DK183979A - Apparat til proevning af et kredsloebs elektriske egenskaber - Google Patents

Apparat til proevning af et kredsloebs elektriske egenskaber

Info

Publication number
DK183979A
DK183979A DK183979A DK183979A DK183979A DK 183979 A DK183979 A DK 183979A DK 183979 A DK183979 A DK 183979A DK 183979 A DK183979 A DK 183979A DK 183979 A DK183979 A DK 183979A
Authority
DK
Denmark
Prior art keywords
appliance
testing
circuit
electrical properties
properties
Prior art date
Application number
DK183979A
Other languages
Danish (da)
English (en)
Inventor
D W Raymond
T C Garrett
Original Assignee
Zehntel Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zehntel Inc filed Critical Zehntel Inc
Publication of DK183979A publication Critical patent/DK183979A/da

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuits
    • G01R31/31903Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31915In-circuit Testers
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26Functional testing
    • G06F11/273Tester hardware, i.e. output processing circuits
    • G06F11/2733Test interface between tester and unit under test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
DK183979A 1978-05-05 1979-05-04 Apparat til proevning af et kredsloebs elektriske egenskaber DK183979A (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/903,160 US4216539A (en) 1978-05-05 1978-05-05 In-circuit digital tester

Publications (1)

Publication Number Publication Date
DK183979A true DK183979A (da) 1979-12-10

Family

ID=25417033

Family Applications (1)

Application Number Title Priority Date Filing Date
DK183979A DK183979A (da) 1978-05-05 1979-05-04 Apparat til proevning af et kredsloebs elektriske egenskaber

Country Status (12)

Country Link
US (1) US4216539A (ja)
JP (1) JPS54146940A (ja)
AU (1) AU525707B2 (ja)
CA (1) CA1141436A (ja)
DE (1) DE2918053A1 (ja)
DK (1) DK183979A (ja)
FI (1) FI791414A (ja)
FR (1) FR2425078A1 (ja)
GB (1) GB2020439B (ja)
IT (1) IT1116589B (ja)
NO (1) NO791508L (ja)
SE (1) SE437431B (ja)

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US5596715A (en) * 1993-07-06 1997-01-21 Digital Equipment Corporation Method and apparatus for testing high speed busses using gray-code data
US5539753A (en) * 1995-08-10 1996-07-23 International Business Machines Corporation Method and apparatus for output deselecting of data during test
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US6405335B1 (en) 1998-02-25 2002-06-11 Texas Instruments Incorporated Position independent testing of circuits
US7058862B2 (en) 2000-05-26 2006-06-06 Texas Instruments Incorporated Selecting different 1149.1 TAP domains from update-IR state
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DE10042620B4 (de) * 2000-08-30 2005-05-04 Infineon Technologies Ag Anordnung zum Testen eines Speichermoduls
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US8307342B2 (en) * 2008-05-14 2012-11-06 Honeywell International Inc. Method, apparatus, and system for automatic test generation from statecharts
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RU200558U1 (ru) * 2020-01-23 2020-10-29 Василий Львович Зотов Устройство для диагностики электронных схем

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Also Published As

Publication number Publication date
GB2020439A (en) 1979-11-14
SE437431B (sv) 1985-02-25
AU525707B2 (en) 1982-11-25
GB2020439B (en) 1982-12-15
DE2918053C2 (ja) 1988-03-10
NO791508L (no) 1979-11-06
FI791414A (fi) 1979-11-06
FR2425078B1 (ja) 1985-05-17
DE2918053A1 (de) 1979-11-15
JPS54146940A (en) 1979-11-16
CA1141436A (en) 1983-02-15
JPS638435B2 (ja) 1988-02-23
SE7903873L (sv) 1979-11-06
FR2425078A1 (fr) 1979-11-30
US4216539A (en) 1980-08-05
AU4632779A (en) 1979-12-20
IT1116589B (it) 1986-02-10
IT7948942A0 (it) 1979-05-04

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Legal Events

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AHS Application shelved for other reasons than non-payment