DE69621719T2 - Kurzwelliger, oberflächenemittierender Laser mit vertikalem Resonator und Al-freiem aktiven Gebiet - Google Patents

Kurzwelliger, oberflächenemittierender Laser mit vertikalem Resonator und Al-freiem aktiven Gebiet

Info

Publication number
DE69621719T2
DE69621719T2 DE69621719T DE69621719T DE69621719T2 DE 69621719 T2 DE69621719 T2 DE 69621719T2 DE 69621719 T DE69621719 T DE 69621719T DE 69621719 T DE69621719 T DE 69621719T DE 69621719 T2 DE69621719 T2 DE 69621719T2
Authority
DE
Germany
Prior art keywords
wave
short
active area
emitting laser
free active
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69621719T
Other languages
English (en)
Other versions
DE69621719D1 (de
Inventor
Jamal Ramdani
Michael S Lebby
Hsing-Chung Lee
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Motorola Solutions Inc
Original Assignee
Motorola Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Motorola Inc filed Critical Motorola Inc
Publication of DE69621719D1 publication Critical patent/DE69621719D1/de
Application granted granted Critical
Publication of DE69621719T2 publication Critical patent/DE69621719T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/30—Structure or shape of the active region; Materials used for the active region
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/30—Structure or shape of the active region; Materials used for the active region
    • H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
    • H01S5/3403—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers having a strained layer structure in which the strain performs a special function, e.g. general strain effects, strain versus polarisation
    • H01S5/3406—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers having a strained layer structure in which the strain performs a special function, e.g. general strain effects, strain versus polarisation including strain compensation
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
    • H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
    • H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/30—Structure or shape of the active region; Materials used for the active region
    • H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
    • H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
    • H01S5/34326—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer based on InGa(Al)P, e.g. red laser
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/30—Structure or shape of the active region; Materials used for the active region
    • H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
    • H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
    • H01S5/3434—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer comprising at least both As and P as V-compounds

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biophysics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Semiconductor Lasers (AREA)
DE69621719T 1995-08-28 1996-08-16 Kurzwelliger, oberflächenemittierender Laser mit vertikalem Resonator und Al-freiem aktiven Gebiet Expired - Fee Related DE69621719T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/520,061 US5633886A (en) 1995-08-28 1995-08-28 Short wavelength VCSEL with Al-free active region

Publications (2)

Publication Number Publication Date
DE69621719D1 DE69621719D1 (de) 2002-07-18
DE69621719T2 true DE69621719T2 (de) 2002-10-31

Family

ID=24071042

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69621719T Expired - Fee Related DE69621719T2 (de) 1995-08-28 1996-08-16 Kurzwelliger, oberflächenemittierender Laser mit vertikalem Resonator und Al-freiem aktiven Gebiet

Country Status (6)

Country Link
US (1) US5633886A (de)
EP (1) EP0760545B1 (de)
JP (1) JPH09107153A (de)
KR (1) KR100440650B1 (de)
DE (1) DE69621719T2 (de)
TW (1) TW317037B (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5912913A (en) * 1995-12-27 1999-06-15 Hitachi, Ltd. Vertical cavity surface emitting laser, optical transmitter-receiver module using the laser, and parallel processing system using the laser
US5953362A (en) * 1997-12-15 1999-09-14 Pamulapati; Jagadeesh Strain induce control of polarization states in vertical cavity surface emitting lasers and method of making same
GB2333895B (en) * 1998-01-31 2003-02-26 Mitel Semiconductor Ab Pre-fusion oxidized and wafer-bonded vertical cavity laser
US6556553B1 (en) * 1999-04-12 2003-04-29 Intermec Ip Corp. Method for determining when a communication device should rate shift or roam in a wireless environment
GB2353899A (en) * 1999-09-01 2001-03-07 Sharp Kk A quantum well semiconductor device with strained barrier layer
JP2003283056A (ja) * 2002-01-15 2003-10-03 Sharp Corp 半導体レーザ装置および光ディスク再生記録装置
JP3846367B2 (ja) 2002-05-30 2006-11-15 セイコーエプソン株式会社 半導体素子部材及び半導体装置並びにそれらの製造方法、電気光学装置、電子機器
JP2004281968A (ja) * 2003-03-19 2004-10-07 Fuji Photo Film Co Ltd 面発光型半導体レーザ素子
US7684458B2 (en) 2004-06-11 2010-03-23 Ricoh Company, Ltd. Surface-emission laser diode and fabrication process thereof
EP1980001B1 (de) * 2006-02-03 2018-04-04 Ricoh Company, Ltd. Oberflächenemittierende laservorrichtung
US7693204B2 (en) 2006-02-03 2010-04-06 Ricoh Company, Ltd. Surface-emitting laser device and surface-emitting laser array including same
JP5224155B2 (ja) * 2006-02-03 2013-07-03 株式会社リコー 面発光レーザ素子、それを備えた面発光レーザアレイ、面発光レーザアレイを備えた画像形成装置、面発光レーザ素子または面発光レーザアレイを備えた光ピックアップ装置、面発光レーザ素子または面発光レーザアレイを備えた光送信モジュール、面発光レーザ素子または面発光レーザアレイを備えた光送受信モジュールおよび面発光レーザ素子または面発光レーザアレイを備えた光通信システム。
JP2008053353A (ja) * 2006-08-23 2008-03-06 Ricoh Co Ltd 面発光レーザアレイ、それに用いられる面発光レーザ素子および面発光レーザアレイの製造方法
KR100990702B1 (ko) 2006-08-23 2010-10-29 가부시키가이샤 리코 면 발광 레이저 어레이, 광학 주사 장치 및 화상 형성 장치
US7627017B2 (en) 2006-08-25 2009-12-01 Stc. Unm Laser amplifier and method of making the same
JP5748949B2 (ja) 2008-11-20 2015-07-15 株式会社リコー 面発光レーザ素子、面発光レーザアレイ、光走査装置及び画像形成装置
JP2016208049A (ja) * 2011-03-17 2016-12-08 株式会社リコー 面発光レーザ素子、原子発振器及び面発光レーザ素子の検査方法
JP2012209534A (ja) * 2011-03-17 2012-10-25 Ricoh Co Ltd 面発光レーザ素子、原子発振器及び面発光レーザ素子の検査方法
JP5300996B2 (ja) * 2012-02-10 2013-09-25 ローム株式会社 半導体レーザ素子
JP2013165275A (ja) * 2013-03-12 2013-08-22 Rohm Co Ltd 半導体レーザ素子

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5012486A (en) * 1990-04-06 1991-04-30 At&T Bell Laboratories Vertical cavity semiconductor laser with lattice-mismatched mirror stack
US5237581A (en) * 1990-11-14 1993-08-17 Nec Corporation Semiconductor multilayer reflector and light emitting device with the same
US5172384A (en) * 1991-05-03 1992-12-15 Motorola, Inc. Low threshold current laser
JP3080831B2 (ja) * 1994-02-03 2000-08-28 日本電気株式会社 多重量子井戸半導体レーザ
US5513202A (en) * 1994-02-25 1996-04-30 Matsushita Electric Industrial Co., Ltd. Vertical-cavity surface-emitting semiconductor laser
US5412680A (en) * 1994-03-18 1995-05-02 Photonics Research Incorporated Linear polarization of semiconductor laser
US5559818A (en) * 1994-03-24 1996-09-24 Sanyo Electric Co., Ltd. Semiconductor laser device
US5491710A (en) * 1994-05-05 1996-02-13 Cornell Research Foundation, Inc. Strain-compensated multiple quantum well laser structures
US5432809A (en) * 1994-06-15 1995-07-11 Motorola, Inc. VCSEL with Al-free cavity region

Also Published As

Publication number Publication date
KR100440650B1 (ko) 2004-10-14
DE69621719D1 (de) 2002-07-18
EP0760545B1 (de) 2002-06-12
JPH09107153A (ja) 1997-04-22
TW317037B (de) 1997-10-01
KR970013541A (ko) 1997-03-29
EP0760545A1 (de) 1997-03-05
US5633886A (en) 1997-05-27

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee