EP0147009B1 - Dispositif de balayage à rayons X - Google Patents

Dispositif de balayage à rayons X Download PDF

Info

Publication number
EP0147009B1
EP0147009B1 EP84306270A EP84306270A EP0147009B1 EP 0147009 B1 EP0147009 B1 EP 0147009B1 EP 84306270 A EP84306270 A EP 84306270A EP 84306270 A EP84306270 A EP 84306270A EP 0147009 B1 EP0147009 B1 EP 0147009B1
Authority
EP
European Patent Office
Prior art keywords
cathode
light
source
anode
chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
EP84306270A
Other languages
German (de)
English (en)
Other versions
EP0147009A2 (fr
EP0147009A3 (en
Inventor
Krishnamurti Ramamurti
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Publication of EP0147009A2 publication Critical patent/EP0147009A2/fr
Publication of EP0147009A3 publication Critical patent/EP0147009A3/en
Application granted granted Critical
Publication of EP0147009B1 publication Critical patent/EP0147009B1/fr
Expired legal-status Critical Current

Links

Images

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/06—Cathodes
    • H01J35/065—Field emission, photo emission or secondary emission cathodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/24—Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof

Definitions

  • This invention relates to X-ray scanners, which is to be understood as including computed tomography X-ray scanners, but being not limited thereto, since the invention is also applicable to fast-scan projection digital radiography systems, fast stereo video-fluorscope systems, and X-ray lithography.
  • Computed tomography scanners are known (e.g. US-A-4.287.425) which employ conventional X-ray tubes or radioactive nuclei to provide a single source of high intensity X-rays.
  • This single source of X-rays is mechanically revolved about a target, typically through use of a revolving ring mounted in a scanner gantry.
  • Such prior art scanners have an inherent limitation in the speed with which a particular image may be produced due to speed limitations of the mechanical revolution of the single source of X-rays.
  • Computed tomography scanners which employ a continuous annular anode X-ray source which surrounds a target, e.g. WO-A-84/00848; this document falls under Article 54(3) EPC.
  • the anode X-ray source is scanned by an electron beam to selectively produce X-rays.
  • the electron beam is derived from a single fixed electron beam generator located along the axis of a target and is deflected to the anode by deflection coils or the like. Accordingly, a large evacuated chamber is required to enclose the electron beam generator, the annular anode, and the path of travel of the electron beam between the beam generator and the anode.
  • Computed tomography scanners are also known to be planned which propose the use of flash-X-ray sources using high voltage discharges.
  • the utilization of sequentially pulsed, high voltage discharge sources may prove capable of high speed resolution.
  • independent control of X-ray energy intensity may prove difficult to implement.
  • the invention relates generally to the type of X-ray scanner having a source of X-rays which comprise an annular chamber at least partially surrounding a target location, an X-ray penetrable window in the chamber opening towards the target location and extending along a circumferential surface of the chamber, an anode extending arcuately within the chamber, and means for causing generation of X-rays from a selected portion of the anode for discharge through the window towards the target location.
  • An object of the invention is to provide such an X-ray scanner of such construction that a desired size of focal spot can be readily attained and easily and continuously varied.
  • the invention is characterised by having the means for causing X-ray generation comprise: a cathode extending arcuately within the chamber and spaced from the anode, the cathode having a surface capable of emitting electrons on the incidence of light thereon; optical means for directing light from a light source through a light-penetrable window of the chamber on to a selectable portion of the cathode surface; and means for applying a high-voltage potential between the cathode and anode to accelerate the electrons from the selected portion of the cathode towards a corresponding portion of the anode to produce X-rays thereat.
  • Figure 1 illustrates in cross-section an annular vacuum chamber 10 which is shown to encirle completely a target 12.
  • Chamber 10 preferably is constructed of stainless steel with an exterior lead coating to prevent uncontrolled escape of X-rays produced within chamber 10.
  • an X-ray penetrable window 16 which may, for example, be constructed of aluminium or beryllium. Window 16 is located circumferentially along surface 14 of chamber 10 and is positioned to open toward target 12.
  • Chamber 10 also is illustrated in Figures 1 and 2 as including a light penetrable window 18 opening along a circumferential surface 20 of chamber 10.
  • Light penetrable window 18 is constructed of materials having suitable transmission and reflective characteristics. In many instances, quartz is a suitable material. Anti-reflective coatings may be employed.
  • ring-shaped anode 22 which extends annularly around the interior of chamber 10.
  • a ring-shaped cathode 24 is also shown in Figures 1 and 2 to extend annularly around the interior of chamber 10 in spaced-apart relation to anode 22.
  • Cathode 24 has one surface 26 which is located so as to receive light through light penetrable window 18.
  • Light source 30 may comprise a visible light source, an ultraviolet light source, or a laser. Source 30 may be either continuous or pulsating. Source 30 is preferably located on, and directed along, axis 32 of target 12.
  • the mechanism utilized for producing electrons at cathode 24 can be either photo-electric or thermionic.
  • cathode surface 26 must be constructed of material capable of emitting electrons in response to receipt of incident light, such as semiconductor or other nonmetallic solids like bialkali or trialkali cathodes.
  • a metallic or semiconductor cathode surface 26 is required which is photo- electronically sensitive.
  • Light source 30 may be an infrared laser, in which case cathode 24 and surface 26 may comprise suitable metallic elements such as tungsten or tantalum to generate electrons through a thermionic process in response to receipt of incident infrared laser light.
  • the choice between a photo-electric and thermionic electron emission mechanism will determine the cathode material and the nature of the light source. This choice will also determine the transmission and reflective properties of the optical components through which the light beam will pass, and the structure of the cathode.
  • the cathode must be stable against temperature rise under operation. Photoemission cathodes may be subjected to several hundred degrees centigrade whereas thermionic emission cathodes may be subject to several thousand degrees centrigrade.
  • Thermionic cathodes may be backed by a high thermal conductivity material such as copper.
  • the copper will emphasize quick heating when a laser beam strikes and quick cooling so that the temperature and, therefore thermionic emission drops substantially when the laser beam is turned off.
  • the copper accordingly, permits thermionic cathodes to respond to stimulating light with the least delay.
  • Photo-electric cathodes must have sufficient quantum efficiency, i.e. the number of electrons generated per incident light quantum. The degree of efficiency must be balanced to the intensity of available incident light.
  • optical system 40 selectively directs light from source 30 through light penetrable window 18 on to selective portions of cathode surface 26.
  • the optical system 40 includes a lens system 42, a rotatable mirror 44, a first stationary mirror 46, and a second stationary mirror 48.
  • Mirror 44 is preferably a flat mirror located on axis 32 and rotatable about that axis with which the plane of the mirror intersects at an angle of 45°; in other words mirror 44 is tangent to a 45° angle cone having its axis coincident with axis 32.
  • Mirrors 46 and 48 are illustrated in Figure 2 as being annular and centred on the axis 32; the face of each mirror is the surface of a right angle cone, lying between two planes at right angles to the axis.
  • Mirrors 46 and 48 may, however, have an elliptical or other focusing cross-sectional shape to help concentrate light from source 30 on to a particular location of cathode surface 26.
  • Mirrors 44, 46 and 48 are oriented such that tight from source 30 is reflected by mirror 44 on to a particular location of mirror 46 which is a function of the instantaneous angle of rotation of mirror 44. From mirror 46 this light from source 30 is reflected to a corresponding point on the surface of mirror 48, and then passes from mirror 48 through a corresponding portion of penetrable window 18 on to a corresponding location of cathode surface 26. As mirror 44 rotates, the location of cathode surface 26 struck by lightfrom source 30 is correspondingly rotated along cathode surface 26.
  • Lens 42 is illustratively shown in Figure 2 for the purpose of indicating that various lenses and apertures may be employed along the path of light from source 30 in order to focus a resultant spot of light on a desired section of cathode surface 26.
  • Figure 2 further shows a high volta supply 50, a slot collimator 60, and a detector ring 70.
  • High , voltage supply 50 is coupled by suitable cables to anode 22 and cathode 24 to provide a high voltage potential between anode 22 and cathode 24, preferably on the order of 100 to 150 keV.
  • electrons emitted from a selected portion cathode surface 26 by incident light from source 30 are accelerated towards a corresponding selected portion of anode 22 to produce X-rays at that corresponding portion. At least a portion of these X-rays are directed out through X-ray penetrable window 16, through the opening of collimator 60 and through target 12 toward detector ring 70.
  • mirror 44 rotates, the point at which light from source 30 strikes cathode surface 26 varies and causes a corresponding variance in the location along anode 22 at which X-rays are generated.
  • FIG. 3 schematically illustrates the relationship between light source 30, cathode 24, cathode surface 26, anode 22 and the X-rays.
  • cathode surface 26 need not be a section of a right angle cone, but may rather have an ellipsoidal or other form of focusing shape to help direct electrons to a particular corresponding portion of anode 22.
  • Figure 4 schematically illustrates an optical system 80 which employs both a first light source 30 and a second light source 82.
  • a second rotating mirror 84 is employed to select light from source 30 or source 82 for use in the system.
  • the second light source may thus be brought into immediate use should the first source fail.
  • either a visible light source, an ultraviolet light source, or an infrared laser is employed to generate light which is focussed by an optical system on to a particular section of a ring-shaped cathode. Electrons produced at cathode surface 26 are accelerated and produce X-rays at a corresponding section of ring-shaped anode 22. As mirror 44 rotates, the X-ray source position traces out a circular path on anode 22. The X-rays from anode 22 are restricted by a double ring collimator 70 after passing through X-ray penetrable window 16. After passing through a target 12 located about axis 32, the X-ray beam strikes a ring of detectors 70.
  • Cathode 24 and anode 22 are basically oriented parallel to each other in order that the X-ray source position or focus spot will have the same size and shape as the optical spot produced on cathode surface 26 by source 30 and optical system 40.
  • a conventional shallow "heel angle" may be used to minimize heat density.
  • the subject invention accordingly, provides an apparatus by which focal spot size can be varied easily and continuously.
  • X-ray tube construction is simplified since there are no filament power connections to chamber 10. Feed back control of X-ray intensity is simple to implement by controlling the intensity of source 30.
  • the X-ray tube high-voltage power supply 50 is much simpler than the supply in conventional systems since filament supply and grid supply are eliminated.
  • X-ray tube life can be made longer with utilization of a movable cathode to provide fresh areas for electron emission.
  • Methods for moving the X-ray source or focus spot can be implemented optically and from outside the X-ray tube.
  • X-ray beam intensity profiles can be shaped easily by varying the profile of light source 30. For example, when source 30 is a laser, variations can be made between a flat profile and a double gaussian profile.
  • the subjected invention has potential application in ultra-fast CT scanners, fast-scan projection digital radiography systems, fast stereo video- fluoroscope systems, and as a high intensity small focus source for X-ray lithography applications. Accordingly, the use of the term "X-ray scanner” as applied both to the above description and to the preamble of the following claims is intended to have this broad range of potential application.
  • Fast scans in the order 50 to 200 ms (milliseconds) intervals are expected to be easily implemented.
  • Morover simultaneous multiple X-ray sources can easily be provided.
  • X-ray source positions can be easily and accurately related to the scanning mirror position with the scanning mirror position in turn being computer controlled, thus eliminating the need for a special position sensor.
  • Multiple fast computer tomography slices should be able to be obtained without patient motion through the utilization of multiple anodes. Since no electron optical focusing is required, performance (emission current, focal spot size, etc.) is not restricted by space-charge limited electron-optical requirements. Alignment requirements are simple to meet and can be visually checked with a visible low intensity laser. Moreover, "beam parking" facilities of prior art scan electron beam systems are not required in connection with the subject invention.

Landscapes

  • X-Ray Techniques (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Claims (9)

1. Scanner à rayons X qui comprend une source de rayons X, une chambre annulaire (10) qui entoure, au moins partiellement, l'emplacement de la cible, dans la chambre (10), une fenêtre perméable aux rayons X (14), débouchant en direction de l'emplacement de la cible et qui s'étend le long d'une surface circonférentielle de ladite chambre, une anode (22) s'étendant en arc de cercle dans la chambre et des moyens qui provoquent la génération de rayons X par une partie sélectionnée de l'anode (22) qui sont projetés à travers la fenêtre (14) vers la cible, ces moyens comprenant une cathode (24) s'étendant en arc de cercle à l'intérieur de la chambre (10) et qui est espacée de l'anode (22), cette cathode possédant une surface capable d'émettre des électrons lorsqu'elle est frappée par la lumière; des moyens optiques (40, 48) pour diriger la lumière issue d'une source lumineuse (30), à travers une fenêtre transparente à la lumière (18) de la chambre (10) sur une partie sélectionnable de la surface de la cathode; et des moyens (50) pour appliquer une haute tension électrique entre la cathode (24) et l'anode (22) afin ' ccélérer les électrons émis par la partie sélectionnée de la cathode (24) vers la partie correspondante de l'anode afin d'y produire des rayons X.
2. Scanner à rayons X selon la revendication 1, caractérisé en ce que les moyens optiques utilisés comprennent un miroir (44) qui est monté à rotation afin de permettre de sélectionner la partie voulue de la surface de la cathode devant recevoir la lumière.
3. Scanner à rayons X selon la revendication 1 ou 2, caractérisé en ce que la source lumineuse (30) produit de la lumière visible.
4. Scanner à rayons X selon la revendication 3, caractérisé en ce que la source lumineuse (30) est un laser.
5. Scanner à rayons X selon la revendication 4, caractérisé en ce que la source lumineuse (30) est un laser à rayons infrarouges, en ce que la cathode comprend un métal et en ce que les électrons sont dus à une émission thermo-ionique.
6. Scanner à rayons X selon la revendication 4, caractérisé en ce que la cathode (24) comprend une matière semiconductrice et en ce que les électrons sont émis par voie photo-électrique.
7. Scanner à rayons X selon la revendication 1 ou 2, caractérisé en ce que la source lumineuse (30) produit des rayons ultra-violets et en ce que les électrons sont émis par voie photo-électrique.
8. Scanner à rayons X selon la revendication 7, caractérisé en ce que la cathode comprend une matière semiconductrice.
9. Scanner à rayons X selon l'une quelconque des revendications précédentes, caractérisé par la présence d'une seconde source de lumière (82) et par des moyens (84) pour sélectionner l'une ou l'autre des deux sources (30 ou 82).
EP84306270A 1983-12-28 1984-09-13 Dispositif de balayage à rayons X Expired EP0147009B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/566,158 US4606061A (en) 1983-12-28 1983-12-28 Light controlled x-ray scanner
US566158 1983-12-28

Publications (3)

Publication Number Publication Date
EP0147009A2 EP0147009A2 (fr) 1985-07-03
EP0147009A3 EP0147009A3 (en) 1987-05-13
EP0147009B1 true EP0147009B1 (fr) 1989-12-06

Family

ID=24261749

Family Applications (1)

Application Number Title Priority Date Filing Date
EP84306270A Expired EP0147009B1 (fr) 1983-12-28 1984-09-13 Dispositif de balayage à rayons X

Country Status (4)

Country Link
US (1) US4606061A (fr)
EP (1) EP0147009B1 (fr)
JP (1) JPS60157147A (fr)
DE (1) DE3480674D1 (fr)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005043372A1 (de) * 2005-09-12 2007-03-22 Siemens Ag Röntgenstrahler
DE102006024436A1 (de) * 2006-05-24 2007-11-29 Siemens Ag Röntgeneinheit
DE102006024435A1 (de) * 2006-05-24 2007-11-29 Siemens Ag Röntgenstrahler
DE102007041107A1 (de) 2007-08-30 2009-03-05 Siemens Ag Röntgengerät
DE102007046278A1 (de) * 2007-09-27 2009-04-09 Siemens Ag Röntgenröhre mit Transmissionsanode

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3426624A1 (de) * 1984-07-19 1986-01-30 Scanray A/S, Kopenhagen Roentgenroehre
JPS61140040A (ja) * 1984-12-11 1986-06-27 Hamamatsu Photonics Kk Ｘ線ストリ−ク管の時間較正方法
JPS61138150A (ja) * 1984-12-11 1986-06-25 Hamamatsu Photonics Kk 時間分解シヤドウグラフ装置
EP0261199A4 (en) * 1986-03-25 1991-04-10 Varian Associates, Inc. Photoelectric x-ray tube
US4821305A (en) * 1986-03-25 1989-04-11 Varian Associates, Inc. Photoelectric X-ray tube
US5042058A (en) * 1989-03-22 1991-08-20 University Of California Ultrashort time-resolved x-ray source
US5930331A (en) * 1989-03-22 1999-07-27 Rentzepis; Peter M. Compact high-intensity pulsed x-ray source, particularly for lithography
US5442678A (en) * 1990-09-05 1995-08-15 Photoelectron Corporation X-ray source with improved beam steering
US5153900A (en) * 1990-09-05 1992-10-06 Photoelectron Corporation Miniaturized low power x-ray source
US5602894A (en) * 1994-08-04 1997-02-11 Bardash; Michael J. Three-dimensional imaging system using laser generated ultrashort x-ray pulses
US6195411B1 (en) 1999-05-13 2001-02-27 Photoelectron Corporation Miniature x-ray source with flexible probe
US6170674B1 (en) 1999-10-15 2001-01-09 American Greetings Corporation Product display system with support structures for holding product in locked and unlocked conditions
WO2005112070A1 (fr) * 2004-05-13 2005-11-24 Koninklijke Philips Electronics N.V. Tube a rayons x comprenant un emetteur a zone d'emission etendue
US7085352B2 (en) 2004-06-30 2006-08-01 General Electric Company Electron emitter assembly and method for generating electron beams
US7085350B2 (en) * 2004-11-02 2006-08-01 General Electric Company Electron emitter assembly and method for adjusting a power level of electron beams
US7187755B2 (en) * 2004-11-02 2007-03-06 General Electric Company Electron emitter assembly and method for generating electron beams
DE102004061347B3 (de) * 2004-12-20 2006-09-28 Siemens Ag Röntgen-Computertomograph für schnelle Bildaufzeichung
DE102006006840A1 (de) * 2006-02-14 2007-08-23 Siemens Ag Röntgen-Computertomograph mit Lichtstrahl-gesteuerter Röntgenquelle
WO2008157388A1 (fr) * 2007-06-13 2008-12-24 Vitaliy Ziskin Balayage de rayonnement à rayons x
DE102007035177A1 (de) * 2007-07-27 2009-02-05 Siemens Ag Computertomographie-System mit feststehendem Anodenring
DE102007036038A1 (de) 2007-08-01 2009-02-05 Siemens Ag Röntgen-Computertomograph der 5ten Generation
DE102007037848B4 (de) * 2007-08-10 2009-09-10 Siemens Ag Kathode
DE102007041829B4 (de) * 2007-09-03 2009-08-20 Siemens Ag Elektronenquelle
FR2926924B1 (fr) * 2008-01-25 2012-10-12 Thales Sa Source radiogene comprenant au moins une source d'electrons associee a un dispositif photoelectrique de commande
DE102008034584A1 (de) * 2008-07-24 2010-02-04 Siemens Aktiengesellschaft Röntgen-Computertomograph
DE102008045332B4 (de) * 2008-09-01 2016-02-04 Siemens Aktiengesellschaft Röntgen-CT-System mit statischem Anoden/Kathoden-Ringsystem
US9520260B2 (en) * 2012-09-14 2016-12-13 The Board Of Trustees Of The Leland Stanford Junior University Photo emitter X-ray source array (PeXSA)
US10405813B2 (en) 2015-02-04 2019-09-10 Dental Imaging Technologies Corporation Panoramic imaging using multi-spectral X-ray source
EP3933881A1 (fr) 2020-06-30 2022-01-05 VEC Imaging GmbH & Co. KG Source de rayons x à plusieurs réseaux

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1984000848A1 (fr) * 1982-08-19 1984-03-01 Puumalaisen Tutkimuslaitos Oy Procede et dispositif d'utilisation et de focalisation d'un equipement tomographique a rayons x

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2076604A5 (fr) * 1970-01-21 1971-10-15 Commissariat Energie Atomique
US4075489A (en) * 1977-01-21 1978-02-21 Simulation Physics Method and apparatus involving the generation of x-rays
US4130759A (en) * 1977-03-17 1978-12-19 Haimson Research Corporation Method and apparatus incorporating no moving parts, for producing and selectively directing x-rays to different points on an object
US4122346A (en) * 1977-03-23 1978-10-24 High Voltage Engineering Corporation Optical devices for computed transaxial tomography
US4143275A (en) * 1977-09-28 1979-03-06 Battelle Memorial Institute Applying radiation
US4289969A (en) * 1978-07-10 1981-09-15 Butler Greenwich Inc. Radiation imaging apparatus
JPS5622036A (en) * 1979-07-31 1981-03-02 Shimadzu Corp X-ray tube device
US4287425A (en) * 1979-12-31 1981-09-01 Pfizer, Incorporated Construction of a CT scanner using heavy ions or protons
JPS58147A (ja) * 1981-05-22 1983-01-05 Jido Keisoku Gijutsu Kenkiyuukumiai 絶縁分離基板の製造方法
GB2111299B (en) * 1981-11-30 1986-07-09 Thermo Electron Corp High current density photoelectron generators

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1984000848A1 (fr) * 1982-08-19 1984-03-01 Puumalaisen Tutkimuslaitos Oy Procede et dispositif d'utilisation et de focalisation d'un equipement tomographique a rayons x

