EP0237259A2 - Spectromètre de masse - Google Patents

Spectromètre de masse Download PDF

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Publication number
EP0237259A2
EP0237259A2 EP87301870A EP87301870A EP0237259A2 EP 0237259 A2 EP0237259 A2 EP 0237259A2 EP 87301870 A EP87301870 A EP 87301870A EP 87301870 A EP87301870 A EP 87301870A EP 0237259 A2 EP0237259 A2 EP 0237259A2
Authority
EP
European Patent Office
Prior art keywords
quadrupole
mass
ions
ion
mass spectrometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP87301870A
Other languages
German (de)
English (en)
Other versions
EP0237259A3 (fr
Inventor
John Edward Philip Syka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thermo Finnigan LLC
Original Assignee
Finnigan Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Finnigan Corp filed Critical Finnigan Corp
Publication of EP0237259A2 publication Critical patent/EP0237259A2/fr
Publication of EP0237259A3 publication Critical patent/EP0237259A3/fr
Withdrawn legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
    • H01J49/4215—Quadrupole mass filters
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction

Definitions

  • This invention relates to a mass spectrometer, and more particularly to a low noise tandem quadrupole mass spectrometer.
  • Tandem quadrupole mass spectrometers are known, and have been used in the study of ion-molecule reactions.
  • a center RF only quadrupole has been added to a tandem quadrupole mass spectrometer for study of photo dissociation and for metastable ion studies.
  • US-A-4234791 and US-A-4329582 disclose tandem quadrupole mass spectrometers including a highly efficient intermediate fragmentation stage which employs collision induced dissociation (CID) in the form of an RF only quadrupole.
  • CID collision induced dissociation
  • a mass spectrometer characterised by means for directing ions to be analyzed or filtered along a predetermined path; a quadrupole means for directing said ions away from said predetermined path; a quadrupole ion filter or analyzer for receiving the output of said quadrupole means; and detector means offset from said path and positioned to receive the output from said quadrupole ion filter or analyzer.
  • the invention provides an improved tandem quadrupole mass spectrometer having low neutral particle and fast ion noise.
  • the known tandem quadrupole mass spectrometer shown in Figure 1 includes an ion source 11 shown as including a chamber 12 with an electron source 13 and collector 14.
  • the ion source 11 may be operated in electron impact (EI) mode or chemical ionization (CI) mode.
  • EI electron impact
  • CI chemical ionization
  • Other suitable types of ion sources used in mass spectrometry are those which generate secondary ions from a sample liquid matrix or solid sample by bombardment with a beam of fast atoms or ions. These ion sources are used for analysis of high mass organic compounds.
  • There are other ionization techniques for use in elemental or inorganic mass spectrometry. These types of ion source provide more neutral particles and fast ions giving rise to higher noise levels.
  • the ion source generates ions which are accelerated and directed in a predetermined path by lens 16 into the quadrupole mass filter or analyzer 17. Neutral particles and fast ions also travel to the quadrupole mass filter.
  • the quadrupole analyzer of filter 17 operates with a periodical voltage comprising an RF voltage and a d.c. voltage.
  • the analyzer or filter 17 passes only ions of a selected charge to mass ration. That is, it filters the ions and only selects those having a charge to mass ratio within a predetermined range. The range is determined by the RF and d.c. voltages applied to the quadruopole rods 18.
  • the ions which are not trapped or passed by the quadrupole filter or analyzer strike the walls of the enclosure or the qudrupole rods 18 and are neutralized.
  • the selected or filtered ions pass through the analyzer 17.
  • a lens 19 focuses the ions of selected mass to charge ratio which are passed by the analyzer 17 into the quadrupole region 21 which includes rods 22 operated RF only. By operating the quadrupole RF only, it passes substantially all the ions, that is, it acts as a very broad band high pass filter.
  • the RF quadrupole 21 is in a separate volume defined by the walls 25 which also form part of the associated lens 19 and 24.
  • a collision gas is introduced into the volume via a suitable inlet 23.
  • the ions passed by quadrupole 21 collide with the gas to form daughters or fragments of the selected ions.
  • the fragments or daughters are passed through lens 24 into a second quadrupole mass filter or analyzer 26 where particles of selected mass are selected and passed through the aperture 27 through the openings formed in the X-ray shield 28 to either dynodes 31 or 32 depending whether negative or positive ions are to be analyzed.
  • the secon­dary ions or electrons leaving the dynodes are then collect­ed by an electron multiplier 33 which provides an output signal.
