DE69904069D1 - Verfahren zum nitrieren eines silizium-substrates zur erzeugung einer isolationsbeschichtung - Google Patents
Verfahren zum nitrieren eines silizium-substrates zur erzeugung einer isolationsbeschichtungInfo
- Publication number
- DE69904069D1 DE69904069D1 DE69904069T DE69904069T DE69904069D1 DE 69904069 D1 DE69904069 D1 DE 69904069D1 DE 69904069 T DE69904069 T DE 69904069T DE 69904069 T DE69904069 T DE 69904069T DE 69904069 D1 DE69904069 D1 DE 69904069D1
- Authority
- DE
- Germany
- Prior art keywords
- nitrating
- producing
- silicon substrate
- insulation coating
- insulation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C28/00—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
- C23C28/04—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D only coatings of inorganic non-metallic material
- C23C28/044—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D only coatings of inorganic non-metallic material coatings specially adapted for cutting tools or wear applications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C8/00—Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals
- C23C8/06—Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using gases
- C23C8/28—Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using gases more than one element being applied in one step
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24802—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.]
- Y10T428/24926—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.] including ceramic, glass, porcelain or quartz layer
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Formation Of Insulating Films (AREA)
- Non-Volatile Memory (AREA)
- Semiconductor Memories (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9811746A FR2783530B1 (fr) | 1998-09-21 | 1998-09-21 | Procede de preparation, par nitruration, d'un substrat de silicium pour la formation d'une couche isolante mince |
PCT/FR1999/002228 WO2000017412A1 (fr) | 1998-09-21 | 1999-09-20 | Procede de traitement, par nitruration, d'un substrat de silicium pour la formation d'une couche isolante mince |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69904069D1 true DE69904069D1 (de) | 2003-01-02 |
DE69904069T2 DE69904069T2 (de) | 2003-07-17 |
Family
ID=9530648
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69904069T Expired - Lifetime DE69904069T2 (de) | 1998-09-21 | 1999-09-20 | Verfahren zum nitrieren eines silizium-substrates zur erzeugung einer isolationsbeschichtung |
Country Status (5)
Country | Link |
---|---|
US (1) | US6551698B1 (de) |
EP (1) | EP1115895B1 (de) |
DE (1) | DE69904069T2 (de) |
FR (1) | FR2783530B1 (de) |
WO (1) | WO2000017412A1 (de) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8114486B2 (en) * | 2006-02-28 | 2012-02-14 | Evonik Degussa Corporation | Colored paper and substrates coated for enhanced printing performance |
WO2008039562A1 (en) * | 2006-09-26 | 2008-04-03 | Evonik Degussa Corporation | Multi-functional paper for enhanced printing performance |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4438157A (en) * | 1980-12-05 | 1984-03-20 | Ncr Corporation | Process for forming MNOS dual dielectric structure |
CA1317034C (en) * | 1988-09-30 | 1993-04-27 | Alliedsignal Inc. | Fabrication of oxynitride frontside microstructures |
JPH03160720A (ja) * | 1989-11-20 | 1991-07-10 | Oki Electric Ind Co Ltd | 絶縁膜形成方法 |
KR930002661B1 (ko) * | 1990-05-10 | 1993-04-07 | 금성일렉트론 주식회사 | 수직 lpcvd법을 이용한 질산화막 실리콘 제조장치 및 방법 |
US5407870A (en) * | 1993-06-07 | 1995-04-18 | Motorola Inc. | Process for fabricating a semiconductor device having a high reliability dielectric material |
KR970009863B1 (ko) * | 1994-01-22 | 1997-06-18 | 금성일렉트론 주식회사 | 반도체 소자의 실리콘절연막형성방법 |
US5674788A (en) * | 1995-06-06 | 1997-10-07 | Advanced Micro Devices, Inc. | Method of forming high pressure silicon oxynitride gate dielectrics |
US5861190A (en) * | 1996-03-25 | 1999-01-19 | Hewlett-Packard Co. | Arrangement for growing a thin dielectric layer on a semiconductor wafer at low temperatures |
CA2213034C (en) * | 1996-09-02 | 2002-12-17 | Murata Manufacturing Co., Ltd. | A semiconductor device with a passivation film |
WO1998027580A1 (en) * | 1996-12-03 | 1998-06-25 | Scott Specialty Gases, Inc. | Process for forming ultrathin oxynitride layers and thin layer devices containing ultrathin oxynitride layers |
US5843817A (en) * | 1997-09-19 | 1998-12-01 | Taiwan Semiconductor Manufacturing Company, Ltd. | Process for integrating stacked capacitor DRAM devices with MOSFET devices used for high performance logic circuits |
FR2775120B1 (fr) | 1998-02-18 | 2000-04-07 | France Telecom | Procede de nitruration de la couche d'oxyde de grille d'un dispositif semiconducteur et dispositif obtenu |
-
1998
- 1998-09-21 FR FR9811746A patent/FR2783530B1/fr not_active Expired - Fee Related
-
1999
- 1999-09-20 WO PCT/FR1999/002228 patent/WO2000017412A1/fr active IP Right Grant
- 1999-09-20 US US09/763,532 patent/US6551698B1/en not_active Expired - Fee Related
- 1999-09-20 DE DE69904069T patent/DE69904069T2/de not_active Expired - Lifetime
- 1999-09-20 EP EP99943005A patent/EP1115895B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP1115895B1 (de) | 2002-11-20 |
US6551698B1 (en) | 2003-04-22 |
EP1115895A1 (de) | 2001-07-18 |
WO2000017412A1 (fr) | 2000-03-30 |
DE69904069T2 (de) | 2003-07-17 |
FR2783530B1 (fr) | 2001-08-31 |
FR2783530A1 (fr) | 2000-03-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |