DK183979A - Apparat til proevning af et kredsloebs elektriske egenskaber - Google Patents

Apparat til proevning af et kredsloebs elektriske egenskaber

Info

Publication number
DK183979A
DK183979A DK183979A DK183979A DK183979A DK 183979 A DK183979 A DK 183979A DK 183979 A DK183979 A DK 183979A DK 183979 A DK183979 A DK 183979A DK 183979 A DK183979 A DK 183979A
Authority
DK
Denmark
Prior art keywords
appliance
testing
circuit
electrical properties
properties
Prior art date
Application number
DK183979A
Other languages
Danish (da)
English (en)
Inventor
D W Raymond
T C Garrett
Original Assignee
Zehntel Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zehntel Inc filed Critical Zehntel Inc
Publication of DK183979A publication Critical patent/DK183979A/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31915—In-circuit Testers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/2733—Test interface between tester and unit under test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
DK183979A 1978-05-05 1979-05-04 Apparat til proevning af et kredsloebs elektriske egenskaber DK183979A (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/903,160 US4216539A (en) 1978-05-05 1978-05-05 In-circuit digital tester

Publications (1)

Publication Number Publication Date
DK183979A true DK183979A (da) 1979-12-10

Family

ID=25417033

Family Applications (1)

Application Number Title Priority Date Filing Date
DK183979A DK183979A (da) 1978-05-05 1979-05-04 Apparat til proevning af et kredsloebs elektriske egenskaber

Country Status (12)

Country Link
US (1) US4216539A (it)
JP (1) JPS54146940A (it)
AU (1) AU525707B2 (it)
CA (1) CA1141436A (it)
DE (1) DE2918053A1 (it)
DK (1) DK183979A (it)
FI (1) FI791414A (it)
FR (1) FR2425078A1 (it)
GB (1) GB2020439B (it)
IT (1) IT1116589B (it)
NO (1) NO791508L (it)
SE (1) SE437431B (it)

Families Citing this family (73)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4348759A (en) * 1979-12-17 1982-09-07 International Business Machines Corporation Automatic testing of complex semiconductor components with test equipment having less channels than those required by the component under test
GB2070300B (en) * 1980-02-27 1984-01-25 Racal Automation Ltd Electrical testing apparatus and methods
US4339819A (en) * 1980-06-17 1982-07-13 Zehntel, Inc. Programmable sequence generator for in-circuit digital testing
US4500993A (en) * 1980-06-17 1985-02-19 Zehntel, Inc. In-circuit digital tester for testing microprocessor boards
US4317412A (en) * 1980-06-25 1982-03-02 International Business Machines Corporation Control system and method for testing print hammers in a high speed printer
US4392107A (en) * 1980-09-09 1983-07-05 The Bendix Corporation Switching equipment for testing apparatus
US4357703A (en) * 1980-10-09 1982-11-02 Control Data Corporation Test system for LSI circuits resident on LSI chips
US4439858A (en) * 1981-05-28 1984-03-27 Zehntel, Inc. Digital in-circuit tester
US4517661A (en) * 1981-07-16 1985-05-14 International Business Machines Corporation Programmable chip tester having plural pin unit buffers which each store sufficient test data for independent operations by each pin unit
US4554630A (en) * 1981-08-24 1985-11-19 Genrad, Inc. Control apparatus for back-driving computer memory and forcing execution of idle loop program in external memory
US4433414A (en) * 1981-09-30 1984-02-21 Fairchild Camera And Instrument Corporation Digital tester local memory data storage system
US4450560A (en) * 1981-10-09 1984-05-22 Teradyne, Inc. Tester for LSI devices and memory devices
US4451918A (en) * 1981-10-09 1984-05-29 Teradyne, Inc. Test signal reloader
EP0077725B1 (en) * 1981-10-16 1986-04-30 FAIRCHILD CAMERA & INSTRUMENT CORPORATION Current probe signal processing circuit
US4555783A (en) * 1982-04-30 1985-11-26 Genrad, Inc. Method of computerized in-circuit testing of electrical components and the like with automatic spurious signal suppression
FR2531230A1 (fr) * 1982-07-27 1984-02-03 Rank Xerox Sa Ensemble destine au test automatique centralise de circuits imprimes et procede de test de circuits a microprocesseur faisant application de cet ensemble
US4504783A (en) * 1982-09-30 1985-03-12 Storage Technology Partners Test fixture for providing electrical access to each I/O pin of a VLSI chip having a large number of I/O pins
US4550406A (en) * 1983-06-14 1985-10-29 Everett/Charles Test Equipment, Inc. Automatic test program list generation using programmed digital computer
GB2149129B (en) * 1983-11-04 1987-10-21 Membrain Ltd Automatic test equipment
DK557884A (da) * 1983-11-25 1985-05-26 Mars Inc Automatisk testudstyr
US4641254A (en) * 1984-06-14 1987-02-03 The United States Of America As Represented By The Secretary Of The Navy Test set for a navigational satellite receiver
US4633417A (en) * 1984-06-20 1986-12-30 Step Engineering Emulator for non-fixed instruction set VLSI devices
FR2573887B1 (fr) * 1984-11-26 1992-09-04 Nec Corp Procede de generation de configurations de test pour dispositifs a reseaux logiques
US4752886A (en) * 1985-07-22 1988-06-21 General Electric Company Method for on-line testing of load control circuitry and the associated load
US4709366A (en) * 1985-07-29 1987-11-24 John Fluke Mfg. Co., Inc. Computer assisted fault isolation in circuit board testing
JPS6244674A (ja) * 1985-08-23 1987-02-26 Toshiba Corp 評価容易化回路
US4644265A (en) * 1985-09-03 1987-02-17 International Business Machines Corporation Noise reduction during testing of integrated circuit chips
US4931723A (en) * 1985-12-18 1990-06-05 Schlumberger Technologies, Inc. Automatic test system having a "true tester-per-pin" architecture
US4672307A (en) * 1985-12-20 1987-06-09 University Of Southern California Simplified delay testing for LSI circuit faults
US4760330A (en) * 1986-06-06 1988-07-26 Northern Telecom Limited Test system with shared test instruments
US5025210A (en) * 1986-07-18 1991-06-18 Kabushiki Kaisha Toshiba Evaluation facilitating circuit device
US4712058A (en) * 1986-07-22 1987-12-08 Tektronix, Inc. Active load network
US4856001A (en) * 1987-05-29 1989-08-08 Zehntel, Inc. Digital in-circuit tester having channel-memory earse-preventer
US6539497B2 (en) * 1987-06-02 2003-03-25 Texas Instruments Incorporated IC with selectively applied functional and test clocks
US4864570A (en) * 1987-06-29 1989-09-05 International Business Machines Corporation Processing pulse control circuit for use in device performing signature analysis of digital circuits
US4829521A (en) * 1987-09-11 1989-05-09 The United States Of America As Represented By The Secretary Of The Navy Test circuit for detecting short duration pulses
US5228139A (en) * 1988-04-19 1993-07-13 Hitachi Ltd. Semiconductor integrated circuit device with test mode for testing CPU using external signal
US4870354A (en) * 1988-08-11 1989-09-26 Zehntel, Inc. Apparatus for contacting a printed circuit board with an array of test probes
US6304987B1 (en) 1995-06-07 2001-10-16 Texas Instruments Incorporated Integrated test circuit
US4998250A (en) * 1988-09-08 1991-03-05 Data I/O Corporation Method and apparatus for determining an internal state of an electronic component
US4949341A (en) * 1988-10-28 1990-08-14 Motorola Inc. Built-in self test method for application specific integrated circuit libraries
US4980889A (en) * 1988-12-29 1990-12-25 Deguise Wayne J Multi-mode testing systems
FR2648916B1 (fr) * 1989-06-27 1991-09-06 Cit Alcatel Agencement de test de cartes a circuit imprime et son application au test de cartes a circuit imprime formant un equipement de multiplexage-demultiplexage de signaux numeriques
JP3005250B2 (ja) 1989-06-30 2000-01-31 テキサス インスツルメンツ インコーポレイテツド バスモニター集積回路
US5045782A (en) * 1990-01-23 1991-09-03 Hewlett-Packard Company Negative feedback high current driver for in-circuit tester
US5289116A (en) * 1990-05-31 1994-02-22 Hewlett Packard Company Apparatus and method for testing electronic devices
JPH04297880A (ja) * 1990-08-06 1992-10-21 Texas Instr Inc <Ti> 事象識別テストアーキテクチャ
US5293123A (en) * 1990-10-19 1994-03-08 Tandem Computers Incorporated Pseudo-Random scan test apparatus
US5321701A (en) * 1990-12-06 1994-06-14 Teradyne, Inc. Method and apparatus for a minimal memory in-circuit digital tester
GB2251081B (en) * 1990-12-18 1995-08-23 Motorola Ltd Automatic analysis apparatus
US5515383A (en) * 1991-05-28 1996-05-07 The Boeing Company Built-in self-test system and method for self test of an integrated circuit
US5550844A (en) * 1992-11-19 1996-08-27 Proteus Corporation Printed circuit board fault injection circuit
US5951703A (en) * 1993-06-28 1999-09-14 Tandem Computers Incorporated System and method for performing improved pseudo-random testing of systems having multi driver buses
US5442644A (en) * 1993-07-01 1995-08-15 Unisys Corporation System for sensing the state of interconnection points
US5596715A (en) * 1993-07-06 1997-01-21 Digital Equipment Corporation Method and apparatus for testing high speed busses using gray-code data
US5539753A (en) * 1995-08-10 1996-07-23 International Business Machines Corporation Method and apparatus for output deselecting of data during test
GB2307051B (en) * 1995-11-06 1999-11-03 Marconi Instruments Ltd An equipment for testing electronic circuitry
US6408413B1 (en) 1998-02-18 2002-06-18 Texas Instruments Incorporated Hierarchical access of test access ports in embedded core integrated circuits
US6405335B1 (en) 1998-02-25 2002-06-11 Texas Instruments Incorporated Position independent testing of circuits
US7058862B2 (en) 2000-05-26 2006-06-06 Texas Instruments Incorporated Selecting different 1149.1 TAP domains from update-IR state
US6311311B1 (en) 1999-08-19 2001-10-30 International Business Machines Corporation Multiple input shift register (MISR) signatures used on architected registers to detect interim functional errors on instruction stream test
US6728915B2 (en) 2000-01-10 2004-04-27 Texas Instruments Incorporated IC with shared scan cells selectively connected in scan path
US6769080B2 (en) 2000-03-09 2004-07-27 Texas Instruments Incorporated Scan circuit low power adapter with counter
US6449576B1 (en) * 2000-03-29 2002-09-10 International Business Machines Corporation Network processor probing and port mirroring
DE10042620B4 (de) * 2000-08-30 2005-05-04 Infineon Technologies Ag Anordnung zum Testen eines Speichermoduls
JP2002131392A (ja) * 2000-10-24 2002-05-09 Ando Electric Co Ltd アナログ・ディジタル特性試験回路
DE10148157B4 (de) * 2001-09-28 2006-05-18 Infineon Technologies Ag Programmgesteuerte Einheit
CN100486068C (zh) * 2001-11-13 2009-05-06 普尔文公司 利用插件来扩展测验驱动器功能的基于计算机的测验方法和系统
US20040153911A1 (en) * 2002-12-24 2004-08-05 Alon Regev Testing of a CAM
US8719837B2 (en) 2004-05-19 2014-05-06 Synopsys, Inc. Microprocessor architecture having extendible logic
US8307342B2 (en) * 2008-05-14 2012-11-06 Honeywell International Inc. Method, apparatus, and system for automatic test generation from statecharts
US20100192128A1 (en) * 2009-01-27 2010-07-29 Honeywell International Inc. System and methods of using test points and signal overrides in requirements-based test generation
RU200558U1 (ru) * 2020-01-23 2020-10-29 Василий Львович Зотов Устройство для диагностики электронных схем

