CA990405A - Method for generating test patterns for asynchronous sequential circuits - Google Patents

Method for generating test patterns for asynchronous sequential circuits

Info

Publication number
CA990405A
CA990405A CA171,632A CA171632A CA990405A CA 990405 A CA990405 A CA 990405A CA 171632 A CA171632 A CA 171632A CA 990405 A CA990405 A CA 990405A
Authority
CA
Canada
Prior art keywords
test patterns
generating test
sequential circuits
asynchronous sequential
asynchronous
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA171,632A
Other versions
CA171632S (en
Inventor
Dennis K. Chia
Mu-Yue Hsiao
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Application granted granted Critical
Publication of CA990405A publication Critical patent/CA990405A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318392—Generation of test inputs, e.g. test vectors, patterns or sequences for sequential circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318555—Control logic

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
CA171,632A 1972-06-21 1973-05-15 Method for generating test patterns for asynchronous sequential circuits Expired CA990405A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US26503572A 1972-06-21 1972-06-21

Publications (1)

Publication Number Publication Date
CA990405A true CA990405A (en) 1976-06-01

Family

ID=23008681

Family Applications (1)

Application Number Title Priority Date Filing Date
CA171,632A Expired CA990405A (en) 1972-06-21 1973-05-15 Method for generating test patterns for asynchronous sequential circuits

Country Status (4)

Country Link
JP (1) JPS4952547A (en)
CA (1) CA990405A (en)
GB (1) GB1381413A (en)
IT (1) IT998133B (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4184630A (en) * 1978-06-19 1980-01-22 International Business Machines Corporation Verifying circuit operation
US4853928A (en) * 1987-08-28 1989-08-01 Hewlett-Packard Company Automatic test generator for logic devices
US5097468A (en) * 1988-05-03 1992-03-17 Digital Equipment Corporation Testing asynchronous processes
DE69333806T2 (en) * 1992-03-27 2005-10-06 Matsushita Electric Industrial Co., Ltd., Kadoma Method and apparatus for test sequence generation

Also Published As

Publication number Publication date
JPS4952547A (en) 1974-05-22
GB1381413A (en) 1975-01-22
IT998133B (en) 1976-01-20

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