EP0317252A2 - Méthode pour mesurer la distribution des grains cristallins dans une feuille métallique et appareil à cet effet - Google Patents

Méthode pour mesurer la distribution des grains cristallins dans une feuille métallique et appareil à cet effet Download PDF

Info

Publication number
EP0317252A2
EP0317252A2 EP88310752A EP88310752A EP0317252A2 EP 0317252 A2 EP0317252 A2 EP 0317252A2 EP 88310752 A EP88310752 A EP 88310752A EP 88310752 A EP88310752 A EP 88310752A EP 0317252 A2 EP0317252 A2 EP 0317252A2
Authority
EP
European Patent Office
Prior art keywords
ultrasonic wave
sheet
ultrasonic
grains
wave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP88310752A
Other languages
German (de)
English (en)
Other versions
EP0317252A3 (en
EP0317252B1 (fr
Inventor
Fumihiko Technical Research Division Ichikawa
Hajime Technical Research Division Takada
Kazuya Technical Research Division Asano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Original Assignee
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kawasaki Steel Corp filed Critical Kawasaki Steel Corp
Publication of EP0317252A2 publication Critical patent/EP0317252A2/fr
Publication of EP0317252A3 publication Critical patent/EP0317252A3/en
Application granted granted Critical
Publication of EP0317252B1 publication Critical patent/EP0317252B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04Analysing solids
    • G01N29/11Analysing solids by measuring attenuation of acoustic waves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22Details, e.g. general constructional or apparatus details
    • G01N29/28Details, e.g. general constructional or apparatus details providing acoustic coupling, e.g. water
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4454Signal recognition, e.g. specific values or portions, signal events, signatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20Metals
    • G01N33/204Structure thereof, e.g. crystal structure
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/02Indexing codes associated with the analysed material
    • G01N2291/028Material parameters
    • G01N2291/0289Internal structure, e.g. defects, grain size, texture
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/04Wave modes and trajectories
    • G01N2291/044Internal reflections (echoes), e.g. on walls or defects

Definitions

  • the present invention relates to a method of measuring a distribution of crystal grains in metal sheet and an apparatus therefor. More particularly, the present invention relates to a highly practical method of measuring a distribution of crystal grains in metal sheet and an apparatus therefor, suitable for use in producing an anistropic silicon steel sheet high in electromagnetic properties in a rolling direction, capable of non-­destructively measuring the distribution of crystal grains in orientation of the anisotropic silicon steel sheet on line.
  • an anisotropic silicon steel sheet high in electromagnetic properties in the rolling direction.
  • This anisotropic silicon steel sheet is producted by obtaining the crystal grains directed in a so-called GOS orientation, in which a plane ⁇ 110 ⁇ is in parallel to the sheet surface and a direction ⁇ 100> is in parallel to the rolling direction.
  • Fig. 14 shows a typified view of a product 10 including the abnormal grains 10A.
  • a normal grain 10B close to the GOS orientation has a grain diameter as large as several mm - several 10 mm, however, the abnormal grain 10A has a grain diameter of several mm or less in general, the orientation of the grain is directed in random directions, and distributed extending long in the rolling direction as shown in Fig. 14.
  • an Epstein detector and a single sheet tester are used off line, while, a continuous iron loss tester is used on line, thus measuring an iron loss of the steel sheet and a density of magnetic fluxes.
  • the aforesaid measuring instruments can measure only the mean electromagnetic properties in the widthwise direction of the steel sheet, but cannot measure the distribution of the abnormal grains 10A.
  • a method of measuring the distribution of the abnormal grains of the silicon steel sheet there is a macro-etch method, wherein the product is cut into strip-like forms, an insulation coating film on the surface thereof is peeled off and the surface is etched by use of a Nital etchant, whereby the fact that etched effects are different in accordance with the orientations of the crystal grains is utilized, so that the distribution of the crystal grains is observed.
  • a sonic speed v of a longitudinal ultrasonic wave propagated in a direction of ⁇ n1, n2, n3> of a body of equi-axed crystal is given as a root of the following equation.
  • ( ⁇ V 2 - C 44 ) 3 - a ( ⁇ V 2 - C 44 ) 2 + c (a + b ) ( n 1 2 n 2 2 + n 2 2 n 3 2 + n 3 2 n 1 2 ) ( ⁇ V 2 - C 44 ) - C 2 ( a + 2 b ) n 1 2 n 2 2 2 n 3 2 0 ( 1 )
  • n1, n2, and n3 are direction cosines between the propagated direction and the principal axis of crystal, and a, b and c are shown in the following equations, respectively.
  • a C 11 - C 44 ( 2 )
  • b C 12 + C 44 ( 3 )
  • c C 11 -
  • steel is supposed to be a body, and an elastic constant of steel is given, whereby a sonic speed v of the longitudinal ultrasonic wave propagated in a single crystal in various directions can be calculated from the equation (1).
  • Fig. 15 shows examples of calculated results in forms on a stereo-projection drawing.
  • the sonic speed v is different in accordance with the propagated directions of the ultrasonic wave, which is known from the results. Therefor, on the contrary, the sonic speed v is measured, so that the orientation of the crystals can be determined to a certain extent.
  • a sonic speed v in the direction of Z-axis is measured and, when the measured value is 6500 m/s, it can be said that, in this body, an axis [111] of the crystal is laid in the direction of the sheet thickness.
  • S denotes a signal produced by a surface reflected wave.
  • the wave length of the longitudinal wave is about 0.6 mm
  • the sheet thickness d of the silicon steel sheet 11 to be measured is 0.1 - 0.5 mm, then this method is not applicable.
  • a method not utilizing the row of bottom echoes is thought of.
  • the body 11 to be measured is interposed between a transmitting element 12A and a receiving element 12B of ultrasonic wave, whereby a penetration time difference ti of the ultrasonic wave is measured.
  • the relationship between the penetration time difference ti and the sonic speed v is shown by the following equations.
  • the present invention has been developed to obviate the above-described disadvantages of the prior art and, it is an object of the present invention to provide a practical method of measuring a distribution of crystal grains in metal sheet and an apparatus therefor, in which it is possible to efficiently detect the distribution of the abnormal grains of the metal sheet non-destructively and on line and to ensure the quality over the total length thereof without the need of cutting the product into strip-­like forms and peeling off the insulation coating film as in the macro-etch method.
  • the present invention contemsheets in that, in measuring the distribution of the crystal grains in metal sheet; an exciting frequency of ultrasonic wave is determined such that a wave length of the ultrasonic wave propagated in a direction of the sheet thickness of the grains each having an aimed orientation is set at a value of the doubled sheet thicknesses multiplied by about integral times or about half integral times; burst-like ultrasonic pulses having this frequency and including two or more waves are caused to incide into the direction of the sheet thickness by use of at least one ultrasonic probe moving relatively with a body to be measured; multiple reflected waves generated from the bottom and top faces of the metal sheet upon the reflection from the sheet surface are caused to interfere with each other; the multiple reflected waves, which have interfered with each other, are detected; orientations of the grains in the metal sheet are estimated from the magnitudes in amplitude of the interferent multiple reflected waves; and the distribution of the grains in orientation in various portions, into which the ultrasonic wave incides, is detected two-dimensional
  • the exciting frequency of the ultrasonic wave is determined such that the wave length of the ultrasonic wave is set at a value slightly shifted from the value of the doubled sheet thicknesses multiplied by integral times or half integral times.
  • an apparatus for measuring the distribution of crystal grains in metal sheet comprises: ultrasonic probes as being a transmitting element and a receiving element, which are respectively provided at positions opposed to each other and interposing a body to be measured therebetween, for interchanging an electric signal and ultrasonic wave; a transmitting means for delivering two or more continuous burst wave electric signal having a frequency determined such that a wave length of the ultrasonic wave propagated in a direction of the sheet thickness of the crystal grains each having an aimed orientation is set at a value of the doubled sheet thicknesses multiplied by about integral times or about half integral times, to the transmitting element; a receiving means for receiving a signal generated at the receiving element; a means for taking out a signal produced by the interference between multiple reflected waves from the bottom and top faces of the metal sheet, which are generated upon the reflection from the sheet surface, from signals received by the receiving means; and a means for determining whether the orientation of the grains at portions, into which the ultrasonic wave incides, is normal or not
  • the ultrasonic probe is formed into a focus type ultrasonic probe capable of converging the ultrasonic wave, and the focal position thereof is made substantially coincident with the center of the sheet thickness of the body to be measured.
  • the apparatus for measuring the distribution of the crystal grains in metal sheet comprises: an ultrasonic probe as being a transmitting and a receiving elements, which is provided on one side of a body to be measured, for interchanging an electric signal and ultrasonic wave; a reflecting plate provided on the other side of the ultrasonic probe and interposing the body in cooperation with the ultrasonic probe; a transmitting means for transmitting two or more continuous burst wave electric signal having a frequency determined such that a wave length of the ultrasonic wave propagated in a direction of the sheet thickness of the crystal grains each having an aimed orientation is set at a value of the doubled sheet thicknesses multiplied by about integral times or about half integral times, to the ultrasonic probe; a receiving means for receiving a signal generated at the ultrasonic probe after being reflected by the reflecting plate and penetrating through the body again; a means for taking out a signal produced by the interference between multiple reflected waves from the bottom and top faces of the metal sheet, which are generated upon the reflection from
  • an ultrasonic wave reflecting portion of the reflecting plate is made to be concave, and the ultrasonic wave reflected by this concave surface is focused at about the center of the sheet thickness of the body again.
  • the apparatus for measuring the distribution of the crystal grains in metal sheet comprises: a least one ultrasonic probe for interchanging an electric signal and ultrasonic wave; a scanner for scanning the ultrasonic probe or probes in the two dimensional directions; a pulser for transmitting two or more continuous burst wave electric signal having a frequency determined such that a wave length of the ultrasonic wave propagated in a direction of the sheet thickness of the crystal grains each having an aimed orientation is set at a value of the doubled sheet thicknesses multiplied by about integral times or about half integral times; a receiver for receiving a signal from the ultrasonic probe; a timing control circuit for controlling the driving of the pulser; a gate circuit for taking out only a signal produced by the interference between multiple reflected waves from the bottom and top faces of the metal sheet, excluding signals generated by the reflected waves from the sheet surface, in synchronism with a pulse emitted from the timing control circuit; a peak hold circuit for holding a peak value of the interferent signal for
  • the inventors of the present invention have thought of that, without detecting the sonic speed of the ultrasonic wave as it is, a change in the sonic speed is converted into the intensity of the interference by utilizing the interference of the ultrasonic wave, and the intensity is detected, so that information corresponding to the sonic speed can be taken out. More specifically, as shown in Fig. 2, when ultrasonic pulses vertically fall into the body 11 to be measured (metal sheet) having a sheet thickness d from the probe 12 though a contacting medium (water for example), the reflection and penetration of the ultrasonic wave occur on the upper and under surfaces of the sheet, whereby multiple reflected waves are observed.
  • the multiple reflected waves overlie each other, whereby the interference occurs as shown in Fig. 3.
  • the multiple reflected waves do not agree with each other at the phase of 180°, the multiple reflected waves offset each other (interferent multiple reflected wave signal Bb′).
  • the multiple reflected waves intensify each other to the most (interferent multiple reflected wave signal Ba′).
  • Sa′ and Sb′ each denote a surface reflected wave signal.
  • the ultrasonic wave is a wave including at least two pulses or more, that is, a burst wave.
  • the normal grains in a silicon steel sheet takes the GOS orientation.
  • the axis of crystal in the direction of the sheet thickness is ⁇ 110> and the sonic speed in this direction is 6200 m/s.
  • the exciting frequency of the ultrasonic wave f at 10.33 MHz and the number of the burst waves at 10
  • the results as shown in Fig. 4 is obtained.
  • the normal grains in the anisotropic silicon steel sheet take the GOS orientation, and shifts in orientation are within 10° at the most. When this is converted into a sonic speed in the direction of the sheet thickness, the distribution of 6200 ⁇ 50 m/s is obtained. Accordingly, the intensity of the interferent multiple reflected waves is monitored, and, when it becomes lower than a certain value, it is possible to determine the presence of the abnormal grains.
  • the abnormal grains 10A have very small grain diameters as compared with those of the normal grains 10B and the distribution thereof is concentrated, and the orientations of the respective grains are random. Accordingly, even if a threshold value for detecting only the grains having orientations ⁇ 111> and ⁇ 100> is adopted, the distribution of the abnormal grains can be detected.
  • a first point to be noted in working the present invention is that, as shown in Fig. 3, the interferent multiple reflected waves Ba′ and Bb′ occur upon the occurrence of the surface reflected waves Sa′ and Sb′ which are first reflected waves of the inciding wave in the boundary between the surface of a contact medium (water) and the body to be measured (metal sheet) and have high amplitudes, so that the surface reflected waves should not be detected.
  • a transmitting element 12A and a receiving element 12B of ultrasonic wave which interpose the body 11 to be measured, are provided for detecting the penetrating ultrasonic wave (Transmission method).
  • a received signal is limited to only an interferent multiple wave signal T1, and the peak thereof is easily detected, as shown in Fig. 6.
  • a focus type ultrasonic probe capable of converging the ultrasonic wave is used as the ultrasonic probe 12, and the focal position thereof is made substantially coincident with the center of the sheet thickness of the body 11, so that a spatial resolution in measuring can be improved.
  • the ultrasonic probe 12 As shown in Fig. 7 the ultrasonic probe 12 as being the transmitting and the receiving elements is provided on one side and a reflecting plate 14 having a thickness not allowing the multiple reflected waves to interfere therewith is provided on the other side, interposing the body 11 to be measured therebetween, whereby the ultrasonic wave is reflected by the reflecting plate 14, so that the magnitude of a signal obtained by the ultrasonic wave having penetrated through the body 11 again can be detected (Reflecting plate method).
  • signals by the ultrasonic probe 12 are shown in Fig. 8, and, out of these signals, R1 is a signal to be detected, and still, the surface reflected wave B reflected by the upper surface of the body 11 and having the high intensity is not included. Accordingly, by a gate signal B shown in the bottom stage in Fig. 8, it becomes easy to detect a peak of the aimed interferent multiple wave signal R1.
  • Sa indicates a signal reflected by the surface of the body 11, and Ba denotes interferent multiple echoes occurring upon the occurrence of Sa. This Ba can be taken out by a gate signal A shown in the middle stage in Fig. 8.
  • a portion on the reflecting plate 14, to which the ultrasonic wave is applied is formed into a concave surface 14A, whereby the ultrasonic wave is focused at about the center of the sheet thickness of the body 11 again, so that the spatial resolution in measuring can be improved.
  • the wave length of the ultrasonic wave was set at a value slightly shifted from the value of the doubled sheet thicknesses multiplied by the integral times. More especially, in Fig. 4, a frequency (10.33 MHz) of the ultrasonic wave is determined so that the wave length of the ultrasonic wave propagated in the direction of [110] can be set at a value of the twice (0.6 mm) of the sheet thickness (0.3 mm).
  • a second point to be noted in working the present invention is that, in order to cause the interference to easily occur, it is necessary to adopt two waves or more continuous pulse waves (burst waves) as the inciding wave as shown in Fig. 11, instead of a single pulse.
  • burst waves continuous pulse waves
  • the number of the burst waves can be set at about 10 to 20 waves actually.
  • the distribution of the grains in the abnormal orientation of the metal sheet can be detected non-contactingly, non-destructively and rapidly. Accordingly, the disadvantages of the conventional macro-etch method can be obviated, that is, the working of peeling off the insulation coating film and the working of treating the chemicals for etching become unnecessary. Furthermore, the processing time of the inspection is shortened considerably. In the past, there has been no practical technique to be applied to on-line, however, application of the present invention to on-line makes it possible to conduct the inspection over the total length relating to the abnormal grains of the product. Further, in an after-step of work such as a slitter step, portions of the abnormal grains are removed, whereby only portions of the normal grains are accepted as the product, so that excellent products can be delivered.
  • the embodiment of the apparatus by the reflecting plate method accroding to the present invention is arranged as shown in Fig. 1.
  • a timing control circuit 22 outputs rapetition pulses at a rate of 1 - 10 KHz for example, in association with a probe scanning speed of a scanner 26.
