DE69940556D1 - Photodetektorvorrichtung - Google Patents

Photodetektorvorrichtung

Info

Publication number
DE69940556D1
DE69940556D1 DE69940556T DE69940556T DE69940556D1 DE 69940556 D1 DE69940556 D1 DE 69940556D1 DE 69940556 T DE69940556 T DE 69940556T DE 69940556 T DE69940556 T DE 69940556T DE 69940556 D1 DE69940556 D1 DE 69940556D1
Authority
DE
Germany
Prior art keywords
photo detector
detector device
photo
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69940556T
Other languages
English (en)
Inventor
Seiichiro Mizuno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Application granted granted Critical
Publication of DE69940556D1 publication Critical patent/DE69940556D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06G—ANALOGUE COMPUTERS
    • G06G7/00—Devices in which the computing operation is performed by varying electric or magnetic quantities
    • G06G7/12—Arrangements for performing computing operations, e.g. operational amplifiers
    • G06G7/18—Arrangements for performing computing operations, e.g. operational amplifiers for integration or differentiation; for forming integrals
    • G06G7/184—Arrangements for performing computing operations, e.g. operational amplifiers for integration or differentiation; for forming integrals using capacitive elements
    • G06G7/186—Arrangements for performing computing operations, e.g. operational amplifiers for integration or differentiation; for forming integrals using capacitive elements using an operational amplifier comprising a capacitor or a resistor in the feedback loop
    • G06G7/1865—Arrangements for performing computing operations, e.g. operational amplifiers for integration or differentiation; for forming integrals using capacitive elements using an operational amplifier comprising a capacitor or a resistor in the feedback loop with initial condition setting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/30—Single-ended push-pull [SEPP] amplifiers; Phase-splitters therefor
    • H03F3/3001—Single-ended push-pull [SEPP] amplifiers; Phase-splitters therefor with field-effect transistors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Software Systems (AREA)
  • Computer Hardware Design (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Light Receiving Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
DE69940556T 1998-12-02 1999-12-02 Photodetektorvorrichtung Expired - Lifetime DE69940556D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP34310398A JP4390881B2 (ja) 1998-12-02 1998-12-02 光検出装置
PCT/JP1999/006757 WO2000033038A1 (fr) 1998-12-02 1999-12-02 Photodetecteur

Publications (1)

Publication Number Publication Date
DE69940556D1 true DE69940556D1 (de) 2009-04-23

Family

ID=18358972

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69940556T Expired - Lifetime DE69940556D1 (de) 1998-12-02 1999-12-02 Photodetektorvorrichtung

Country Status (6)

Country Link
US (1) US6455837B2 (de)
EP (1) EP1136798B1 (de)
JP (1) JP4390881B2 (de)
AU (1) AU1414400A (de)
DE (1) DE69940556D1 (de)
WO (1) WO2000033038A1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4119052B2 (ja) * 1999-07-16 2008-07-16 浜松ホトニクス株式会社 光検出装置
DE10160626A1 (de) * 2001-12-11 2003-06-18 Sick Ag Auswerteschaltung und Signalverarbeitungsverfahren
JP2005218052A (ja) * 2004-02-02 2005-08-11 Hamamatsu Photonics Kk 光検出装置
KR100656666B1 (ko) * 2004-09-08 2006-12-11 매그나칩 반도체 유한회사 이미지 센서
US7671460B2 (en) * 2006-01-25 2010-03-02 Teledyne Licensing, Llc Buried via technology for three dimensional integrated circuits
US7436342B2 (en) * 2007-01-30 2008-10-14 Teledyne Licensing, Llc Numerical full well capacity extension for photo sensors with an integration capacitor in the readout circuit using two and four phase charge subtraction
US7498650B2 (en) * 2007-03-08 2009-03-03 Teledyne Licensing, Llc Backside illuminated CMOS image sensor with pinned photodiode
US7923763B2 (en) * 2007-03-08 2011-04-12 Teledyne Licensing, Llc Two-dimensional time delay integration visible CMOS image sensor
US7795650B2 (en) * 2008-12-09 2010-09-14 Teledyne Scientific & Imaging Llc Method and apparatus for backside illuminated image sensors using capacitively coupled readout integrated circuits

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6226970A (ja) * 1985-07-26 1987-02-04 Nec Corp 電荷検出回路
JPH0563272A (ja) * 1991-08-31 1993-03-12 Ricoh Co Ltd 半導体レーザ駆動回路
JP3146716B2 (ja) * 1993-02-10 2001-03-19 富士電機株式会社 光電変換回路
JPH08107317A (ja) * 1994-10-05 1996-04-23 Fujitsu Ltd 電圧バッファ回路及びこれを用いた回路
JP3308146B2 (ja) * 1995-06-02 2002-07-29 浜松ホトニクス株式会社 固体撮像装置
JP3445407B2 (ja) * 1995-06-02 2003-09-08 浜松ホトニクス株式会社 固体撮像装置
JP3798462B2 (ja) 1996-04-01 2006-07-19 浜松ホトニクス株式会社 固体撮像装置
JP3825503B2 (ja) 1996-06-14 2006-09-27 浜松ホトニクス株式会社 固体撮像装置
US5793230A (en) * 1997-02-26 1998-08-11 Sandia Corporation Sensor readout detector circuit

Also Published As

Publication number Publication date
WO2000033038A1 (fr) 2000-06-08
EP1136798B1 (de) 2009-03-11
AU1414400A (en) 2000-06-19
US20010040212A1 (en) 2001-11-15
EP1136798A4 (de) 2004-05-26
JP2000171296A (ja) 2000-06-23
US6455837B2 (en) 2002-09-24
JP4390881B2 (ja) 2009-12-24
EP1136798A1 (de) 2001-09-26

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition