DE69912062T2 - Verbesserungen bezüglich der Messung einer Teilchengrössenverteilung - Google Patents
Verbesserungen bezüglich der Messung einer Teilchengrössenverteilung Download PDFInfo
- Publication number
- DE69912062T2 DE69912062T2 DE69912062T DE69912062T DE69912062T2 DE 69912062 T2 DE69912062 T2 DE 69912062T2 DE 69912062 T DE69912062 T DE 69912062T DE 69912062 T DE69912062 T DE 69912062T DE 69912062 T2 DE69912062 T2 DE 69912062T2
- Authority
- DE
- Germany
- Prior art keywords
- light
- detector
- detector means
- readings
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000002245 particle Substances 0.000 title claims abstract description 98
- 238000009826 distribution Methods 0.000 title claims abstract description 25
- 230000006872 improvement Effects 0.000 title description 5
- 238000004364 calculation method Methods 0.000 claims description 25
- 238000000034 method Methods 0.000 claims description 19
- 230000001419 dependent effect Effects 0.000 claims description 5
- 238000005259 measurement Methods 0.000 abstract description 38
- 238000001514 detection method Methods 0.000 abstract description 8
- 238000007415 particle size distribution analysis Methods 0.000 abstract 1
- 210000004027 cell Anatomy 0.000 description 61
- 230000005540 biological transmission Effects 0.000 description 25
- 230000008033 biological extinction Effects 0.000 description 11
- 230000000694 effects Effects 0.000 description 10
- 230000003287 optical effect Effects 0.000 description 10
- 238000013459 approach Methods 0.000 description 9
- 230000008901 benefit Effects 0.000 description 7
- 238000012937 correction Methods 0.000 description 7
- 238000002474 experimental method Methods 0.000 description 7
- 230000010354 integration Effects 0.000 description 6
- 239000000463 material Substances 0.000 description 6
- 230000008569 process Effects 0.000 description 6
- 238000012545 processing Methods 0.000 description 6
- 238000002310 reflectometry Methods 0.000 description 6
- 238000000149 argon plasma sintering Methods 0.000 description 4
- 210000002421 cell wall Anatomy 0.000 description 4
- 238000000576 coating method Methods 0.000 description 4
- 238000004458 analytical method Methods 0.000 description 3
- 230000006399 behavior Effects 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 3
- 239000003795 chemical substances by application Substances 0.000 description 3
- 230000003247 decreasing effect Effects 0.000 description 3
- 238000001914 filtration Methods 0.000 description 3
- 238000012544 monitoring process Methods 0.000 description 3
- 239000003381 stabilizer Substances 0.000 description 3
- 239000006117 anti-reflective coating Substances 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 241001025261 Neoraja caerulea Species 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 210000005056 cell body Anatomy 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000001186 cumulative effect Effects 0.000 description 1
- 238000012217 deletion Methods 0.000 description 1
- 230000037430 deletion Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
- 230000003467 diminishing effect Effects 0.000 description 1
- 239000010419 fine particle Substances 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000005459 micromachining Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000005549 size reduction Methods 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 239000011800 void material Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 230000003313 weakening effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
- G01N15/0211—Investigating a scatter or diffraction pattern
Landscapes
- Chemical & Material Sciences (AREA)
- Dispersion Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB9818348 | 1998-08-22 | ||
| GBGB9818348.6A GB9818348D0 (en) | 1998-08-22 | 1998-08-22 | Improvements relating to the measurement of particle size distribution |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE69912062D1 DE69912062D1 (de) | 2003-11-20 |
| DE69912062T2 true DE69912062T2 (de) | 2004-07-15 |
Family
ID=10837685
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE69912062T Expired - Lifetime DE69912062T2 (de) | 1998-08-22 | 1999-08-23 | Verbesserungen bezüglich der Messung einer Teilchengrössenverteilung |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US6778271B2 (enExample) |
| EP (1) | EP0992786B1 (enExample) |
| JP (1) | JP4605839B2 (enExample) |
| AT (1) | ATE252230T1 (enExample) |
| DE (1) | DE69912062T2 (enExample) |
| GB (1) | GB9818348D0 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3786613B1 (de) * | 2019-08-23 | 2024-06-19 | Fritsch GmbH | Partikelgrössenmessgerät |
Families Citing this family (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007527997A (ja) * | 2004-03-06 | 2007-10-04 | マイケル トレイナー， | 粒子のサイズおよび形状を決定する方法および装置 |
| US9297737B2 (en) | 2004-03-06 | 2016-03-29 | Michael Trainer | Methods and apparatus for determining characteristics of particles |
| US7495763B2 (en) * | 2006-03-23 | 2009-02-24 | Hach Company | Dual function measurement system |
| US8557588B2 (en) * | 2007-03-27 | 2013-10-15 | Schlumberger Technology Corporation | Methods and apparatus for sampling and diluting concentrated emulsions |
| US7847936B2 (en) * | 2007-05-15 | 2010-12-07 | Waters Technologies Corporation | Evaporative light scattering device and methods of use thereof |
| JP5546454B2 (ja) * | 2007-08-15 | 2014-07-09 | マルベルン インスツルメンツ リミテッド | 広幅分光計 |
| US7782459B2 (en) * | 2007-09-24 | 2010-08-24 | Process Metrix | Laser-based apparatus and method for measuring agglomerate concentration and mean agglomerate size |
| US8941505B2 (en) | 2008-10-09 | 2015-01-27 | Hochiki Corporation | Smoke detector |
| US20130342684A1 (en) * | 2011-01-19 | 2013-12-26 | Teknologian Tutkimuskeskus Vtt | Method and System for Determining Particle Size Information |
| GB2494734B (en) * | 2011-09-14 | 2016-04-06 | Malvern Instr Ltd | Apparatus and method for measuring particle size distribution by light scattering |
| US8831884B2 (en) * | 2011-10-25 | 2014-09-09 | Rosemount Aerospace Inc. | Methods of determining water droplet size distributions of clouds |
| CN102539385B (zh) * | 2012-01-09 | 2013-09-18 | 北京大学 | 多波长雾霾识别方法及能见度测量方法 |
| WO2014097724A1 (ja) * | 2012-12-21 | 2014-06-26 | ソニー株式会社 | 粒子検出装置及び粒子検出方法 |
| US9207190B2 (en) | 2013-04-10 | 2015-12-08 | Technology Assessment & Transfer, Inc. | Method for nondestructive testing of optical discontinuities in monolithic transparent polycrystalline ceramic articles |
| EP2860513B1 (en) * | 2013-10-08 | 2018-04-25 | Anton Paar GmbH | Apparatus and method for analyzing a sample which compensate for refraction index related distortions |
| US10456767B2 (en) * | 2014-10-22 | 2019-10-29 | Hitachi High-Technologies Corporation | Cytometric mechanism, cell culture device comprising same, and cytometric method |
| WO2016143083A1 (ja) * | 2015-03-10 | 2016-09-15 | 技術研究組合次世代３Ｄ積層造形技術総合開発機構 | 光加工ヘッド、光加工装置およびその制御方法ならびに制御プログラム |
