DE69811927D1 - Automatisches mikrowellentestsystem mit besserer genauigkeit - Google Patents

Automatisches mikrowellentestsystem mit besserer genauigkeit

Info

Publication number
DE69811927D1
DE69811927D1 DE69811927T DE69811927T DE69811927D1 DE 69811927 D1 DE69811927 D1 DE 69811927D1 DE 69811927 T DE69811927 T DE 69811927T DE 69811927 T DE69811927 T DE 69811927T DE 69811927 D1 DE69811927 D1 DE 69811927D1
Authority
DE
Germany
Prior art keywords
test system
better accuracy
microwave test
automatic microwave
automatic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69811927T
Other languages
English (en)
Inventor
Thomas Begg
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Application granted granted Critical
Publication of DE69811927D1 publication Critical patent/DE69811927D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Tests Of Electronic Circuits (AREA)
DE69811927T 1997-10-22 1998-10-13 Automatisches mikrowellentestsystem mit besserer genauigkeit Expired - Lifetime DE69811927D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/955,782 US6249128B1 (en) 1997-10-22 1997-10-22 Automated microwave test system with improved accuracy
PCT/US1998/021541 WO1999021025A1 (en) 1997-10-22 1998-10-13 Automated microwave test system with improved accuracy

Publications (1)

Publication Number Publication Date
DE69811927D1 true DE69811927D1 (de) 2003-04-10

Family

ID=25497324

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69811927T Expired - Lifetime DE69811927D1 (de) 1997-10-22 1998-10-13 Automatisches mikrowellentestsystem mit besserer genauigkeit

Country Status (8)

Country Link
US (1) US6249128B1 (de)
EP (1) EP1025450B1 (de)
JP (1) JP4282897B2 (de)
KR (1) KR100538405B1 (de)
CN (1) CN1111747C (de)
DE (1) DE69811927D1 (de)
TW (1) TW394849B (de)
WO (1) WO1999021025A1 (de)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6571187B1 (en) * 2000-02-09 2003-05-27 Avaya Technology Corp. Method for calibrating two port high frequency measurements
US6366097B1 (en) * 2000-04-26 2002-04-02 Verizon Laboratories Inc. Technique for the measurement of reflection coefficients in stored energy systems
US6466007B1 (en) * 2000-08-14 2002-10-15 Teradyne, Inc. Test system for smart card and indentification devices and the like
JP2005526250A (ja) * 2002-05-16 2005-09-02 コーニンクレッカ　フィリップス　エレクトロニクス　エヌ　ヴィ 較正及びデエンベッディングのための方法、デエンベッディングのためのデバイスセット、並びにベクトルネットワークアナライザ
US6861846B2 (en) * 2002-12-16 2005-03-01 Agilent Technologies, Inc. Distortion measurements with a vector network analyzer
US7034548B2 (en) * 2003-04-11 2006-04-25 Agilent Technologies, Inc. Balanced device characterization including test system calibration
US7643545B2 (en) * 2005-03-31 2010-01-05 Teradyne, Inc. Calibrating automatic test equipment to account for magnitude and phase offsets
DE102005018090A1 (de) 2005-04-19 2006-10-26 Rohde & Schwarz Gmbh & Co. Kg Kalibriervorrichtung und Kalibrierverfahren zum Abgleich eines Richtkoppler-Messsystems
US20070136018A1 (en) * 2005-12-09 2007-06-14 Fernandez Andrew D Nonlinear model calibration using attenuated stimuli
DE102007018096A1 (de) * 2007-04-17 2008-10-23 Rohde & Schwarz Gmbh & Co. Kg Verfahren zur Ermittlung von Zeitunterschieden zwischen durch zumindest zwei gekoppelte Messgeräte gemessenen Signalen sowie Messsystem und entsprechende Umschaltvorrichtung
DE202008013687U1 (de) * 2008-10-15 2009-01-02 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Messanordnung mit Kalibriersubstrat und elektronischer Schaltung
DE102012024480A1 (de) 2012-12-14 2014-06-18 Eads Deutschland Gmbh Verfahren zur Kalibrierung von Messdaten aus Hochfrequenzmessungen an einer automatisierten Prüfeinrichtung zur Vermessung einer Mehrzahl von Mikrowellenbauelementen
CN104419843B (zh) * 2013-08-21 2016-11-16 吕传盛 耐电热银基双相线及其制造方法
WO2015070923A1 (en) 2013-11-15 2015-05-21 Advantest Corporation Tester
WO2015070924A1 (en) 2013-11-15 2015-05-21 Advantest Corporation Tester
WO2015081980A1 (en) 2013-12-02 2015-06-11 Advantest Corporation Instruction provider and method for providing a sequence of instructions, test processor and method for providing a device under test
WO2015090425A1 (en) 2013-12-19 2015-06-25 Advantest Corporation A power supply device, a test equipment comprising a power supply device and a method for operating a power supply device
WO2015090478A1 (en) 2013-12-20 2015-06-25 Advantest Corporation Multi-port measurement technique for determining s-parameters
WO2015113607A1 (en) 2014-01-30 2015-08-06 Advantest Corporation Test apparatus and method for testing a device under test
CN104076214B (zh) * 2014-06-11 2017-01-25 南京第五十五所技术开发有限公司 多通道微波组件自动测试方法
WO2016066191A1 (en) 2014-10-29 2016-05-06 Advantest Corporation Scheduler
WO2016082899A1 (en) 2014-11-28 2016-06-02 Advantest Corporation Removal of sampling clock jitter induced in an output signal of an analog-to-digital converter
WO2016102020A1 (en) 2014-12-23 2016-06-30 Advantest Corporation Test equipment, method for operating a test equipment and computer program
WO2016155830A1 (en) 2015-04-01 2016-10-06 Advantest Corporation Method for operating a test apparatus and a test apparatus
WO2016173619A1 (en) 2015-04-27 2016-11-03 Advantest Corporation Switch circuit, method for operating a switch circuit and an automated test equipment
WO2016188572A1 (en) 2015-05-27 2016-12-01 Advantest Corporation Automated test equipment for combined signals
WO2016198100A1 (en) 2015-06-10 2016-12-15 Advantest Corporation High frequency integrated circuit and emitting device for irradiating the integrated circuit
US11693046B2 (en) * 2017-07-20 2023-07-04 Tektronix, Inc. Monitoring waveforms from waveform generator at device under test
US10890604B2 (en) * 2017-07-20 2021-01-12 Tektronix, Inc. Monitoring device under test waveform on signal generator
CN110967537A (zh) * 2018-10-01 2020-04-07 特克特朗尼克公司 在被测设备处监视来自波形发生器的波形
CN112051534B (zh) * 2020-08-31 2023-08-25 中电科思仪科技股份有限公司 一种提高微波网络测量与校准精度的外置式装置及方法
CN112858978A (zh) * 2021-01-08 2021-05-28 胜达克半导体科技(上海)有限公司 一种载具板自校准的高精度测试方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0234112B1 (de) 1986-01-17 1992-03-04 Marconi Instruments Limited Sechstorreflektometer-Prüfanordnung
US4839578A (en) 1987-06-04 1989-06-13 Eip Microwave, Inc. Method for removing phase instabilities caused by flexure of cables in microwave network analyzer measurements
US4853613A (en) 1987-10-27 1989-08-01 Martin Marietta Corporation Calibration method for apparatus evaluating microwave/millimeter wave circuits
US4858160A (en) 1988-03-18 1989-08-15 Cascade Microtech, Inc. System for setting reference reactance for vector corrected measurements
US4982164A (en) 1988-04-22 1991-01-01 Rhode & Schwarz Gmbh & Co. K.G. Method of calibrating a network analyzer
US5047725A (en) 1989-11-28 1991-09-10 Cascade Microtech, Inc. Verification and correction method for an error model for a measurement network
US5191294A (en) 1990-04-02 1993-03-02 Wiltron Company Measuring noise figure and y-factor
US5241277A (en) 1992-02-28 1993-08-31 United Technologies Corporation Test system for automatic testing of insulation resistance, capacitance and attenuation of each contact pair in a filter pin connector
US5276411A (en) 1992-06-01 1994-01-04 Atn Microwave, Inc. High power solid state programmable load
US5467021A (en) * 1993-05-24 1995-11-14 Atn Microwave, Inc. Calibration method and apparatus
US5434511A (en) 1993-05-24 1995-07-18 Atn Microwave, Inc. Electronic microwave calibration device
US5587934A (en) 1993-10-21 1996-12-24 Wiltron Company Automatic VNA calibration apparatus
US5572160A (en) 1994-12-01 1996-11-05 Teradyne, Inc. Architecture for RF signal automatic test equipment

