GB1381413A - Methods of testing asynchronous sequential circuits - Google Patents

Methods of testing asynchronous sequential circuits

Info

Publication number
GB1381413A
GB1381413A GB2122273A GB2122273A GB1381413A GB 1381413 A GB1381413 A GB 1381413A GB 2122273 A GB2122273 A GB 2122273A GB 2122273 A GB2122273 A GB 2122273A GB 1381413 A GB1381413 A GB 1381413A
Authority
GB
United Kingdom
Prior art keywords
state
sequence
testing
methods
variables
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2122273A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of GB1381413A publication Critical patent/GB1381413A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318392—Generation of test inputs, e.g. test vectors, patterns or sequences for sequential circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318555—Control logic

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

1381413 Generating test patterns INTERNATIONAL BUSINESS MACHINES CORP 4 May 1973 [21 June 1972] 21222/73 Heading G4A A homing sequence for placing a sequential logic circuit in a predetermined state, compatible with testing by a testing sequence, is generated by data processing apparatus arranged to derive the sequence in reverse order from the total state (input variables and circuit state variables) corresponding to the desired set state. A sequence of total states is derived until a state having no circuit state variables is reached, this state defining the start of the homing sequence. Details of an algorithm for generating the homing sequence are described with reference to Fig. 5 (not shown). Specification 1,381,414 is referred to.
GB2122273A 1972-06-21 1973-05-04 Methods of testing asynchronous sequential circuits Expired GB1381413A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US26503572A 1972-06-21 1972-06-21

Publications (1)

Publication Number Publication Date
GB1381413A true GB1381413A (en) 1975-01-22

Family

ID=23008681

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2122273A Expired GB1381413A (en) 1972-06-21 1973-05-04 Methods of testing asynchronous sequential circuits

Country Status (4)

Country Link
JP (1) JPS4952547A (en)
CA (1) CA990405A (en)
GB (1) GB1381413A (en)
IT (1) IT998133B (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0006168A1 (en) * 1978-06-19 1980-01-09 International Business Machines Corporation Method and apparatus for testing fixed function logic circuits
EP0305217A2 (en) * 1987-08-28 1989-03-01 Hewlett-Packard Company An automatic test process for logic devices
US5097468A (en) * 1988-05-03 1992-03-17 Digital Equipment Corporation Testing asynchronous processes
EP0562886A2 (en) * 1992-03-27 1993-09-29 Matsushita Electric Industrial Co., Ltd. Method and apparatus for generating test sequence

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0006168A1 (en) * 1978-06-19 1980-01-09 International Business Machines Corporation Method and apparatus for testing fixed function logic circuits
EP0305217A2 (en) * 1987-08-28 1989-03-01 Hewlett-Packard Company An automatic test process for logic devices
EP0305217A3 (en) * 1987-08-28 1990-10-24 Hewlett-Packard Company An automatic test process for logic devices
US5097468A (en) * 1988-05-03 1992-03-17 Digital Equipment Corporation Testing asynchronous processes
EP0562886A2 (en) * 1992-03-27 1993-09-29 Matsushita Electric Industrial Co., Ltd. Method and apparatus for generating test sequence
EP0562886A3 (en) * 1992-03-27 1996-11-06 Matsushita Electric Ind Co Ltd Method and apparatus for generating test sequence
EP1132749A2 (en) * 1992-03-27 2001-09-12 Matsushita Electric Industrial Co., Ltd. Method and apparatus for generating test sequence
EP1132749A3 (en) * 1992-03-27 2002-02-27 Matsushita Electric Industrial Co., Ltd. Method and apparatus for generating test sequence

Also Published As

Publication number Publication date
CA990405A (en) 1976-06-01
IT998133B (en) 1976-01-20
JPS4952547A (en) 1974-05-22

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Legal Events

Date Code Title Description
PS Patent sealed
PCNP Patent ceased through non-payment of renewal fee