  • a preferred detector is described in US-A-4423324.
  • a tandem quadrupole mass spectrometer of the type just described suffers from noise because of ex­cited and fast neutral particles and fast ions which are generated in the ion source. It is believed that these neutral particles and fast ions travel in a straight line through the various quadrupoles and lenses and strike sur­faces in the vicinity of the dynodes 31, 32. When they strike these surfaces, they cause emission of positive and negative ions (possibly electrons) which are attracted by the dynodes 31 or 32 and sensed by multiplier 32 and de­tected as a signal.
  • Figure 2 shows a triple tandem mass spectrometer in accord­ance with the present invention. Like reference numerals have been applied to parts which correspond to those in Figure 1.
  • the RF only quad­rupole is bent as illustrated by quadrupole 36 so that the detector is no longer in line with the ion source 11.
  • Neu­tral particles traveling in a straight line from the ion source 11 then strike either the walls of the enclosure or the quadrupole rods 37.
  • any secondary particles are collected and dissipated, never finding their way to the vicinity of the detector.
  • the excited neutrals impinge upon intervening surfaces and never reach the region of the detector where they can add to the signal.
  • the neutrals are effectively filtered by the RF only quadrupole and never travel to the mass filter. Even if a secondary from an excited neutral would have a mass appropriate to allow it to traverse through the last quadrupole 26 to the detector, its initial position would most likely be such that its transmission through the quadrupole and to the detector would be highly unlikely.
  • Bent quadrupoles have been known for bending of ion beams.
  • the book "Quadrupole Mass Spectrometry and its Applications” edited by Peter H. Dawson provides criteria for operation of a bent quadrupole ion beam guide.
  • the radius of curvature of the axis of the quadrupole structure must be much larger than the characteristic dimension of the quadrupole electrode structure.
  • the quadruple mass filter operation occurs when the applied ratio of DC to RF is such that the pass band of the device is so narrow as to allow only a single ion mass to transmit.
  • the spec­ific range of ion masses passed by the quadrupole is theorectically solely a function of the device character­istic dimension, r o , the magnitudes of the applied RF and DC voltages, and the frequency of the applied RF.
  • r o the magnitudes of the applied RF and DC voltages
  • the effect of axial velocity on ion transmission is substantially different from the straight quadrupole.
  • the strong focusing nature of the quadrupole field is sufficient to divert all ions within the pass band along the curved axis of the quadrupole.
  • ions with masses near the limits of the pass band do not experience sufficient strong focusing to follow the curved ion path and are not transmitted.
  • the effect of increased axial ion velocity is a progressive narrowing and smearing of the ion mass pass band limits. At very high axial ion veloc­ities no ions can be transmitted.
  • a spectrometer in accordance with the invention can otherwise include only a single mass filter or analyzer such as the mass spectrometer shown in Figure 3 wherein like reference numerals have been applied to like parts.
  • this mass spectrometer the first tandem analyzer or filter stage of Figure 2 has been eliminated.
  • the ions created in the ion source 11 are mass analyzed at high resolution and the parent ion beam exits at the exit slit 75.
  • Low energy CID and high energy CID The low energy CID experiment is the same experiment that is performed with the instrument in Figure 1.
  • the parent ion beam is transmitted through and decelerated in the deceleration lens system 77 into a conventional RF quad­rupole collision cell 21 where it undergoes low energy CID at kinetic energies ranging from 2 to 200 eV.
  • the daughter ions are in turn mass analyzed in the RF/DC quad­rupole mass analyzer and detected at the detector. This experiment is very quiet as the noise causing particles generated in the ion source, as discussed before, do not transmit through the sector analyzer.
  • the mass spectrometer may use one or more bent or angled sections to provide enhanced noise immunity.
  • Figure 7 shows a system using three RF sections 46, 47 and 48, two of which are curved and one of which is straight.
  • the center straight section 47 may have a gas inlet 49 and perform in the CID mode.
  • the RF only quadrupole may be composed of combined straight and curved sections.
  • Figure 8 shows a mass spectrometer including an RF section having outer straight sections 52 and 53 separated from a CID section 54 which includes a curved rod portion 56 and a straight por­tion 57.
EP87301870A 1986-03-07 1987-03-04 Spectromètre de masse Withdrawn EP0237259A3 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US83760086A 1986-03-07 1986-03-07
US837600 1997-04-21

