DE69732085D1 - Anordnung und Verfahren zur Phasenmessung - Google Patents

Anordnung und Verfahren zur Phasenmessung

Info

Publication number
DE69732085D1
DE69732085D1 DE69732085T DE69732085T DE69732085D1 DE 69732085 D1 DE69732085 D1 DE 69732085D1 DE 69732085 T DE69732085 T DE 69732085T DE 69732085 T DE69732085 T DE 69732085T DE 69732085 D1 DE69732085 D1 DE 69732085D1
Authority
DE
Germany
Prior art keywords
arrangement
phase measurement
measurement
phase
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69732085T
Other languages
English (en)
Other versions
DE69732085T2 (de
Inventor
Stephen F Blazo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Application granted granted Critical
Publication of DE69732085D1 publication Critical patent/DE69732085D1/de
Publication of DE69732085T2 publication Critical patent/DE69732085T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
    • H04L1/205—Arrangements for detecting or preventing errors in the information received using signal quality detector jitter monitoring

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Synchronisation In Digital Transmission Systems (AREA)
  • Measuring Phase Differences (AREA)
  • Time-Division Multiplex Systems (AREA)
  • Dc Digital Transmission (AREA)
DE69732085T 1996-09-10 1997-07-18 Anordnung und Verfahren zur Phasenmessung Expired - Lifetime DE69732085T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US711837 1991-06-07
US08/711,837 US5754437A (en) 1996-09-10 1996-09-10 Phase measurement apparatus and method

Publications (2)

Publication Number Publication Date
DE69732085D1 true DE69732085D1 (de) 2005-02-03
DE69732085T2 DE69732085T2 (de) 2005-06-02

Family

ID=24859736

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69732085T Expired - Lifetime DE69732085T2 (de) 1996-09-10 1997-07-18 Anordnung und Verfahren zur Phasenmessung

Country Status (4)

Country Link
US (1) US5754437A (de)
EP (1) EP0849907B1 (de)
JP (1) JP3062880B2 (de)
DE (1) DE69732085T2 (de)

