DE69804742D1 - Magnetisches Dünnfilmspeicherelement und Aufnahme-/Wiedergabeverfahren unter dessen Verwendung - Google Patents
Magnetisches Dünnfilmspeicherelement und Aufnahme-/Wiedergabeverfahren unter dessen VerwendungInfo
- Publication number
- DE69804742D1 DE69804742D1 DE69804742T DE69804742T DE69804742D1 DE 69804742 D1 DE69804742 D1 DE 69804742D1 DE 69804742 T DE69804742 T DE 69804742T DE 69804742 T DE69804742 T DE 69804742T DE 69804742 D1 DE69804742 D1 DE 69804742D1
- Authority
- DE
- Germany
- Prior art keywords
- recording
- thin film
- same
- memory element
- reproducing method
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000010409 thin film Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/14—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements
- G11C11/15—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements using multiple magnetic layers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/14—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements
- G11C11/155—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements with cylindrical configuration
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/161—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1659—Cell access
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1675—Writing or programming circuits or methods
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1693—Timing circuits or methods
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/10—Magnetoresistive devices
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Semiconductor Memories (AREA)
- Hall/Mr Elements (AREA)
- Mram Or Spin Memory Techniques (AREA)
- Thin Magnetic Films (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25353197 | 1997-09-18 | ||
JP15780698A JP4040173B2 (ja) | 1998-06-05 | 1998-06-05 | メモリ |
JP10256965A JPH11154389A (ja) | 1997-09-18 | 1998-09-10 | 磁気抵抗素子、磁性薄膜メモリ素子および該メモリ素子の記録再生方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69804742D1 true DE69804742D1 (de) | 2002-05-16 |
DE69804742T2 DE69804742T2 (de) | 2002-09-26 |
Family
ID=27321232
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69804742T Expired - Fee Related DE69804742T2 (de) | 1997-09-18 | 1998-09-17 | Magnetisches Dünnfilmspeicherelement und Aufnahme-/Wiedergabeverfahren unter dessen Verwendung |
Country Status (3)
Country | Link |
---|---|
US (1) | US6111784A (de) |
EP (1) | EP0910092B1 (de) |
DE (1) | DE69804742T2 (de) |
Families Citing this family (69)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0959475A3 (de) * | 1998-05-18 | 2000-11-08 | Canon Kabushiki Kaisha | Magnetischer Dünnfilmspeicher sowie Schreibe- und Leseverfahren und Anordnung unter Verwendung solchen Speichers |
JP2002520874A (ja) * | 1998-07-15 | 2002-07-09 | インフィネオン テクノロジース アクチエンゲゼルシャフト | メモリ素子の電気抵抗が情報でありかつ磁場により影響を与えることができるメモリセル装置及びその製造方法 |
CN1182552C (zh) * | 1998-08-12 | 2004-12-29 | 因芬尼昂技术股份公司 | 磁致电阻元件及其作为存储单元阵列内的存储元的应用 |
JP3235572B2 (ja) * | 1998-09-18 | 2001-12-04 | 日本電気株式会社 | 磁気抵抗効果素子,磁気抵抗効果センサ及びそれらを利用したシステム |
US6391483B1 (en) * | 1999-03-30 | 2002-05-21 | Carnegie Mellon University | Magnetic device and method of forming same |
JP3589346B2 (ja) * | 1999-06-17 | 2004-11-17 | 松下電器産業株式会社 | 磁気抵抗効果素子および磁気抵抗効果記憶素子 |
JP2001084758A (ja) * | 1999-09-17 | 2001-03-30 | Fujitsu Ltd | 強磁性トンネル接合ランダムアクセスメモリ、スピンバルブランダムアクセスメモリ、単一強磁性膜ランダムアクセスメモリ、およびこれらをつかったメモリセルアレイ |
US6473336B2 (en) * | 1999-12-16 | 2002-10-29 | Kabushiki Kaisha Toshiba | Magnetic memory device |
DE10032278C1 (de) * | 2000-07-03 | 2001-11-29 | Infineon Technologies Ag | Verfahren zur Verhinderung von Elektromigration in einem MRAM |