Also Published As

Publication number Publication date
CN1276872A (zh) 2000-12-13
JP2001521153A (ja) 2001-11-06
EP1025450A1 (de) 2000-08-09
JP4282897B2 (ja) 2009-06-24
US6249128B1 (en) 2001-06-19
WO1999021025A1 (en) 1999-04-29
CN1111747C (zh) 2003-06-18
KR100538405B1 (ko) 2005-12-22
EP1025450B1 (de) 2003-03-05
KR20010031308A (ko) 2001-04-16
TW394849B (en) 2000-06-21

Similar Documents

Publication Publication Date Title
DE69811927D1 (de) Automatisches mikrowellentestsystem mit besserer genauigkeit
DE69807539D1 (de) Automatisches Analysegerät
DE69837230D1 (de) Automatische Analysevorrichtung
DE69817725D1 (de) Mikroprozessor Testsystem
NO20011740L (no) Nivåmålesystem
DE69917505D1 (de) Tonermengenmesssystem
DE69708773T2 (de) Automatisches Messgerät
DE69916998T2 (de) Fasertestsystem mit unterprobenahme
DE19781837T1 (de) Automatischer Immunoassay-Analysator
DE69609663T2 (de) Automatische Analysevorrichtung
DE69927449D1 (de) Automatisches Messgerät mit ringförmiger Förderanlage
DE69829729D1 (de) Automatische Schaltungsprüfeinrichtung mit Wellenformerfassungsbetriebsarten
DE69725771D1 (de) Automatische Lastmessvorrichtung
DE69832765D1 (de) Mikrowellenkonzentrationsmessvorrichtung
DE59800558D1 (de) Messsystem
DE29817719U1 (de) Positionsmeßsystem
DE69811027T2 (de) Zirkulator mit konzentrierten Elementen
DE29718238U1 (de) Pipette
DE29619496U1 (de) Steckverbinder mit Leuchtanzeige
DE69839052D1 (de) Elektronischer zähler mit automatischer netzerkennung
DE69831573D1 (de) Inspektionssystem mit probenvorschau
DE29712213U1 (de) Wiegeeinrichtung mit Wechselgerät
DE69530461T2 (de) Rechner mit Probefunktion
DE59808303D1 (de) Uv-optisches system mit reduzierter alterung
DE29607030U1 (de) Prüfanlage

Legal Events

Date Code Title Description
8332 No legal effect for de