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US6144712A (en) * 1997-10-09 2000-11-07 Broadcom Corporation Variable rate modulator
US5886752A (en) * 1997-12-22 1999-03-23 Rockwell International Spurious free wideband phase and frequency modulator using a direct digital synthesis alias frequency band
US6085345A (en) * 1997-12-24 2000-07-04 Intel Corporation Timing control for input/output testability
US6243652B1 (en) * 1998-06-10 2001-06-05 Hubbell Incorporated System for concurrent digital measurement of peak voltage and RMS voltage in high voltage system
ES2153740B1 (es) * 1998-07-08 2001-10-01 Univ Valencia Politecnica Sistema para compensar los efectos de rozamiento viscoso en la medida de la frecuencia de resonancia de un cristal piezometrico en un fluido
TW559668B (en) 1999-02-08 2003-11-01 Advantest Corp Apparatus for and method of measuring a jitter
US6157232A (en) * 1999-03-18 2000-12-05 Nec Corporation Local clock generator
GB9911750D0 (en) 1999-05-21 1999-07-21 Hewlett Packard Co Method and apparatus for measuring parameters of an electrical system
US6640193B2 (en) * 1999-12-15 2003-10-28 Texas Instruments Incorporated Method and system for measuring jitter
US6980592B1 (en) * 1999-12-23 2005-12-27 Agere Systems Inc. Digital adaptive equalizer for T1/E1 long haul transceiver
DE60038672T2 (de) * 1999-12-24 2009-05-28 Anritsu Corp. Wandergenerator und diesen enthaltender digitaler leitungsprüfer
US7245638B2 (en) * 2000-07-21 2007-07-17 Broadcom Corporation Methods and systems for DSP-based receivers
US6542914B1 (en) 2000-09-01 2003-04-01 Lecroy Corporation Method and apparatus for increasing bandwidth in sampled systems
US7082182B2 (en) * 2000-10-06 2006-07-25 The University Of North Carolina At Chapel Hill Computed tomography system for imaging of human and small animal
US6614216B2 (en) * 2001-02-07 2003-09-02 Square D Company System and method for intersample timing error reduction
US7127018B2 (en) * 2001-03-20 2006-10-24 Advantest Corporation Apparatus for and method of measuring clock skew
EP1244241B1 (de) * 2001-03-20 2006-10-18 Agilent Technologies, Inc. (a Delaware corporation) Verfahren und Einrichtung zur Netzwerkmessung
US6701335B2 (en) * 2002-02-27 2004-03-02 Lecroy Corporation Digital frequency response compensator and arbitrary response generator system
TW522654B (en) * 2002-03-26 2003-03-01 Via Tech Inc Apparatus and method for measuring jitter of phase lock loop signal
US7302237B2 (en) * 2002-07-23 2007-11-27 Mercury Computer Systems, Inc. Wideband signal generators, measurement devices, methods of signal generation, and methods of signal analysis
US7170964B2 (en) * 2002-08-07 2007-01-30 Broadcom Corporation Transition insensitive timing recovery method and apparatus
US7460499B2 (en) * 2003-01-17 2008-12-02 Texas Instruments Incorporated Modulation noise estimation mechanism
JP3961437B2 (ja) * 2003-03-24 2007-08-22 アンリツ株式会社 伝送状態表示装置
DE102004007648B3 (de) * 2004-02-17 2005-09-08 Infineon Technologies Ag Phasenregelkreis und Verfahren zur Bewertung eines Jitters eines Phasenregelkreises
CN1989751B (zh) * 2004-07-15 2011-07-13 汤姆森特许公司 改进的载波恢复的系统和方法
US20060020650A1 (en) * 2004-07-20 2006-01-26 Guozhong Shen Ripple elimination filter
CN1770633B (zh) * 2004-10-26 2010-04-14 大唐移动通信设备有限公司 时钟锁相环及时钟锁相的控制方法
US7593495B2 (en) * 2005-03-30 2009-09-22 Arris Group, Inc. Method for performing high resolution phase alignment of multiple clocks using low resolution converters
US8155262B2 (en) * 2005-04-25 2012-04-10 The University Of North Carolina At Chapel Hill Methods, systems, and computer program products for multiplexing computed tomography
US7778319B2 (en) * 2005-11-04 2010-08-17 Advantest Corporation Jitter measuring apparatus, jitter measuring method and test apparatus
US8068538B2 (en) * 2005-11-04 2011-11-29 Advantest Corporation Jitter measuring apparatus, jitter measuring method and test apparatus
US20070201595A1 (en) * 2006-02-24 2007-08-30 Stimple James R Clock recovery system
US7571339B2 (en) * 2006-04-19 2009-08-04 Agilent Technologies, Inc. Clock recovery system with triggered phase error measurement
TWI308430B (en) * 2006-04-26 2009-04-01 Ind Tech Res Inst Phase tracking method and device thereof
US8189893B2 (en) * 2006-05-19 2012-05-29 The University Of North Carolina At Chapel Hill Methods, systems, and computer program products for binary multiplexing x-ray radiography
US20080072130A1 (en) * 2006-05-31 2008-03-20 Stimple James R Pattern-triggered measurement system
US8363559B2 (en) * 2006-09-25 2013-01-29 Lantiq Deutschland Gmbh Method and system for providing information for recovering a clock frequency
JP2010010773A (ja) * 2008-06-24 2010-01-14 Kyoraku Sangyo Kk Ｐｌｌ制御装置及びｐｌｌ制御方法
US8600003B2 (en) 2009-01-16 2013-12-03 The University Of North Carolina At Chapel Hill Compact microbeam radiation therapy systems and methods for cancer treatment and research
US8693876B2 (en) * 2009-01-23 2014-04-08 Ciena Corporation High speed signal generator
CN102435865A (zh) * 2011-10-17 2012-05-02 无锡东集电子有限责任公司 基于自参考信号的可校准抖动测量电路
CN102749514B (zh) * 2012-07-27 2014-09-03 中国科学院半导体研究所 基于SOBI及FastICA的同频信号相位差测量方法
JP6164680B2 (ja) * 2012-12-27 2017-07-19 リーダー電子株式会社 ジッタ関連データを生成する方法および装置
CN103344830B (zh) * 2013-05-30 2015-11-18 国家电网公司 一种合闸相位检测方法
CN103616580B (zh) * 2013-11-08 2016-04-13 北京博电新力电气股份有限公司 合并单元数据转换角差测试方法
KR101457558B1 (ko) * 2014-06-13 2014-11-04 주식회사 앨엔비 기지국용 기준신호 공급 장치
US10980494B2 (en) 2014-10-20 2021-04-20 The University Of North Carolina At Chapel Hill Systems and related methods for stationary digital chest tomosynthesis (s-DCT) imaging
CN104991121B (zh) * 2015-06-16 2018-01-16 中国电子科技集团公司第二十二研究所 一种扫频阵列校准方法
US9613652B2 (en) 2015-07-24 2017-04-04 Seagate Technology Llc Phase error recovery circuitry and method for a magnetic recording device
US9525576B1 (en) 2015-07-24 2016-12-20 Seagate Technology Llc Self-adapting phase-locked loop filter for use in a read channel
CN106814339B (zh) * 2015-11-27 2019-11-12 西门子(深圳)磁共振有限公司 相位信息获取方法、系统及磁共振成像系统
WO2017152412A1 (zh) * 2016-03-11 2017-09-14 华为技术有限公司 支持多时钟域时钟传递的设备和方法
CN109324215B (zh) * 2018-09-21 2022-04-19 北京无线电计量测试研究所 一种基于dds的标准相位产生方法和装置
CN112595893B (zh) * 2020-11-16 2023-09-08 闽南理工学院 一种基于自适应滤波器的电网相位同步信号检测方法
WO2023272373A1 (en) * 2021-06-29 2023-01-05 Magna International Inc. Overcurrent detection using a programmable logic device

