DE69333806D1 - Verfahren und Gerät zur Prüfsequenzgenerierung - Google Patents
Verfahren und Gerät zur PrüfsequenzgenerierungInfo
- Publication number
- DE69333806D1 DE69333806D1 DE69333806T DE69333806T DE69333806D1 DE 69333806 D1 DE69333806 D1 DE 69333806D1 DE 69333806 T DE69333806 T DE 69333806T DE 69333806 T DE69333806 T DE 69333806T DE 69333806 D1 DE69333806 D1 DE 69333806D1
- Authority
- DE
- Germany
- Prior art keywords
- test sequence
- sequence generation
- generation
- test
- sequence
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318392—Generation of test inputs, e.g. test vectors, patterns or sequences for sequential circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318371—Methodologies therefor, e.g. algorithms, procedures
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7075792 | 1992-03-27 | ||
JP7075792 | 1992-03-27 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69333806D1 true DE69333806D1 (de) | 2005-06-09 |
DE69333806T2 DE69333806T2 (de) | 2005-10-06 |
Family
ID=13440705
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69333806T Expired - Fee Related DE69333806T2 (de) | 1992-03-27 | 1993-03-26 | Verfahren und Gerät zur Prüfsequenzgenerierung |
DE69333510T Expired - Fee Related DE69333510T2 (de) | 1992-03-27 | 1993-03-26 | Verfahren und Gerät zur Prüfsequenzgenerierung |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69333510T Expired - Fee Related DE69333510T2 (de) | 1992-03-27 | 1993-03-26 | Verfahren und Gerät zur Prüfsequenzgenerierung |
Country Status (3)
Country | Link |
---|---|
US (1) | US5410552A (de) |
EP (2) | EP1132749B1 (de) |
DE (2) | DE69333806T2 (de) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5602856A (en) * | 1993-04-06 | 1997-02-11 | Nippon Telegraph And Telephone Corporation | Test pattern generation for logic circuits with reduced backtracking operations |
US5566187A (en) * | 1994-09-14 | 1996-10-15 | Lucent Technologies Inc. | Method for identifying untestable faults in logic circuits |
US5559811A (en) * | 1994-09-14 | 1996-09-24 | Lucent Technologies Inc. | Method for identifying untestable and redundant faults in sequential logic circuits. |
JP3212228B2 (ja) * | 1994-10-17 | 2001-09-25 | 富士通株式会社 | 試験プログラム作成装置における試験プログラム自動作成方法 |
US5862149A (en) * | 1995-08-29 | 1999-01-19 | Unisys Corporation | Method of partitioning logic designs for automatic test pattern generation based on logical registers |
JPH09145800A (ja) * | 1995-11-17 | 1997-06-06 | Nec Corp | テストパターン生成方式 |
US6141630A (en) * | 1997-08-07 | 2000-10-31 | Verisity Design, Inc. | System and method for automated design verification |
US6865706B1 (en) * | 2000-06-07 | 2005-03-08 | Agilent Technologies, Inc. | Apparatus and method for generating a set of test vectors using nonrandom filling |
DE10144455A1 (de) * | 2001-09-10 | 2003-04-03 | Infineon Technologies Ag | Verfahren zur Prüfung eines Abbilds einer elektrischen Schaltung |
US6941497B2 (en) * | 2002-01-15 | 2005-09-06 | Agilent Technologies, Inc. | N-squared algorithm for optimizing correlated events |
US7685485B2 (en) * | 2003-10-30 | 2010-03-23 | Altera Corporation | Functional failure analysis techniques for programmable integrated circuits |
JP4418310B2 (ja) * | 2004-06-29 | 2010-02-17 | 富士通株式会社 | テストパターン生成方法およびテストパターン生成プログラム |
DE102010062553A1 (de) * | 2010-12-07 | 2012-06-14 | Siemens Aktiengesellschaft | Vorrichtung und Verfahren zum effizienten Durchführen von Systemtestläufen |
JP2022187741A (ja) * | 2021-06-08 | 2022-12-20 | 富士通株式会社 | 解析プログラム、解析方法及び解析装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1381413A (en) * | 1972-06-21 | 1975-01-22 | Ibm | Methods of testing asynchronous sequential circuits |
US4204633A (en) * | 1978-11-20 | 1980-05-27 | International Business Machines Corporation | Logic chip test system with path oriented decision making test pattern generator |
US4696006A (en) * | 1984-11-26 | 1987-09-22 | Nec Corporation | Method of generating test patterns for logic network devices |
US4937826A (en) * | 1988-09-09 | 1990-06-26 | Crosscheck Technology, Inc. | Method and apparatus for sensing defects in integrated circuit elements |
US4996689A (en) * | 1989-02-01 | 1991-02-26 | Vlsi Technology, Inc. | Method of generating tests for a combinational logic circuit |
JPH0587885A (ja) * | 1991-09-30 | 1993-04-06 | Matsushita Electric Ind Co Ltd | 検査系列生成方法 |
-
1993
- 1993-03-26 US US08/037,244 patent/US5410552A/en not_active Expired - Lifetime
- 1993-03-26 DE DE69333806T patent/DE69333806T2/de not_active Expired - Fee Related
- 1993-03-26 EP EP00128551A patent/EP1132749B1/de not_active Expired - Lifetime
- 1993-03-26 DE DE69333510T patent/DE69333510T2/de not_active Expired - Fee Related
- 1993-03-26 EP EP93302400A patent/EP0562886B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0562886B1 (de) | 2004-05-12 |
EP1132749B1 (de) | 2005-05-04 |
DE69333510D1 (de) | 2004-06-17 |
DE69333806T2 (de) | 2005-10-06 |
EP1132749A2 (de) | 2001-09-12 |
US5410552A (en) | 1995-04-25 |
DE69333510T2 (de) | 2005-08-18 |
EP0562886A3 (en) | 1996-11-06 |
EP0562886A2 (de) | 1993-09-29 |
EP1132749A3 (de) | 2002-02-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |