a data storage medium through dynamic remapping

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03228265A (ja) 1990-02-01 1991-10-09 Sony Corp ディスク装置
JPH11144244A (ja) * 1997-11-04 1999-05-28 Sony Tektronix Corp 磁気ディスク媒体検査におけるデータ処理方法
KR100233141B1 (ko) * 1997-12-02 1999-12-01 윤종용 자기 디스크 구동장치의 디스크 디펙 처리방법
KR100564534B1 (ko) * 1998-01-15 2006-05-29 삼성전자주식회사 하드 디스크 드라이브에서의 서보 디펙트 처리방법
KR19990065646A (ko) * 1998-01-15 1999-08-05 윤종용 하드 디스크 드라이브의 디펙트 처리 방법
US6081411A (en) * 1998-06-29 2000-06-27 International Business Machines Corporation Thin film disk media using optimum surface orientation to written data tracks
US6557125B1 (en) * 1998-12-11 2003-04-29 Iomega Corporation System and method for generating a defect map for a data-storage medium without the use of a hard index
US6301679B1 (en) 1999-10-28 2001-10-09 Seagate Technology Llc Sync byte padding
JP2001176001A (ja) 1999-12-15 2001-06-29 Fuji Electric Co Ltd 磁気ディスク試験方法
JP2002268829A (ja) * 2001-03-05 2002-09-20 Internatl Business Mach Corp <Ibm> コンピュータ装置、ディスクドライブ装置、データのリード／ライト制御方法、ディフェクトマップの登録方法
US7278053B2 (en) * 2003-05-06 2007-10-02 International Business Machines Corporation Self healing storage system
US20050138464A1 (en) * 2003-11-21 2005-06-23 Chong Pohsoon Scratch fill using scratch tracking table

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07334933A (ja) * 1994-06-06 1995-12-22 Nec Eng Ltd ディスク記憶装置
US6223303B1 (en) * 1998-06-29 2001-04-24 Western Digital Corporation Disk drive having two tiered defect list comprising marginal and reserved data sectors
US20010055172A1 (en) * 2000-05-22 2001-12-27 Yip Ying Ee Pattern-based defect description method
US20020191319A1 (en) * 2001-04-12 2002-12-19 Seagate Technology Llc Merged defect entries for defects running in circumferential and radial directions on a disc
US20040100715A1 (en) * 2002-11-21 2004-05-27 International Business Machines Corporation Accommodation of media defect growth on a data storage medium through dynamic remapping

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
INTERNATIONAL BUSINESS MACHINES CORPORATION: "The new procedure to search contiguous defects" RESEARCH DISCLOSURE, MASON PUBLICATIONS, HAMPSHIRE, GB, vol. 450, no. 124, October 2001 (2001-10), XP007129146 ISSN: 0374-4353 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1975936A2 (fr) * 2007-03-30 2008-10-01 Kabushiki Kaisha Toshiba Appareil et procédé de gestion d'enregistrement de disque
EP1975936A3 (fr) * 2007-03-30 2008-10-29 Kabushiki Kaisha Toshiba Appareil et procédé de gestion d'enregistrement de disque

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US7617419B2 (en) 2009-11-10
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JP2004192797A (ja) 2004-07-08
US20040158769A1 (en) 2004-08-12
EP1429332A3 (fr) 2009-03-18

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