DE69536105D1 - Massenspektrometer - Google Patents

Massenspektrometer

Info

Publication number
DE69536105D1
DE69536105D1 DE69536105T DE69536105T DE69536105D1 DE 69536105 D1 DE69536105 D1 DE 69536105D1 DE 69536105 T DE69536105 T DE 69536105T DE 69536105 T DE69536105 T DE 69536105T DE 69536105 D1 DE69536105 D1 DE 69536105D1
Authority
DE
Germany
Prior art keywords
mass spectrometry
spectrometry
mass
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69536105T
Other languages
English (en)
Inventor
Takashi Baba
Izumi Waki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Application granted granted Critical
Publication of DE69536105D1 publication Critical patent/DE69536105D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/422—Two-dimensional RF ion traps
    • H01J49/423—Two-dimensional RF ion traps with radial ejection
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
    • H01J49/4215—Quadrupole mass filters
DE69536105T 1995-07-03 1995-07-03 Massenspektrometer Expired - Lifetime DE69536105D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP1995/001322 WO1997002591A1 (fr) 1995-07-03 1995-07-03 Spectrometre de masse

Publications (1)

Publication Number Publication Date
DE69536105D1 true DE69536105D1 (de) 2010-10-28

Family

ID=14126070

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69536105T Expired - Lifetime DE69536105D1 (de) 1995-07-03 1995-07-03 Massenspektrometer

Country Status (5)

Country Link
US (1) US6075244A (de)
EP (1) EP0871201B1 (de)
JP (1) JP3361528B2 (de)
DE (1) DE69536105D1 (de)
WO (1) WO1997002591A1 (de)

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JP3495512B2 (ja) * 1996-07-02 2004-02-09 株式会社日立製作所 イオントラップ質量分析装置
US5783824A (en) * 1995-04-03 1998-07-21 Hitachi, Ltd. Ion trapping mass spectrometry apparatus
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US6815668B2 (en) * 1999-07-21 2004-11-09 The Charles Stark Draper Laboratory, Inc. Method and apparatus for chromatography-high field asymmetric waveform ion mobility spectrometry
US6911650B1 (en) * 1999-08-13 2005-06-28 Bruker Daltonics, Inc. Method and apparatus for multiple frequency multipole
JP3625265B2 (ja) * 1999-12-07 2005-03-02 株式会社日立製作所 イオントラップ型質量分析装置
JP2002150992A (ja) * 2000-11-09 2002-05-24 Anelva Corp 質量分析のためのイオン化装置およびイオン化方法
US6627883B2 (en) * 2001-03-02 2003-09-30 Bruker Daltonics Inc. Apparatus and method for analyzing samples in a dual ion trap mass spectrometer
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GB0210930D0 (en) * 2002-05-13 2002-06-19 Thermo Electron Corp Improved mass spectrometer and mass filters therefor
US6897438B2 (en) * 2002-08-05 2005-05-24 University Of British Columbia Geometry for generating a two-dimensional substantially quadrupole field
US7045797B2 (en) * 2002-08-05 2006-05-16 The University Of British Columbia Axial ejection with improved geometry for generating a two-dimensional substantially quadrupole field
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JP2004200130A (ja) * 2002-12-20 2004-07-15 Ulvac Japan Ltd 四重極質量分析計の電圧制御方法及び電圧制御回路装置
US7019289B2 (en) * 2003-01-31 2006-03-28 Yang Wang Ion trap mass spectrometry
CN1833300B (zh) * 2003-03-19 2010-05-12 萨默费尼根有限公司 在离子总体中获取多个母离子的串联质谱分析数据
US6900431B2 (en) * 2003-03-21 2005-05-31 Predicant Biosciences, Inc. Multiplexed orthogonal time-of-flight mass spectrometer
US7019290B2 (en) * 2003-05-30 2006-03-28 Applera Corporation System and method for modifying the fringing fields of a radio frequency multipole
JP3912345B2 (ja) * 2003-08-26 2007-05-09 株式会社島津製作所 質量分析装置
EP1668665A4 (de) * 2003-09-25 2008-03-19 Mds Inc Dba Mds Sciex Verfahren und vorrichtung zur bereitstellung von zweidimensionalen feldern im wesentlichen des quadrupol-typs mit gewählten hexapol-komponenten
US20050072915A1 (en) * 2003-10-07 2005-04-07 Biospect Inc. Methods and apparatus for self-optimization of electrospray ionization devices
US20050133712A1 (en) * 2003-12-18 2005-06-23 Predicant Biosciences, Inc. Scan pipelining for sensitivity improvement of orthogonal time-of-flight mass spectrometers
US7026613B2 (en) * 2004-01-23 2006-04-11 Thermo Finnigan Llc Confining positive and negative ions with fast oscillating electric potentials
US6958473B2 (en) * 2004-03-25 2005-10-25 Predicant Biosciences, Inc. A-priori biomarker knowledge based mass filtering for enhanced biomarker detection
CA2595631C (en) * 2005-01-17 2014-04-22 Micromass Uk Limited Mass spectrometer
JP4806214B2 (ja) 2005-01-28 2011-11-02 株式会社日立ハイテクノロジーズ 電子捕獲解離反応装置
US7183545B2 (en) * 2005-03-15 2007-02-27 Agilent Technologies, Inc. Multipole ion mass filter having rotating electric field
GB2427067B (en) * 2005-03-29 2010-02-24 Thermo Finnigan Llc Improvements relating to ion trapping
US7351955B2 (en) * 2005-09-09 2008-04-01 Thermo Finnigan Llc Reduction of chemical noise in a MALDI mass spectrometer by in-trap photodissociation of matrix cluster ions
US7446310B2 (en) * 2006-07-11 2008-11-04 Thermo Finnigan Llc High throughput quadrupolar ion trap
US8395112B1 (en) * 2006-09-20 2013-03-12 Mark E. Bier Mass spectrometer and method for using same
GB0624679D0 (en) * 2006-12-11 2007-01-17 Shimadzu Corp A time-of-flight mass spectrometer and a method of analysing ions in a time-of-flight mass spectrometer
EP1933365A1 (de) * 2006-12-14 2008-06-18 Tofwerk AG Vorrichtung zur Massenanalyse von Ionen
EP1933366B1 (de) * 2006-12-14 2019-06-12 Tofwerk AG Vorrichtung zur Massenanalyse von Ionen
EP1968100B1 (de) * 2007-03-08 2014-04-30 Tofwerk AG Ionenführungskammer
WO2009009471A2 (en) * 2007-07-06 2009-01-15 Massachusetts Institute Of Technology Performance enhancement through use of higher stability regions and signal processing in on-ideal quadrupole mass filters
US8334506B2 (en) * 2007-12-10 2012-12-18 1St Detect Corporation End cap voltage control of ion traps
GB0800526D0 (en) * 2008-01-11 2008-02-20 Micromass Ltd Mass spectrometer
US7973277B2 (en) 2008-05-27 2011-07-05 1St Detect Corporation Driving a mass spectrometer ion trap or mass filter
US7855361B2 (en) * 2008-05-30 2010-12-21 Varian, Inc. Detection of positive and negative ions
EP2502258B1 (de) * 2009-11-16 2021-09-01 DH Technologies Development Pte. Ltd. Vorrichtung und verfahren zur kopplung von hf- und ac-signalen zur stromversorgung eines mehrfachpols in einem massenspektrometer
EP2502259B1 (de) * 2009-11-16 2022-04-06 DH Technologies Development Pte. Ltd. Vorrichtung zur stromversorgung eines multipols in einem massenspektrometer
US8455814B2 (en) * 2010-05-11 2013-06-04 Agilent Technologies, Inc. Ion guides and collision cells
JP5950913B2 (ja) * 2010-08-25 2016-07-13 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド 有意な六重極および八重極成分を有する実質的に四重極の電場を提供するための方法およびシステム
WO2012082909A2 (en) * 2010-12-14 2012-06-21 The Regents Of The University Of Michigan Auxiliary frequency parametric excitation of quadrupole mass spectrometers
WO2012081122A1 (ja) * 2010-12-17 2012-06-21 株式会社島津製作所 イオンガイド及び質量分析装置
GB201118579D0 (en) * 2011-10-27 2011-12-07 Micromass Ltd Control of ion populations
JP6541210B2 (ja) * 2011-12-27 2019-07-10 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド イオントラップから低ｍ／ｚ比を有するイオンを抽出する方法
CN103367094B (zh) * 2012-03-31 2016-12-14 株式会社岛津制作所 离子阱分析器以及离子阱质谱分析方法
WO2016020789A1 (en) * 2014-08-05 2016-02-11 Dh Technologies Development Pte. Ltd. Band pass extraction from an ion trapping device and tof mass spectrometer sensitivity enhancement
US11342169B2 (en) * 2019-04-12 2022-05-24 Agilent Technologies, Inc. Multi frequency LC resonator topologies applicable to mass spectrometer radio-frequency drive systems
CN114235937B (zh) * 2021-11-30 2023-08-01 清华大学深圳国际研究生院 一种在质谱仪离子阱中同时检测正离子与负离子的方法
WO2023235862A1 (en) * 2022-06-02 2023-12-07 Northwestern University Methods and systems for individual ion mass spectrometry

