DK0876619T3 - Maskine til elektrisk test af trykte kredsløb med justerbar positionering af testnålene - Google Patents

Maskine til elektrisk test af trykte kredsløb med justerbar positionering af testnålene

Info

Publication number
DK0876619T3
DK0876619T3 DK96926571T DK96926571T DK0876619T3 DK 0876619 T3 DK0876619 T3 DK 0876619T3 DK 96926571 T DK96926571 T DK 96926571T DK 96926571 T DK96926571 T DK 96926571T DK 0876619 T3 DK0876619 T3 DK 0876619T3
Authority
DK
Denmark
Prior art keywords
machine
pct
printed circuits
electrical testing
adjustable positioning
Prior art date
Application number
DK96926571T
Other languages
Danish (da)
English (en)
Inventor
Jozef Vodopivec
Cesare Fumo
Original Assignee
New System Srl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by New System Srl filed Critical New System Srl
Application granted granted Critical
Publication of DK0876619T3 publication Critical patent/DK0876619T3/da

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Perforating, Stamping-Out Or Severing By Means Other Than Cutting (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
DK96926571T 1995-12-22 1996-08-09 Maskine til elektrisk test af trykte kredsløb med justerbar positionering af testnålene DK0876619T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IT95UD000251A IT1282829B1 (it) 1995-12-22 1995-12-22 Macchina di test elettrico per circuiti stampati con posizione registrabile degli aghi di sonda
PCT/IT1996/000160 WO1997023784A1 (en) 1995-12-22 1996-08-09 Machine for the electric test of printed circuits with adjustable position of the sound needles

Publications (1)

Publication Number Publication Date
DK0876619T3 true DK0876619T3 (da) 2001-10-22

Family

ID=11421986

Family Applications (1)

Application Number Title Priority Date Filing Date
DK96926571T DK0876619T3 (da) 1995-12-22 1996-08-09 Maskine til elektrisk test af trykte kredsløb med justerbar positionering af testnålene

Country Status (27)

Country Link
US (1) US6124722A (cs)
EP (1) EP0876619B1 (cs)
JP (1) JP2000502791A (cs)
KR (1) KR100526744B1 (cs)
CN (1) CN1175270C (cs)
AT (1) ATE202850T1 (cs)
AU (1) AU718507B2 (cs)
BR (1) BR9612251A (cs)
CA (1) CA2241326C (cs)
CZ (1) CZ298035B6 (cs)
DE (1) DE69613717T2 (cs)
DK (1) DK0876619T3 (cs)
ES (1) ES2160830T3 (cs)
GR (1) GR3036790T3 (cs)
HU (1) HUP9901931A3 (cs)
IT (1) IT1282829B1 (cs)
MX (1) MX9805100A (cs)
NO (1) NO315877B1 (cs)
NZ (1) NZ315085A (cs)
PL (1) PL327496A1 (cs)
PT (1) PT876619E (cs)
RO (1) RO119659B1 (cs)
RU (1) RU2212775C2 (cs)
SI (1) SI9620133B (cs)
TR (1) TR199801178T2 (cs)
UA (1) UA28121C2 (cs)
WO (1) WO1997023784A1 (cs)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1282827B1 (it) 1995-09-22 1998-03-31 New System Srl Macchina per il controllo contrapposto dei circuiti stampati
AU2001272733A1 (en) * 2000-07-19 2002-02-05 Orbotech Ltd. Apparatus and method for electrical testing of electrical circuits
RU2256306C1 (ru) * 2004-02-10 2005-07-10 ОАО Завод "Красное Знамя" Двухстороннее контактное устройство для контроля многослойных печатных плат
WO2005093441A1 (fr) * 2004-03-26 2005-10-06 Quanta Display Inc. Dispositif et procede de reparation et de mise a l'essai d'un defaut de ligne
CN100357752C (zh) * 2004-03-26 2007-12-26 广辉电子股份有限公司 线路缺陷检测维修设备及方法
CN100388001C (zh) * 2004-05-24 2008-05-14 名威科技实业有限公司 具有多个侦测单元的检测芯片
DE102009004555A1 (de) 2009-01-14 2010-09-30 Atg Luther & Maelzer Gmbh Verfahren zum Prüfen von Leiterplatten
RU2426283C1 (ru) * 2009-12-24 2011-08-10 Открытое акционерное общество "Научно-производственный комплекс "ЭЛАРА" имени Г.А. Ильенко (ОАО "ЭЛАРА") Устройство контактное
CN108761233B (zh) * 2018-05-23 2024-07-26 沈小晴 针对ied设备柔性化测试的模块可切换针盘设备及测试方法
CN110824331A (zh) * 2018-08-10 2020-02-21 苏州天目光学科技有限公司 一种背光板fpc自动点灯机构
CN113039443A (zh) * 2018-09-11 2021-06-25 迈吉克汽车运动公司 用于在电气和/或电子电路上进行测试的工具和组件
WO2021121670A1 (en) * 2019-12-18 2021-06-24 Advantest Corporation Automated test equipment for testing one or more devices-under-test and method for operating an automated test equipment
DE112020000048T5 (de) * 2019-12-18 2022-06-02 Advantest Corporation Automatisierte prüfeinrichtung zum prüfen eines oder mehrerer prüfobjekte undverfahren zum betreiben einer automatisierten prüfeinrichtung
TWI797552B (zh) * 2020-02-06 2023-04-01 日商愛德萬測試股份有限公司 用於測試一或多個受測裝置之自動測試設備及用於操作自動測試設備的方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU563614A1 (ru) * 1974-04-17 1977-06-30 Московский Ордена Ленина Энергетический Институт Вихретоковый преобразователь
DE2628428C3 (de) * 1976-06-24 1979-02-15 Siemens Ag, 1000 Berlin Und 8000 Muenchen Adapter zum Verbinden von Anschluß- und/oder Prüfpunkten einer Baugruppe mit einer Mefischaltung
US4841241A (en) * 1986-08-07 1989-06-20 Siemens Aktiengesellschaft Testing device for both-sided contacting of component-equipped printed circuit boards
EP0256368B1 (de) * 1986-08-07 1992-09-30 Siemens Aktiengesellschaft Prüfeinrichtung für beidseitige, zweistufige Kontaktierung bestückter Leiterplatten
SU1531234A1 (ru) * 1987-07-10 1989-12-23 Научно-производственное объединение "Ротор" Устройство дл контрол печатных блоков
US4975637A (en) * 1989-12-29 1990-12-04 International Business Machines Corporation Method and apparatus for integrated circuit device testing
RU2019923C1 (ru) * 1991-05-15 1994-09-15 Научно-исследовательский центр электронной вычислительной техники Устройство для контроля печатных плат
US5436567A (en) * 1993-02-08 1995-07-25 Automated Test Engineering, Inc. Double-sided automatic test equipment probe clamshell with vacuum-actuated bottom probe contacts and mechanical-actuated top probe contacts

Also Published As

Publication number Publication date
PT876619E (pt) 2001-12-28
ITUD950251A0 (cs) 1995-12-22
KR100526744B1 (ko) 2005-12-21
IT1282829B1 (it) 1998-03-31
UA28121C2 (uk) 2000-10-16
PL327496A1 (en) 1998-12-21
TR199801178T2 (xx) 1998-12-21
ATE202850T1 (de) 2001-07-15
RU2212775C2 (ru) 2003-09-20
CZ298035B6 (cs) 2007-05-30
DE69613717T2 (de) 2002-05-16
BR9612251A (pt) 1999-07-13
MX9805100A (es) 1998-10-31
EP0876619A1 (en) 1998-11-11
SI9620133B (sl) 2005-10-31
SI9620133A (sl) 1998-12-31
NO315877B1 (no) 2003-11-03
CA2241326C (en) 2001-11-27
NO982707L (no) 1998-07-13
ES2160830T3 (es) 2001-11-16
WO1997023784A1 (en) 1997-07-03
RO119659B1 (ro) 2005-01-28
CZ187498A3 (cs) 1998-11-11
EP0876619B1 (en) 2001-07-04
NZ315085A (en) 2007-12-21
CN1205774A (zh) 1999-01-20
CN1175270C (zh) 2004-11-10
KR19990076663A (ko) 1999-10-15
DE69613717D1 (de) 2001-08-09
AU718507B2 (en) 2000-04-13
US6124722A (en) 2000-09-26
CA2241326A1 (en) 1997-07-03
GR3036790T3 (en) 2002-01-31
ITUD950251A1 (it) 1997-06-22
NO982707D0 (no) 1998-06-12
JP2000502791A (ja) 2000-03-07
HUP9901931A2 (hu) 1999-10-28
AU6668496A (en) 1997-07-17
HUP9901931A3 (en) 1999-11-29

Similar Documents

Publication Publication Date Title
DK0876619T3 (da) Maskine til elektrisk test af trykte kredsløb med justerbar positionering af testnålene
SE8106000L (sv) Provningsanordning
ITMI932323A0 (it) Macchina per eseguire il test elettrico simultaneo, sulle due facce diuna piastra con circuiti stampati
DK157958C (da) Broforbinder med broforbindelsesorgan til dannelse af elektrisk forbindelse mellem to kontaktstifter, navnlig paa kredsloebskort
ATE266265T1 (de) Elektrisches oder elektronisches gerät
DE3479341D1 (en) Adapter for a printed-circuit board testing device
EP1186898A3 (de) Verfahren und Vorrichtung zum Prüfen von Leiterplatten
DE69118451D1 (de) Prüfungsanordnung für elektrische Schaltungen auf Printplatten
FR2660072B1 (fr) Appareil de test de circuit imprime.
DK0852014T3 (da) Fremgangsmåde til at kontrollere printkredsløb
EP0787992A3 (en) Housing for an electricity meter
SE9900429D0 (sv) Arrangement for an electric apparatus
SE9402155L (sv) Adapter för användning vid en apparat för testning av kretskort
ATE114055T1 (de) Adaptiervorrichtung zur prüfung von filmmontierten integrierten bausteinen.
ES292286U (es) Placa para montaje de circuitos electronicos en juegos didacticos
ATE306673T1 (de) Kopplungs- und zentrierungssystem, insbesondere für die ausrichtung von gedruckten schaltungen in einem testverfahren