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JPH0624345B2 (ja) * 1986-04-28 1994-03-30 日本電気株式会社 予備回線監視回路
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US5402443A (en) * 1992-12-15 1995-03-28 National Semiconductor Corp. Device and method for measuring the jitter of a recovered clock signal
US5425060A (en) * 1993-01-25 1995-06-13 Harris Corporation Mechanism for reducing timing jitter in clock recovery scheme for blind acquisition of full duplex signals
US5517685A (en) * 1993-04-27 1996-05-14 Matsushita Electric Industrial Co., Ltd. PLL circuit having a multiloop, and FM receiving method and apparatus able to utilize the same
US5373255A (en) * 1993-07-28 1994-12-13 Motorola, Inc. Low-power, jitter-compensated phase locked loop and method therefor
US5406592A (en) * 1993-07-30 1995-04-11 At&T Corp. First order FLL/PLL system with low phase error
US5493243A (en) * 1994-01-04 1996-02-20 Level One Communications, Inc. Digitally controlled first order jitter attentuator using a digital frequency synthesizer
US5506627A (en) * 1994-06-10 1996-04-09 Tektronix, Inc. Phase locked loop chain for locking audio sampling to serial digital component vide timing
US5438254A (en) * 1994-07-29 1995-08-01 Ho; Edmond Y. Phase difference measuring device
KR970009688B1 (ko) * 1994-10-19 1997-06-17 엘지정보통신 주식회사 지터 억압회로
US5608761A (en) * 1994-12-09 1997-03-04 Motorola, Inc. Method, device, and radio for compensating for modulator frequency drift while allowing for data transmission
US5757652A (en) * 1995-12-21 1998-05-26 Tektronix, Inc. Electrical signal jitter and wander measurement system and method

Also Published As

Publication number Publication date
EP0849907A3 (de) 1999-11-24
EP0849907B1 (de) 2004-12-29
EP0849907A2 (de) 1998-06-24
DE69732085T2 (de) 2005-06-02
JP3062880B2 (ja) 2000-07-12
JPH10153626A (ja) 1998-06-09
US5754437A (en) 1998-05-19

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