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005043372A1 (de) * 2005-09-12 2007-03-22 Siemens Ag Röntgenstrahler
DE102005043372B4 (de) * 2005-09-12 2012-04-26 Siemens Ag Röntgenstrahler
DE102006024436A1 (de) * 2006-05-24 2007-11-29 Siemens Ag Röntgeneinheit
DE102006024435A1 (de) * 2006-05-24 2007-11-29 Siemens Ag Röntgenstrahler
DE102006024435B4 (de) * 2006-05-24 2012-02-16 Siemens Ag Röntgenstrahler
DE102006024436B4 (de) * 2006-05-24 2013-01-03 Siemens Aktiengesellschaft Röntgeneinheit
DE102007041107A1 (de) 2007-08-30 2009-03-05 Siemens Ag Röntgengerät
DE102007046278A1 (de) * 2007-09-27 2009-04-09 Siemens Ag Röntgenröhre mit Transmissionsanode

Also Published As

Publication number Publication date
JPH0372174B2 (fr) 1991-11-15
EP0147009A2 (fr) 1985-07-03
US4606061A (en) 1986-08-12
JPS60157147A (ja) 1985-08-17
EP0147009A3 (en) 1987-05-13
DE3480674D1 (de) 1990-01-11

Similar Documents

Publication Publication Date Title
EP0147009B1 (fr) Dispositif de balayage à rayons X
US8520803B2 (en) Multi-segment anode target for an X-ray tube of the rotary anode type with each anode disk segment having its own anode inclination angle with respect to a plane normal to the rotational axis of the rotary anode and X-ray tube comprising a rotary anode with such a multi-segment anode target
US4274005A (en) X-ray apparatus for computed tomography scanner
US4914681A (en) Computer tomography apparatus
US9653247B2 (en) X-ray apparatus and a CT device having the same
US4531226A (en) Multiple electron beam target for use in X-ray scanner
US6760407B2 (en) X-ray source and method having cathode with curved emission surface
US7976218B2 (en) Apparatus for providing shielding in a multispot x-ray source and method of making same
US5125012A (en) Computer tomography apparatus
US20190178821A1 (en) X-Ray Tomography Inspection Systems and Methods
US4827494A (en) X-ray apparatus
US4352196A (en) X-Ray tube for producing a flat wide-angle fan-shaped beam of X-rays
US7643606B2 (en) X-ray computed tomography apparatus with light beam-controlled x-ray source
US20090304158A1 (en) Modular multispot x-ray source and method of making same
CA1120615A (fr) Tomographie par ordinateur a grande vitesse
US20040120462A1 (en) Method and apparatus for generating x-ray beams
CN115112694A (zh) 一种手持式背散射成像装置
JPH04231941A (ja) 回転陰極ｘ線管
WO1997042646A1 (fr) Tubes a rayons x pour systemes d'imagerie
CN220208886U (zh) 一种x射线源、ct扫描仪
US20210148840A1 (en) Scanning-type x-ray source and imaging system therefor
CN117832045A (zh) 一种基于透射靶的电子束动态扫描的微焦点射线源
Mayo et al. Improvements in or relating to X-ray generation
CN117979525A (zh) 一种基于环形靶的动态扫描的电子束高亮度微焦点射线源
CN116759280A (zh) 一种x射线源、ct扫描仪

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

17P Request for examination filed

Effective date: 19841001

AK Designated contracting states

Designated state(s): DE GB NL

PUAL Search report despatched

Free format text: ORIGINAL CODE: 0009013

AK Designated contracting states

Kind code of ref document: A3

Designated state(s): DE GB NL

17Q First examination report despatched

Effective date: 19881221

GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): DE GB NL

REF Corresponds to:

Ref document number: 3480674

Country of ref document: DE

Date of ref document: 19900111

PLBE No opposition filed within time limit

Free format text: ORIGINAL CODE: 0009261

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT

26N No opposition filed
PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: GB

Payment date: 19910805

Year of fee payment: 8

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: NL

Payment date: 19910930

Year of fee payment: 8

Ref country code: DE

Payment date: 19910930

Year of fee payment: 8

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: GB

Effective date: 19920913

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: NL

Effective date: 19930401

GBPC Gb: european patent ceased through non-payment of renewal fee

Effective date: 19920913

NLV4 Nl: lapsed or anulled due to non-payment of the annual fee
PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: DE

Effective date: 19930602