EP0575777A3 - - Google Patents

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Publication number
EP0575777A3
EP0575777A3 EP19930108670 EP93108670A EP0575777A3 EP 0575777 A3 EP0575777 A3 EP 0575777A3 EP 19930108670 EP19930108670 EP 19930108670 EP 93108670 A EP93108670 A EP 93108670A EP 0575777 A3 EP0575777 A3 EP 0575777A3
Authority
EP
European Patent Office
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP19930108670
Other languages
English (en)
Other versions
EP0575777A2 (en
EP0575777B1 (en
Inventor
Gregory J. Wells
Mingda Wang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Varian Medical Systems Inc
Original Assignee
Varian Associates Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Varian Associates Inc filed Critical Varian Associates Inc
Priority to EP98103434A priority Critical patent/EP0852390B1/en
Priority to EP97104015A priority patent/EP0786796B1/en
Publication of EP0575777A2 publication Critical patent/EP0575777A2/en
Publication of EP0575777A3 publication Critical patent/EP0575777A3/en
Application granted granted Critical
Publication of EP0575777B1 publication Critical patent/EP0575777B1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/145—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/005—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by collision with gas, e.g. by introducing gas or by accelerating ions with an electric field
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
EP19930108670 1992-05-29 1993-05-28 Methods of using ion trap mass spectrometers Expired - Lifetime EP0575777B1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP98103434A EP0852390B1 (en) 1992-05-29 1993-05-28 Improved methods of using ion trap mass spectrometers
EP97104015A EP0786796B1 (en) 1992-05-29 1993-05-28 Methods of using ion trap mass spectrometers

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US89099192A 1992-05-29 1992-05-29
US890991 1992-05-29

Related Child Applications (2)

Application Number Title Priority Date Filing Date
EP97104015A Division EP0786796B1 (en) 1992-05-29 1993-05-28 Methods of using ion trap mass spectrometers
EP98103434A Division EP0852390B1 (en) 1992-05-29 1993-05-28 Improved methods of using ion trap mass spectrometers

Publications (3)

Publication Number Publication Date
EP0575777A2 EP0575777A2 (en) 1993-12-29
EP0575777A3 true EP0575777A3 (zh) 1994-03-16
EP0575777B1 EP0575777B1 (en) 1998-09-23

Family

ID=25397431

Family Applications (1)

Application Number Title Priority Date Filing Date
EP19930108670 Expired - Lifetime EP0575777B1 (en) 1992-05-29 1993-05-28 Methods of using ion trap mass spectrometers

Country Status (4)

Country Link
EP (1) EP0575777B1 (zh)
JP (2) JP3444429B2 (zh)
CA (1) CA2097211A1 (zh)
DE (3) DE69321165T2 (zh)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5448061A (en) * 1992-05-29 1995-09-05 Varian Associates, Inc. Method of space charge control for improved ion isolation in an ion trap mass spectrometer by dynamically adaptive sampling
US5291017A (en) * 1993-01-27 1994-03-01 Varian Associates, Inc. Ion trap mass spectrometer method and apparatus for improved sensitivity
US5396064A (en) * 1994-01-11 1995-03-07 Varian Associates, Inc. Quadrupole trap ion isolation method
DE4425384C1 (de) * 1994-07-19 1995-11-02 Bruker Franzen Analytik Gmbh Verfahren zur stoßinduzierten Fragmentierung von Ionen in Ionenfallen
US5714755A (en) * 1996-03-01 1998-02-03 Varian Associates, Inc. Mass scanning method using an ion trap mass spectrometer
DE19932839B4 (de) * 1999-07-14 2007-10-11 Bruker Daltonik Gmbh Fragmentierung in Quadrupol-Ionenfallenmassenspektrometern
JP4384542B2 (ja) 2004-05-24 2009-12-16 株式会社日立ハイテクノロジーズ 質量分析装置
DE102005061425B4 (de) * 2005-12-22 2009-06-10 Bruker Daltonik Gmbh Rückgesteuerte Fragmentierung in Ionenfallen-Massenspektrometern
JP4996962B2 (ja) 2007-04-04 2012-08-08 株式会社日立ハイテクノロジーズ 質量分析装置
DE102013213501A1 (de) 2013-07-10 2015-01-15 Carl Zeiss Microscopy Gmbh Massenspektrometer, dessen Verwendung, sowie Verfahren zur massenspektrometrischen Untersuchung eines Gasgemisches
US10985002B2 (en) * 2019-06-11 2021-04-20 Perkinelmer Health Sciences, Inc. Ionization sources and methods and systems using them

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0202943A2 (en) * 1985-05-24 1986-11-26 Finnigan Corporation Method of operating an ion trap
EP0215615A2 (en) * 1985-09-06 1987-03-25 Finnigan Corporation Method of operating a quadrupole ion trap
EP0336990A1 (en) * 1988-04-13 1989-10-18 Bruker Franzen Analytik GmbH Method of mass analyzing a sample by use of a quistor and a quistor designed for performing this method
EP0362432A1 (en) * 1988-10-07 1990-04-11 Bruker Franzen Analytik GmbH Improvement of a method of mass analyzing a sample
WO1993005533A1 (en) * 1991-08-30 1993-03-18 Teledyne Mec Mass spectrometry method using supplemental ac voltage signals

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0202943A2 (en) * 1985-05-24 1986-11-26 Finnigan Corporation Method of operating an ion trap
EP0215615A2 (en) * 1985-09-06 1987-03-25 Finnigan Corporation Method of operating a quadrupole ion trap
EP0336990A1 (en) * 1988-04-13 1989-10-18 Bruker Franzen Analytik GmbH Method of mass analyzing a sample by use of a quistor and a quistor designed for performing this method
EP0362432A1 (en) * 1988-10-07 1990-04-11 Bruker Franzen Analytik GmbH Improvement of a method of mass analyzing a sample
WO1993005533A1 (en) * 1991-08-30 1993-03-18 Teledyne Mec Mass spectrometry method using supplemental ac voltage signals

Also Published As

Publication number Publication date
DE69333589D1 (de) 2004-09-16
DE69328979T2 (de) 2001-02-15
JP2004004082A (ja) 2004-01-08
DE69333589T2 (de) 2005-02-03
DE69321165T2 (de) 1999-06-02
DE69328979D1 (de) 2000-08-10
CA2097211A1 (en) 1993-11-30
JP3444429B2 (ja) 2003-09-08
EP0575777A2 (en) 1993-12-29
DE69321165D1 (de) 1998-10-29
EP0575777B1 (en) 1998-09-23
JPH0696727A (ja) 1994-04-08

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