DE69714356D1 - Plasma-Massenspektrometer - Google Patents

Plasma-Massenspektrometer

Info

Publication number
DE69714356D1
DE69714356D1 DE69714356T DE69714356T DE69714356D1 DE 69714356 D1 DE69714356 D1 DE 69714356D1 DE 69714356 T DE69714356 T DE 69714356T DE 69714356 T DE69714356 T DE 69714356T DE 69714356 D1 DE69714356 D1 DE 69714356D1
Authority
DE
Germany
Prior art keywords
mass spectrometer
plasma mass
plasma
spectrometer
mass
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69714356T
Other languages
English (en)
Other versions
DE69714356T2 (de
Inventor
James Speakman
Raymond Clive Haines
Patrick James Turner
Thomas Oliver Merren
Stuart Alan Jarvis
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micromass UK Ltd
Original Assignee
Micromass UK Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=10795023&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE69714356(D1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Micromass UK Ltd filed Critical Micromass UK Ltd
Publication of DE69714356D1 publication Critical patent/DE69714356D1/de
Application granted granted Critical
Publication of DE69714356T2 publication Critical patent/DE69714356T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H01J49/063—Multipole ion guides, e.g. quadrupoles, hexapoles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/0481—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for collisional cooling
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
DE69714356T 1996-06-10 1997-05-30 Plasma-Massenspektrometer Expired - Lifetime DE69714356T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB9612070.4A GB9612070D0 (en) 1996-06-10 1996-06-10 Plasma mass spectrometer

Publications (2)

Publication Number Publication Date
DE69714356D1 true DE69714356D1 (de) 2002-09-05
DE69714356T2 DE69714356T2 (de) 2002-11-21

Family

ID=10795023

Family Applications (3)

Application Number Title Priority Date Filing Date
DE69714356T Expired - Lifetime DE69714356T2 (de) 1996-06-10 1997-05-30 Plasma-Massenspektrometer
DE0813228T Pending DE813228T1 (de) 1996-06-10 1997-05-30 Plasma-Massenspektrometer
DE69740125T Expired - Lifetime DE69740125D1 (de) 1996-06-10 1997-05-30 Plasmamassenspektrometer

Family Applications After (2)

Application Number Title Priority Date Filing Date
DE0813228T Pending DE813228T1 (de) 1996-06-10 1997-05-30 Plasma-Massenspektrometer
DE69740125T Expired - Lifetime DE69740125D1 (de) 1996-06-10 1997-05-30 Plasmamassenspektrometer

Country Status (7)

Country Link
US (3) US6222185B1 (de)
EP (2) EP1246225B1 (de)
JP (1) JP3493460B2 (de)
AU (1) AU713008C (de)
CA (1) CA2206667C (de)
DE (3) DE69714356T2 (de)
GB (1) GB9612070D0 (de)

