DE69733477T2 - Winkelpositionierung der detektoroberfläche in einem flugzeit-massenspektrometer - Google Patents

Winkelpositionierung der detektoroberfläche in einem flugzeit-massenspektrometer Download PDF

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Publication number
DE69733477T2
DE69733477T2 DE69733477T DE69733477T DE69733477T2 DE 69733477 T2 DE69733477 T2 DE 69733477T2 DE 69733477 T DE69733477 T DE 69733477T DE 69733477 T DE69733477 T DE 69733477T DE 69733477 T2 DE69733477 T2 DE 69733477T2
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DE
Germany
Prior art keywords
ion
angle
detector
deflection
plane
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69733477T
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German (de)
English (en)
Other versions
DE69733477D1 (de
Inventor
Thomas Dresch
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PerkinElmer Health Sciences Inc
Original Assignee
Analytica of Branford Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US08/694,878 external-priority patent/US5654544A/en
Application filed by Analytica of Branford Inc filed Critical Analytica of Branford Inc
Application granted granted Critical
Publication of DE69733477D1 publication Critical patent/DE69733477D1/de
Publication of DE69733477T2 publication Critical patent/DE69733477T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/025—Detectors specially adapted to particle spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/061—Ion deflecting means, e.g. ion gates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
DE69733477T 1996-08-09 1997-08-11 Winkelpositionierung der detektoroberfläche in einem flugzeit-massenspektrometer Expired - Fee Related DE69733477T2 (de)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US694878 1991-05-02
US08/694,878 US5654544A (en) 1995-08-10 1996-08-09 Mass resolution by angular alignment of the ion detector conversion surface in time-of-flight mass spectrometers with electrostatic steering deflectors
US08/880,060 US5847385A (en) 1996-08-09 1997-06-20 Mass resolution by angular alignment of the ion detector conversion surface in time-of-flight mass spectrometers with electrostatic steering deflectors
US880060 1997-06-20
PCT/US1997/014195 WO1998007179A1 (fr) 1996-08-09 1997-08-11 Alignement angulaire de la surface d'un detecteur d'ions dans des spectrometres de masse de mesure du temps de vol

Publications (2)

Publication Number Publication Date
DE69733477D1 DE69733477D1 (de) 2005-07-14
DE69733477T2 true DE69733477T2 (de) 2006-03-23

Family

ID=27105457

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69733477T Expired - Fee Related DE69733477T2 (de) 1996-08-09 1997-08-11 Winkelpositionierung der detektoroberfläche in einem flugzeit-massenspektrometer

Country Status (6)

Country Link
US (1) US5847385A (fr)
EP (1) EP0917727B1 (fr)
JP (1) JP2001523378A (fr)
AU (1) AU3914397A (fr)
DE (1) DE69733477T2 (fr)
WO (2) WO1998007176A1 (fr)