  • An ultrasonic proble 12 as being a transmitting and a receiving elements as shown in Fig 7 transduces the electric signal from the pulser 20 into an ultrasonic signal and output the same into a body 11 to be measured.
  • the ultrasonic probe 12 is generally immersed in water together with the body 11, for example. Further, the scanner 26 causes the ultrasonic probe 12 to scan the surface of the body 11 in the two-dimensional directions.
  • a reflecting sheet 14 as shown in Fig. 7 is disposed beneath the body 11.
  • Ultrasonic reflected waves from the top and bottom faces of the body 11 are reflected by the reflecting plate 14 and incide again into the ultrasonic probe 12 to be converted into electric signals therein.
  • a receiver 28 upon receiving the electric signals from the ultrasonic probe 12, suitably amplifies the electric signals and outputs the same into a gate circuit 30.
  • the gate circuit 30, in synchronism with a pulse from the timing control circuit 22, opens the gate circuit 30 with a predetermined delay, to thereby allow only the interferent multiple reflected signal R1 shown in Fig. 8 to be passed to a peak hold circuit 32.
  • the peak hold circuit 32 in synchronism with a pulse from the timing control circuit 22, detects a peak value of the signals from the gate circuit 30 during one repetition time until the following pulse comes, and holds the peak value for one repetition time.
  • a duration of the ultrasonic signal is only in 1 micro second order, a duration of the detected signals is lengthened in this peak hold circuit 32, so that analog-­digital (A/D) conversion by an A/D converter 34 is facilitated.
  • the A/D converter 34 converts an analog signal from the peak hold circuit 32 into a digital signal in synchronism with a pulse from the timing control circuit 22 and outputs the same into a micro-processor 36.
  • the micro-processor 36 receives the digital signal from the A/D converter 34 and a proble position signal from the scanner 26, determines whether the grains are normal or abnormal from the magnitude of the interferent multiple reflected wave signal R1, and outputs the result into a display unit 38.
  • the apparatus for measuring the distribution of the crystal grains in orientation according to the present invention is assembled into a controller in a before-step or an after-step of work for example, whereby on-line control can be directly performed in accordance with the result of measuring.
  • the display unit 38 may be dispensed with.
  • the scanner 26 causes the ultrasonic probe 12 to scan the surface of the steel sheet 11 in the two-dimensional directions as shown in Fig. 12.
  • a relative speed during scanning is set at 1 m/s, a scanning pitch at 0.5 mm and the repetition frequency of the pulse from the timing control circuit 22 at 2 KHz, the ultrasonic wave incides into the steel sheet 11 at a rate of one per square of 0.5 mm by 0.5 mm.
  • the grain diameter of the crystal grain in the sheet plane of the anisotropic silicon steel sheet in the abnormal grain portion is 0.5 - 1 mm, and that in the normal grain portion is more than this. Therefore one or more ultrasonic pulses incide into almost of all crystal grains, so that the magnitude of the interferent multiple reflected wave signal for all of the grains can be measured.
  • the focus type ultrasonic probe capable of converging the ultrasonic wave is used as the ultrasonic probe 12 and the focal position is made substantially coincident with the center of the sheet thickness of the steel sheet 11, an ultrasonic wave beam having a diameter of about 0.5 mm can be easily obtained, and further, the distance between the steel sheet 11 and the probe 12 can be made as much as the focal length (several mm - several ten mm).
  • Fig. 13 shows a case in which, when the number of burst waves of the ultrasonic wave is set at 10, only the portion of the abnormal grains are drawn black as an example of the result of measuring according to this embodiment. It can be ascertained that this result of measuring corresponds well to the result of measuring by the conventional macro-­etch method. As described above, according to the present invention, the portion of the abnormal grains can be detected with high accuracy and non-destructively.
  • This embodiment is arranged such that a single ultrasonic probe 12 is combined with the reflecting plate 14 for use as shown in Fig. 7 (reflecting plate method), whereby, it is possible to measure from one side, so that it is advantageous in on-line measurement in particular.
  • the arrangement for transmitting and receiving the ultrasonic wave is not limited to this, and such an arrangement that, as shown in Fig. 5 for example, an ultrasonic probe functioning as the transmitting element 12A and an ultrasonic probe functioning as the receiving element 12B are provided at positions opposed to each other, interposing the body 11 to be measured therebetween (transmission method).
  • an arrangement wherein the reflecting sheet 14 is dispensed with may be adopted.
  • one ultrasonic probe 12 has been used, however, when the body 11 to be measured is moved as in the on-line measurement and high speed measurement is required, a plurality (or a plurality of pairs) of ultrasonic probes may be used to increase the speed of measuring.
  • the frequency f of the ultrasonic wave has been determined such that the phase agree with each other when the speed is in the direction ⁇ 110>.
  • the frequency f may be determined such that the phases are shifted from each other by 180° , or, on the contrary, the frequency f may be determined in conformity with the speed of the abnormal orientation.

