IT998133B - EQUIPMENT TO GENERATE THE SAMPLE TEST SAMPLE FOR ASYNCHRONOUS SEQUENTIAL CIRCUITS - Google Patents

EQUIPMENT TO GENERATE THE SAMPLE TEST SAMPLE FOR ASYNCHRONOUS SEQUENTIAL CIRCUITS

Info

Publication number
IT998133B
IT998133B IT2516773A IT2516773A IT998133B IT 998133 B IT998133 B IT 998133B IT 2516773 A IT2516773 A IT 2516773A IT 2516773 A IT2516773 A IT 2516773A IT 998133 B IT998133 B IT 998133B
Authority
IT
Italy
Prior art keywords
state
sequence
sample
generate
equipment
Prior art date
Application number
IT2516773A
Other languages
Italian (it)
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Application granted granted Critical
Publication of IT998133B publication Critical patent/IT998133B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318392—Generation of test inputs, e.g. test vectors, patterns or sequences for sequential circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318555—Control logic

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

1381413 Generating test patterns INTERNATIONAL BUSINESS MACHINES CORP 4 May 1973 [21 June 1972] 21222/73 Heading G4A A homing sequence for placing a sequential logic circuit in a predetermined state, compatible with testing by a testing sequence, is generated by data processing apparatus arranged to derive the sequence in reverse order from the total state (input variables and circuit state variables) corresponding to the desired set state. A sequence of total states is derived until a state having no circuit state variables is reached, this state defining the start of the homing sequence. Details of an algorithm for generating the homing sequence are described with reference to Fig. 5 (not shown). Specification 1,381,414 is referred to.
IT2516773A 1972-06-21 1973-06-12 EQUIPMENT TO GENERATE THE SAMPLE TEST SAMPLE FOR ASYNCHRONOUS SEQUENTIAL CIRCUITS IT998133B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US26503572A 1972-06-21 1972-06-21

Publications (1)

Publication Number Publication Date
IT998133B true IT998133B (en) 1976-01-20

Family

ID=23008681

Family Applications (1)

Application Number Title Priority Date Filing Date
IT2516773A IT998133B (en) 1972-06-21 1973-06-12 EQUIPMENT TO GENERATE THE SAMPLE TEST SAMPLE FOR ASYNCHRONOUS SEQUENTIAL CIRCUITS

Country Status (4)

Country Link
JP (1) JPS4952547A (en)
CA (1) CA990405A (en)
GB (1) GB1381413A (en)
IT (1) IT998133B (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4184630A (en) * 1978-06-19 1980-01-22 International Business Machines Corporation Verifying circuit operation
US4853928A (en) * 1987-08-28 1989-08-01 Hewlett-Packard Company Automatic test generator for logic devices
US5097468A (en) * 1988-05-03 1992-03-17 Digital Equipment Corporation Testing asynchronous processes
DE69333806T2 (en) * 1992-03-27 2005-10-06 Matsushita Electric Industrial Co., Ltd., Kadoma Method and apparatus for test sequence generation

Also Published As

Publication number Publication date
JPS4952547A (en) 1974-05-22
GB1381413A (en) 1975-01-22
CA990405A (en) 1976-06-01

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