SG11201702040WA - Mass spectrometer - Google Patents

Mass spectrometer

Info

Publication number
SG11201702040WA
SG11201702040WA SG11201702040WA SG11201702040WA SG11201702040WA SG 11201702040W A SG11201702040W A SG 11201702040WA SG 11201702040W A SG11201702040W A SG 11201702040WA SG 11201702040W A SG11201702040W A SG 11201702040WA SG 11201702040W A SG11201702040W A SG 11201702040WA
Authority
SG
Singapore
Prior art keywords
mass spectrometer
spectrometer
mass
Prior art date
Application number
SG11201702040WA
Inventor
Natsuyo Asano
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of SG11201702040WA publication Critical patent/SG11201702040WA/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/165—Electrospray ionisation
    • H01J49/167—Capillaries and nozzles specially adapted therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0095—Particular arrangements for generating, introducing or analyzing both positive and negative analyte ions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/165—Electrospray ionisation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Dc-Dc Converters (AREA)
SG11201702040WA 2014-09-17 2014-09-17 Mass spectrometer SG11201702040WA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2014/074591 WO2016042627A1 (en) 2014-09-17 2014-09-17 Mass spectrometer

Publications (1)

Publication Number Publication Date
SG11201702040WA true SG11201702040WA (en) 2017-04-27

Family

ID=55532693

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201702040WA SG11201702040WA (en) 2014-09-17 2014-09-17 Mass spectrometer

Country Status (7)

Country Link
US (1) US9929001B2 (en)
EP (1) EP3196640B1 (en)
JP (1) JP6337970B2 (en)
CN (1) CN106716121B (en)
CA (1) CA2961183C (en)
SG (1) SG11201702040WA (en)
WO (1) WO2016042627A1 (en)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10473634B2 (en) * 2014-06-12 2019-11-12 Shimadzu Corporation Data processing device for mass spectrometry and program for said device
EP3211781A4 (en) * 2014-10-20 2017-11-22 Shimadzu Corporation Mass spectroscope
WO2017046867A1 (en) * 2015-09-15 2017-03-23 株式会社島津製作所 Mass spectrometer, mass spectrometry method, and program for mass spectrometry
US9916968B1 (en) * 2016-08-22 2018-03-13 Agilent Technologies, Inc. In-source collision-induced heating and activation of gas-phase ions for spectrometry
WO2018173223A1 (en) * 2017-03-23 2018-09-27 株式会社島津製作所 Mass spectrometer and chromatographic mass spectrometer
US10964521B2 (en) * 2017-07-18 2021-03-30 Shimadzu Corporation Mass spectrometer
JP6908138B2 (en) 2018-02-06 2021-07-21 株式会社島津製作所 Ionizer and mass spectrometer
CN108469466B (en) * 2018-03-23 2020-11-03 中国检验检疫科学研究院 Online extraction and purification needle point spray ionization device and sample rapid measurement method
CN112243496A (en) * 2018-05-31 2021-01-19 株式会社岛津制作所 Probe electrospray ionization mass spectrum analysis device
GB2583092B (en) * 2019-04-15 2021-09-22 Thermo Fisher Scient Bremen Gmbh Mass spectrometer having improved quadrupole robustness
GB201907332D0 (en) * 2019-05-24 2019-07-10 Micromass Ltd Mass filter having reduced contamination
CN112432990B (en) * 2019-08-06 2022-12-02 岛津企业管理（中国）有限公司 Method for analyzing aristolochic acid and/or aristoloclactam
US11011362B2 (en) * 2019-09-19 2021-05-18 Thermo Finnigan Llc Fast continuous SRM acquisitions with or without ion trapping
CN111579631B (en) * 2020-06-11 2021-04-27 中国地质大学（武汉） Interface conversion circuit of plasma mass spectrometer driven by laser ablation system

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008534955A (en) * 2005-03-31 2008-08-28 ジョージタウン ユニバーシティ Advantageous thyroxine and free triiodothyronine analysis by mass spectrometry
EP1931020B1 (en) * 2005-09-08 2015-11-11 Shimadzu Corporation High-voltage power supply and mass spectrometer using the same
JP4752676B2 (en) * 2006-08-24 2011-08-17 株式会社島津製作所 Mass spectrometer
JP5083160B2 (en) * 2008-10-06 2012-11-28 株式会社島津製作所 Quadrupole mass spectrometer
CN101419190B (en) * 2008-11-19 2012-05-09 闻路红 Ion sampling method based on external ion source and mass spectrometric analysis method
JP5408107B2 (en) * 2010-11-10 2014-02-05 株式会社島津製作所 MS / MS mass spectrometer and program for the same
WO2012124020A1 (en) * 2011-03-11 2012-09-20 株式会社島津製作所 Mass spectrometer
JP2013175297A (en) * 2012-02-23 2013-09-05 Shimadzu Corp Triple quadrupole type mass spectroscope
JP5757270B2 (en) * 2012-04-26 2015-07-29 株式会社島津製作所 Data processing equipment for chromatographic mass spectrometry
WO2014068780A1 (en) 2012-11-05 2014-05-08 株式会社島津製作所 High voltage power supply apparatus and mass spectrometer using same
CN103499669A (en) * 2013-10-13 2014-01-08 福建省纤维检验局 Component analysis and qualitative and quantitative method for dihardenedtallowdimethyl ammonium compounds (DHTDMAC)

Also Published As

Publication number Publication date
EP3196640B1 (en) 2018-04-25
EP3196640A4 (en) 2017-09-06
US9929001B2 (en) 2018-03-27
CN106716121B (en) 2019-04-19
JPWO2016042627A1 (en) 2017-04-27
US20170287691A1 (en) 2017-10-05
CA2961183C (en) 2019-08-06
CA2961183A1 (en) 2016-03-24
WO2016042627A1 (en) 2016-03-24
JP6337970B2 (en) 2018-06-06
EP3196640A1 (en) 2017-07-26
CN106716121A (en) 2017-05-24

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