Family Cites Families (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3076864A (en) * 1960-07-13 1963-02-05 Ohio Brass Co Suspension apparatus for bundle conductors
US3492571A (en) * 1965-12-02 1970-01-27 Western Electric Co Apparatus for testing an electrical circuit for opens,shorts and cross connections with its terminal groups being sequentially connected to the apparatus
US3423677A (en) * 1965-12-07 1969-01-21 Texas Instruments Inc Test system for automatically making static and dynamic tests on an electronic device
US3492572A (en) * 1966-10-10 1970-01-27 Ibm Programmable electronic circuit testing apparatus having plural multifunction test condition generating circuits
US3549996A (en) * 1967-04-04 1970-12-22 Bendix Corp Universal tester for dynamic and static tests on the operating efficiency of electrical apparatus
US3546582A (en) * 1968-01-15 1970-12-08 Ibm Computer controlled test system for performing functional tests on monolithic devices
US3541441A (en) * 1969-02-17 1970-11-17 Ibm Test system for evaluating amplitude and response characteristics of logic circuits
US3621387A (en) * 1969-08-21 1971-11-16 Gen Instrument Corp Computer-controlled tester for integrated circuit devices
US3631229A (en) * 1970-09-30 1971-12-28 Ibm Monolithic memory array tester
US3673397A (en) * 1970-10-02 1972-06-27 Singer Co Circuit tester
US3622876A (en) * 1970-12-14 1971-11-23 Datatron Inc Digital module tester system
DE2113302A1 (de) * 1971-03-19 1972-10-19 Knoll Alois Dr Ing Verfahren zur Pruefung von Schaltungsanordnungen und Einrichtung zur Ausuebung des Verfahrens mit einer programmgesteuerten Datenverarbeitungsanlage
DE2121330C3 (de) * 1971-04-30 1974-10-17 Ludwig 6369 Dortelweil Illian Verfahren und Schaltungsanordnung zum Prüfen digital arbeitender elektronischer Geräte und ihrer Bauteile
US3764995A (en) * 1971-12-21 1973-10-09 Prd Electronics Inc Programmable test systems
US3763430A (en) * 1972-01-14 1973-10-02 Burroughs Corp Circuit testing method and apparatus
US3832535A (en) * 1972-10-25 1974-08-27 Instrumentation Engineering Digital word generating and receiving apparatus
US3812337A (en) * 1973-04-06 1974-05-21 Gte Automatic Electric Lab Inc Sequential control circuit having improved fault detection and diagnostic capabilities
US3889109A (en) * 1973-10-01 1975-06-10 Honeywell Inf Systems Data communications subchannel having self-testing apparatus
US3924181A (en) * 1973-10-16 1975-12-02 Hughes Aircraft Co Test circuitry employing a cyclic code generator
US4000460A (en) * 1974-07-01 1976-12-28 Xerox Corporation Digital circuit module test system
US3924109A (en) * 1974-07-22 1975-12-02 Technology Marketing Inc Automatic circuit card testing system
US4097797A (en) * 1974-10-17 1978-06-27 Burroughs Corporation Apparatus for testing electrical circuit units such as printed circuit cards
US3931506A (en) * 1974-12-30 1976-01-06 Zehntel, Inc. Programmable tester
US3943439A (en) * 1974-12-30 1976-03-09 Zehntel, Inc. Capacitor test apparatus and method
US4012625A (en) * 1975-09-05 1977-03-15 Honeywell Information Systems, Inc. Non-logic printed wiring board test system
US4001818A (en) * 1975-10-22 1977-01-04 Storage Technology Corporation Digital circuit failure detector
US4102491A (en) * 1975-12-23 1978-07-25 Instrumentation Engineering, Inc. Variable function digital word generating, receiving and monitoring device
US4039814A (en) * 1976-06-18 1977-08-02 Saint Hilaire Gilles Real time programmable digital register analyser
US4044244A (en) * 1976-08-06 1977-08-23 International Business Machines Corporation Automatic tester for complex semiconductor components including combinations of logic, memory and analog devices and processes of testing thereof
US4070565A (en) * 1976-08-18 1978-01-24 Zehntel, Inc. Programmable tester method and apparatus

