DE69725808D1 - Mikrorechner mit Selbstprüfungseinheit - Google Patents

Mikrorechner mit Selbstprüfungseinheit

Info

Publication number
DE69725808D1
DE69725808D1 DE69725808T DE69725808T DE69725808D1 DE 69725808 D1 DE69725808 D1 DE 69725808D1 DE 69725808 T DE69725808 T DE 69725808T DE 69725808 T DE69725808 T DE 69725808T DE 69725808 D1 DE69725808 D1 DE 69725808D1
Authority
DE
Germany
Prior art keywords
microcomputer
self
test unit
test
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69725808T
Other languages
English (en)
Other versions
DE69725808T2 (de
Inventor
Nobushi Takahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Electronics Corp
Original Assignee
NEC Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Electronics Corp filed Critical NEC Electronics Corp
Application granted granted Critical
Publication of DE69725808D1 publication Critical patent/DE69725808D1/de
Publication of DE69725808T2 publication Critical patent/DE69725808T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Debugging And Monitoring (AREA)
  • Microcomputers (AREA)
DE69725808T 1996-08-28 1997-08-27 Mikrorechner mit Selbstprüfungseinheit Expired - Fee Related DE69725808T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP08226581A JP3141787B2 (ja) 1996-08-28 1996-08-28 マイクロコンピュータ
JP22658196 1996-08-28

Publications (2)

Publication Number Publication Date
DE69725808D1 true DE69725808D1 (de) 2003-12-04
DE69725808T2 DE69725808T2 (de) 2004-05-19

Family

ID=16847422

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69725808T Expired - Fee Related DE69725808T2 (de) 1996-08-28 1997-08-27 Mikrorechner mit Selbstprüfungseinheit

Country Status (5)

Country Link
US (1) US6125456A (de)
EP (1) EP0827080B1 (de)
JP (1) JP3141787B2 (de)
KR (1) KR19980019215A (de)
DE (1) DE69725808T2 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19833208C1 (de) 1998-07-23 1999-10-28 Siemens Ag Integrierte Schaltung mit einer Selbsttesteinrichtung zur Durchführung eines Selbsttests der integrierten Schaltung
DE10041697A1 (de) * 2000-08-24 2002-03-14 Infineon Technologies Ag Verfahren zum Testen einer programmgesteuerten Einheit durch eine externe Testvorrichtung
EP1496435A1 (de) * 2003-07-11 2005-01-12 Yogitech Spa Gesicherte Mikrokontroller, Verfahren zum Entwurf eines gesichertes Mikrokontrollers, und Computerprogrammprodukt dafür
US7856549B2 (en) * 2007-01-24 2010-12-21 Hewlett-Packard Development Company, L.P. Regulating power consumption
GB2561881A (en) 2017-04-27 2018-10-31 Airbus Group Ltd Microcontroller

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0018736A1 (de) * 1979-05-01 1980-11-12 Motorola, Inc. Selbstprüfender Microcomputer und Prüfverfahren
JPS5696331A (en) * 1979-12-28 1981-08-04 Fujitsu Ltd Panel function control system
JPS5920069A (ja) * 1982-07-26 1984-02-01 Toshiba Corp １チツプマイクロコンピユ−タ
EP0153764B1 (de) * 1984-03-02 1993-11-03 Nec Corporation Informationsverarbeitungseinheit mit Unterbrechungsfunktion
JPS60183639A (ja) * 1984-03-02 1985-09-19 Nec Corp デ−タ処理装置
JPH0821028B2 (ja) * 1986-04-23 1996-03-04 株式会社日立製作所 デ−タ処理装置
JPS6367647A (ja) * 1986-09-09 1988-03-26 Yokogawa Electric Corp マイクロプロセツサ応用機器
JPH0212432A (ja) * 1988-06-30 1990-01-17 Nec Corp データ処理装置
JPH06105432B2 (ja) * 1989-06-01 1994-12-21 三菱電機株式会社 マイクロプロセッサ
JPH0410138A (ja) * 1990-04-27 1992-01-14 Omron Corp テストプログラム機能付き制御装置
JPH04178742A (ja) * 1990-11-13 1992-06-25 Mitsubishi Electric Corp 装置診断制御方式
JPH05233352A (ja) * 1992-02-19 1993-09-10 Nec Corp マイクロプロセッサ
EP0569969B1 (de) * 1992-05-12 1998-03-04 Nec Corporation Mikrocomputer mit Befehlsspeicher für Befehle zum Auslesen interner Bedingungen
JPH06162225A (ja) * 1992-11-17 1994-06-10 Hitachi Ltd 自己テスト機能内蔵シングルチップマイコン
JP3323009B2 (ja) * 1994-09-29 2002-09-09 日本電気株式会社 データ処理装置
JPH08137824A (ja) * 1994-11-15 1996-05-31 Mitsubishi Semiconductor Software Kk セルフテスト機能内蔵シングルチップマイコン

Also Published As

Publication number Publication date
DE69725808T2 (de) 2004-05-19
JPH1069399A (ja) 1998-03-10
JP3141787B2 (ja) 2001-03-05
KR19980019215A (ko) 1998-06-05
EP0827080B1 (de) 2003-10-29
EP0827080A2 (de) 1998-03-04
US6125456A (en) 2000-09-26
EP0827080A3 (de) 1999-05-06

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee