DE69416375T2 - Analysesystem für Wärmebild - Google Patents

Analysesystem für Wärmebild

Info

Publication number
DE69416375T2
DE69416375T2 DE69416375T DE69416375T DE69416375T2 DE 69416375 T2 DE69416375 T2 DE 69416375T2 DE 69416375 T DE69416375 T DE 69416375T DE 69416375 T DE69416375 T DE 69416375T DE 69416375 T2 DE69416375 T2 DE 69416375T2
Authority
DE
Germany
Prior art keywords
analysis system
thermal imaging
imaging
thermal
analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69416375T
Other languages
English (en)
Other versions
DE69416375D1 (de
Inventor
Tetsuo Miyoshi
Yuuji Hozumi
Akira Yamagishi
Kaoru Kozumi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Application granted granted Critical
Publication of DE69416375D1 publication Critical patent/DE69416375D1/de
Publication of DE69416375T2 publication Critical patent/DE69416375T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00Details of television systems
    • H04N5/30Transforming light or analogous information into electric information
    • H04N5/33Transforming infrared radiation

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Radiation Pyrometers (AREA)
DE69416375T 1993-10-29 1994-10-28 Analysesystem für Wärmebild Expired - Fee Related DE69416375T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5272085A JPH07128151A (ja) 1993-10-29 1993-10-29 熱画像解析装置

Publications (2)

Publication Number Publication Date
DE69416375D1 DE69416375D1 (de) 1999-03-18
DE69416375T2 true DE69416375T2 (de) 1999-06-10

Family

ID=17508882

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69416375T Expired - Fee Related DE69416375T2 (de) 1993-10-29 1994-10-28 Analysesystem für Wärmebild

Country Status (4)

Country Link
US (1) US5534695A (de)
EP (1) EP0651567B1 (de)
JP (1) JPH07128151A (de)
DE (1) DE69416375T2 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5920066A (en) * 1996-08-02 1999-07-06 Raytheon Company Real-time adaptive thermal reference control for night vision systems
JPH10260487A (ja) * 1997-01-14 1998-09-29 Canon Inc 放射線画像撮影装置
US7321119B2 (en) * 2004-08-12 2008-01-22 E.D. Bullard Company Method and system for thermal imaging having a selective temperature imaging mode
US7248425B2 (en) * 2004-12-14 2007-07-24 Samsung Electronics Co., Ltd. Disk writing/reproducing apparatus and method
EP2608713A4 (de) 2010-08-27 2014-01-08 Milwaukee Electric Tool Corp Wärmeerkennungssysteme, -verfahren und -vorrichtungen
US9883084B2 (en) 2011-03-15 2018-01-30 Milwaukee Electric Tool Corporation Thermal imager
US10794769B2 (en) 2012-08-02 2020-10-06 Milwaukee Electric Tool Corporation Thermal detection systems, methods, and devices
RU2572803C1 (ru) * 2014-09-12 2016-01-20 Открытое акционерное общество "Научно-производственное объединение "Государственный институт прикладной оптики" (ОАО "НПО ГИПО") Устройство формирования изображения
JP2021012124A (ja) * 2019-07-08 2021-02-04 株式会社シーピーアイテクノロジーズ 温度計測装置、温度計測プログラムおよび温度計測方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1573133A1 (de) * 1965-06-16 1971-03-25 Aga Ab Geraet zum optischen Abtasten eines Blickfeldes mittels infraroter Strahlen
US3798366A (en) * 1972-03-06 1974-03-19 R Winkler Infrared imaging system
GB2079562B (en) * 1980-07-02 1984-02-22 British Aerospace I r camera calibration
JPS58120136A (ja) * 1982-01-13 1983-07-16 Jeol Ltd サ−モグラフイ装置用測温レンジ検出装置
JPS58191937A (ja) * 1982-05-06 1983-11-09 Chino Works Ltd 光学的測定装置
JPS5967431A (ja) * 1982-10-08 1984-04-17 Jeol Ltd 赤外線温度分布表示方法
JPS59114423A (ja) * 1982-12-21 1984-07-02 Jeol Ltd サ−モグラフイ装置
FR2652471B1 (fr) * 1989-09-22 1991-11-29 Thomson Csf Dispositif de correction des defauts d'une suite d'images analysee par un capteur infrarouge matriciel a integration.
JPH03120431A (ja) * 1989-10-03 1991-05-22 Nec San-Ei Instr Co Ltd サーモグラフィ装置
US5101271A (en) * 1990-03-30 1992-03-31 Hughes Aircraft Company Image restoration and faulty sensor detection and compensation system and process
JPH0481178A (ja) * 1990-07-24 1992-03-13 Fujitsu Ltd Irccd検知器の直流オフセット補正方法
US5032727A (en) * 1990-09-14 1991-07-16 Digital Equipment Corporation Product defect detection using thermal ratio analysis
JP2762321B2 (ja) * 1991-07-19 1998-06-04 東海カーボン株式会社 温度画像測定法および装置

Also Published As

Publication number Publication date
DE69416375D1 (de) 1999-03-18
JPH07128151A (ja) 1995-05-19
EP0651567A1 (de) 1995-05-03
US5534695A (en) 1996-07-09
EP0651567B1 (de) 1999-02-03

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8320 Willingness to grant licences declared (paragraph 23)
8339 Ceased/non-payment of the annual fee