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Acoustics & Sound (AREA)
  • Signal Processing (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
EP88310752A 1987-11-16 1988-11-15 Méthode pour mesurer la distribution des grains cristallins dans une feuille métallique et appareil à cet effet Expired - Lifetime EP0317252B1 (fr)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP289019/87 1987-11-16
JP28901987 1987-11-16
JP235294/88 1988-09-20
JP63235294A JPH071255B2 (ja) 1987-11-16 1988-09-20 方向性珪素鋼板の結晶粒方位分布測定方法及び装置

Publications (3)

Publication Number Publication Date
EP0317252A2 true EP0317252A2 (fr) 1989-05-24
EP0317252A3 EP0317252A3 (en) 1990-07-18
EP0317252B1 EP0317252B1 (fr) 1994-01-19

Family

ID=26532043

Family Applications (1)

Application Number Title Priority Date Filing Date
EP88310752A Expired - Lifetime EP0317252B1 (fr) 1987-11-16 1988-11-15 Méthode pour mesurer la distribution des grains cristallins dans une feuille métallique et appareil à cet effet

Country Status (4)

Country Link
US (1) US4893510A (fr)
EP (1) EP0317252B1 (fr)
JP (1) JPH071255B2 (fr)
DE (1) DE3887286T2 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012122807A (ja) * 2010-12-07 2012-06-28 Kawasaki Heavy Ind Ltd ろう接接合部の超音波探傷装置および方法

