DE69520960T2 - Zeitgeber für ein automatisches testsystem mit hohen datenraten - Google Patents

Zeitgeber für ein automatisches testsystem mit hohen datenraten

Info

Publication number
DE69520960T2
DE69520960T2 DE69520960T DE69520960T DE69520960T2 DE 69520960 T2 DE69520960 T2 DE 69520960T2 DE 69520960 T DE69520960 T DE 69520960T DE 69520960 T DE69520960 T DE 69520960T DE 69520960 T2 DE69520960 T2 DE 69520960T2
Authority
DE
Germany
Prior art keywords
timer
test system
data rates
high data
automatic test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69520960T
Other languages
English (en)
Other versions
DE69520960D1 (de
Inventor
B Robbins
J Brown
A Reichert
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of DE69520960D1 publication Critical patent/DE69520960D1/de
Application granted granted Critical
Publication of DE69520960T2 publication Critical patent/DE69520960T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/13—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841—Signal generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/13—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
    • H03K5/131—Digitally controlled

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Tests Of Electronic Circuits (AREA)
DE69520960T 1995-03-29 1995-12-05 Zeitgeber für ein automatisches testsystem mit hohen datenraten Expired - Lifetime DE69520960T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/413,063 US5566188A (en) 1995-03-29 1995-03-29 Low cost timing generator for automatic test equipment operating at high data rates
PCT/US1995/015744 WO1996031002A1 (en) 1995-03-29 1995-12-05 Timing generator for automatic test equipment operating at high data rates

Publications (2)

Publication Number Publication Date
DE69520960D1 DE69520960D1 (de) 2001-06-21
DE69520960T2 true DE69520960T2 (de) 2001-11-15

Family

ID=23635674

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69520960T Expired - Lifetime DE69520960T2 (de) 1995-03-29 1995-12-05 Zeitgeber für ein automatisches testsystem mit hohen datenraten

Country Status (6)

Country Link
US (1) US5566188A (de)
EP (1) EP0818079B1 (de)
JP (1) JPH11502929A (de)
KR (1) KR100389608B1 (de)
DE (1) DE69520960T2 (de)
WO (1) WO1996031002A1 (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5854797A (en) * 1997-08-05 1998-12-29 Teradyne, Inc. Tester with fast refire recovery time
FR2773651A1 (fr) * 1998-01-13 1999-07-16 Motorola Semiconducteurs Circuit de temporisation
US6037821A (en) * 1998-05-28 2000-03-14 General Electric Company Digital programmable clock generator with improved accuracy
US6158030A (en) 1998-08-21 2000-12-05 Micron Technology, Inc. System and method for aligning output signals in massively parallel testers and other electronic devices
US6282682B1 (en) * 1999-02-05 2001-08-28 Teradyne, Inc. Automatic test equipment using sigma delta modulation to create reference levels
US6124745A (en) * 1999-05-19 2000-09-26 Analog Devices, Inc. Delay and interpolation timing structures and methods
US6553529B1 (en) 1999-07-23 2003-04-22 Teradyne, Inc. Low cost timing system for highly accurate multi-modal semiconductor testing
US6774598B1 (en) * 1999-09-08 2004-08-10 Dr. Johannes Heidenhain Gmbh Method and circuitry for producing nominal position values for a closed loop position control of a numerically continuous-path controlled machine
EP1085335A1 (de) * 1999-09-14 2001-03-21 Alcatel Verfahren und Vorrichtung zum Testen integrierter Schaltungen mit einer automatischen Testeinrichtung
US6396313B1 (en) 2000-08-24 2002-05-28 Teradyne, Inc. Noise-shaped digital frequency synthesis
US7765443B1 (en) * 2001-03-19 2010-07-27 Credence Systems Corporation Test systems and methods for integrated circuit devices
US6915462B1 (en) * 2002-07-30 2005-07-05 Adaptec, Inc. Method and apparatus for a programmable deskew circuit
US7404512B2 (en) * 2003-10-31 2008-07-29 The Boeing Company Clamping apparatus and methods for manufacturing
US7216281B2 (en) * 2004-09-29 2007-05-08 Advantest Corp. Format control circuit and semiconductor test device
US7571407B2 (en) * 2005-04-08 2009-08-04 Kabushiki Kaisha Toshiba Semiconductor integrated circuit and method of testing delay thereof
US7356897B2 (en) * 2005-05-11 2008-04-15 The Boeing Company Systems and methods for verifying a pre-programmed materials processing path
KR100736673B1 (ko) * 2006-08-01 2007-07-06 주식회사 유니테스트 반도체 소자 테스트 장치
US7539592B2 (en) * 2007-03-23 2009-05-26 Advantest Corporation Test apparatus and electronic device
US20080238516A1 (en) * 2007-03-30 2008-10-02 Teradyne, Inc. Timing interpolator with improved linearity
US11961220B2 (en) 2018-01-23 2024-04-16 Texas Instruments Incorporated Handling integrated circuits in automated testing

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4079456A (en) * 1977-01-24 1978-03-14 Rca Corporation Output buffer synchronizing circuit having selectively variable delay means
US4482983A (en) * 1980-06-23 1984-11-13 Sperry Corporation Variable speed cycle time for synchronous machines
US4564953A (en) * 1983-03-28 1986-01-14 Texas Instruments Incorporated Programmable timing system
US4789835A (en) * 1983-08-01 1988-12-06 Fairchild Camera & Instrument Corporation Control of signal timing apparatus in automatic test systems using minimal memory
JPS6089775A (ja) * 1983-08-01 1985-05-20 フエアチアイルド　カメラ　アンド　インストルメント　コ−ポレ−シヨン 自動テスト装置用のテスト期間発生器
US4806852A (en) * 1984-09-07 1989-02-21 Megatest Corporation Automatic test system with enhanced performance of timing generators
JP2539600B2 (ja) * 1985-07-10 1996-10-02 株式会社アドバンテスト タイミング発生装置
US4779221A (en) * 1987-01-28 1988-10-18 Megatest Corporation Timing signal generator
US5274796A (en) * 1987-02-09 1993-12-28 Teradyne, Inc. Timing generator with edge generators, utilizing programmable delays, providing synchronized timing signals at non-integer multiples of a clock signal
CA1281385C (en) * 1987-02-09 1991-03-12 George William Conner Timing generator
US5122988A (en) * 1989-09-21 1992-06-16 Schlumberger Tecnologies, Inc. Data stream smoothing using a FIFO memory
US5321702A (en) * 1989-10-11 1994-06-14 Teradyne, Inc. High speed timing generator
US5321700A (en) * 1989-10-11 1994-06-14 Teradyne, Inc. High speed timing generator
JPH0793558B2 (ja) * 1989-12-15 1995-10-09 安藤電気株式会社 タイミング信号遅延回路
US5033066A (en) * 1990-02-16 1991-07-16 Hughes Aircraft Company Event tagging time delay
US5280486A (en) * 1990-03-16 1994-01-18 Teradyne, Inc. High speed fail processor
US5212443A (en) * 1990-09-05 1993-05-18 Schlumberger Technologies, Inc. Event sequencer for automatic test equipment
US5437021A (en) * 1992-06-12 1995-07-25 Intel Corporation Programmable dedicated timer operating on a clock independent of processor timer

Also Published As

Publication number Publication date
DE69520960D1 (de) 2001-06-21
JPH11502929A (ja) 1999-03-09
KR100389608B1 (ko) 2003-08-19
EP0818079B1 (de) 2001-05-16
EP0818079A1 (de) 1998-01-14
US5566188A (en) 1996-10-15
KR19980703404A (ko) 1998-11-05
WO1996031002A1 (en) 1996-10-03

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