EP1231460A3 - Un mètre-lentille pour mesurer les propriétés d'une lentille spectrale ou d'une lentille de contact - Google Patents

Un mètre-lentille pour mesurer les propriétés d'une lentille spectrale ou d'une lentille de contact Download PDF

Info

Publication number
EP1231460A3
EP1231460A3 EP02000794A EP02000794A EP1231460A3 EP 1231460 A3 EP1231460 A3 EP 1231460A3 EP 02000794 A EP02000794 A EP 02000794A EP 02000794 A EP02000794 A EP 02000794A EP 1231460 A3 EP1231460 A3 EP 1231460A3
Authority
EP
European Patent Office
Prior art keywords
lens
pattern image
pattern
meter
examination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP02000794A
Other languages
German (de)
English (en)
Other versions
EP1231460A2 (fr
EP1231460B1 (fr
Inventor
Hisanori Akiyama
Masahiro Jinbo
Toshiro Yoda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hoya Corp
Original Assignee
Hoya Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hoya Corp filed Critical Hoya Corp
Publication of EP1231460A2 publication Critical patent/EP1231460A2/fr
Publication of EP1231460A3 publication Critical patent/EP1231460A3/fr
Application granted granted Critical
Publication of EP1231460B1 publication Critical patent/EP1231460B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0228—Testing optical properties by measuring refractive power
    • G01M11/0235—Testing optical properties by measuring refractive power by measuring multiple properties of lenses, automatic lens meters

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Eyeglasses (AREA)
  • Lenses (AREA)
EP02000794A 2001-02-09 2002-01-14 Mesureur de lentille pour mesurer les propriétés d'un verre de lunettes ou d'une lentille de contact Expired - Lifetime EP1231460B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2001033936 2001-02-09
JP2001033936 2001-02-09

Publications (3)

Publication Number Publication Date
EP1231460A2 EP1231460A2 (fr) 2002-08-14
EP1231460A3 true EP1231460A3 (fr) 2003-09-03
EP1231460B1 EP1231460B1 (fr) 2005-06-08

Family

ID=18897619

Family Applications (1)

Application Number Title Priority Date Filing Date
EP02000794A Expired - Lifetime EP1231460B1 (fr) 2001-02-09 2002-01-14 Mesureur de lentille pour mesurer les propriétés d'un verre de lunettes ou d'une lentille de contact

Country Status (6)

Country Link
US (1) US6621564B2 (fr)
EP (1) EP1231460B1 (fr)
KR (1) KR20020066378A (fr)
CN (1) CN1369697A (fr)
AT (1) ATE297546T1 (fr)
DE (1) DE60204495T2 (fr)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4756828B2 (ja) * 2004-04-27 2011-08-24 株式会社ニデック レンズメータ
US7477366B2 (en) * 2006-12-07 2009-01-13 Coopervision International Holding Company, Lp Contact lens blister packages and methods for automated inspection of hydrated contact lenses
JP5122581B2 (ja) * 2006-12-21 2013-01-16 ジョンソン・アンド・ジョンソン・ビジョン・ケア・インコーポレイテッド 干渉法検査用レンズ、ならびに干渉法検査用システムおよび装置
KR100899088B1 (ko) * 2007-05-09 2009-05-26 주식회사 휴비츠 렌즈미터
CN101359021B (zh) * 2007-08-03 2011-04-13 采钰科技股份有限公司 检测结构以及检测方法
DE102011084562B4 (de) * 2011-10-14 2018-02-15 Leica Microsystems Cms Gmbh Verfahren und Vorrichtung zur Feststellung und Korrektur von sphärischen Abbildungsfehlern in einem mikroskopischen Abbildungsstrahlengang
US20130321773A1 (en) * 2012-06-05 2013-12-05 Cheng-Chung Lee Optometric Automatic Test Device and Method
TW201441670A (zh) * 2013-04-26 2014-11-01 Hon Hai Prec Ind Co Ltd 鏡頭模組檢測裝置
KR101374173B1 (ko) * 2013-08-27 2014-03-13 유니코스주식회사 정점간거리 조절이 가능한 렌즈미터 및 정점간거리 조절방법
EP3428604B1 (fr) * 2016-03-10 2020-07-15 Panasonic Intellectual Property Management Co., Ltd. Dispositif d'inspection optique, lentille et procédé d'inspection optique
US10036685B2 (en) * 2016-05-18 2018-07-31 Jand, Inc. Fixtureless lensmeter and methods of operating same
US10557773B2 (en) 2016-05-18 2020-02-11 Jand, Inc. Fixtureless lensmeter system
US11488239B2 (en) 2019-08-26 2022-11-01 Warby Parker Inc. Virtual fitting systems and methods for spectacles
WO2021211374A1 (fr) 2020-04-15 2021-10-21 Jand, Inc. Systèmes d'essayage virtuel pour lunettes utilisant des cadres de référence
US12108988B2 (en) 2020-06-17 2024-10-08 Warby Parker Inc. System and method for measuring pupillary distance and uses thereof
TWI759850B (zh) * 2020-09-04 2022-04-01 瑞軒科技股份有限公司 鏡片檢測系統及其操作方法

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4707090A (en) * 1980-10-31 1987-11-17 Humphrey Instruments, Inc. Objective refractor for the eye
US4806774A (en) * 1987-06-08 1989-02-21 Insystems, Inc. Inspection system for array of microcircuit dies having redundant circuit patterns
US5331394A (en) * 1992-04-10 1994-07-19 Metaphase Corporation Automated lensometer
US5340992A (en) * 1988-02-16 1994-08-23 Canon Kabushiki Kaisha Apparatus and method of detecting positional relationship using a weighted coefficient
US5583609A (en) * 1993-04-23 1996-12-10 Nikon Corporation Projection exposure apparatus
US5825476A (en) * 1994-06-14 1998-10-20 Visionix Ltd. Apparatus for mapping optical elements
EP0922999A2 (fr) * 1997-12-12 1999-06-16 Nikon Corporation Système optique d'illumination et méthode d'illumination
US6236453B1 (en) * 1996-09-30 2001-05-22 Kabushiki Kaisha Topcon Lens meter

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5242389B2 (fr) 1973-03-22 1977-10-24
JPS6212269Y2 (fr) * 1977-12-26 1987-03-28
JPS6017335A (ja) 1983-07-08 1985-01-29 Nidetsuku:Kk オ−トレンズメ−タ
JPS6056237A (ja) 1983-09-07 1985-04-01 Canon Inc 屈折度測定装置
JPH0820334B2 (ja) * 1988-03-05 1996-03-04 ホーヤ株式会社 自動レンズメータ
JP2942596B2 (ja) * 1990-07-06 1999-08-30 株式会社ニデック 自動レンズメーター
JPH05264401A (ja) * 1992-03-18 1993-10-12 Topcon Corp オートレンズメータ
JP3055836B2 (ja) * 1992-03-31 2000-06-26 株式会社ニデック レンズメ−タ
KR100225779B1 (ko) * 1992-04-02 1999-11-01 유무성 광학계의 성능 측정장치
US5379111A (en) * 1992-04-30 1995-01-03 Nidek Co., Ltd. Lens meter
US5489978A (en) * 1992-11-05 1996-02-06 Canon Kabushiki Kaisha Lens measuring apparatus
JPH06249749A (ja) * 1993-02-26 1994-09-09 Topcon Corp レンズメータ
JPH06347732A (ja) * 1993-06-11 1994-12-22 Topcon Corp レンズメータ
JP3348975B2 (ja) * 1994-04-28 2002-11-20 株式会社ニデック レンズメ−タ
JPH0820334A (ja) 1994-07-11 1996-01-23 Ishikawajima Harima Heavy Ind Co Ltd ダム堰堤内人員搬送設備
US5684576A (en) * 1995-07-27 1997-11-04 Nidek Co., Ltd. Lens meter
JPH09138181A (ja) * 1995-11-15 1997-05-27 Nikon Corp 光学系の屈折力および曲率半径の測定装置
KR100292434B1 (ko) * 1996-04-12 2002-02-28 이중구 선형시시디를이용한카메라렌즈자동검사장치및그방법
JPH10132707A (ja) * 1996-09-05 1998-05-22 Topcon Corp 隠しマーク観察装置とレンズメータ
JPH10104120A (ja) * 1996-09-30 1998-04-24 Topcon Corp レンズメーター
JP3886191B2 (ja) * 1996-12-20 2007-02-28 株式会社トプコン レンズメーター
JP3435019B2 (ja) * 1997-05-09 2003-08-11 株式会社ニデック レンズ特性測定装置及びレンズ特性測定方法

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4707090A (en) * 1980-10-31 1987-11-17 Humphrey Instruments, Inc. Objective refractor for the eye
US4806774A (en) * 1987-06-08 1989-02-21 Insystems, Inc. Inspection system for array of microcircuit dies having redundant circuit patterns
US5340992A (en) * 1988-02-16 1994-08-23 Canon Kabushiki Kaisha Apparatus and method of detecting positional relationship using a weighted coefficient
US5331394A (en) * 1992-04-10 1994-07-19 Metaphase Corporation Automated lensometer
US5583609A (en) * 1993-04-23 1996-12-10 Nikon Corporation Projection exposure apparatus
US5825476A (en) * 1994-06-14 1998-10-20 Visionix Ltd. Apparatus for mapping optical elements
US6236453B1 (en) * 1996-09-30 2001-05-22 Kabushiki Kaisha Topcon Lens meter
EP0922999A2 (fr) * 1997-12-12 1999-06-16 Nikon Corporation Système optique d'illumination et méthode d'illumination

Also Published As

Publication number Publication date
KR20020066378A (ko) 2002-08-16
DE60204495T2 (de) 2006-03-16
CN1369697A (zh) 2002-09-18
ATE297546T1 (de) 2005-06-15
DE60204495D1 (de) 2005-07-14
EP1231460A2 (fr) 2002-08-14
US6621564B2 (en) 2003-09-16
US20020140928A1 (en) 2002-10-03
EP1231460B1 (fr) 2005-06-08

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