DE69416375T2 - Analysesystem für Wärmebild - Google Patents
Analysesystem für WärmebildInfo
- Publication number
- DE69416375T2 DE69416375T2 DE69416375T DE69416375T DE69416375T2 DE 69416375 T2 DE69416375 T2 DE 69416375T2 DE 69416375 T DE69416375 T DE 69416375T DE 69416375 T DE69416375 T DE 69416375T DE 69416375 T2 DE69416375 T2 DE 69416375T2
- Authority
- DE
- Germany
- Prior art keywords
- analysis system
- thermal imaging
- imaging
- thermal
- analysis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/33—Transforming infrared radiation
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Radiation Pyrometers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5272085A JPH07128151A (ja) | 1993-10-29 | 1993-10-29 | 熱画像解析装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69416375D1 DE69416375D1 (de) | 1999-03-18 |
DE69416375T2 true DE69416375T2 (de) | 1999-06-10 |
Family
ID=17508882
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69416375T Expired - Fee Related DE69416375T2 (de) | 1993-10-29 | 1994-10-28 | Analysesystem für Wärmebild |
Country Status (4)
Country | Link |
---|---|
US (1) | US5534695A (de) |
EP (1) | EP0651567B1 (de) |
JP (1) | JPH07128151A (de) |
DE (1) | DE69416375T2 (de) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5920066A (en) * | 1996-08-02 | 1999-07-06 | Raytheon Company | Real-time adaptive thermal reference control for night vision systems |
JPH10260487A (ja) * | 1997-01-14 | 1998-09-29 | Canon Inc | 放射線画像撮影装置 |
US7321119B2 (en) * | 2004-08-12 | 2008-01-22 | E.D. Bullard Company | Method and system for thermal imaging having a selective temperature imaging mode |
US7248425B2 (en) * | 2004-12-14 | 2007-07-24 | Samsung Electronics Co., Ltd. | Disk writing/reproducing apparatus and method |
EP2608713A4 (de) | 2010-08-27 | 2014-01-08 | Milwaukee Electric Tool Corp | Wärmeerkennungssysteme, -verfahren und -vorrichtungen |
US9883084B2 (en) | 2011-03-15 | 2018-01-30 | Milwaukee Electric Tool Corporation | Thermal imager |
US10794769B2 (en) | 2012-08-02 | 2020-10-06 | Milwaukee Electric Tool Corporation | Thermal detection systems, methods, and devices |
RU2572803C1 (ru) * | 2014-09-12 | 2016-01-20 | Открытое акционерное общество "Научно-производственное объединение "Государственный институт прикладной оптики" (ОАО "НПО ГИПО") | Устройство формирования изображения |
JP2021012124A (ja) * | 2019-07-08 | 2021-02-04 | 株式会社シーピーアイテクノロジーズ | 温度計測装置、温度計測プログラムおよび温度計測方法 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1573133A1 (de) * | 1965-06-16 | 1971-03-25 | Aga Ab | Geraet zum optischen Abtasten eines Blickfeldes mittels infraroter Strahlen |
US3798366A (en) * | 1972-03-06 | 1974-03-19 | R Winkler | Infrared imaging system |
GB2079562B (en) * | 1980-07-02 | 1984-02-22 | British Aerospace | I r camera calibration |
JPS58120136A (ja) * | 1982-01-13 | 1983-07-16 | Jeol Ltd | サ−モグラフイ装置用測温レンジ検出装置 |
JPS58191937A (ja) * | 1982-05-06 | 1983-11-09 | Chino Works Ltd | 光学的測定装置 |
JPS5967431A (ja) * | 1982-10-08 | 1984-04-17 | Jeol Ltd | 赤外線温度分布表示方法 |
JPS59114423A (ja) * | 1982-12-21 | 1984-07-02 | Jeol Ltd | サ−モグラフイ装置 |
FR2652471B1 (fr) * | 1989-09-22 | 1991-11-29 | Thomson Csf | Dispositif de correction des defauts d'une suite d'images analysee par un capteur infrarouge matriciel a integration. |
JPH03120431A (ja) * | 1989-10-03 | 1991-05-22 | Nec San-Ei Instr Co Ltd | サーモグラフィ装置 |
US5101271A (en) * | 1990-03-30 | 1992-03-31 | Hughes Aircraft Company | Image restoration and faulty sensor detection and compensation system and process |
JPH0481178A (ja) * | 1990-07-24 | 1992-03-13 | Fujitsu Ltd | Irccd検知器の直流オフセット補正方法 |
US5032727A (en) * | 1990-09-14 | 1991-07-16 | Digital Equipment Corporation | Product defect detection using thermal ratio analysis |
JP2762321B2 (ja) * | 1991-07-19 | 1998-06-04 | 東海カーボン株式会社 | 温度画像測定法および装置 |
-
1993
- 1993-10-29 JP JP5272085A patent/JPH07128151A/ja active Pending
-
1994
- 1994-10-24 US US08/327,973 patent/US5534695A/en not_active Expired - Lifetime
- 1994-10-28 EP EP94117067A patent/EP0651567B1/de not_active Expired - Lifetime
- 1994-10-28 DE DE69416375T patent/DE69416375T2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE69416375D1 (de) | 1999-03-18 |
JPH07128151A (ja) | 1995-05-19 |
EP0651567A1 (de) | 1995-05-03 |
US5534695A (en) | 1996-07-09 |
EP0651567B1 (de) | 1999-02-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8320 | Willingness to grant licences declared (paragraph 23) | ||
8339 | Ceased/non-payment of the annual fee |