DE69618119D1 - Verfahren zur programmierung einer einzigen eprom oder flashspeicherzelle zur speicherung von mehrfachpegeldaten die vorgespannte source/substrate verwenden - Google Patents

Verfahren zur programmierung einer einzigen eprom oder flashspeicherzelle zur speicherung von mehrfachpegeldaten die vorgespannte source/substrate verwenden

Info

Publication number
DE69618119D1
DE69618119D1 DE69618119T DE69618119T DE69618119D1 DE 69618119 D1 DE69618119 D1 DE 69618119D1 DE 69618119 T DE69618119 T DE 69618119T DE 69618119 T DE69618119 T DE 69618119T DE 69618119 D1 DE69618119 D1 DE 69618119D1
Authority
DE
Germany
Prior art keywords
programming
substrate
level data
storage cell
flash storage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69618119T
Other languages
English (en)
Other versions
DE69618119T2 (de
Inventor
Albert Bergemont
Min-Hwa Chi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Semiconductor Corp
Original Assignee
National Semiconductor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by National Semiconductor Corp filed Critical National Semiconductor Corp
Application granted granted Critical
Publication of DE69618119D1 publication Critical patent/DE69618119D1/de
Publication of DE69618119T2 publication Critical patent/DE69618119T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • G11C11/5628—Programming or writing circuits; Data input circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)
  • Read Only Memory (AREA)
DE69618119T 1995-02-22 1996-02-14 Verfahren zur programmierung einer einzigen eprom oder flashspeicherzelle zur speicherung von mehrfachpegeldaten die vorgespannte source/substrate verwenden Expired - Lifetime DE69618119T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/394,171 US5511021A (en) 1995-02-22 1995-02-22 Method for programming a single EPROM or flash memory cell to store multiple levels of data that utilizes a forward-biased source-to-substrate junction
PCT/US1996/002146 WO1996026521A1 (en) 1995-02-22 1996-02-14 A method for programming a single eprom or flash memory cell to store multiple levels of data that utilizes a forward-biased source-to-substrate junction

Publications (2)

Publication Number Publication Date
DE69618119D1 true DE69618119D1 (de) 2002-01-31
DE69618119T2 DE69618119T2 (de) 2002-08-29

Family

ID=23557863

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69618119T Expired - Lifetime DE69618119T2 (de) 1995-02-22 1996-02-14 Verfahren zur programmierung einer einzigen eprom oder flashspeicherzelle zur speicherung von mehrfachpegeldaten die vorgespannte source/substrate verwenden

Country Status (5)

Country Link
US (1) US5511021A (de)
EP (1) EP0764328B1 (de)
KR (1) KR100271049B1 (de)
DE (1) DE69618119T2 (de)
WO (1) WO1996026521A1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5808937A (en) * 1994-12-16 1998-09-15 National Semiconductor Corporation Self-convergent method for programming FLASH and EEPROM memory cells that moves the threshold voltage from an erased threshold voltage range to one of a plurality of programmed threshold voltage ranges
US5587949A (en) * 1995-04-27 1996-12-24 National Semiconductor Corporation Method for programming an ETOX EPROM or flash memory when cells of the array are formed to store multiple bits of data
US5659504A (en) * 1995-05-25 1997-08-19 Lucent Technologies Inc. Method and apparatus for hot carrier injection
KR0185611B1 (ko) * 1995-12-11 1999-04-15 김광호 불휘발성 반도체 메모리장치의 고전압 레벨 최적화 회로 및 그 방법
JP2982670B2 (ja) * 1995-12-12 1999-11-29 日本電気株式会社 不揮発性半導体記憶装置および記憶方法
KR100217900B1 (ko) * 1996-04-01 1999-09-01 김영환 플래쉬 메모리 셀의 프로그램 방법
US5870407A (en) * 1996-05-24 1999-02-09 Advanced Micro Devices, Inc. Method of screening memory cells at room temperature that would be rejected during hot temperature programming tests
US5908311A (en) * 1996-07-25 1999-06-01 National Semiconductor Corporation Method for forming a mixed-signal CMOS circuit that includes non-volatile memory cells
JP3204119B2 (ja) * 1996-09-30 2001-09-04 日本電気株式会社 不揮発性半導体メモリおよびそのデータ書込方法
US5978269A (en) * 1998-08-17 1999-11-02 National Semiconductor Corporation Apparatus and method for lowering the potential barrier across the source-to-well junction during the programming of non-volatile memory cells
US6011722A (en) * 1998-10-13 2000-01-04 Lucent Technologies Inc. Method for erasing and programming memory devices
US6282145B1 (en) 1999-01-14 2001-08-28 Silicon Storage Technology, Inc. Array architecture and operating methods for digital multilevel nonvolatile memory integrated circuit system
US6522584B1 (en) * 2001-08-02 2003-02-18 Micron Technology, Inc. Programming methods for multi-level flash EEPROMs
US7038248B2 (en) * 2002-02-15 2006-05-02 Sandisk Corporation Diverse band gap energy level semiconductor device
CN113454722B (zh) * 2020-05-19 2022-08-19 长江存储科技有限责任公司 存储器器件及其编程操作

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4181980A (en) * 1978-05-15 1980-01-01 Electronic Arrays, Inc. Acquisition and storage of analog signals
DE2828855C2 (de) * 1978-06-30 1982-11-18 Siemens AG, 1000 Berlin und 8000 München Wortweise elektrisch umprogrammierbarer, nichtflüchtiger Speicher sowie Verfahren zum Löschen bzw. Einschreiben eines bzw. in einen solchen Speicher(s)
IT1224062B (it) * 1979-09-28 1990-09-26 Ates Componenti Elettron Metodo di programmazione per una memoria a semiconduttore non volatile elettricamente alterabile
JPS57189391A (en) * 1981-05-15 1982-11-20 Agency Of Ind Science & Technol Nonvolatile semiconductor memory integrated circuit
US4698787A (en) * 1984-11-21 1987-10-06 Exel Microelectronics, Inc. Single transistor electrically programmable memory device and method
JPS61179569A (ja) * 1985-02-04 1986-08-12 Mitsubishi Electric Corp 半導体記憶装置
JPH07120720B2 (ja) * 1987-12-17 1995-12-20 三菱電機株式会社 不揮発性半導体記憶装置
US5043940A (en) * 1988-06-08 1991-08-27 Eliyahou Harari Flash EEPROM memory systems having multistate storage cells
US5204835A (en) * 1990-06-13 1993-04-20 Waferscale Integration Inc. Eprom virtual ground array
US5187683A (en) * 1990-08-31 1993-02-16 Texas Instruments Incorporated Method for programming EEPROM memory arrays
US5218569A (en) * 1991-02-08 1993-06-08 Banks Gerald J Electrically alterable non-volatile memory with n-bits per memory cell
US5346842A (en) * 1992-02-04 1994-09-13 National Semiconductor Corporation Method of making alternate metal/source virtual ground flash EPROM cell array
US5418743A (en) * 1992-12-07 1995-05-23 Nippon Steel Corporation Method of writing into non-volatile semiconductor memory
JPH06268231A (ja) * 1993-03-16 1994-09-22 Sony Corp 浮遊ゲート型不揮発性半導体記憶装置
US5440505A (en) * 1994-01-21 1995-08-08 Intel Corporation Method and circuitry for storing discrete amounts of charge in a single memory element

Also Published As

Publication number Publication date
EP0764328A1 (de) 1997-03-26
EP0764328B1 (de) 2001-12-19
KR100271049B1 (ko) 2000-11-01
WO1996026521A1 (en) 1996-08-29
DE69618119T2 (de) 2002-08-29
KR970702560A (ko) 1997-05-13
US5511021A (en) 1996-04-23

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