Families Citing this family (51)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6259091B1 (en) 1996-01-05 2001-07-10 Battelle Memorial Institute Apparatus for reduction of selected ion intensities in confined ion beams
US5942752A (en) * 1996-05-17 1999-08-24 Hewlett-Packard Company Higher pressure ion source for two dimensional radio-frequency quadrupole electric field for mass spectrometer
GB9612070D0 (en) * 1996-06-10 1996-08-14 Micromass Ltd Plasma mass spectrometer
US6140638A (en) * 1997-06-04 2000-10-31 Mds Inc. Bandpass reactive collision cell
JP3904322B2 (ja) * 1998-04-20 2007-04-11 株式会社日立製作所 分析装置
US6069355A (en) * 1998-05-14 2000-05-30 Varian, Inc. Ion trap mass pectrometer with electrospray ionization
GB2341270A (en) 1998-09-02 2000-03-08 Shimadzu Corp Mass spectrometer having ion lens composed of plurality of virtual rods comprising plurality of electrodes
GB9820210D0 (en) 1998-09-16 1998-11-11 Vg Elemental Limited Means for removing unwanted ions from an ion transport system and mass spectrometer
US6528784B1 (en) 1999-12-03 2003-03-04 Thermo Finnigan Llc Mass spectrometer system including a double ion guide interface and method of operation
CA2326514A1 (en) * 2000-01-10 2001-07-10 Mds Inc. An apparatus for and method of discriminating against unwanted ionized species in mass spectrometry with collision and reaction devices
JP2002015699A (ja) * 2000-06-28 2002-01-18 Shimadzu Corp イオンガイドおよびこれを用いた質量分析装置
AUPQ861500A0 (en) * 2000-07-06 2000-08-03 Varian Australia Pty Ltd Plasma source for spectrometry
US6576897B1 (en) * 2000-09-13 2003-06-10 Varian, Inc. Lens-free ion collision cell
US6627912B2 (en) * 2001-05-14 2003-09-30 Mds Inc. Method of operating a mass spectrometer to suppress unwanted ions
JP4569049B2 (ja) * 2001-06-06 2010-10-27 株式会社島津製作所 質量分析装置
DE10297199T5 (de) * 2001-09-10 2004-08-12 Varian Australia Pty. Ltd., Mulgrave Vorrichtung und Verfahren zur Elementaren Massenspektrometrie
AU2002328668B2 (en) * 2001-09-10 2006-09-28 Agilent Technologies Australia (M) Pty Ltd Apparatus and method for elemental mass spectrometry
US7119330B2 (en) 2002-03-08 2006-10-10 Varian Australia Pty Ltd Plasma mass spectrometer
GB0210930D0 (en) 2002-05-13 2002-06-19 Thermo Electron Corp Improved mass spectrometer and mass filters therefor
US6914242B2 (en) * 2002-12-06 2005-07-05 Agilent Technologies, Inc. Time of flight ion trap tandem mass spectrometer system
CA2517700C (en) * 2003-03-19 2009-11-17 Thermo Finnigan Llc Obtaining tandem mass spectrometry data for multiple parent ions in an ion population
GB0514964D0 (en) 2005-07-21 2005-08-24 Ms Horizons Ltd Mass spectrometer devices & methods of performing mass spectrometry
JP4193734B2 (ja) 2004-03-11 2008-12-10 株式会社島津製作所 質量分析装置
US7424980B2 (en) * 2004-04-08 2008-09-16 Bristol-Myers Squibb Company Nano-electrospray nebulizer
DE102004037511B4 (de) * 2004-08-03 2007-08-23 Bruker Daltonik Gmbh Multipole durch Drahterosion
GB0427634D0 (en) * 2004-12-17 2005-01-19 Micromass Ltd Mass spectrometer
EP1984934A4 (de) * 2006-02-08 2015-01-14 Dh Technologies Dev Pte Ltd Hochfrequenzionenführung
CA2656197C (en) 2006-07-10 2015-06-16 John Brian Hoyes Mass spectrometer
US7927329B2 (en) * 2006-09-28 2011-04-19 Covidien Ag Temperature sensing return electrode pad
US8507850B2 (en) * 2007-05-31 2013-08-13 Perkinelmer Health Sciences, Inc. Multipole ion guide interface for reduced background noise in mass spectrometry
US8334506B2 (en) 2007-12-10 2012-12-18 1St Detect Corporation End cap voltage control of ion traps
US20090194679A1 (en) * 2008-01-31 2009-08-06 Agilent Technologies, Inc. Methods and apparatus for reducing noise in mass spectrometry
US7973277B2 (en) 2008-05-27 2011-07-05 1St Detect Corporation Driving a mass spectrometer ion trap or mass filter
GB2484488B (en) * 2010-10-12 2013-04-17 Vg Systems Ltd Improvements in and relating to ion guns
JP5792561B2 (ja) * 2011-08-25 2015-10-14 株式会社日立製作所 自動クリーニング機能付き質量分析装置
US8378293B1 (en) 2011-09-09 2013-02-19 Agilent Technologies, Inc. In-situ conditioning in mass spectrometer systems
WO2013134833A1 (en) * 2012-03-16 2013-09-19 Bruker Biosciences Pty Ltd An improved interface for mass spectrometry apparatus
US20140138533A1 (en) * 2012-11-19 2014-05-22 Canon Kabushiki Kaisha Ion mass selector, ion irradiation device, surface analysis device, and ion mass selecting method
GB2535754A (en) 2015-02-26 2016-08-31 Nu Instr Ltd Mass spectrometers
GB2541383B (en) 2015-08-14 2018-12-12 Thermo Fisher Scient Bremen Gmbh Mirror lens for directing an ion beam
GB2546060B (en) 2015-08-14 2018-12-19 Thermo Fisher Scient Bremen Gmbh Multi detector mass spectrometer and spectrometry method
GB2541384B (en) 2015-08-14 2018-11-14 Thermo Fisher Scient Bremen Gmbh Collision cell having an axial field
GB201519830D0 (en) * 2015-11-10 2015-12-23 Micromass Ltd A method of transmitting ions through an aperture
GB2544484B (en) 2015-11-17 2019-01-30 Thermo Fisher Scient Bremen Gmbh Addition of reactive species to ICP source in a mass spectrometer
GB2549248B (en) 2016-01-12 2020-07-22 Thermo Fisher Scient Bremen Gmbh IRMS sample introduction system and method
GB2561142B (en) 2016-12-19 2019-05-08 Thermo Fisher Scient Bremen Gmbh Determination of isobaric interferences in a mass spectrometer
GB2568178B (en) * 2017-02-23 2020-09-02 Thermo Fisher Scient (Bremen) Gmbh Methods in mass spectrometry using collision gas as ion source
GB2560160B (en) 2017-02-23 2021-08-18 Thermo Fisher Scient Bremen Gmbh Methods in mass spectrometry using collision gas as ion source
WO2019011175A1 (zh) 2017-07-12 2019-01-17 赵晓峰 一种存储和传输正负离子的装置和方法
US10580632B2 (en) 2017-12-18 2020-03-03 Agilent Technologies, Inc. In-situ conditioning in mass spectrometry systems
CN114242560A (zh) * 2021-11-02 2022-03-25 中国原子能科学研究院 一种用于排除同量异位素的激光光解装置及方法

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4234791A (en) * 1978-11-13 1980-11-18 Research Corporation Tandem quadrupole mass spectrometer for selected ion fragmentation studies and low energy collision induced dissociator therefor
US4328420A (en) * 1980-07-28 1982-05-04 French John B Tandem mass spectrometer with open structure AC-only rod sections, and method of operating a mass spectrometer system
CA1245778A (en) 1985-10-24 1988-11-29 John B. French Mass analyzer system with reduced drift
US4963735A (en) * 1988-11-11 1990-10-16 Hitachi, Ltd. Plasma source mass spectrometer
CA1307859C (en) 1988-12-12 1992-09-22 Donald James Douglas Mass spectrometer and method with improved ion transmission
JP2543761B2 (ja) * 1989-03-23 1996-10-16 セイコー電子工業株式会社 誘導結合プラズマ質量分析装置
GB9110960D0 (en) * 1991-05-21 1991-07-10 Logicflit Limited Mass spectrometer
DE4202123C2 (de) 1992-01-27 1995-04-06 Bruker Franzen Analytik Gmbh Vorrichtung für die massenspektrometrische Untersuchung schneller organischer Ionen
US5248875A (en) 1992-04-24 1993-09-28 Mds Health Group Limited Method for increased resolution in tandem mass spectrometry
US5381008A (en) 1993-05-11 1995-01-10 Mds Health Group Ltd. Method of plasma mass analysis with reduced space charge effects
JP3367719B2 (ja) 1993-09-20 2003-01-20 株式会社日立製作所 質量分析計および静電レンズ
JP3404849B2 (ja) 1993-12-29 2003-05-12 株式会社島津製作所 Ｍｓ／ｍｓ型質量分析装置
ES2331494T3 (es) 1994-02-28 2010-01-05 Perkinelmer Health Sciences, Inc. Guia de iones multipolar para espectrometria de masas.
JPH0836989A (ja) 1994-07-26 1996-02-06 Shimadzu Corp 四重極型ｍｓ／ｍｓ質量分析装置
DE19520319A1 (de) * 1995-06-02 1996-12-12 Bruker Franzen Analytik Gmbh Verfahren und Vorrichtung für die Einführung von Ionen in Quadrupol-Ionenfallen
US5576540A (en) * 1995-08-11 1996-11-19 Mds Health Group Limited Mass spectrometer with radial ejection
US5767512A (en) 1996-01-05 1998-06-16 Battelle Memorial Institute Method for reduction of selected ion intensities in confined ion beams
US5672868A (en) * 1996-02-16 1997-09-30 Varian Associates, Inc. Mass spectrometer system and method for transporting and analyzing ions
GB9612070D0 (en) * 1996-06-10 1996-08-14 Micromass Ltd Plasma mass spectrometer

Also Published As

Publication number Publication date
US6545270B2 (en) 2003-04-08
DE813228T1 (de) 1998-06-25
EP1246225B1 (de) 2011-02-16
DE69740125D1 (de) 2011-03-31
AU713008B2 (en) 1999-11-18
US20010010354A1 (en) 2001-08-02
JP3493460B2 (ja) 2004-02-03
EP0813228B1 (de) 2002-07-31
CA2206667C (en) 2001-04-17
EP1246225A1 (de) 2002-10-02
US6222185B1 (en) 2001-04-24
DE69714356T2 (de) 2002-11-21
AU2370297A (en) 1997-12-18
AU713008C (en) 2003-09-18
JPH10188879A (ja) 1998-07-21
EP0813228A1 (de) 1997-12-17
CA2206667A1 (en) 1997-12-10
US20030160168A1 (en) 2003-08-28
US6707032B2 (en) 2004-03-16
GB9612070D0 (en) 1996-08-14

Similar Documents

Publication Publication Date Title
DE69714356D1 (de) Plasma-Massenspektrometer
DE69629920D1 (de) Massenspektrometer
DE69536105D1 (de) Massenspektrometer
DE69737478D1 (de) Miniaturspektrometer
DE69518386T2 (de) Spektrometer
DE69720878D1 (de) Plasmaanzeigevorrichtung
DE69723529D1 (de) Ionisationskammer
GB9920280D0 (en) Mass spectrometer
DE19681632T1 (de) Miniaturisierte Vierpol-Massenspektrometeranordnung
DE4494905T1 (de) Spektrometer
DE69906935D1 (de) Flugzeitmassenspektrometer
DE69739009D1 (de) Gasanalysator
DE69524282D1 (de) Ionenmobilitätsspektrometer
DE69823808D1 (de) Abbildungs-spektrometer
GB9622191D0 (en) Mass spectrometer
DE69936800D1 (de) Massenspektrometer
GB2300967B (en) Mass spectrometer
DE69714375T2 (de) Plasmaanzeigevorrichtung
DE69414284T2 (de) Plasma-Massenspektrometrie
DE69623728D1 (de) Massenspektrometer
DE59611459D1 (de) Plasmareaktor
DE69835765D1 (de) Plasma-Verfahren
DE69402513D1 (de) Quadrupolmassenspektrometer
AU8274798A (en) Novel mass spectrometer
GB2317266B (en) Linear time-of-flight mass spectrometer

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: MICROMASS UK LTD., MANCHESTER, GB