DE69624297T2 - Halbleiterspeicheranordnung - Google Patents

Halbleiterspeicheranordnung

Info

Publication number
DE69624297T2
DE69624297T2 DE69624297T DE69624297T DE69624297T2 DE 69624297 T2 DE69624297 T2 DE 69624297T2 DE 69624297 T DE69624297 T DE 69624297T DE 69624297 T DE69624297 T DE 69624297T DE 69624297 T2 DE69624297 T2 DE 69624297T2
Authority
DE
Germany
Prior art keywords
memory device
semiconductor memory
semiconductor
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69624297T
Other languages
English (en)
Other versions
DE69624297D1 (de
Inventor
Hong-Sun Hwang
Seung-Moon Yoo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of DE69624297D1 publication Critical patent/DE69624297D1/de
Application granted granted Critical
Publication of DE69624297T2 publication Critical patent/DE69624297T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/12—Group selection circuits, e.g. for memory block selection, chip selection, array selection
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/14—Word line organisation; Word line lay-out
DE69624297T 1995-07-15 1996-07-10 Halbleiterspeicheranordnung Expired - Lifetime DE69624297T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019950020914A KR0164377B1 (ko) 1995-07-15 1995-07-15 반도체 메모리장치의 서브워드라인 드라이버

Publications (2)

Publication Number Publication Date
DE69624297D1 DE69624297D1 (de) 2002-11-21
DE69624297T2 true DE69624297T2 (de) 2003-09-11

Family

ID=19420734

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69624297T Expired - Lifetime DE69624297T2 (de) 1995-07-15 1996-07-10 Halbleiterspeicheranordnung

Country Status (6)

Country Link
US (1) US5808955A (de)
EP (1) EP0755057B1 (de)
JP (1) JPH0935475A (de)
KR (1) KR0164377B1 (de)
DE (1) DE69624297T2 (de)
TW (1) TW312016B (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100224667B1 (ko) * 1996-12-10 1999-10-15 윤종용 계층적 입출력라인 구조를 갖는 반도체 메모리장치 및 이의 배치방법
TW405121B (en) * 1996-12-31 2000-09-11 Hyundai Electronics Ind Sub row decoder circuit for semiconductor memory device
US6011746A (en) * 1997-02-06 2000-01-04 Hyundai Electronics America, Inc. Word line driver for semiconductor memories
JP3938803B2 (ja) * 1997-03-31 2007-06-27 株式会社日立製作所 ダイナミック型ｒａｍ
JP3228319B2 (ja) * 1997-04-07 2001-11-12 日本電気株式会社 半導体装置
US6191999B1 (en) * 1997-06-20 2001-02-20 Fujitsu Limited Semiconductor memory device with reduced power consumption
JP3478953B2 (ja) * 1997-09-03 2003-12-15 Ｎｅｃエレクトロニクス株式会社 半導体記憶装置
KR100268889B1 (ko) * 1997-10-28 2000-10-16 김영환 반도체 메모리 장치의 워드라인 구동회로
KR19990061134A (ko) * 1997-12-31 1999-07-26 김영환 서브 워드 라인 디코더
JP2000057766A (ja) * 1998-08-11 2000-02-25 Mitsubishi Electric Corp 昇圧電圧駆動回路およびそれを用いた半導体記憶装置
US6144610A (en) * 1999-04-20 2000-11-07 Winbond Electronics Corporation Distributed circuits to turn off word lines in a memory array
JP2001291832A (ja) * 2000-04-07 2001-10-19 Nec Microsystems Ltd 半導体メモリ装置
DE10038925A1 (de) * 2000-08-09 2002-03-14 Infineon Technologies Ag Elektronische Treiberschaltung für Wortleitungen einer Speichermatrix und Speichervorrichtung
US6347052B1 (en) * 2000-08-31 2002-02-12 Advanced Micro Devices Inc. Word line decoding architecture in a flash memory
JP4354917B2 (ja) 2003-02-27 2009-10-28 富士通マイクロエレクトロニクス株式会社 半導体記憶装置
KR100704039B1 (ko) * 2006-01-20 2007-04-04 삼성전자주식회사 디코딩 신호가 워드라인 방향으로 버싱되는 반도체 메모리장치
KR100904047B1 (ko) * 2007-08-17 2009-06-23 주식회사 하도에프앤씨 논슬립, 흡음 및 통기성을 가진 매트용 바닥재 및 그 제조방법과, 상기 바닥재를 사용하여 제조된 매트 및 자동차바닥용 매트
US20090307891A1 (en) * 2008-06-17 2009-12-17 Ge-Hitachi Nuclear Energy Americas Llc Method and apparatus for remotely inspecting and/or treating welds, pipes, vessels and/or other components used in reactor coolant systems or other process applications
KR101011648B1 (ko) * 2008-08-01 2011-01-28 (주) 비앤비 지지력이 보강된 섬유판재
KR102378537B1 (ko) * 2015-11-06 2022-03-25 에스케이하이닉스 주식회사 Gidl 스크린을 위한 워드라인 드라이버, 이를 이용하는 반도체 메모리 장치 및 테스트 방법

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3024687B2 (ja) * 1990-06-05 2000-03-21 三菱電機株式会社 半導体記憶装置
JP3093432B2 (ja) * 1992-04-08 2000-10-03 日本電気株式会社 行デコーダ
US5416747A (en) * 1992-07-15 1995-05-16 Kawasaki Steel Corporation Semiconductor memory driven at low voltage
JP2725570B2 (ja) * 1993-11-02 1998-03-11 日本電気株式会社 半導体メモリ装置

Also Published As

Publication number Publication date
US5808955A (en) 1998-09-15
KR0164377B1 (ko) 1999-02-18
DE69624297D1 (de) 2002-11-21
KR970008184A (ko) 1997-02-24
EP0755057A3 (de) 1998-11-25
EP0755057B1 (de) 2002-10-16
EP0755057A2 (de) 1997-01-22
JPH0935475A (ja) 1997-02-07
TW312016B (de) 1997-08-01

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Legal Events

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