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US3371204A (en) * 1966-09-07 1968-02-27 Bell & Howell Co Mass filter with one or more rod electrodes separated into a plurality of insulated segments
US3629573A (en) * 1970-08-20 1971-12-21 Bendix Corp Monopole/quadrupole mass spectrometer
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JP3148264B2 (ja) * 1991-03-01 2001-03-19 横河電機株式会社 四重極質量分析計
US5179278A (en) * 1991-08-23 1993-01-12 Mds Health Group Limited Multipole inlet system for ion traps
GB2267385B (en) * 1992-05-29 1995-12-13 Finnigan Corp Method of detecting the ions in an ion trap mass spectrometer
JPH07240171A (ja) * 1994-02-24 1995-09-12 Shimadzu Corp Ｍｓ／ｍｓ型質量分析装置
US5420425A (en) * 1994-05-27 1995-05-30 Finnigan Corporation Ion trap mass spectrometer system and method
JP3509267B2 (ja) * 1995-04-03 2004-03-22 株式会社日立製作所 イオントラップ質量分析方法および装置
US5783824A (en) * 1995-04-03 1998-07-21 Hitachi, Ltd. Ion trapping mass spectrometry apparatus
US5598001A (en) * 1996-01-30 1997-01-28 Hewlett-Packard Company Mass selective multinotch filter with orthogonal excision fields

Also Published As

Publication number Publication date
JP3361528B2 (ja) 2003-01-07
EP0871201B1 (de) 2010-09-15
EP0871201A1 (de) 1998-10-14
EP0871201A4 (de) 2006-07-26
US6075244A (en) 2000-06-13
WO1997002591A1 (fr) 1997-01-23

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