DK0675346T3 - Temperaturdetekteringskredsløb til frembringelse af et udgangssignal i overensstemmelse med temperaturen - Google Patents

Temperaturdetekteringskredsløb til frembringelse af et udgangssignal i overensstemmelse med temperaturen

Info

Publication number
DK0675346T3
DK0675346T3 DK95302041T DK95302041T DK0675346T3 DK 0675346 T3 DK0675346 T3 DK 0675346T3 DK 95302041 T DK95302041 T DK 95302041T DK 95302041 T DK95302041 T DK 95302041T DK 0675346 T3 DK0675346 T3 DK 0675346T3
Authority
DK
Denmark
Prior art keywords
temperature
generating
accordance
output signal
detection circuits
Prior art date
Application number
DK95302041T
Other languages
Danish (da)
English (en)
Inventor
Shinji Kurihara
Original Assignee
Sanyo Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co filed Critical Sanyo Electric Co
Application granted granted Critical
Publication of DK0675346T3 publication Critical patent/DK0675346T3/da

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/12—Heads, e.g. forming of the optical beam spot or modulation of the optical beam
    • G11B7/125—Optical beam sources therefor, e.g. laser control circuitry specially adapted for optical storage devices; Modulators, e.g. means for controlling the size or intensity of optical spots or optical traces
    • G11B7/126—Circuits, methods or arrangements for laser control or stabilisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
    • G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
    • G01K7/24—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit
    • G01K7/25—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit for modifying the output characteristic, e.g. linearising
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B11/00—Recording on or reproducing from the same record carrier wherein for these two operations the methods are covered by different main groups of groups G11B3/00 - G11B7/00 or by different subgroups of group G11B9/00; Record carriers therefor
    • G11B11/10—Recording on or reproducing from the same record carrier wherein for these two operations the methods are covered by different main groups of groups G11B3/00 - G11B7/00 or by different subgroups of group G11B9/00; Record carriers therefor using recording by magnetic means or other means for magnetisation or demagnetisation of a record carrier, e.g. light induced spin magnetisation; Demagnetisation by thermal or stress means in the presence or not of an orienting magnetic field
    • G11B11/105—Recording on or reproducing from the same record carrier wherein for these two operations the methods are covered by different main groups of groups G11B3/00 - G11B7/00 or by different subgroups of group G11B9/00; Record carriers therefor using recording by magnetic means or other means for magnetisation or demagnetisation of a record carrier, e.g. light induced spin magnetisation; Demagnetisation by thermal or stress means in the presence or not of an orienting magnetic field using a beam of light or a magnetic field for recording by change of magnetisation and a beam of light for reproducing, i.e. magneto-optical, e.g. light-induced thermomagnetic recording, spin magnetisation recording, Kerr or Faraday effect reproducing
    • G11B11/10595—Control of operating function

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Optical Head (AREA)
  • Amplifiers (AREA)
DK95302041T 1994-03-31 1995-03-27 Temperaturdetekteringskredsløb til frembringelse af et udgangssignal i overensstemmelse med temperaturen DK0675346T3 (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6063386A JP2951198B2 (ja) 1994-03-31 1994-03-31 温度検出回路

Publications (1)

Publication Number Publication Date
DK0675346T3 true DK0675346T3 (da) 2001-09-24

Family

ID=13227817

Family Applications (1)

Application Number Title Priority Date Filing Date
DK95302041T DK0675346T3 (da) 1994-03-31 1995-03-27 Temperaturdetekteringskredsløb til frembringelse af et udgangssignal i overensstemmelse med temperaturen

Country Status (8)