Also Published As

Publication number Publication date
SE437431B (sv) 1985-02-25
SE7903873L (sv) 1979-11-06
CA1141436A (en) 1983-02-15
US4216539A (en) 1980-08-05
GB2020439A (en) 1979-11-14
DE2918053C2 (it) 1988-03-10
AU4632779A (en) 1979-12-20
JPS54146940A (en) 1979-11-16
IT7948942A0 (it) 1979-05-04
FR2425078B1 (it) 1985-05-17
NO791508L (no) 1979-11-06
FI791414A (fi) 1979-11-06
IT1116589B (it) 1986-02-10
AU525707B2 (en) 1982-11-25
JPS638435B2 (it) 1988-02-23
DE2918053A1 (de) 1979-11-15
GB2020439B (en) 1982-12-15
FR2425078A1 (fr) 1979-11-30

Similar Documents

Publication Publication Date Title
DK183979A (da) Apparat til proevning af et kredsloebs elektriske egenskaber
DK147726C (da) Apparat til afproevning af hoerelsen
DK144848C (da) Apparat til findeling af naeringsmidler
SE7902707L (sv) Anordning for uppstellning av en elektrisk apparat
NO781601L (no) Elektrisk apparat inneholdende dielektrisk vaeske
DK158426C (da) Elektrisk apparat til forbindelse med et terminalorgan og fremgangsmaade til fremstilling af apparat
NO156466C (no) Elektrisk apparat
DK483478A (da) Apparat til indfoering af ledninger i elektriske terminaler
DK149740C (da) Apparat til skylning af draenraer
DK34777A (da) Spendingskilde til patrykkelse af hojspendingsimpulser over et tendror i et apparat til afprovning af tendror
DK37281A (da) Fremgangsmaade til fremstilling af elektriske kunststofkombinationsiolatorer
SE423472B (sv) Apparat for eliminering av tidbasfel
DK179480A (da) Elektrisk komponent
DK514979A (da) Apparat til transport af faste legemer
DK507875A (da) Apparat til rensning af kabler
IT1093718B (it) Circuito elettrico
DK239879A (da) Gastaet stoebt hus til et elektrisk apparat
DK299678A (da) Indretning til fastgoerelse af elektriske kontaktelementer
DK27079A (da) Fremgangsmaade og apparat til fremstilling af forbindelsesisolatorer
SE7801747L (sv) Apparat for avslutning av elektriska ledare
DK137700C (da) Anordning til befaestigelse af et elektrisk apparat
DK148662C (da) Apparat til fremstilling af fiberplader
GB2029032B (en) Circuit testing apparatus
DK84880A (da) Apparat til maling af striber
DK345480A (da) Apparat til partering af slagtekoed

Legal Events

Date Code Title Description
AHS Application shelved for other reasons than non-payment