DE9005697U1 - - Google Patents

Info

Publication number
DE9005697U1
DE9005697U1 DE9005697U DE9005697U DE9005697U1 DE 9005697 U1 DE9005697 U1 DE 9005697U1 DE 9005697 U DE9005697 U DE 9005697U DE 9005697 U DE9005697 U DE 9005697U DE 9005697 U1 DE9005697 U1 DE 9005697U1
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE9005697U
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Priority to DE9005697U priority Critical patent/DE9005697U1/de
Publication of DE9005697U1 publication Critical patent/DE9005697U1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318572—Input/Output interfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318566—Comparators; Diagnosing the device under test
DE9005697U 1990-05-18 1990-05-18 Expired - Lifetime DE9005697U1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE9005697U DE9005697U1 (de) 1990-05-18 1990-05-18

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE9005697U DE9005697U1 (de) 1990-05-18 1990-05-18

Publications (1)

Publication Number Publication Date
DE9005697U1 true DE9005697U1 (de) 1990-08-30

Family

ID=6853941

Family Applications (1)

Application Number Title Priority Date Filing Date
DE9005697U Expired - Lifetime DE9005697U1 (de) 1990-05-18 1990-05-18

Country Status (1)

Country Link
DE (1) DE9005697U1 (de)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4406510C1 (de) * 1994-02-28 1995-07-13 Siemens Ag Integrierter Schaltkreis mit einer mitintegrierten Prüfvorrichtung
EP0699920A2 (de) * 1994-08-29 1996-03-06 Matsushita Electric Industrial Co., Ltd. Halbleiter-integrierte Schaltung mit prüfbaren Blöcken
US5729553A (en) * 1994-08-29 1998-03-17 Matsushita Electric Industrial Co., Ltd. Semiconductor integrated circuit with a testable block

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4406510C1 (de) * 1994-02-28 1995-07-13 Siemens Ag Integrierter Schaltkreis mit einer mitintegrierten Prüfvorrichtung
EP0699920A2 (de) * 1994-08-29 1996-03-06 Matsushita Electric Industrial Co., Ltd. Halbleiter-integrierte Schaltung mit prüfbaren Blöcken
EP0699920A3 (de) * 1994-08-29 1997-09-10 Matsushita Electric Ind Co Ltd Halbleiter-integrierte Schaltung mit prüfbaren Blöcken
US5729553A (en) * 1994-08-29 1998-03-17 Matsushita Electric Industrial Co., Ltd. Semiconductor integrated circuit with a testable block
US5894482A (en) * 1994-08-29 1999-04-13 Matsushita Electric Industrial Co., Ltd. Semiconductor integrated circuit with a testable block

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