Publications (2)

Publication Number Publication Date
EP0237259A2 true EP0237259A2 (fr) 1987-09-16
EP0237259A3 EP0237259A3 (fr) 1989-04-05

Family

ID=25274923

Family Applications (1)

Application Number Title Priority Date Filing Date
EP87301870A Withdrawn EP0237259A3 (fr) 1986-03-07 1987-03-04 Spectromètre de masse

Country Status (3)

Country Link
EP (1) EP0237259A3 (fr)
JP (1) JPS62264546A (fr)
CA (1) CA1249381A (fr)

Cited By (52)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2225159A (en) * 1988-11-18 1990-05-23 Vg Instr Group Mass spectrometers
GB2230896A (en) * 1989-02-23 1990-10-31 Finnigan Mat Gmbh Process and apparatus for the mass-spectrometric investigation of isotopes
FR2648230A1 (fr) * 1989-06-12 1990-12-14 Centre Nat Rech Scient Procede et dispositif d'analyse d'un echantillon par spectrometrie de masse a bon rendement de transmission des ions
US5426301A (en) * 1991-05-21 1995-06-20 Turner; Patrick Off-axis interface for a mass spectrometer
US5481107A (en) * 1993-09-20 1996-01-02 Hitachi, Ltd. Mass spectrometer
EP0771019A1 (fr) * 1995-10-27 1997-05-02 Hitachi, Ltd. Méthode et dispositif pour l'analyse de masse d'un échantillon en solution
WO1997030469A1 (fr) * 1996-02-16 1997-08-21 Varian Associates, Inc. Systeme de spectrometre de masse et procede de transport et d'analyse d'ions
US5663560A (en) * 1993-09-20 1997-09-02 Hitachi, Ltd. Method and apparatus for mass analysis of solution sample
DE19628093A1 (de) * 1996-07-12 1998-01-22 Deutsche Forsch Luft Raumfahrt Verfahren und Vorrichtung zum Nachweis von Probenmolekülen
US5825026A (en) * 1996-07-19 1998-10-20 Bruker-Franzen Analytik, Gmbh Introduction of ions from ion sources into mass spectrometers
WO1998052209A1 (fr) * 1997-05-12 1998-11-19 Mds Inc. Spectrometre de masse uniquement rf a excitation auxiliaire
WO1999062101A1 (fr) * 1998-05-29 1999-12-02 Analytica Of Branford, Inc. Spectrometrie de masse avec guides d'ions multipolaires
US6028308A (en) * 1996-11-18 2000-02-22 Mds Inc. Resolving RF mass spectrometer
WO2001013100A2 (fr) * 1999-08-13 2001-02-22 Bruker Daltonics, Inc. Procede et appareil permettant d'obtenir un multipole multifrequences
WO2001091159A1 (fr) * 2001-04-27 2001-11-29 Varian Australia Pty Ltd Spectrometre de masse comprenant un analyseur de masse quadrupolaire
US6462338B1 (en) * 1998-09-02 2002-10-08 Shimadzu Corporation Mass spectrometer
AU778228B2 (en) * 2001-04-27 2004-11-25 Agilent Technologies Australia (M) Pty Ltd Mass spectrometer including a quadrupole mass analyser arrangement
US6891157B2 (en) * 2002-05-31 2005-05-10 Micromass Uk Limited Mass spectrometer
WO2005052984A1 (fr) * 2003-11-25 2005-06-09 Syft Technologies Limited Ameliorations portant sur des instruments sift-ms
GB2436467A (en) * 2006-03-22 2007-09-26 Itt Mfg Enterprises Inc Ion Detection System With Neutral Noise Suppression
DE10340849B4 (de) * 2002-09-04 2009-01-29 Micromass Uk Ltd. Verwendung eines Quadrupol-Stabsatzes und eines Ionendetektors eines Massenspektrometers
WO2009036569A1 (fr) * 2007-09-19 2009-03-26 Mds Analytical Technologies, A Business Unit Of Mds Inc. Doing Business Through Its Sciex Division Cellule de collision pour spectromètre de masse
EP2150967A2 (fr) * 2007-05-31 2010-02-10 Analytica of Branford, Inc. Interface de guide d'ions multipolaire pour une réduction du bruit de fond en spectrométrie de masse