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04188058A (ja) * 1990-11-21 1992-07-06 Olympus Optical Co Ltd 超音波探傷装置
US5167157A (en) * 1991-03-26 1992-12-01 Ball Corporation Nondestructive inspection system for laminated products
US5327083A (en) * 1992-03-19 1994-07-05 Allegheny Ludlum Corporation Method and apparatus using magnetic flux scanning to test grain structure of magnetic sheet material
US5631424A (en) * 1995-07-31 1997-05-20 General Electric Company Method for ultrasonic evaluation of materials using time of flight measurements
US5955671A (en) * 1997-03-28 1999-09-21 General Electric Company Method and apparatus for measurement of orientation in an anisotropic medium
US6266983B1 (en) * 1998-12-09 2001-07-31 Kawasaki Steel Corporation Method and apparatus for detecting flaws in strip, method of manufacturing cold-rolled steel sheet and pickling equipment for hot-rolled steel strip
WO2000046583A1 (fr) * 1999-02-04 2000-08-10 Bechtel Bwxt Idaho, Llc Systeme capteur a ultrasons de qualite de fluide
US6439054B1 (en) * 2000-05-31 2002-08-27 Honeywell International Inc. Methods of testing sputtering target materials
EP1467203A1 (fr) * 2003-04-10 2004-10-13 Zumbach Electronic Ag Dispositif et procédé de mesure d'un cable plat extrudé
CN102298127B (zh) * 2010-06-22 2013-03-13 宝山钢铁股份有限公司 一种取向硅钢电磁性能的检测方法
CN103175898B (zh) * 2013-03-04 2015-04-22 江苏大学 一种焊缝平均晶粒尺寸的焊缝特征导波检测方法
KR101635811B1 (ko) * 2014-08-14 2016-07-05 주식회사 포스코 주편 품질 모니터링장치 및 주편 품질 평가방법
US10416120B2 (en) 2014-08-29 2019-09-17 University Of Louisiana At Lafayette System and methods for determining sensitization of alloy by measuring and correlating ultrasonic parameters
KR102207211B1 (ko) 2014-10-27 2021-01-25 삼성전자주식회사 검사 장치, 및 이를 포함하는 영상 장치
WO2017223499A1 (fr) * 2016-06-24 2017-12-28 Wyle Laboratories Inc. Procédé d'imagerie non destructrice ultrasonore à micro-résolution

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4223790A (en) * 1978-02-13 1980-09-23 Hajime Industries, Ltd. Container inspection system
DE3032356A1 (de) * 1979-09-28 1981-07-02 VEB Otto Buchwitz Starkstrom-Anlagenbau Dresden, DDR 8060 Dresden Verfahren zur kontaktlosen kontrolle von gasen in behaeltern
GB2144551A (en) * 1983-08-01 1985-03-06 Nippon Steel Corp Method of determining grain size
EP0155630A2 (fr) * 1984-03-17 1985-09-25 TERUMO KABUSHIKI KAISHA trading as TERUMO CORPORATION Méthode de mesure ultrasonore et appareil à cet effet
JPS61164154A (ja) * 1985-01-17 1986-07-24 Nippon Steel Corp 鋼構造物の腐食検出方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH589277A5 (fr) * 1973-11-26 1977-06-30 Western Electric Co
JPS59162449A (ja) * 1983-03-07 1984-09-13 Hitachi Ltd 超音波顕微鏡

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4223790A (en) * 1978-02-13 1980-09-23 Hajime Industries, Ltd. Container inspection system
DE3032356A1 (de) * 1979-09-28 1981-07-02 VEB Otto Buchwitz Starkstrom-Anlagenbau Dresden, DDR 8060 Dresden Verfahren zur kontaktlosen kontrolle von gasen in behaeltern
GB2144551A (en) * 1983-08-01 1985-03-06 Nippon Steel Corp Method of determining grain size
EP0155630A2 (fr) * 1984-03-17 1985-09-25 TERUMO KABUSHIKI KAISHA trading as TERUMO CORPORATION Méthode de mesure ultrasonore et appareil à cet effet
JPS61164154A (ja) * 1985-01-17 1986-07-24 Nippon Steel Corp 鋼構造物の腐食検出方法

