DE926267C - Elektronenmikroskop - Google Patents

Elektronenmikroskop

Info

Publication number
DE926267C
DE926267C DEP24590D DEP0024590D DE926267C DE 926267 C DE926267 C DE 926267C DE P24590 D DEP24590 D DE P24590D DE P0024590 D DEP0024590 D DE P0024590D DE 926267 C DE926267 C DE 926267C
Authority
DE
Germany
Prior art keywords
plane
image
electron
rays
electron microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DEP24590D
Other languages
German (de)
English (en)
Inventor
Jan Bart Le Poole
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Application granted granted Critical
Publication of DE926267C publication Critical patent/DE926267C/de
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/21—Means for adjusting the focus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
    • H01J37/1478—Beam tilting means, i.e. for stereoscopy or for beam channelling

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
DEP24590D 1947-01-25 1948-12-14 Elektronenmikroskop Expired DE926267C (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL264119X 1947-01-25

Publications (1)

Publication Number Publication Date
DE926267C true DE926267C (de) 1955-04-14

Family

ID=19781637

Family Applications (1)

Application Number Title Priority Date Filing Date
DEP24590D Expired DE926267C (de) 1947-01-25 1948-12-14 Elektronenmikroskop

Country Status (6)

Country Link
US (1) US2485754A (forum.php)
CH (1) CH264119A (forum.php)
DE (1) DE926267C (forum.php)
FR (1) FR961355A (forum.php)
GB (1) GB660787A (forum.php)
NL (1) NL74565C (forum.php)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021234035A3 (de) * 2020-05-19 2022-01-06 Carl Zeiss Microscopy Gmbh Verfahren zum fokussieren und betreiben eines teilchenstrahlmikroskops

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2617041A (en) * 1949-11-15 1952-11-04 Farrand Optical Co Inc Stereoscopic electron microscope
GB687207A (en) * 1950-02-23 1953-02-11 Vickers Electrical Co Ltd Improvements relating to electron microscopes
US2688091A (en) * 1951-05-21 1954-08-31 Hitachi Ltd Electron lens system
US2688092A (en) * 1951-05-21 1954-08-31 Hitachi Ltd Electron lens system
NL177954B (nl) * 1952-05-03 Stein Industrie Warmtewisselaar met meerdere parallel geschakelde modulen.
BE539818A (forum.php) * 1954-07-15
US2986634A (en) * 1954-07-15 1961-05-30 Philips Corp Method of examining the quality of electron-optical images and devices for carrying out this method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE734736C (de) * 1940-04-11 1943-04-22 Aeg Elektronenmikroskop zur Aufnahme mit Hell- und Dunkelfeldbeleuchtung

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE734736C (de) * 1940-04-11 1943-04-22 Aeg Elektronenmikroskop zur Aufnahme mit Hell- und Dunkelfeldbeleuchtung

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021234035A3 (de) * 2020-05-19 2022-01-06 Carl Zeiss Microscopy Gmbh Verfahren zum fokussieren und betreiben eines teilchenstrahlmikroskops

Also Published As

Publication number Publication date
FR961355A (forum.php) 1950-05-11
NL74565C (forum.php)
US2485754A (en) 1949-10-25
CH264119A (de) 1949-09-30
GB660787A (en) 1951-11-14

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