GB2568178B - Methods in mass spectrometry using collision gas as ion source - Google Patents
Methods in mass spectrometry using collision gas as ion source Download PDFInfo
- Publication number
- GB2568178B GB2568178B GB1902350.6A GB201902350A GB2568178B GB 2568178 B GB2568178 B GB 2568178B GB 201902350 A GB201902350 A GB 201902350A GB 2568178 B GB2568178 B GB 2568178B
- Authority
- GB
- United Kingdom
- Prior art keywords
- methods
- mass spectrometry
- ion source
- collision gas
- collision
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
- H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
- H01J49/0077—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction specific reactions other than fragmentation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0027—Methods for using particle spectrometers
- H01J49/0031—Step by step routines describing the use of the apparatus
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB1902350.6A GB2568178B (en) | 2017-02-23 | 2017-02-23 | Methods in mass spectrometry using collision gas as ion source |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB1702953.9A GB2560160B (en) | 2017-02-23 | 2017-02-23 | Methods in mass spectrometry using collision gas as ion source |
GB1902350.6A GB2568178B (en) | 2017-02-23 | 2017-02-23 | Methods in mass spectrometry using collision gas as ion source |
Publications (3)
Publication Number | Publication Date |
---|---|
GB201902350D0 GB201902350D0 (en) | 2019-04-10 |
GB2568178A GB2568178A (en) | 2019-05-08 |
GB2568178B true GB2568178B (en) | 2020-09-02 |
Family
ID=65998855
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB1902350.6A Active GB2568178B (en) | 2017-02-23 | 2017-02-23 | Methods in mass spectrometry using collision gas as ion source |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB2568178B (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112730590A (en) * | 2021-01-18 | 2021-04-30 | 天津师范大学 | Method for detecting sulfur stable isotope in water sample of landscape river |
CN114545873B (en) * | 2021-12-28 | 2024-03-19 | 四川红华实业有限公司 | Product abundance adjustment control method and device |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4870276A (en) * | 1986-06-20 | 1989-09-26 | Werner Lindinger | Process for verifying the energy of an ion beam |
US5049739A (en) * | 1988-12-09 | 1991-09-17 | Hitachi, Ltd. | Plasma ion source mass spectrometer for trace elements |
WO1997025737A1 (en) * | 1996-01-05 | 1997-07-17 | Battelle Memorial Institute | A method for reduction of selected ion intensities in confined ion beams |
EP0813228A1 (en) * | 1996-06-10 | 1997-12-17 | Micromass Limited | Plasma mass spectrometer |
US20030116705A1 (en) * | 2001-11-30 | 2003-06-26 | Isik Kanik | Proton-transfer-reaction/ion-mobility-spectrometer and method of using the same |
US20120003748A1 (en) * | 2007-10-10 | 2012-01-05 | Mks Instruments, Inc. | Chemical Ionization Reaction or Proton Transfer Reaction Mass Spectrometry |
US20130264475A1 (en) * | 2012-04-06 | 2013-10-10 | Implant Sciences Corporation | Selective ionization using high frequency filtering of reactive ions |
-
2017
- 2017-02-23 GB GB1902350.6A patent/GB2568178B/en active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4870276A (en) * | 1986-06-20 | 1989-09-26 | Werner Lindinger | Process for verifying the energy of an ion beam |
US5049739A (en) * | 1988-12-09 | 1991-09-17 | Hitachi, Ltd. | Plasma ion source mass spectrometer for trace elements |
WO1997025737A1 (en) * | 1996-01-05 | 1997-07-17 | Battelle Memorial Institute | A method for reduction of selected ion intensities in confined ion beams |
EP0813228A1 (en) * | 1996-06-10 | 1997-12-17 | Micromass Limited | Plasma mass spectrometer |
US20030116705A1 (en) * | 2001-11-30 | 2003-06-26 | Isik Kanik | Proton-transfer-reaction/ion-mobility-spectrometer and method of using the same |
US20120003748A1 (en) * | 2007-10-10 | 2012-01-05 | Mks Instruments, Inc. | Chemical Ionization Reaction or Proton Transfer Reaction Mass Spectrometry |
US20130264475A1 (en) * | 2012-04-06 | 2013-10-10 | Implant Sciences Corporation | Selective ionization using high frequency filtering of reactive ions |
Also Published As
Publication number | Publication date |
---|---|
GB201902350D0 (en) | 2019-04-10 |
GB2568178A (en) | 2019-05-08 |
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