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
PATENT ABSTRACTS OF JAPAN, vol. 10, no. 371 (P-526)[2428], 11th December 1986; & JP-A-61 164 154 (NIPPON STEEL CORP.) 24-07-1986 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012122807A (ja) * 2010-12-07 2012-06-28 Kawasaki Heavy Ind Ltd ろう接接合部の超音波探傷装置および方法

Also Published As

Publication number Publication date
DE3887286D1 (de) 1994-03-03
EP0317252A3 (en) 1990-07-18
US4893510A (en) 1990-01-16
JPH01229962A (ja) 1989-09-13
DE3887286T2 (de) 1994-05-05
JPH071255B2 (ja) 1995-01-11
EP0317252B1 (fr) 1994-01-19

Similar Documents

Publication Publication Date Title
EP0317252A2 (fr) Méthode pour mesurer la distribution des grains cristallins dans une feuille métallique et appareil à cet effet
EP0239275B1 (fr) Mesure de tartre d'oxide sur des surfaces intérieures de tubes de chaudières
EP1927856B1 (fr) Procédé d'inspection ultrasonique
US5383366A (en) Ultrasonic two probe system for locating and sizing
EP0188335A2 (fr) Inspection de matériaux par l'emploi d'ondes ultrasonores
EP0212899A2 (fr) Essai de matériaux aux ultra-sons
US4759221A (en) Apparatus for the determination of surface cracks
US4596142A (en) Ultrasonic resonance for detecting changes in elastic properties
JP2001343365A (ja) 金属薄板の厚み共振スペクトル測定方法及び金属薄板の電磁超音波計測方法
JPS60170764A (ja) タ−ビンデイスク用超音波探傷装置
JP4761147B2 (ja) 超音波探傷方法及び装置
JP2006313110A (ja) 超音波探傷方法及び装置
JPH04274754A (ja) タービンロータ羽根植込部超音波探傷装置
JPH09145696A (ja) 欠陥深さ測定方法およびその装置
JP2824488B2 (ja) 超音波パルス反射法によるコンクリート構造物の版厚の測定方法
JPS6014166A (ja) 超音波探傷方法及びその装置
JP2799824B2 (ja) 水素侵食によるキャビティ発生評価方法
JPS6411143B2 (fr)
JPS61223648A (ja) スポツト溶接部の良否判定方法
JPH1038862A (ja) 鉄損値評価方法及びその装置
US6393917B1 (en) System and method for ultrasonic image reconstruction using mode-converted Rayleigh wave
JP3132263B2 (ja) 結晶粒測定装置の異常判定方法
GB2143036A (en) Ultrasonic resonance for detecting changes in elastic properties
SU1293630A1 (ru) Способ ультразвукового контрол изделий
JP3463729B2 (ja) 内部組織の非破壊検査方法

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

AK Designated contracting states

Kind code of ref document: A2

Designated state(s): DE FR GB SE

PUAL Search report despatched

Free format text: ORIGINAL CODE: 0009013

AK Designated contracting states

Kind code of ref document: A3

Designated state(s): DE FR GB SE

17P Request for examination filed

Effective date: 19901120

17Q First examination report despatched

Effective date: 19920326

GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): DE FR GB

REF Corresponds to:

Ref document number: 3887286

Country of ref document: DE

Date of ref document: 19940303

ET Fr: translation filed
ET1 Fr: translation filed ** revision of the translation of the patent or the claims
PLBE No opposition filed within time limit

Free format text: ORIGINAL CODE: 0009261

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT

26N No opposition filed
REG Reference to a national code

Ref country code: GB

Ref legal event code: IF02

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: FR

Payment date: 20031110

Year of fee payment: 16

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: GB

Payment date: 20031112

Year of fee payment: 16

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: DE

Payment date: 20031127

Year of fee payment: 16

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: GB

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20041115

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: DE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20050601

GBPC Gb: european patent ceased through non-payment of renewal fee

Effective date: 20041115

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: FR

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20050729

REG Reference to a national code

Ref country code: FR

Ref legal event code: ST