DE69428963D1 - Verfahren und vorrichtung zur verarbeitung von signalen für einen ultraschallinspektionsapparat - Google Patents

Verfahren und vorrichtung zur verarbeitung von signalen für einen ultraschallinspektionsapparat

Info

Publication number
DE69428963D1
DE69428963D1 DE69428963T DE69428963T DE69428963D1 DE 69428963 D1 DE69428963 D1 DE 69428963D1 DE 69428963 T DE69428963 T DE 69428963T DE 69428963 T DE69428963 T DE 69428963T DE 69428963 D1 DE69428963 D1 DE 69428963D1
Authority
DE
Germany
Prior art keywords
inspection apparatus
processing signals
ultrasonic inspection
ultrasonic
signals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69428963T
Other languages
English (en)
Other versions
DE69428963T2 (de
Inventor
Yukinori Iizuka
Hidekazu Horigome
Akira Murayama
Shin Nakazawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Original Assignee
NKK Corp
Nippon Kokan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP5135562A external-priority patent/JP2985579B2/ja
Application filed by NKK Corp, Nippon Kokan Ltd filed Critical NKK Corp
Publication of DE69428963D1 publication Critical patent/DE69428963D1/de
Application granted granted Critical
Publication of DE69428963T2 publication Critical patent/DE69428963T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/449Statistical methods not provided for in G01N29/4409, e.g. averaging, smoothing and interpolation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/36Detecting the response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/38Detecting the response signal, e.g. electronic circuits specially adapted therefor by time filtering, e.g. using time gates
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/46Processing the detected response signal, e.g. electronic circuits specially adapted therefor by spectral analysis, e.g. Fourier analysis or wavelet analysis
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/04Wave modes and trajectories
    • G01N2291/044Internal reflections (echoes), e.g. on walls or defects

Landscapes

  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Mathematical Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Probability & Statistics with Applications (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
DE69428963T 1993-06-07 1994-06-07 Verfahren und vorrichtung zur verarbeitung von signalen für einen ultraschallinspektionsapparat Expired - Lifetime DE69428963T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP5135562A JP2985579B2 (ja) 1992-06-09 1993-06-07 超音波探傷装置の信号処理装置
PCT/JP1994/000916 WO1994029714A1 (fr) 1993-06-07 1994-06-07 Procede et appareil pour traiter les signaux d'un detecteur de defauts par ultrasons

Publications (2)

Publication Number Publication Date
DE69428963D1 true DE69428963D1 (de) 2001-12-13
DE69428963T2 DE69428963T2 (de) 2002-08-14

Family

ID=15154719

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69428963T Expired - Lifetime DE69428963T2 (de) 1993-06-07 1994-06-07 Verfahren und vorrichtung zur verarbeitung von signalen für einen ultraschallinspektionsapparat

Country Status (6)

Country Link
US (1) US5671154A (de)
EP (1) EP0654666B1 (de)
KR (1) KR0160003B1 (de)
CN (1) CN1035690C (de)
DE (1) DE69428963T2 (de)
WO (1) WO1994029714A1 (de)

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US6016700A (en) * 1997-10-29 2000-01-25 Krautkramer Branson, Inc. Signal processing apparatus for ultrasonic flaw detection system
US6715354B2 (en) 1998-02-24 2004-04-06 Massachusetts Institute Of Technology Flaw detection system using acoustic doppler effect
US6474164B1 (en) 1999-08-20 2002-11-05 Slx, Inc. Noise suppression and signal enhancement system for ultrasonic non-destructive inspection/evaluation
DE19941690C2 (de) * 1999-09-01 2001-12-06 Siemens Ag Steuergerät und Lötverfahren
US6728515B1 (en) 2000-02-16 2004-04-27 Massachusetts Institute Of Technology Tuned wave phased array
US6392327B1 (en) 2000-03-29 2002-05-21 James L. Sackrison Sonic transducer and feedback control method thereof
JP4552309B2 (ja) 2000-11-02 2010-09-29 株式会社Ihi 超音波探傷方法及び装置
US6833554B2 (en) * 2000-11-21 2004-12-21 Massachusetts Institute Of Technology Laser-induced defect detection system and method
WO2002086474A1 (en) * 2001-04-20 2002-10-31 Commonwealth Scientific And Industrial Research Organisation Probe for non-destructive testing
AUPR450801A0 (en) * 2001-04-20 2001-05-24 Commonwealth Scientific And Industrial Research Organisation Method and apparatus for carrying out non-destructive testing of materials
US20050111011A1 (en) * 2001-04-20 2005-05-26 Dickinson Laurence P. Probe for non-destructive testing
CN100520396C (zh) * 2003-09-30 2009-07-29 北京时代之峰科技有限公司 数字式便携超声探伤仪的dac曲线制作方法
US7404671B2 (en) * 2005-03-10 2008-07-29 Luna Innovations Incorporated Dynamic acoustic thermometer
US7757557B2 (en) * 2005-10-14 2010-07-20 Olympus Ndt Ultrasonic detection measurement system using a tunable digital filter with 4x interpolator
US7461554B2 (en) * 2005-10-14 2008-12-09 Olympus Ndt Digital time variable gain circuit for non-destructive test instrument
US8001841B2 (en) * 2005-10-14 2011-08-23 Olympus Ndt Ultrasonic fault detection system using a high dynamic range analog to digital conversion system
CN101331395B (zh) * 2005-10-14 2012-06-27 奥林巴斯Ndt公司 超声波探伤系统
KR100769627B1 (ko) * 2006-04-19 2007-10-25 미승씨엔에스검사주식회사 비파괴 검사장치
CN101467035B (zh) * 2006-06-13 2012-10-31 住友金属工业株式会社 超声波探伤方法、焊接钢管的制造方法及超声波探伤装置
EP2478353B1 (de) * 2009-09-18 2016-11-02 Conocophillips Company Hochpräzise ultraschall-korrosionsratenüberwachung
EP2372318B1 (de) * 2010-03-26 2020-03-18 VEGA Grieshaber KG Störechospeicherung bei Behälterrauschen
GB2482124B (en) * 2010-07-19 2016-08-17 Ultra Electronics Ltd Acoustic structural integrity monitoring system and method
US9638673B2 (en) * 2012-10-18 2017-05-02 Olympus Scientific Solutions Americas Inc. Ultrasonic testing instrument with dithery pulsing
CN103175900B (zh) * 2013-03-19 2016-02-17 中国科学院声学研究所 一种相控阵无损探伤装置和系统
KR101738803B1 (ko) * 2013-04-02 2017-05-22 제이에프이 스틸 가부시키가이샤 초음파 탐상 방법 및 초음파 탐상 장치
CA2967646A1 (en) * 2014-11-14 2016-05-19 Ursus Medical, Llc Ultrasound beamforming system and method based on aram array
BR112018003357B1 (pt) 2015-08-28 2021-09-28 Micro Motion, Inc. Medidor e método de geração de um sinal
CN107060739B (zh) * 2017-06-29 2023-03-21 西安海联石化科技有限公司 一种存储式油井动液面监测系统及方法
CN107505395A (zh) * 2017-08-31 2017-12-22 北京金风慧能技术有限公司 工件内部损伤检测方法及装置
JP6909697B2 (ja) 2017-10-04 2021-07-28 上田日本無線株式会社 伝搬時間測定器、気体濃度測定装置、および伝搬時間測定プログラム

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US3506813A (en) * 1966-06-13 1970-04-14 Hewlett Packard Co Signal-to-noise ratio enhancement methods and means
US3446949A (en) * 1966-10-28 1969-05-27 Hewlett Packard Co Signal-to-noise ratio enhancement methods and means
DE2422439C2 (de) * 1974-05-09 1983-12-08 Krautkrämer GmbH, 5000 Köln Verfahren zur Fehlerblendeneinstellung bei einem Ultraschallprüfverfahren
US4435984A (en) * 1980-04-21 1984-03-13 Southwest Research Institute Ultrasonic multiple-beam technique for detecting cracks in bimetallic or coarse-grained materials
US4495587A (en) * 1981-12-08 1985-01-22 Bethlehem Steel Corporation Automatic nondestructive roll defect inspection system
US4470304A (en) * 1982-06-01 1984-09-11 Bethlehem Steel Corp. Ultrasonic inspection system
JPS59171540A (ja) * 1983-03-18 1984-09-28 富士通株式会社 スペクトル形状利用測定方法
JPS6014165A (ja) * 1983-07-06 1985-01-24 Toshiba Corp 超音波検査装置
JPS61162747A (ja) * 1985-01-14 1986-07-23 Mitsubishi Electric Corp 超音波検査装置
US4817016A (en) * 1986-05-21 1989-03-28 Iowa State University Research Foundation, Inc. Non-destructive evaluation means and method of flaw reconstruction utilizing an ultrasonic multi-viewing transducer data acquistion system
FR2615288B1 (fr) * 1987-05-12 1989-09-22 Commissariat Energie Atomique Procede automatique d'identification de defauts par ultrasons et systeme correspondant
US4928182A (en) * 1989-01-31 1990-05-22 North American Philips Corporation Dual aspect ratio display with cyclicly moving raster area to prevent uneven phosphor aging
US5163323A (en) * 1990-01-18 1992-11-17 Ezra C. Lundahl, Inc. Ultrasonic distance measuring instrument
JP2513901B2 (ja) * 1990-06-01 1996-07-10 パイオニア株式会社 複数の記録ディスクによるビデオフォ―マット信号記録再生方法
US5303061A (en) * 1991-06-18 1994-04-12 Matsushita Electric Industrial Co., Ltd. Apparatus for rejecting time base error of video signal
US5497662A (en) * 1993-09-07 1996-03-12 General Electric Company Method and apparatus for measuring and controlling refracted angle of ultrasonic waves
US5511425A (en) * 1993-12-09 1996-04-30 Krautkramer-Branson, Inc. Flaw detector incorporating DGS

Also Published As

Publication number Publication date
CN1112374A (zh) 1995-11-22
KR0160003B1 (ko) 1999-03-30
CN1035690C (zh) 1997-08-20
WO1994029714A1 (fr) 1994-12-22
EP0654666A4 (de) 1995-11-02
DE69428963T2 (de) 2002-08-14
KR950703144A (ko) 1995-08-23
EP0654666B1 (de) 2001-11-07
EP0654666A1 (de) 1995-05-24
US5671154A (en) 1997-09-23

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: JFE ENGINEERING CORP., TOKIO/TOKYO, JP

8327 Change in the person/name/address of the patent owner

Owner name: JFE STEEL CORP., TOKIO/TOKYO, JP