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US6369384B1 (en) 1999-06-23 2002-04-09 Agilent Technologies, Inc. Time-of-flight mass spectrometer with post-deflector filter assembly
US6365893B1 (en) 1999-11-23 2002-04-02 Agilent Technologies, Inc. Internal calibration of time to mass conversion in time-of-flight mass spectrometry
AU2001229351A1 (en) * 2000-01-25 2001-08-07 Boston Scientific Limited Manufacturing medical devices by vapor deposition
US7084395B2 (en) * 2001-05-25 2006-08-01 Ionwerks, Inc. Time-of-flight mass spectrometer for monitoring of fast processes
US20040124351A1 (en) * 2001-09-25 2004-07-01 Pineda Fernando J Method for calibration of time-of-flight mass spectrometers
DE10156604A1 (de) * 2001-11-17 2003-05-28 Bruker Daltonik Gmbh Raumwinkelfokussierender Reflektor für Flugzeitmassenspektrometer
DE10162267B4 (de) * 2001-12-18 2007-05-31 Bruker Daltonik Gmbh Reflektor für Flugzeitmassenspektrometer mit orthogonalem Ioneneinschuss
GB0200469D0 (en) * 2002-01-10 2002-02-27 Amersham Biosciences Ab Adaptive mounting
JP5357538B2 (ja) * 2005-03-22 2013-12-04 レコ コーポレイション 等時性湾曲イオンインタフェースを備えた多重反射型飛行時間質量分析計
CN105206500B (zh) * 2005-10-11 2017-12-26 莱克公司 具有正交加速的多次反射飞行时间质谱仪
US7709789B2 (en) * 2008-05-29 2010-05-04 Virgin Instruments Corporation TOF mass spectrometry with correction for trajectory error
US8373120B2 (en) * 2008-07-28 2013-02-12 Leco Corporation Method and apparatus for ion manipulation using mesh in a radio frequency field
US7932491B2 (en) * 2009-02-04 2011-04-26 Virgin Instruments Corporation Quantitative measurement of isotope ratios by time-of-flight mass spectrometry
US20100301202A1 (en) * 2009-05-29 2010-12-02 Virgin Instruments Corporation Tandem TOF Mass Spectrometer With High Resolution Precursor Selection And Multiplexed MS-MS
US8674292B2 (en) 2010-12-14 2014-03-18 Virgin Instruments Corporation Reflector time-of-flight mass spectrometry with simultaneous space and velocity focusing
US8461521B2 (en) 2010-12-14 2013-06-11 Virgin Instruments Corporation Linear time-of-flight mass spectrometry with simultaneous space and velocity focusing
US20110049350A1 (en) * 2009-08-27 2011-03-03 Virgin Instruments Corporation Tandem TOF Mass Spectrometer With Pulsed Accelerator To Reduce Velocity Spread
US8847155B2 (en) 2009-08-27 2014-09-30 Virgin Instruments Corporation Tandem time-of-flight mass spectrometry with simultaneous space and velocity focusing
US8399828B2 (en) * 2009-12-31 2013-03-19 Virgin Instruments Corporation Merged ion beam tandem TOF-TOF mass spectrometer
US8698107B2 (en) * 2011-01-10 2014-04-15 Varian Semiconductor Equipment Associates, Inc. Technique and apparatus for monitoring ion mass, energy, and angle in processing systems
GB201108082D0 (en) * 2011-05-16 2011-06-29 Micromass Ltd Segmented planar calibration for correction of errors in time of flight mass spectrometers
JP5885474B2 (ja) * 2011-11-17 2016-03-15 キヤノン株式会社 質量分布分析方法及び質量分布分析装置
CN104254903B (zh) * 2012-04-26 2017-05-24 莱克公司 具有快速响应的电子轰击离子源
US8735810B1 (en) 2013-03-15 2014-05-27 Virgin Instruments Corporation Time-of-flight mass spectrometer with ion source and ion detector electrically connected
WO2015026727A1 (fr) 2013-08-19 2015-02-26 Virgin Instruments Corporation Système optique ionique de spectromètre de masse maldi-tof
US9536723B1 (en) * 2015-02-06 2017-01-03 Agilent Technologies, Inc. Thin field terminator for linear quadrupole ion guides, and related systems and methods
GB2543036A (en) * 2015-10-01 2017-04-12 Shimadzu Corp Time of flight mass spectrometer
GB2567794B (en) 2017-05-05 2023-03-08 Micromass Ltd Multi-reflecting time-of-flight mass spectrometers
GB2563571B (en) 2017-05-26 2023-05-24 Micromass Ltd Time of flight mass analyser with spatial focussing
US11295944B2 (en) 2017-08-06 2022-04-05 Micromass Uk Limited Printed circuit ion mirror with compensation
WO2019030477A1 (fr) * 2017-08-06 2019-02-14 Anatoly Verenchikov Accélérateur pour spectromètres de masse à passages multiples
WO2019030472A1 (fr) 2017-08-06 2019-02-14 Anatoly Verenchikov Miroir ionique servant à des spectromètres de masse à réflexion multiple
JP6808669B2 (ja) * 2018-03-14 2021-01-06 日本電子株式会社 質量分析装置
GB201806507D0 (en) 2018-04-20 2018-06-06 Verenchikov Anatoly Gridless ion mirrors with smooth fields
GB201807626D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
GB201807605D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
JP6874906B2 (ja) * 2018-05-16 2021-05-19 株式会社島津製作所 飛行時間型質量分析装置
GB201808459D0 (en) * 2018-05-23 2018-07-11 Thermo Fisher Scient Bremen Gmbh Ion front tilt correction for time of flight(tof) mass spectrometer
GB201808530D0 (en) 2018-05-24 2018-07-11 Verenchikov Anatoly TOF MS detection system with improved dynamic range
GB201810573D0 (en) 2018-06-28 2018-08-15 Verenchikov Anatoly Multi-pass mass spectrometer with improved duty cycle
GB2576745B (en) * 2018-08-30 2022-11-02 Brian Hoyes John Pulsed accelerator for time of flight mass spectrometers

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US2642535A (en) * 1946-10-18 1953-06-16 Rca Corp Mass spectrometer
US2938116A (en) * 1956-04-02 1960-05-24 Vard Products Inc Molecular mass spectrometer
FR2514905A1 (fr) * 1981-10-21 1983-04-22 Commissariat Energie Atomique Dispositif de mesure d'un courant ionique produit par un faisceau d'ions
DE3842044A1 (de) * 1988-12-14 1990-06-21 Forschungszentrum Juelich Gmbh Flugzeit(massen)spektrometer mit hoher aufloesung und transmission
US5160840A (en) * 1991-10-25 1992-11-03 Vestal Marvin L Time-of-flight analyzer and method
US5689111A (en) * 1995-08-10 1997-11-18 Analytica Of Branford, Inc. Ion storage time-of-flight mass spectrometer
US5654544A (en) * 1995-08-10 1997-08-05 Analytica Of Branford Mass resolution by angular alignment of the ion detector conversion surface in time-of-flight mass spectrometers with electrostatic steering deflectors

Also Published As

Publication number Publication date
AU3914397A (en) 1998-03-06
JP2001523378A (ja) 2001-11-20
WO1998007176A1 (fr) 1998-02-19
DE69733477D1 (de) 2005-07-14
EP0917727A1 (fr) 1999-05-26
EP0917727B1 (fr) 2005-06-08
EP0917727A4 (fr) 2000-07-12
WO1998007179A1 (fr) 1998-02-19
US5847385A (en) 1998-12-08

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