DE69532429D1 - Apparat zum Messen der in einem Leiterteil induzierten elektrischen Ladung und elektrisches Ladungsmessverfahren - Google Patents
Apparat zum Messen der in einem Leiterteil induzierten elektrischen Ladung und elektrisches LadungsmessverfahrenInfo
- Publication number
- DE69532429D1 DE69532429D1 DE69532429T DE69532429T DE69532429D1 DE 69532429 D1 DE69532429 D1 DE 69532429D1 DE 69532429 T DE69532429 T DE 69532429T DE 69532429 T DE69532429 T DE 69532429T DE 69532429 D1 DE69532429 D1 DE 69532429D1
- Authority
- DE
- Germany
- Prior art keywords
- electrical charge
- measuring
- conductor part
- measuring method
- induced
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/12—Measuring electrostatic fields or voltage-potential
- G01R29/14—Measuring field distribution
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06766—Input circuits therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/24—Arrangements for measuring quantities of charge
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6119115A JP2908240B2 (ja) | 1994-05-31 | 1994-05-31 | 電荷量の測定方法、静電エネルギーの測定方法及び電荷量測定装置 |
JP11911594 | 1994-05-31 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69532429D1 true DE69532429D1 (de) | 2004-02-19 |
DE69532429T2 DE69532429T2 (de) | 2004-11-11 |
Family
ID=14753304
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69532429T Expired - Lifetime DE69532429T2 (de) | 1994-05-31 | 1995-05-31 | Apparat zum Messen der in einem Leiterteil induzierten elektrischen Ladung und elektrisches Ladungsmessverfahren |
Country Status (5)
Country | Link |
---|---|
US (2) | US6034530A (de) |
EP (1) | EP0685745B1 (de) |
JP (1) | JP2908240B2 (de) |
KR (1) | KR100230628B1 (de) |
DE (1) | DE69532429T2 (de) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2836676B2 (ja) * | 1996-02-09 | 1998-12-14 | 日本電気株式会社 | 半導体要素の試験方法及び装置 |
JP3466518B2 (ja) * | 1999-10-20 | 2003-11-10 | ファブソリューション株式会社 | 電荷測定装置 |
JP3379490B2 (ja) | 1999-10-20 | 2003-02-24 | 日本電気株式会社 | 電荷測定装置 |
US6628121B1 (en) * | 2000-10-13 | 2003-09-30 | Heidelberger Druckmaschinen Ag | Tools for measuring electrometer dispenser response |
JP4413445B2 (ja) * | 2001-03-19 | 2010-02-10 | 三菱電機株式会社 | 空調ダクト装置 |
JP2006023119A (ja) * | 2004-07-06 | 2006-01-26 | Fab Solution Kk | 静電破壊防止用材料の評価方法および静電破壊防止用材料の評価装置 |
KR100802751B1 (ko) * | 2005-11-01 | 2008-02-12 | 현대자동차주식회사 | 유동전위 측정용 센서 |
DE102007053862B4 (de) * | 2006-11-17 | 2011-05-26 | Suss Microtec Test Systems Gmbh | Prober zum Testen von Halbleitersubstraten mit EMI-Abschirmung |
US8278951B2 (en) | 2006-11-17 | 2012-10-02 | Cascade Microtech, Inc. | Probe station for testing semiconductor substrates and comprising EMI shielding |
EP2180327A1 (de) * | 2008-10-21 | 2010-04-28 | Applied Materials, Inc. | Vorrichtung und Verfahren zur aktiven Spannungskompensierung |
US9817032B2 (en) | 2012-05-23 | 2017-11-14 | Semiconductor Energy Laboratory Co., Ltd. | Measurement device |
CN103575942A (zh) * | 2012-07-20 | 2014-02-12 | 太仓子午电气有限公司 | 一种多用防滑测量笔 |
US11609358B2 (en) | 2016-07-18 | 2023-03-21 | Omni Lps. Co., Ltd. | Lightning strike alarm system using bipolar conventional air terminal |
KR101785024B1 (ko) | 2016-07-18 | 2017-10-13 | (주)옴니엘피에스 | 쌍극자피뢰침(BCAT: Bipolar Conventional Air Terminal)를 이용한 낙뢰경보시스템 |
JP7123663B2 (ja) * | 2018-06-29 | 2022-08-23 | 株式会社東芝 | 製造ライン内の静電気測定方法 |
CN110231519A (zh) * | 2019-06-18 | 2019-09-13 | 国网河南省电力公司辉县市供电公司 | 一种静电检测消除装置 |
FR3140443A1 (fr) * | 2022-10-04 | 2024-04-05 | Lipeo | Absorbeur de charge électrique, capteur de charge et magnétomètre |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2883619A (en) * | 1956-02-29 | 1959-04-21 | Tektronix Inc | Electrical probe |
DE1281573B (de) * | 1964-12-08 | 1968-10-31 | Kalle Ag | Messsonde zur Bestimmung der oertlichen Ladungsverteilung auf Oberflaechen von Festkoerpern |
US3826981A (en) * | 1968-05-03 | 1974-07-30 | H Ross | Solid-state high impedance meter system |
US3689832A (en) * | 1970-05-01 | 1972-09-05 | Western Technical Products Inc | Resistance tester for producing an audible tone that varies with the resistance |
US3829776A (en) * | 1973-07-31 | 1974-08-13 | E Lozoya | Pen type voltmeter |
JPS53116182A (en) * | 1977-03-18 | 1978-10-11 | Nippon Kayaku Kk | Method of measuring amount of electrostatic charge |
US4139813A (en) * | 1977-04-01 | 1979-02-13 | Xerox Corporation | Adaptor for an electrometer probe to permit contact potential measurements and method for using same |