US6914749B2 (en) * | 2000-07-25 | 2005-07-05 | Seagate Technology Llc | Magnetic anisotropy of soft-underlayer induced by magnetron field |
US6538921B2 (en) | 2000-08-17 | 2003-03-25 | Nve Corporation | Circuit selection of magnetic memory cells and related cell structures |
US7035138B2 (en) * | 2000-09-27 | 2006-04-25 | Canon Kabushiki Kaisha | Magnetic random access memory having perpendicular magnetic films switched by magnetic fields from a plurality of directions |
US6487110B2 (en) | 2000-09-27 | 2002-11-26 | Canon Kabushiki Kaisha | Nonvolatile solid-state memory device using magnetoresistive effect and recording and reproducing method of the same |
US6579625B1 (en) * | 2000-10-24 | 2003-06-17 | Motorola, Inc. | Magnetoelectronics element having a magnetic layer formed of multiple sub-element layers |
US6515341B2 (en) * | 2001-02-26 | 2003-02-04 | Motorola, Inc. | Magnetoelectronics element having a stressed over-layer configured for alteration of the switching energy barrier |
US6538920B2 (en) * | 2001-04-02 | 2003-03-25 | Manish Sharma | Cladded read conductor for a pinned-on-the-fly soft reference layer |
US6404674B1 (en) * | 2001-04-02 | 2002-06-11 | Hewlett Packard Company Intellectual Property Administrator | Cladded read-write conductor for a pinned-on-the-fly soft reference layer |
US6744086B2 (en) | 2001-05-15 | 2004-06-01 | Nve Corporation | Current switched magnetoresistive memory cell |
JP3482469B2 (ja) * | 2001-05-21 | 2003-12-22 | 北海道大学長 | 磁気記憶素子、磁気メモリ、磁気記録方法、磁気記憶素子の製造方法、及び磁気メモリの製造方法 |
EP1286360A3 (de) * | 2001-07-25 | 2006-12-06 | Hewlett-Packard Company | Herstellungstest für einen fehlertoleranten magnetoresistiven Speicher |
FR2828001B1 (fr) * | 2001-07-27 | 2003-10-10 | Thales Sa | Dispositif de commande de renversement de sens d'aimantation sans champ magnetique externe |
US6888703B2 (en) * | 2001-09-17 | 2005-05-03 | Headway Technologies, Inc. | Multilayered structures comprising magnetic nano-oxide layers for current perpindicular to plane GMR heads |
JP3854839B2 (ja) * | 2001-10-02 | 2006-12-06 | キヤノン株式会社 | 磁気抵抗素子を用いた不揮発固体メモリ |
US6552554B1 (en) | 2001-12-06 | 2003-04-22 | The United States Of America As Represented By The Secretary Of The Navy | Testing current perpendicular to plane giant magnetoresistance multilayer devices |
JP4184668B2 (ja) * | 2002-01-10 | 2008-11-19 | 富士通株式会社 | Cpp構造磁気抵抗効果素子 |
JP3661652B2 (ja) * | 2002-02-15 | 2005-06-15 | ソニー株式会社 | 磁気抵抗効果素子および磁気メモリ装置 |
TW595025B (en) * | 2002-03-29 | 2004-06-21 | Toshiba Corp | Solid-state magnetic element and solid-state magnetic element array |
AU2003234403A1 (en) * | 2002-05-16 | 2003-12-02 | Nova Research, Inc. | Methods of fabricating magnetoresistive memory devices |
US6621730B1 (en) * | 2002-08-27 | 2003-09-16 | Motorola, Inc. | Magnetic random access memory having a vertical write line |
US6927569B2 (en) | 2002-09-16 | 2005-08-09 | International Business Machines Corporation | Techniques for electrically characterizing tunnel junction film stacks with little or no processing |
US6956257B2 (en) | 2002-11-18 | 2005-10-18 | Carnegie Mellon University | Magnetic memory element and memory device including same |
KR100499136B1 (ko) * | 2002-12-14 | 2005-07-04 | 삼성전자주식회사 | 전자 스핀의존 산란을 이용한 자성매체 및 자성매체정보재생장치 및 재생방법 |
US7800933B2 (en) * | 2005-09-28 | 2010-09-21 | Sandisk 3D Llc | Method for using a memory cell comprising switchable semiconductor memory element with trimmable resistance |
US20070164388A1 (en) * | 2002-12-19 | 2007-07-19 | Sandisk 3D Llc | Memory cell comprising a diode fabricated in a low resistivity, programmed state |
US8637366B2 (en) * | 2002-12-19 | 2014-01-28 | Sandisk 3D Llc | Nonvolatile memory cell without a dielectric antifuse having high- and low-impedance states |
US7285464B2 (en) * | 2002-12-19 | 2007-10-23 | Sandisk 3D Llc | Nonvolatile memory cell comprising a reduced height vertical diode |
US8008700B2 (en) * | 2002-12-19 | 2011-08-30 | Sandisk 3D Llc | Non-volatile memory cell with embedded antifuse |
JP2006511965A (ja) * | 2002-12-19 | 2006-04-06 | マトリックス セミコンダクター インコーポレイテッド | 高密度不揮発性メモリを製作するための改良された方法 |
US7618850B2 (en) * | 2002-12-19 | 2009-11-17 | Sandisk 3D Llc | Method of making a diode read/write memory cell in a programmed state |
US20050226067A1 (en) * | 2002-12-19 | 2005-10-13 | Matrix Semiconductor, Inc. | Nonvolatile memory cell operating by increasing order in polycrystalline semiconductor material |
US7660181B2 (en) * | 2002-12-19 | 2010-02-09 | Sandisk 3D Llc | Method of making non-volatile memory cell with embedded antifuse |
US7800932B2 (en) | 2005-09-28 | 2010-09-21 | Sandisk 3D Llc | Memory cell comprising switchable semiconductor memory element with trimmable resistance |
US7027321B2 (en) * | 2004-01-10 | 2006-04-11 | Honeywell International Inc. | Tunneling anisotropic magnetoresistive device and method of operation |
US20070279971A1 (en) * | 2004-06-04 | 2007-12-06 | Micron Technology, Inc. | Modified pseudo-spin valve (psv) for memory applications |
US7120048B2 (en) * | 2004-06-21 | 2006-10-10 | Honeywell International Inc. | Nonvolatile memory vertical ring bit and write-read structure |
US20060023496A1 (en) * | 2004-07-27 | 2006-02-02 | Stephane Aouba | Tunable magnetic switch |
US7307268B2 (en) | 2005-01-19 | 2007-12-11 | Sandisk Corporation | Structure and method for biasing phase change memory array for reliable writing |
US7116575B1 (en) * | 2005-03-23 | 2006-10-03 | Honeywell International Inc. | Architectures for CPP ring shaped (RS) devices |
US7800934B2 (en) * | 2005-09-28 | 2010-09-21 | Sandisk 3D Llc | Programming methods to increase window for reverse write 3D cell |
US7701756B2 (en) | 2005-12-21 | 2010-04-20 | Governing Council Of The University Of Toronto | Magnetic memory composition and method of manufacture |
US20080174936A1 (en) * | 2007-01-19 | 2008-07-24 | Western Lights Semiconductor Corp. | Apparatus and Method to Store Electrical Energy |
US8072791B2 (en) * | 2007-06-25 | 2011-12-06 | Sandisk 3D Llc | Method of making nonvolatile memory device containing carbon or nitrogen doped diode |
US7684226B2 (en) * | 2007-06-25 | 2010-03-23 | Sandisk 3D Llc | Method of making high forward current diodes for reverse write 3D cell |
US7830697B2 (en) * | 2007-06-25 | 2010-11-09 | Sandisk 3D Llc | High forward current diodes for reverse write 3D cell |
US8102694B2 (en) * | 2007-06-25 | 2012-01-24 | Sandisk 3D Llc | Nonvolatile memory device containing carbon or nitrogen doped diode |
US7800939B2 (en) * | 2007-06-29 | 2010-09-21 | Sandisk 3D Llc | Method of making 3D R/W cell with reduced reverse leakage |
US7759666B2 (en) * | 2007-06-29 | 2010-07-20 | Sandisk 3D Llc | 3D R/W cell with reduced reverse leakage |
US7846782B2 (en) | 2007-09-28 | 2010-12-07 | Sandisk 3D Llc | Diode array and method of making thereof |
US7830698B2 (en) * | 2008-04-11 | 2010-11-09 | Sandisk 3D Llc | Multilevel nonvolatile memory device containing a carbon storage material and methods of making and using same |
US7812335B2 (en) * | 2008-04-11 | 2010-10-12 | Sandisk 3D Llc | Sidewall structured switchable resistor cell |
US8450835B2 (en) * | 2008-04-29 | 2013-05-28 | Sandisk 3D Llc | Reverse leakage reduction and vertical height shrinking of diode with halo doping |
US7791925B2 (en) * | 2008-10-31 | 2010-09-07 | Seagate Technology, Llc | Structures for resistive random access memory cells |
KR101215951B1 (ko) * | 2011-03-24 | 2013-01-21 | 에스케이하이닉스 주식회사 | 반도체 메모리 및 그 형성방법 |
TW201505026A (zh) * | 2013-07-17 | 2015-02-01 | Univ Nat Yunlin Sci & Tech | 環形磁阻記憶體及其寫入方法 |
US9806256B1 (en) | 2016-10-21 | 2017-10-31 | Sandisk Technologies Llc | Resistive memory device having sidewall spacer electrode and method of making thereof |
WO2019173421A1 (en) * | 2018-03-09 | 2019-09-12 | Everspin Technologies, Inc. | Three-dimensional annular magnetic tunnel junction array and fabrication thereof |
JP2020042879A (ja) * | 2018-09-12 | 2020-03-19 | キオクシア株式会社 | 磁気記憶装置 |
US10878870B2 (en) * | 2018-09-28 | 2020-12-29 | Spin Memory, Inc. | Defect propagation structure and mechanism for magnetic memory |
JP7136492B2 (ja) * | 2018-11-29 | 2022-09-13 | 国立研究開発法人物質・材料研究機構 | 磁気抵抗効果素子、磁気センサ、再生ヘッドおよび磁気記録再生装置 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5173873A (en) * | 1990-06-28 | 1992-12-22 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | High speed magneto-resistive random access memory |
EP1143434A3 (de) * | 1992-08-28 | 2001-12-12 | Canon Kabushiki Kaisha | Magnetooptisches Aufzeichnungsmedium und Informationsaufzeichungs- und Wiedergabeverfahren damit |
DE69330702T2 (de) * | 1992-10-05 | 2002-07-11 | Canon K.K., Tokio/Tokyo | Verfahren zur Herstellung eines optischen Speichermediums, Zerstäubungsmethode |
JPH06195784A (ja) * | 1992-12-28 | 1994-07-15 | Canon Inc | 光磁気記録媒体及び該媒体を用いた情報記録方法 |
US5719829A (en) * | 1993-03-04 | 1998-02-17 | Canon Kabushiki Kaisha | Magnetooptical recording medium allowing super-resolution, and information reproduction method using the medium |
JP3078145B2 (ja) * | 1993-04-23 | 2000-08-21 | キヤノン株式会社 | 光磁気記録媒体の製造方法 |
US5477482A (en) * | 1993-10-01 | 1995-12-19 | The United States Of America As Represented By The Secretary Of The Navy | Ultra high density, non-volatile ferromagnetic random access memory |
JPH07230637A (ja) * | 1994-02-18 | 1995-08-29 | Canon Inc | 光磁気記録媒体および該媒体を用いた情報記録再生方法 |
CA2142767C (en) * | 1994-02-21 | 1998-11-17 | Naoki Nishimura | Magneto-optical recording medium, and information reproducing method using the medium |
JPH07254175A (ja) * | 1994-03-16 | 1995-10-03 | Canon Inc | 光磁気記録媒体および該媒体を用いた情報記録再生方法 |
JP3164975B2 (ja) * | 1994-08-24 | 2001-05-14 | キヤノン株式会社 | 光磁気記録媒体及び該媒体を用いた情報再生方法 |
JPH08180482A (ja) * | 1994-12-27 | 1996-07-12 | Canon Inc | 光磁気記録媒体及び該媒体を用いた情報再生方法 |
US5663935A (en) * | 1995-02-08 | 1997-09-02 | Canon Kabushiki Kaisha | Magneto-optical recording medium having two magnetic layers of exchange-coupled at ferromagnetic phase |
US5541868A (en) * | 1995-02-21 | 1996-07-30 | The United States Of America As Represented By The Secretary Of The Navy | Annular GMR-based memory element |
JPH08287537A (ja) * | 1995-04-14 | 1996-11-01 | Canon Inc | 光磁気記録媒体及び該媒体を用いた情報再生方法 |
US5717662A (en) * | 1995-05-12 | 1998-02-10 | Canon Kabushiki Kaisha | Super-resolution magneto-optical recording medium using magnetostatic coupling and information reproduction method using the medium |
JPH1165871A (ja) * | 1997-08-11 | 1999-03-09 | Mitsubishi Electric Corp | ワンチップクロック同期式メモリー装置 |
-
1998
- 1998-09-16 US US09/154,859 patent/US6111784A/en not_active Expired - Fee Related
- 1998-09-17 EP EP98307552A patent/EP0910092B1/de not_active Expired - Lifetime
- 1998-09-17 DE DE69804742T patent/DE69804742T2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0910092B1 (de) | 2002-04-10 |
US6111784A (en) | 2000-08-29 |
DE69804742T2 (de) | 2002-09-26 |
EP0910092A2 (de) | 1999-04-21 |
EP0910092A3 (de) | 1999-12-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |