DE69616237D1 - Halbleiter-laserdiode und deren herstellungsverfahren - Google Patents
Halbleiter-laserdiode und deren herstellungsverfahrenInfo
- Publication number
- DE69616237D1 DE69616237D1 DE69616237T DE69616237T DE69616237D1 DE 69616237 D1 DE69616237 D1 DE 69616237D1 DE 69616237 T DE69616237 T DE 69616237T DE 69616237 T DE69616237 T DE 69616237T DE 69616237 D1 DE69616237 D1 DE 69616237D1
- Authority
- DE
- Germany
- Prior art keywords
- production method
- semiconductor laser
- laser diode
- diode
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/3403—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers having a strained layer structure in which the strain performs a special function, e.g. general strain effects, strain versus polarisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/3403—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers having a strained layer structure in which the strain performs a special function, e.g. general strain effects, strain versus polarisation
- H01S5/3406—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers having a strained layer structure in which the strain performs a special function, e.g. general strain effects, strain versus polarisation including strain compensation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34326—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer based on InGa(Al)P, e.g. red laser
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biophysics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Semiconductor Lasers (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP95201613 | 1995-06-16 | ||
PCT/IB1996/000503 WO1997000546A2 (en) | 1995-06-16 | 1996-05-28 | Semiconductor diode laser and method of manufacturing same |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69616237D1 true DE69616237D1 (de) | 2001-11-29 |
DE69616237T2 DE69616237T2 (de) | 2002-07-11 |
Family
ID=8220383
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69616237T Expired - Fee Related DE69616237T2 (de) | 1995-06-16 | 1996-05-28 | Halbleiter-laserdiode und deren herstellungsverfahren |
Country Status (5)
Country | Link |
---|---|
US (1) | US5956359A (de) |
EP (1) | EP0776535B1 (de) |
JP (1) | JPH10504142A (de) |
DE (1) | DE69616237T2 (de) |
WO (1) | WO1997000546A2 (de) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1997050133A1 (en) * | 1996-06-24 | 1997-12-31 | Philips Electronics N.V. | Radiation-emitting semiconductor diode, and method of manufacturing such a diode |
JP3985283B2 (ja) * | 1997-01-22 | 2007-10-03 | ソニー株式会社 | 発光素子 |
KR100239473B1 (ko) | 1997-08-20 | 2000-02-01 | 구자홍 | 레이저 다이오드 및 그 제조방법 |
US6757313B1 (en) * | 1999-11-12 | 2004-06-29 | Trumpf Photonics Inc. | Control of current spreading in semiconductor laser diodes |
DE60021505T2 (de) * | 1999-11-19 | 2006-06-01 | Fuji Photo Film Co. Ltd., Minamiashigara | Hochleistungshalbleiterlaser mit Strombegrenzung und indexgeführter Struktur |
US6731663B1 (en) * | 2000-03-28 | 2004-05-04 | The Furukawa Electric Co., Ltd. | Ridge waveguide type semiconductor laser device |
US7354815B2 (en) * | 2003-11-18 | 2008-04-08 | Silicon Genesis Corporation | Method for fabricating semiconductor devices using strained silicon bearing material |
WO2006104980A2 (en) | 2005-03-25 | 2006-10-05 | Trumpf Photonics Inc. | Laser facet passivation |
DE102005037022A1 (de) * | 2005-06-28 | 2007-01-04 | Osram Opto Semiconductors Gmbh | Strahlungsemittierender optoelektronischer Halbleiterchip mit einer Diffusionsbarriere |
US9755403B2 (en) * | 2015-06-24 | 2017-09-05 | King Abdullah University Of Science And Technology | Controlling the emission wavelength in group III-V semiconductor laser diodes |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5276698A (en) * | 1990-09-20 | 1994-01-04 | Sumitomo Electric Ind., Ltd. | Semiconductor laser having an optical waveguide layer including an AlGaInP active layer |
JPH05145178A (ja) * | 1991-11-18 | 1993-06-11 | Furukawa Electric Co Ltd:The | 歪量子井戸半導体レーザ素子 |
JP3135960B2 (ja) * | 1991-12-20 | 2001-02-19 | シャープ株式会社 | 半導体レーザ装置 |
JPH05243676A (ja) * | 1992-02-28 | 1993-09-21 | Mitsubishi Electric Corp | 半導体レーザ装置 |
JPH0653602A (ja) * | 1992-07-31 | 1994-02-25 | Hitachi Ltd | 半導体レーザ素子 |
JPH0661570A (ja) * | 1992-08-04 | 1994-03-04 | Matsushita Electric Ind Co Ltd | 歪多重量子井戸半導体レーザ |
EP0606821A1 (de) * | 1993-01-11 | 1994-07-20 | International Business Machines Corporation | Lichtemittierende Heterostrukturen mit modulierter Gitterverformung |
JPH07104222A (ja) * | 1993-10-05 | 1995-04-21 | Mitsubishi Electric Corp | 半導体光変調器 |
US5559818A (en) * | 1994-03-24 | 1996-09-24 | Sanyo Electric Co., Ltd. | Semiconductor laser device |
-
1996
- 1996-05-28 JP JP9502839A patent/JPH10504142A/ja active Pending
- 1996-05-28 DE DE69616237T patent/DE69616237T2/de not_active Expired - Fee Related
- 1996-05-28 EP EP96913682A patent/EP0776535B1/de not_active Expired - Lifetime
- 1996-05-28 WO PCT/IB1996/000503 patent/WO1997000546A2/en active IP Right Grant
- 1996-06-14 US US08/670,260 patent/US5956359A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0776535A1 (de) | 1997-06-04 |
EP0776535B1 (de) | 2001-10-24 |
WO1997000546A2 (en) | 1997-01-03 |
US5956359A (en) | 1999-09-21 |
JPH10504142A (ja) | 1998-04-14 |
DE69616237T2 (de) | 2002-07-11 |
WO1997000546A3 (en) | 1997-01-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: JDS UNIPHASE CORP., SAN JOSE, CALIF., US |
|
8339 | Ceased/non-payment of the annual fee |