DE69532398D1 - Abtastprüfbare doppelflankengesteuerte Abtastzelle - Google Patents
Abtastprüfbare doppelflankengesteuerte AbtastzelleInfo
- Publication number
- DE69532398D1 DE69532398D1 DE69532398T DE69532398T DE69532398D1 DE 69532398 D1 DE69532398 D1 DE 69532398D1 DE 69532398 T DE69532398 T DE 69532398T DE 69532398 T DE69532398 T DE 69532398T DE 69532398 D1 DE69532398 D1 DE 69532398D1
- Authority
- DE
- Germany
- Prior art keywords
- scanable
- double
- scan cell
- controlled scan
- edge controlled
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
- H03K3/037—Bistable circuits
- H03K3/0375—Bistable circuits provided with means for increasing reliability; for protection; for ensuring a predetermined initial state when the supply voltage has been applied; for storing the actual state when the supply voltage fails
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318541—Scan latches or cell details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB9417591A GB9417591D0 (en) | 1994-09-01 | 1994-09-01 | Scan testable double edge triggered scan cell |
Publications (1)
Publication Number | Publication Date |
---|---|
DE69532398D1 true DE69532398D1 (de) | 2004-02-12 |
Family
ID=10760671
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69532398T Expired - Lifetime DE69532398D1 (de) | 1994-09-01 | 1995-08-22 | Abtastprüfbare doppelflankengesteuerte Abtastzelle |
Country Status (5)
Country | Link |
---|---|
US (1) | US5646567A (de) |
EP (1) | EP0702243B1 (de) |
JP (1) | JP2756935B2 (de) |
DE (1) | DE69532398D1 (de) |
GB (1) | GB9417591D0 (de) |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09294056A (ja) * | 1996-04-25 | 1997-11-11 | Mitsubishi Electric Corp | 半導体集積回路 |
US5938782A (en) * | 1996-09-24 | 1999-08-17 | Vlsi Technology, Inc. | Scan flip-flop and methods for controlling the entry of data therein |
US5774003A (en) * | 1996-10-09 | 1998-06-30 | National Semiconductor Corporation | Flip-flop cell having clock skew protection |
US5774475A (en) * | 1996-12-05 | 1998-06-30 | National Semiconductor Corporation | Testing scheme that re-uses original stimulus for testing circuitry embedded within a larger circuit |
JP3191720B2 (ja) * | 1997-04-11 | 2001-07-23 | 日本電気株式会社 | マルチプレクサ |
JPH11142477A (ja) * | 1997-11-06 | 1999-05-28 | Fujitsu Ltd | 半導体集積回路 |
US6150861A (en) * | 1998-01-09 | 2000-11-21 | Texas Instruments Incorporated | Flip-flop |
GB9810512D0 (en) | 1998-05-15 | 1998-07-15 | Sgs Thomson Microelectronics | Detecting communication errors across a chip boundary |
AU1913500A (en) * | 1998-11-25 | 2000-06-13 | Nanopower, Inc. | Improved flip-flops and other logic circuits and techniques for improving layouts of integrated circuits |
US6748352B1 (en) * | 1999-12-30 | 2004-06-08 | Intel Corporation | Method and apparatus for scan design using a formal verification-based process |
US6300809B1 (en) | 2000-07-14 | 2001-10-09 | International Business Machines Corporation | Double-edge-triggered flip-flop providing two data transitions per clock cycle |
CN100477522C (zh) * | 2001-06-12 | 2009-04-08 | 皇家菲利浦电子有限公司 | 集成电路和用于测试该集成电路的方法 |
JP3535855B2 (ja) * | 2001-09-05 | 2004-06-07 | Necエレクトロニクス株式会社 | スキャンフリップフロップ及び半導体集積回路装置 |
US7082560B2 (en) * | 2002-05-24 | 2006-07-25 | Sun Microsystems, Inc. | Scan capable dual edge-triggered state element for application of combinational and sequential scan test patterns |
US6943605B2 (en) * | 2002-12-31 | 2005-09-13 | Intel Corporation | Scan cell designs for a double-edge-triggered flip-flop |
DE60323851D1 (de) | 2003-12-17 | 2008-11-13 | St Microelectronics Res & Dev | TAP Multiplexer |
DE60314525T2 (de) | 2003-12-17 | 2008-02-28 | Stmicroelectronics Ltd., Almondsbury | TAP Zeitmultiplexen mit Abtasttest |
EP1544632B1 (de) * | 2003-12-17 | 2008-08-27 | STMicroelectronics (Research & Development) Limited | TAP-Daten-Transfer mit doppelter Daten-Rate |
US7146551B2 (en) * | 2005-01-20 | 2006-12-05 | Hewlett-Packard Development Company, L.P. | Method and system of modifying data in functional latches of a logic unit during scan chain testing thereof |
FR2897440A1 (fr) * | 2006-02-10 | 2007-08-17 | St Microelectronics Sa | Circuit electronique comprenant un mode de test securise par rupture d'une chaine de test, et procede associe. |
JP2009105586A (ja) * | 2007-10-23 | 2009-05-14 | Nec Electronics Corp | ラッチ回路 |
EP2234272A3 (de) | 2009-03-23 | 2015-09-30 | Oticon A/S | Doppelflankengetriggerte Speicherzelle mit geringem Stromverbrauch mit Scantestunterstützung und Taktgatterschaltung dafür |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6049443A (ja) * | 1983-08-01 | 1985-03-18 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | ラッチ回路 |
US4629909A (en) * | 1984-10-19 | 1986-12-16 | American Microsystems, Inc. | Flip-flop for storing data on both leading and trailing edges of clock signal |
KR910001937Y1 (ko) * | 1988-05-18 | 1991-03-30 | 삼성전자 주식회사 | 아날로그 스위치회로 |
US5172011A (en) * | 1989-06-30 | 1992-12-15 | Digital Equipment Corporation | Latch circuit and method with complementary clocking and level sensitive scan capability |
US5130568A (en) * | 1990-11-05 | 1992-07-14 | Vertex Semiconductor Corporation | Scannable latch system and method |
JP3057814B2 (ja) * | 1991-06-26 | 2000-07-04 | 日本電気株式会社 | 半導体集積回路 |
US5179295A (en) * | 1992-03-20 | 1993-01-12 | Vlsi Technology, Inc. | Dual edge-triggered digital storage element and method therefor |
-
1994
- 1994-09-01 GB GB9417591A patent/GB9417591D0/en active Pending
-
1995
- 1995-08-22 DE DE69532398T patent/DE69532398D1/de not_active Expired - Lifetime
- 1995-08-22 EP EP95305863A patent/EP0702243B1/de not_active Expired - Lifetime
- 1995-08-24 US US08/518,421 patent/US5646567A/en not_active Expired - Lifetime
- 1995-08-31 JP JP7223699A patent/JP2756935B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2756935B2 (ja) | 1998-05-25 |
GB9417591D0 (en) | 1994-10-19 |
EP0702243A2 (de) | 1996-03-20 |
US5646567A (en) | 1997-07-08 |
EP0702243B1 (de) | 2004-01-07 |
JPH08233906A (ja) | 1996-09-13 |
EP0702243A3 (de) | 1996-04-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de |