WO2011061147A1 (fr) * 2009-11-17 2011-05-26 Bruker Daltonik Gmbh Utilisation des écoulements de gaz dans des spectromètres de masse
US8384028B2 (en) 2008-01-30 2013-02-26 Shimadzu Corporation MS/MS mass spectrometer
US8450681B2 (en) 2011-06-08 2013-05-28 Mks Instruments, Inc. Mass spectrometry for gas analysis in which both a charged particle source and a charged particle analyzer are offset from an axis of a deflector lens, resulting in reduced baseline signal offsets
CN103650101A (zh) * 2011-06-28 2014-03-19 株式会社岛津制作所 三重四极型质量分析装置
US8796620B2 (en) 2011-06-08 2014-08-05 Mks Instruments, Inc. Mass spectrometry for gas analysis with a one-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens
US8796638B2 (en) 2011-06-08 2014-08-05 Mks Instruments, Inc. Mass spectrometry for a gas analysis with a two-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens
EP2801999A1 (fr) * 1998-09-16 2014-11-12 Thermo Fisher Scientific (Bremen) GmbH Moyens pour l'élimination d'ions indésirables d'un système de transport d'ions et spectromètre de masse
US8921803B2 (en) 2011-03-04 2014-12-30 Perkinelmer Health Sciences, Inc. Electrostatic lenses and systems including the same
USRE45553E1 (en) 2002-05-13 2015-06-09 Thermo Fisher Scientific Inc. Mass spectrometer and mass filters therefor
US9123516B2 (en) 2010-10-08 2015-09-01 Hitachi High-Technologies Corporation Multipole segments aligned in an offset manner in a mass spectrometer
US9773656B2 (en) 2014-05-14 2017-09-26 Shimadzu Corporation Ion transport apparatus and mass spectrometer using the same
WO2020021255A1 (fr) * 2018-07-27 2020-01-30 Micromass Uk Limited Interface de transfert d'ions pour sm
US10593533B2 (en) 2015-11-16 2020-03-17 Micromass Uk Limited Imaging mass spectrometer
US10629425B2 (en) 2015-11-16 2020-04-21 Micromass Uk Limited Imaging mass spectrometer
US10741376B2 (en) 2015-04-30 2020-08-11 Micromass Uk Limited Multi-reflecting TOF mass spectrometer
US10950425B2 (en) 2016-08-16 2021-03-16 Micromass Uk Limited Mass analyser having extended flight path
US11081332B2 (en) 2017-08-06 2021-08-03 Micromass Uk Limited Ion guide within pulsed converters
US11205568B2 (en) 2017-08-06 2021-12-21 Micromass Uk Limited Ion injection into multi-pass mass spectrometers
US11211238B2 (en) 2017-08-06 2021-12-28 Micromass Uk Limited Multi-pass mass spectrometer
US11239067B2 (en) 2017-08-06 2022-02-01 Micromass Uk Limited Ion mirror for multi-reflecting mass spectrometers
US11295944B2 (en) 2017-08-06 2022-04-05 Micromass Uk Limited Printed circuit ion mirror with compensation
US11328920B2 (en) 2017-05-26 2022-05-10 Micromass Uk Limited Time of flight mass analyser with spatial focussing
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JP4978700B2 (ja) * 2008-01-30 2012-07-18 株式会社島津製作所 Ｍｓ／ｍｓ型質量分析装置
US8866077B2 (en) * 2011-10-20 2014-10-21 Shimadzu Corporation Mass spectrometer
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US5036195A (en) * 1988-11-18 1991-07-30 Vg Instruments Group Limited Gas analyzer
GB2225159B (en) * 1988-11-18 1993-05-05 Vg Instr Group Gas analyzer
GB2225159A (en) * 1988-11-18 1990-05-23 Vg Instr Group Mass spectrometers
GB2230896A (en) * 1989-02-23 1990-10-31 Finnigan Mat Gmbh Process and apparatus for the mass-spectrometric investigation of isotopes
US5043575A (en) * 1989-02-23 1991-08-27 Finnigan Mat Gmbh Process for the mass-spectrometric investigation of isotopes, as well as isotope mass spectrometer
FR2648230A1 (fr) * 1989-06-12 1990-12-14 Centre Nat Rech Scient Procede et dispositif d'analyse d'un echantillon par spectrometrie de masse a bon rendement de transmission des ions
US5426301A (en) * 1991-05-21 1995-06-20 Turner; Patrick Off-axis interface for a mass spectrometer
US5663560A (en) * 1993-09-20 1997-09-02 Hitachi, Ltd. Method and apparatus for mass analysis of solution sample
US5481107A (en) * 1993-09-20 1996-01-02 Hitachi, Ltd. Mass spectrometer
EP0771019A1 (fr) * 1995-10-27 1997-05-02 Hitachi, Ltd. Méthode et dispositif pour l'analyse de masse d'un échantillon en solution
GB2314967B (en) * 1996-02-16 2000-12-06 Varian Associates Mass spectrometer system and method for transporting and analyzing ions
GB2314967A (en) * 1996-02-16 1998-01-14 Varian Associates Mass spectrometer system and method for transporting and analyzing ion
US5818041A (en) * 1996-02-16 1998-10-06 Varian Associates, Inc. Mass spectrometer system and method for transporting and analyzing ions
US5672868A (en) * 1996-02-16 1997-09-30 Varian Associates, Inc. Mass spectrometer system and method for transporting and analyzing ions
WO1997030469A1 (fr) * 1996-02-16 1997-08-21 Varian Associates, Inc. Systeme de spectrometre de masse et procede de transport et d'analyse d'ions
DE19628093B4 (de) * 1996-07-12 2006-09-21 Deutsches Zentrum für Luft- und Raumfahrt e.V. Verfahren und Vorrichtung zum Nachweis von Probenmolekülen
DE19628093A1 (de) * 1996-07-12 1998-01-22 Deutsche Forsch Luft Raumfahrt Verfahren und Vorrichtung zum Nachweis von Probenmolekülen
US5825026A (en) * 1996-07-19 1998-10-20 Bruker-Franzen Analytik, Gmbh Introduction of ions from ion sources into mass spectrometers
US6028308A (en) * 1996-11-18 2000-02-22 Mds Inc. Resolving RF mass spectrometer
US6114691A (en) * 1997-05-12 2000-09-05 Mds Inc. RF-only mass spectrometer with auxiliary excitation
WO1998052209A1 (fr) * 1997-05-12 1998-11-19 Mds Inc. Spectrometre de masse uniquement rf a excitation auxiliaire
WO1999062101A1 (fr) * 1998-05-29 1999-12-02 Analytica Of Branford, Inc. Spectrometrie de masse avec guides d'ions multipolaires
US6462338B1 (en) * 1998-09-02 2002-10-08 Shimadzu Corporation Mass spectrometer
EP2801999A1 (fr) * 1998-09-16 2014-11-12 Thermo Fisher Scientific (Bremen) GmbH Moyens pour l'élimination d'ions indésirables d'un système de transport d'ions et spectromètre de masse
USRE45386E1 (en) 1998-09-16 2015-02-24 Thermo Fisher Scientific (Bremen) Gmbh Means for removing unwanted ions from an ion transport system and mass spectrometer
WO2001013100A2 (fr) * 1999-08-13 2001-02-22 Bruker Daltonics, Inc. Procede et appareil permettant d'obtenir un multipole multifrequences
WO2001013100A3 (fr) * 1999-08-13 2002-03-07 Bruker Daltonics Inc Procede et appareil permettant d'obtenir un multipole multifrequences
US6762407B2 (en) * 2001-04-27 2004-07-13 Varian Australia Pty Ltd Mass spectrometer including a quadrupole mass analyzer arrangement
AU778228B2 (en) * 2001-04-27 2004-11-25 Agilent Technologies Australia (M) Pty Ltd Mass spectrometer including a quadrupole mass analyser arrangement
WO2001091159A1 (fr) * 2001-04-27 2001-11-29 Varian Australia Pty Ltd Spectrometre de masse comprenant un analyseur de masse quadrupolaire
USRE45553E1 (en) 2002-05-13 2015-06-09 Thermo Fisher Scientific Inc. Mass spectrometer and mass filters therefor
US6891157B2 (en) * 2002-05-31 2005-05-10 Micromass Uk Limited Mass spectrometer
DE10340849B4 (de) * 2002-09-04 2009-01-29 Micromass Uk Ltd. Verwendung eines Quadrupol-Stabsatzes und eines Ionendetektors eines Massenspektrometers
DE10362251B3 (de) * 2002-09-04 2012-10-31 Micromass Uk Limited Verwendung einer Mehrmodus-Wechselspannungs- oder HF-Ionenführung und eines lonendetektors eines Massenspektrometers
WO2005052984A1 (fr) * 2003-11-25 2005-06-09 Syft Technologies Limited Ameliorations portant sur des instruments sift-ms
EP1695374A1 (fr) * 2003-11-25 2006-08-30 Syft technologies Limited Ameliorations portant sur des instruments sift-ms
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US7429730B2 (en) 2003-11-25 2008-09-30 Syft Technologies Limited SIFT-MS instruments
GB2436467A (en) * 2006-03-22 2007-09-26 Itt Mfg Enterprises Inc Ion Detection System With Neutral Noise Suppression
GB2436467B (en) * 2006-03-22 2011-03-23 Itt Mfg Enterprises Inc Ion detection system with neutral noise suppression
EP2150967A4 (fr) * 2007-05-31 2012-12-05 Perkinelmer Health Sci Inc Interface de guide d'ions multipolaire pour une réduction du bruit de fond en spectrométrie de masse
US8507850B2 (en) 2007-05-31 2013-08-13 Perkinelmer Health Sciences, Inc. Multipole ion guide interface for reduced background noise in mass spectrometry
EP2150967A2 (fr) * 2007-05-31 2010-02-10 Analytica of Branford, Inc. Interface de guide d'ions multipolaire pour une réduction du bruit de fond en spectrométrie de masse
US8723107B2 (en) 2007-05-31 2014-05-13 Perkinelmer Health Sciences, Inc. Multipole ion guide interface for reduced background noise in mass spectrometry
US7923681B2 (en) 2007-09-19 2011-04-12 Dh Technologies Pte. Ltd. Collision cell for mass spectrometer
EP2198448A4 (fr) * 2007-09-19 2015-08-19 Dh Technologies Dev Pte Ltd Cellule de collision pour spectromètre de masse
WO2009036569A1 (fr) * 2007-09-19 2009-03-26 Mds Analytical Technologies, A Business Unit Of Mds Inc. Doing Business Through Its Sciex Division Cellule de collision pour spectromètre de masse
US8384028B2 (en) 2008-01-30 2013-02-26 Shimadzu Corporation MS/MS mass spectrometer
US8941058B2 (en) 2009-11-17 2015-01-27 Bruker Daltonik Gmbh Utilizing gas flows in mass spectrometers
WO2011061147A1 (fr) * 2009-11-17 2011-05-26 Bruker Daltonik Gmbh Utilisation des écoulements de gaz dans des spectromètres de masse
GB2494228B (en) * 2009-11-17 2016-03-30 Bruker Daltonik Gmbh Utilizing gas flows in mass spectrometers
GB2494228A (en) * 2009-11-17 2013-03-06 Bruker Daltonik Gmbh Utilizing gas flows in mass spectrometers
US9123516B2 (en) 2010-10-08 2015-09-01 Hitachi High-Technologies Corporation Multipole segments aligned in an offset manner in a mass spectrometer
US8921803B2 (en) 2011-03-04 2014-12-30 Perkinelmer Health Sciences, Inc. Electrostatic lenses and systems including the same
US8796638B2 (en) 2011-06-08 2014-08-05 Mks Instruments, Inc. Mass spectrometry for a gas analysis with a two-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens
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CA1249381A (fr) 1989-01-24
EP0237259A3 (fr) 1989-04-05
JPS62264546A (ja) 1987-11-17

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