| US10261006B2 (en) | 2016-07-21 | 2019-04-16 | Rosemount Aerospace, Inc. | Method of estimating cloud particle sizes using LIDAR ratio |
| CN107884317A (zh) * | 2016-09-29 | 2018-04-06 | 香港城市大学 | 颗粒物传感器 |
| CN109781861B (zh) * | 2017-11-10 | 2021-11-23 | 国核电站运行服务技术有限公司 | 电子开关式主/辅多通道超声波采集系统及电子设备 |
| EP3521806B1 (en) * | 2018-02-06 | 2024-12-04 | Malvern Panalytical Limited | Multi-angle dynamic light scattering |
| WO2021096658A1 (en) * | 2019-11-15 | 2021-05-20 | Becton, Dickinson And Company | Methods for determining particle size and light detection systems for same |
| WO2022093286A1 (en) | 2020-11-02 | 2022-05-05 | Tintometer Gmbh | Nephelometric measuring device(s) |
| JP7498093B2 (ja) * | 2020-11-17 | 2024-06-11 | 大塚電子株式会社 | 光散乱測定装置及び測定治具 |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3553462A (en) | 1969-12-31 | 1971-01-05 | Exotech | Apparatus for determining the radiation scattering properties of a fluid(and by ex.) |
| US3901602A (en) * | 1974-05-13 | 1975-08-26 | Us Commerce | Light scattering method and apparatus for the chemical characterization of particulate matter |
| US4361403A (en) | 1978-06-26 | 1982-11-30 | Loos Hendricus G | Multiple wavelength instrument for measurement of particle size distributions |
| US4541719A (en) | 1982-07-20 | 1985-09-17 | Wyatt Philip J | Method and apparatus for characterizing microparticles and measuring their response to their environment |
| US4595291A (en) * | 1982-10-15 | 1986-06-17 | Tokyo Shibaura Denki Kabushiki Kaisha | Particle diameter measuring device |
| EP0167272B1 (en) * | 1984-06-30 | 1991-01-16 | Kabushiki Kaisha Toshiba | Particle size measuring apparatus |
| JPS61110032A (ja) * | 1984-11-02 | 1986-05-28 | Toray Ind Inc | 生理活性物質の検出方法 |
| US4616927A (en) * | 1984-11-15 | 1986-10-14 | Wyatt Technology Corporation | Sample cell for light scattering measurements |
| JPH02212741A (ja) * | 1989-02-10 | 1990-08-23 | Shimadzu Corp | 粒度分布測定装置 |
| US4953978A (en) * | 1989-03-03 | 1990-09-04 | Coulter Electronics Of New England, Inc. | Particle size analysis utilizing polarization intensity differential scattering |
| JPH0758256B2 (ja) * | 1989-04-13 | 1995-06-21 | リオン株式会社 | 微粒子計測装置 |
| US5012119A (en) * | 1989-05-19 | 1991-04-30 | Xinix, Inc. | Method and apparatus for monitoring particles using back-scattered light without interference by bubbles |
| DE69129260T2 (de) * | 1990-11-03 | 1998-11-19 | Horiba Ltd | Gerät zur Messung der Teilchengrössenverteilung |
| JPH07117483B2 (ja) * | 1991-04-22 | 1995-12-18 | 日機装株式会社 | 粒度分布測定装置 |
| JPH0534259A (ja) * | 1991-07-29 | 1993-02-09 | Shimadzu Corp | 粒度分布測定装置 |
| FR2688308B1 (fr) | 1992-03-04 | 1994-05-27 | Cilas | Granulometre a laser. |
| JPH0612943U (ja) * | 1992-07-18 | 1994-02-18 | 株式会社堀場製作所 | 微粒子測定装置 |
| JP2720340B2 (ja) * | 1992-10-11 | 1998-03-04 | 株式会社堀場製作所 | レーザ回折式粒度分布測定方法 |
| US5416580A (en) * | 1993-07-07 | 1995-05-16 | General Signal Corporation | Methods and apparatus for determining small particle size distribution utilizing multiple light beams |
| US5576827A (en) | 1994-04-15 | 1996-11-19 | Micromeritics Instrument Corporation | Apparatus and method for determining the size distribution of particles by light scattering |
| JPH08128942A (ja) * | 1994-10-31 | 1996-05-21 | Shimadzu Corp | 粒度分布測定装置 |
| JPH08178830A (ja) * | 1994-12-26 | 1996-07-12 | Sanyo Electric Co Ltd | 検出装置 |
| JP3258882B2 (ja) * | 1995-11-24 | 2002-02-18 | 株式会社堀場製作所 | 粒度分布測定装置 |
-
1998
- 1998-08-22 GB GBGB9818348.6A patent/GB9818348D0/en not_active Ceased
-
1999
- 1999-08-20 US US09/378,666 patent/US6778271B2/en not_active Expired - Lifetime
