SG10201505519VA - Filament For Mass Spectrometric Electron Impact Ion Source - Google Patents

Filament For Mass Spectrometric Electron Impact Ion Source

Info

Publication number
SG10201505519VA
SG10201505519VA SG10201505519VA SG10201505519VA SG10201505519VA SG 10201505519V A SG10201505519V A SG 10201505519VA SG 10201505519V A SG10201505519V A SG 10201505519VA SG 10201505519V A SG10201505519V A SG 10201505519VA SG 10201505519V A SG10201505519V A SG 10201505519VA
Authority
SG
Singapore
Prior art keywords
filament
ion source
mass spectrometric
electron impact
impact ion
Prior art date
Application number
SG10201505519VA
Inventor
Splendore Maurizio
Muntean Felician
P Moeller Roy
Original Assignee
Bruker Daltonics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bruker Daltonics Inc filed Critical Bruker Daltonics Inc
Publication of SG10201505519VA publication Critical patent/SG10201505519VA/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J27/00—Ion beam tubes
    • H01J27/02—Ion sources; Ion guns
    • H01J27/20—Ion sources; Ion guns using particle beam bombardment, e.g. ionisers
    • H01J27/205—Ion sources; Ion guns using particle beam bombardment, e.g. ionisers with electrons, e.g. electron impact ionisation, electron attachment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/08—Electron sources, e.g. for generating photo-electrons, secondary electrons or Auger electrons

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Combustion & Propulsion (AREA)
  • Electron Sources, Ion Sources (AREA)
SG10201505519VA 2014-07-25 2015-07-14 Filament For Mass Spectrometric Electron Impact Ion Source SG10201505519VA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US14/341,076 US9401266B2 (en) 2014-07-25 2014-07-25 Filament for mass spectrometric electron impact ion source

Publications (1)

Publication Number Publication Date
SG10201505519VA true SG10201505519VA (en) 2016-02-26

Family

ID=53514066

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10201505519VA SG10201505519VA (en) 2014-07-25 2015-07-14 Filament For Mass Spectrometric Electron Impact Ion Source

Country Status (5)

Country Link
US (1) US9401266B2 (en)
EP (1) EP2978008B1 (en)
CN (1) CN105304448B (en)
CA (1) CA2897063C (en)
SG (1) SG10201505519VA (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9721777B1 (en) 2016-04-14 2017-08-01 Bruker Daltonics, Inc. Magnetically assisted electron impact ion source for mass spectrometry
JP2020535622A (en) * 2017-09-29 2020-12-03 パーキンエルマー・ヘルス・サイエンシーズ・カナダ・インコーポレイテッドＰｅｒｋｉｎｅｌｍｅｒ Ｈｅａｌｔｈ Ｓｃｉｅｎｃｅｓ Ｃａｎａｄａ， Ｉｎｃ． Off-axis ionization devices and systems
US10622200B2 (en) * 2018-05-18 2020-04-14 Perkinelmer Health Sciences Canada, Inc. Ionization sources and systems and methods using them
SG10202006597QA (en) * 2019-07-26 2021-02-25 Heraeus Deutschland Gmbh & Co Kg Process for preparing a processed filament by interaction of a filament with at least one processing beam in N processing steps

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2139250C3 (en) 1971-08-02 1975-02-20 Institut Fuer Elektronenmikroskopie Am Fritz-Haber-Institut Der Max-Planckgesellschaft, 1000 Berlin Ion source with a dependent gas discharge between an annular hot cathode and an anode
US4156159A (en) * 1974-06-21 1979-05-22 Futaba Denshi Kogyo Kabushiki Kaisha Self crossed field type ion source
US4080548A (en) * 1976-01-19 1978-03-21 Precision Controls, Inc. Lighting system having dimming capabilities
GB2070853B (en) 1980-03-03 1984-01-18 Varian Associates Parallel-connected cathode segment arrangement for a hot cathode electron impact ion source
US4816685A (en) 1987-10-23 1989-03-28 Lauronics, Inc. Ion volume ring
NL9000203A (en) * 1990-01-29 1991-08-16 Philips Nv ROENTGEN TUBE END WINDOW.
JPH05135734A (en) 1991-11-08 1993-06-01 Jeol Ltd Surface analyzer with ion source
TW297551U (en) * 1992-03-27 1997-02-01 Gen Electric Filament support for incandescent lamps
US5231334A (en) * 1992-04-15 1993-07-27 Texas Instruments Incorporated Plasma source and method of manufacturing
JPH065219A (en) * 1992-06-22 1994-01-14 Nissin Electric Co Ltd Ion source device
JPH065218A (en) * 1992-06-22 1994-01-14 Nissin Electric Co Ltd Ion source device
US5543625A (en) * 1994-05-20 1996-08-06 Finnigan Corporation Filament assembly for mass spectrometer ion sources
US5600136A (en) * 1995-06-07 1997-02-04 Varian Associates, Inc. Single potential ion source
US6204508B1 (en) * 1998-08-07 2001-03-20 Axcelis Technologies, Inc. Toroidal filament for plasma generation
US6239429B1 (en) * 1998-10-26 2001-05-29 Mks Instruments, Inc. Quadrupole mass spectrometer assembly
WO2005045877A1 (en) 2003-10-31 2005-05-19 Saintech Pty Ltd Dual filament ion source
CN102427015B (en) * 2011-11-29 2014-03-12 东南大学 Focusing type cold cathode X-ray tube
US9305760B2 (en) * 2012-08-16 2016-04-05 State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Oregon State University Electron source for an RF-free electronmagnetostatic electron-induced dissociation cell and use in a tandem mass spectrometer
US20140374583A1 (en) * 2013-06-24 2014-12-25 Agilent Technologies, Inc. Electron ionization (ei) utilizing different ei energies

Also Published As

Publication number Publication date
CN105304448A (en) 2016-02-03
US9401266B2 (en) 2016-07-26
CA2897063C (en) 2018-08-28
EP2978008A1 (en) 2016-01-27
EP2978008B1 (en) 2018-10-03
CN105304448B (en) 2018-10-16
CA2897063A1 (en) 2016-01-25
US20160027630A1 (en) 2016-01-28

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