DE69901821T2 - Kopf zum prüfen der lineardimension - Google Patents
Kopf zum prüfen der lineardimensionInfo
- Publication number
- DE69901821T2 DE69901821T2 DE69901821T DE69901821T DE69901821T2 DE 69901821 T2 DE69901821 T2 DE 69901821T2 DE 69901821 T DE69901821 T DE 69901821T DE 69901821 T DE69901821 T DE 69901821T DE 69901821 T2 DE69901821 T2 DE 69901821T2
- Authority
- DE
- Germany
- Prior art keywords
- head according
- electrically resistive
- movable arm
- rotational symmetry
- arm set
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000006073 displacement reaction Methods 0.000 claims description 40
- 238000001514 detection method Methods 0.000 claims description 36
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 claims description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims 2
- 230000001419 dependent effect Effects 0.000 claims 1
- -1 titanium oxide compound Chemical class 0.000 claims 1
- 239000000463 material Substances 0.000 abstract description 10
- 239000000523 sample Substances 0.000 description 4
- 238000013519 translation Methods 0.000 description 4
- 230000014616 translation Effects 0.000 description 4
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 3
- 230000003321 amplification Effects 0.000 description 3
- 238000013459 approach Methods 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- 238000000151 deposition Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000011810 insulating material Substances 0.000 description 3
- 238000003199 nucleic acid amplification method Methods 0.000 description 3
- 230000008021 deposition Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000011144 upstream manufacturing Methods 0.000 description 2
- 229910000831 Steel Inorganic materials 0.000 description 1
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 238000004026 adhesive bonding Methods 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 229910052593 corundum Inorganic materials 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 239000012777 electrically insulating material Substances 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 230000001939 inductive effect Effects 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 239000012811 non-conductive material Substances 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 230000036316 preload Effects 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000000284 resting effect Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 229910001845 yogo sapphire Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/004—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points
- G01B7/008—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points using coordinate measuring machines
- G01B7/012—Contact-making feeler heads therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Magnetic Heads (AREA)
- Extrusion Moulding Of Plastics Or The Like (AREA)
- Adjustment Of The Magnetic Head Position Track Following On Tapes (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IT98BO000217A IT1299953B1 (it) | 1998-04-06 | 1998-04-06 | Testa per il controllo di dimensioni lineari. |
| PCT/EP1999/002251 WO1999051936A1 (en) | 1998-04-06 | 1999-03-29 | Head for the linear dimension checking |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE69901821D1 DE69901821D1 (de) | 2002-07-18 |
| DE69901821T2 true DE69901821T2 (de) | 2003-02-13 |
Family
ID=11343088
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE69901821T Expired - Lifetime DE69901821T2 (de) | 1998-04-06 | 1999-03-29 | Kopf zum prüfen der lineardimension |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US6459281B1 (es) |
| EP (1) | EP1068485B1 (es) |
| JP (1) | JP4290333B2 (es) |
| AT (1) | ATE219238T1 (es) |
| AU (1) | AU3812199A (es) |
| DE (1) | DE69901821T2 (es) |
| ES (1) | ES2177271T3 (es) |
| IT (1) | IT1299953B1 (es) |
| WO (1) | WO1999051936A1 (es) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3500125B2 (ja) * | 2001-02-14 | 2004-02-23 | 株式会社ミツトヨ | 弾性体の振動検出システム |
| US6609308B2 (en) * | 2001-11-02 | 2003-08-26 | Q-Mark Manufacturing, Inc. | Drilled silicon nitride ball |
| JP2007123470A (ja) * | 2005-10-27 | 2007-05-17 | Fujitsu Component Ltd | ソレノイドアクチュエータ及び２軸アクチュエータ |
| CN101408418B (zh) * | 2007-10-12 | 2011-03-30 | 鸿富锦精密工业（深圳）有限公司 | 接触式测量装置 |
| JP2009125853A (ja) * | 2007-11-22 | 2009-06-11 | Murata Mach Ltd | センサ |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE214434C (es) | ||||
| US3678485A (en) * | 1969-10-06 | 1972-07-18 | Technology Uk | Shaft angle transducers |
| US3673695A (en) * | 1970-05-22 | 1972-07-04 | Rohr Corp | Non-tilting probe |
| DE3243126A1 (de) * | 1982-11-22 | 1984-05-24 | Robert Bosch Gmbh, 7000 Stuttgart | Verfahren zur pruefung der korrekten lage eines schleifers eines elektrischen potentiometers und elektrisches potentiometer zur durchfuehrung des verfahrens |
| DD214434A1 (de) * | 1983-03-22 | 1984-10-10 | Rolf Noetzel | Tastkopf zur ausloesung eines signales fuer die messwerterfassung |
| DE3824534A1 (de) * | 1988-07-20 | 1990-01-25 | Bosch Gmbh Robert | Messeinrichtung zur beruehrungslosen bestimmung einer weg- und/oder winkelaenderung |
| US5049827A (en) * | 1990-01-12 | 1991-09-17 | Jet Electronics & Technology Inc. | Non-contacting potentiometer |
| US5491904A (en) * | 1990-02-23 | 1996-02-20 | Mcmurtry; David R. | Touch probe |
| GB2241337B (en) * | 1990-02-24 | 1994-01-05 | Ferranti Int Plc | Potentiometric circuit arrangement |
| US5200747A (en) * | 1990-12-13 | 1993-04-06 | Bourns, Inc. | Turn counting position sensor |
| DE4123081C2 (de) * | 1991-07-12 | 2001-05-17 | Zeiss Carl | Tastkopf vom schaltenden Typ |
| DE4127209C2 (de) | 1991-08-16 | 1996-05-23 | Mehnert Walter Dr | Geber zur induktiven Erzeugung eines Meßsignals |
| JP2785547B2 (ja) * | 1991-10-15 | 1998-08-13 | 富士ゼロックス株式会社 | 用紙サイズ検出装置 |
| FR2684758B1 (fr) * | 1991-12-09 | 1997-03-28 | Alcatel Satmam | Capteur de position angulaire a piste resistive continue fermee, et procede de mesure correspondant. |
| JPH06194113A (ja) * | 1992-12-22 | 1994-07-15 | Nikon Corp | タッチプローブ |
| DE69323289T3 (de) * | 1992-12-24 | 2003-04-24 | Renishaw Plc, Wotton-Under-Edge | Tastsonde und Signalverarbeitungsschaltung dafür |
| JP3370451B2 (ja) * | 1994-10-14 | 2003-01-27 | 富士写真光機株式会社 | 電動雲台の回転角度検出装置 |
| JP3217684B2 (ja) * | 1996-01-23 | 2001-10-09 | 京セラ株式会社 | カメラの回転式情報設定装置 |
-
1998
- 1998-04-06 IT IT98BO000217A patent/IT1299953B1/it active IP Right Grant
-
1999
- 1999-03-29 JP JP2000542626A patent/JP4290333B2/ja not_active Expired - Fee Related
- 1999-03-29 WO PCT/EP1999/002251 patent/WO1999051936A1/en active Search and Examination
- 1999-03-29 DE DE69901821T patent/DE69901821T2/de not_active Expired - Lifetime
- 1999-03-29 EP EP99920586A patent/EP1068485B1/en not_active Expired - Lifetime
- 1999-03-29 AT AT99920586T patent/ATE219238T1/de not_active IP Right Cessation
- 1999-03-29 US US09/647,345 patent/US6459281B1/en not_active Expired - Fee Related
- 1999-03-29 AU AU38121/99A patent/AU3812199A/en not_active Abandoned
- 1999-03-29 ES ES99920586T patent/ES2177271T3/es not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| EP1068485B1 (en) | 2002-06-12 |
| ITBO980217A1 (it) | 1999-10-06 |
| US6459281B1 (en) | 2002-10-01 |
| AU3812199A (en) | 1999-10-25 |
| JP4290333B2 (ja) | 2009-07-01 |
| ES2177271T3 (es) | 2002-12-01 |
| ITBO980217A0 (it) | 1998-04-06 |
| EP1068485A1 (en) | 2001-01-17 |
| DE69901821D1 (de) | 2002-07-18 |
| JP2002510793A (ja) | 2002-04-09 |
| WO1999051936A1 (en) | 1999-10-14 |
| IT1299953B1 (it) | 2000-04-04 |
| ATE219238T1 (de) | 2002-06-15 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8364 | No opposition during term of opposition | ||
| 8328 | Change in the person/name/address of the agent |
Representative=s name: HEYER, V., DIPL.-PHYS. DR.RER.NAT., PAT.-ANW., 806 |