- 1999-08-20 JP JP23459899A patent/JP4605839B2/ja not_active Expired - Lifetime
- 1999-08-23 DE DE69912062T patent/DE69912062T2/de not_active Expired - Lifetime
- 1999-08-23 EP EP99306657A patent/EP0992786B1/en not_active Expired - Lifetime
- 1999-08-23 AT AT99306657T patent/ATE252230T1/de not_active IP Right Cessation
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3786613B1 (de) * | 2019-08-23 | 2024-06-19 | Fritsch GmbH | Partikelgrössenmessgerät |
Also Published As
| Publication number | Publication date |
|---|---|
| US20030030802A1 (en) | 2003-02-13 |
| EP0992786B1 (en) | 2003-10-15 |
| EP0992786A2 (en) | 2000-04-12 |
| DE69912062D1 (de) | 2003-11-20 |
| US6778271B2 (en) | 2004-08-17 |
| JP4605839B2 (ja) | 2011-01-05 |
| EP0992786A3 (en) | 2001-11-21 |
| ATE252230T1 (de) | 2003-11-15 |
| JP2000105185A (ja) | 2000-04-11 |
| GB9818348D0 (en) | 1998-10-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE69912061T2 (de) | Verbesserungen bezüglich der Messung einer Teilchengrössenverteilung | |
| DE69912062T2 (de) | Verbesserungen bezüglich der Messung einer Teilchengrössenverteilung | |
| DE2901738C2 (de) | Spektralphotometer | |
| DE69636862T2 (de) | Vorrichtung zur Messung von Raman-Streulicht | |
| DE69535012T2 (de) | Verfahren und Vorrichtung zur Messung der Konzentration von absorbierenden Bestandteilen in einem streuenden Medium | |
| DE102004045145B4 (de) | Verfahren zur Kristallorientierungsmessung mittels Röntgenstrahlung und Vorrichtung zur Kristallorientierungsmessung mittels Röntgenstrahlung | |
| DE69622588T2 (de) | Fluorometer | |
| DE69635790T2 (de) | Vorrichtung und Verfahren zur Messung eines streuenden Mediums | |
| EP0143282A2 (de) | Verfahren zur berührungslosen, emissionsgradunabhängigen Strahlungsmessung der Temperatur eines Objektes | |
| DE4139032A1 (de) | Wellenlaengenstabilisator fuer schmalbandlaser | |
| DE2354141C2 (de) | Optisches Meßverfahren zum Untersuchen von Oberflächen und Einrichtung zur Durchführung des Verfahrens | |
| DE10149917B4 (de) | Vorrichtung und Verfahren zum Messen einer Teilchengrößeverteilung auf Basis eines Lichtstreuungsverfahrens | |
| DE10023477C2 (de) | Ellipsometer | |
| DE4200869C2 (de) | Infrarot Mikroskop-Spektrometer | |
| DE69918968T2 (de) | Verfahren und vorrichtung zur messung der konzentration einer absorbierenden komponente eines streuenden/absorbierenden körpers | |
| DE102012005428B4 (de) | Vorrichtung zum Bestimmen der Temperatur eines Substrats | |
| DE102017127122B4 (de) | Spektrometrisches Messgerät | |
| DE19637131C2 (de) | Einrichtung zum Beurteilen des Reflexionsverhaltens eines Objektes, insbesondere einer Flüssigkristallanzeige | |
| EP1228355B1 (de) | Verfahren und einrichtungen zum messen und bewerten des streuverhaltens von oberflächen | |
| DE69028687T2 (de) | Vorrichtung zur optischen Messung einer Probe | |
| EP0902272A2 (de) | Atomabsorptionsspektrometer | |
| DE2744168C3 (de) | Magnetooptisches Spektralphotometer | |
| DE69510734T2 (de) | Röntgenspektrometer mit streifendem ausfallwinkel | |
| DE19510034A1 (de) | Vorrichtung zur Bestimmung von Partikelgrößen und/oder Partikelgrößenverteilungen mittels Lichtbeugung | |
| DE19755589C2 (de) | Vorrichtung für dreidimensionale Kreuzkorrelationstechnik und Verfahren zur Durchführung der Justage von Detektionsoptiken zur Messung von Kreuzkorrelationsfunktionen in flüssigen Medien |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8364 | No opposition during term of opposition |