Country Link
US (1) US5660474A (ko)
EP (1) EP0675346B1 (ko)
JP (1) JP2951198B2 (ko)
KR (1) KR100190152B1 (ko)
CN (1) CN1088187C (ko)
DE (1) DE69521356T2 (ko)
DK (1) DK0675346T3 (ko)
TW (1) TW353165B (ko)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2834343B1 (fr) * 2001-12-28 2004-04-09 St Microelectronics Sa Detecteur thermique
US6736540B1 (en) 2003-02-26 2004-05-18 National Semiconductor Corporation Method for synchronized delta-VBE measurement for calculating die temperature
US7828479B1 (en) * 2003-04-08 2010-11-09 National Semiconductor Corporation Three-terminal dual-diode system for fully differential remote temperature sensors
US6957910B1 (en) 2004-01-05 2005-10-25 National Semiconductor Corporation Synchronized delta-VBE measurement system
JP5226248B2 (ja) * 2006-08-02 2013-07-03 ルネサスエレクトロニクス株式会社 温度検出回路及び半導体装置
JP4863818B2 (ja) * 2006-08-29 2012-01-25 セイコーインスツル株式会社 温度センサ回路
CN101586987B (zh) * 2008-05-23 2011-04-20 震一科技股份有限公司 适用于低电压运作的温度感应电路
CN101620012B (zh) * 2008-07-02 2011-04-06 南亚科技股份有限公司 温度检测器及其使用方法
CN101655395B (zh) * 2008-08-19 2011-08-03 纮康科技股份有限公司 温度测量系统及其测量方法
CN102175338B (zh) * 2011-01-21 2012-07-25 西安电子科技大学 用于无源超高频射频识别的微功耗温度检测电路
JP6542103B2 (ja) * 2015-11-09 2019-07-10 エイブリック株式会社 過熱検出回路、過熱保護回路、及び半導体装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3092998A (en) * 1960-08-08 1963-06-11 Rca Corp Thermometers
US4047435A (en) * 1976-05-20 1977-09-13 Rockwell International Corporation Temperature measuring apparatus
US4123698A (en) * 1976-07-06 1978-10-31 Analog Devices, Incorporated Integrated circuit two terminal temperature transducer
US4184126A (en) * 1978-09-27 1980-01-15 Eaton Corporation Temperature sensitive astable multivibrator
JPS58127134A (ja) * 1982-01-26 1983-07-28 Canon Inc 温度検出回路
JPS59140647A (ja) * 1983-01-31 1984-08-13 Canon Inc 光学的情報記録再生装置
JPS61118630A (ja) * 1984-11-15 1986-06-05 Mitsubishi Electric Corp Ｉｃチツプ温度検出装置
US4931665A (en) * 1988-04-13 1990-06-05 National Semiconductor Corporation Master slave voltage reference circuit
US4914317A (en) * 1988-12-12 1990-04-03 Texas Instruments Incorporated Adjustable current limiting scheme for driver circuits
JP2749925B2 (ja) * 1990-01-09 1998-05-13 株式会社リコー Ｉｃ温度センサ
WO1992014244A1 (en) * 1991-02-05 1992-08-20 Sony Corporation Method for reproducing signal in optically recording medium
US5213416A (en) * 1991-12-13 1993-05-25 Unisys Corporation On chip noise tolerant temperature sensing circuit
US5488296A (en) * 1995-01-25 1996-01-30 Honeywell Inc. Temperature compensated magnetically sensitive circuit

Also Published As

Publication number Publication date
TW353165B (en) 1999-02-21
JP2951198B2 (ja) 1999-09-20
JPH07270250A (ja) 1995-10-20
CN1088187C (zh) 2002-07-24
US5660474A (en) 1997-08-26
EP0675346B1 (en) 2001-06-20
DE69521356D1 (de) 2001-07-26
KR950034156A (ko) 1995-12-26
CN1112675A (zh) 1995-11-29
DE69521356T2 (de) 2001-10-11
KR100190152B1 (ko) 1999-06-01
EP0675346A1 (en) 1995-10-04

Similar Documents

Publication Publication Date Title
DE69505871D1 (de) Taktfehlererkennungsschaltung
KR960016111A (ko) 시각 신호 발생용 회로 및 방법
DK7695A (da) Fremgangsmåde til måling af fasestrømme i en vekselretter
DE69618123D1 (de) Ausgangsschaltung
DE69832954D1 (de) Temperaturmessschaltung
DK0675346T3 (da) Temperaturdetekteringskredsløb til frembringelse af et udgangssignal i overensstemmelse med temperaturen
FR2724069B1 (fr) Detecteur de temperature sur circuit integre
DE69600127T2 (de) Für Technologie und Temperatur kompensierte Spannungsdetektionsschaltung
DE69623683T2 (de) Delta-T-Messschaltung
DE69410377T2 (de) Kühlkreis mit unabhängigem Leitungsystem
DK0821841T3 (da) Indretning til tilslutning af forsyningsledninger til et elektronisk apparat samt skab med en sådan indretning
DE69325472T2 (de) Ausgangsschaltung mit Offset-Erfassung
DE69726365D1 (de) Ausgangsschaltung
DE59605550D1 (de) Integrierte Schaltung mit thermischer Abregelung
DK0726549T3 (da) Indretning til detektion af en med et elektronisk sikringselement forsynet artikel
FR2695283B1 (fr) Circuit et procédé de détection de tube chaud.
IT1303111B1 (it) Circuito ritardatore per ritardare un segnale in uscita.
DE69618122T2 (de) Übergangsdetektionsschaltung
KR970015763U (ko) 발열회로부품용 히트싱크
SE9403242D0 (sv) Elektroniskt stopp-ur med speciella funktioner
KR950021180U (ko) 히터의 단선 검출회로
KR960025784U (ko) 입력 페일신호 출력회로
KR960019302U (ko) 입력 페일 신호 발생 회로
KR960025681U (ko) 검출전압 입력회로
KR970060023U (ko) 클록 유실 검출회로