US4205264A (en) * | 1978-04-25 | 1980-05-27 | Charles Gold | High impedance electrical testing instrument for AC and DC voltage detection and continuity testing |
JPS5810663A (ja) * | 1981-07-11 | 1983-01-21 | Hasegawa Denki Kogyo Kk | 直流特別高圧用検電器 |
JPS5833577A (ja) * | 1981-08-25 | 1983-02-26 | Shinko Electric Co Ltd | 無人誘導台車 |
JPS6020694Y2 (ja) * | 1981-08-31 | 1985-06-20 | 日成企業株式会社 | 循環蛇口 |
US4591794A (en) * | 1982-12-28 | 1986-05-27 | United Technologies Corporation | Gas turbine access port plug electrostatic probe |
SU1283672A1 (ru) * | 1985-07-17 | 1987-01-15 | Научно-исследовательский институт механики и физики при Саратовском государственном университете | Датчик поверхностных зар дов и потенциалов |
JPS63281069A (ja) * | 1987-05-13 | 1988-11-17 | Hitachi Ltd | 静電気検出装置 |
EP0395447B1 (de) * | 1989-04-28 | 1995-06-28 | Kabushiki Kaisha Toshiba | Oberflächenpotentialmesssystem |
US5300889A (en) * | 1991-04-25 | 1994-04-05 | Bakhoum Ezzat G | Ground-free electrostatic measurement device with electrical charge storing capacitor |
US5164674A (en) * | 1992-01-22 | 1992-11-17 | Bakhoum Ezzat G | Static charge warning device |
-
1994
- 1994-05-31 JP JP6119115A patent/JP2908240B2/ja not_active Expired - Lifetime
-
1995
- 1995-05-31 KR KR1019950014277A patent/KR100230628B1/ko active IP Right Grant
- 1995-05-31 DE DE69532429T patent/DE69532429T2/de not_active Expired - Lifetime
- 1995-05-31 US US08/454,851 patent/US6034530A/en not_active Expired - Lifetime
- 1995-05-31 EP EP95108331A patent/EP0685745B1/de not_active Expired - Lifetime
-
1998
- 1998-03-10 US US09/038,354 patent/US6107804A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
KR950033500A (ko) | 1995-12-26 |
US6107804A (en) | 2000-08-22 |
EP0685745B1 (de) | 2004-01-14 |
JPH07325119A (ja) | 1995-12-12 |
US6034530A (en) | 2000-03-07 |
DE69532429T2 (de) | 2004-11-11 |
JP2908240B2 (ja) | 1999-06-21 |
KR100230628B1 (ko) | 1999-11-15 |
EP0685745A2 (de) | 1995-12-06 |
EP0685745A3 (de) | 1997-05-07 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE69532429D1 (de) | Apparat zum Messen der in einem Leiterteil induzierten elektrischen Ladung und elektrisches Ladungsmessverfahren | |
NO984301D0 (no) | FremgangsmÕte og apparat for mÕling av resistivitet i en grunnformasjon | |
DE69524298D1 (de) | Apparat und Verfahren zum Messen einer Verschiebung | |
DE3266126D1 (en) | Method and apparatus for contactless electrical testing | |
NO972194L (no) | Apparat for registrering av elektriske utladninger i et pröveobjekt | |
DE69123772D1 (de) | Verfahren und Gerät zum Entfernungsmessen | |
NO954030D0 (no) | Fremgangsmåte og apparat for måling av slam-resistivitet i et borehull | |
DE69736694D1 (de) | Verfahren und Gerät zum Messen von nahem Übersprechen in Verbindungsleitungen | |
GB2306680B (en) | Method and apparatus for measuring RF power in a test set | |
DE69524347D1 (de) | Vorrichtung und Verfahren zum Wegmessung | |
DE69119798D1 (de) | Elektromagnetischer Apparat zum Messen der Leitfähigkeit und Verfahren zum Messen der Leitfähigkeit | |
NO965040D0 (no) | Apparat for måling av resistiviteten i formasjoner | |
DE19580887D2 (de) | Verfahren und Anordnung zum Messen von elektrischen Strömen aus wenigstens zwei Meßbereichen | |
EP0410234A3 (en) | Method and apparatus for measuring an electric field or an electric voltage | |
DE69318476D1 (de) | Verfahren und Vorrichtung zum Schmelzen von elektrischen Leitern | |
DE69315460D1 (de) | Verfahren und Vorrichtung zum Annippeln einer neuen Elektrode an einer verbrauchten Elektrode in einem Elektroofen | |
DE68906710D1 (de) | Verfahren und apparat zum verkapseln einer elektronischen anordnung. | |
PL331532A1 (en) | Gap with measuring method and apparatus | |
DE69009053D1 (de) | Vorrichtung und verfahren zum messen elektrischen stromes im zustand hoher interferenz. | |
DE59610371D1 (de) | Verfahren und Vorrichtung zum Prüfen einer elektrischen Leiteranordnung | |
DE69513429D1 (de) | Verfahren und Vorrichtung zum elektrischen Testen eines mehradrigen Kabels | |
DE19781840T1 (de) | Verfahren und Vorrichtung zum Messen der Schmelzentemperatur in einem Schmelzengefäß | |
NO953609D0 (no) | Fremgangsmåte og apparat for effektmåling | |
DE59802939D1 (de) | Verfahren zum Messen von elektrischen Strömen in n Leitern sowie Vorrichtung zur Durchführung des Verfahrens | |
DE69827406D1 (de) | Verfahren und vorrichtung zum messen von strahlung |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: HARADA CORP., OSAKA, JP |