DE69327609D1 - Röntgenanalysegerät mit Impulsamplitudenverschiebungskorrektur - Google Patents

Röntgenanalysegerät mit Impulsamplitudenverschiebungskorrektur

Info

Publication number
DE69327609D1
DE69327609D1 DE69327609T DE69327609T DE69327609D1 DE 69327609 D1 DE69327609 D1 DE 69327609D1 DE 69327609 T DE69327609 T DE 69327609T DE 69327609 T DE69327609 T DE 69327609T DE 69327609 D1 DE69327609 D1 DE 69327609D1
Authority
DE
Germany
Prior art keywords
pulse amplitude
shift correction
ray analyzer
amplitude shift
analyzer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69327609T
Other languages
English (en)
Other versions
DE69327609T2 (de
Inventor
Hendrik Johannes Jan Bolk
Georges Charles Petronel Zielk
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Malvern Panalytical BV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Application granted granted Critical
Publication of DE69327609D1 publication Critical patent/DE69327609D1/de
Publication of DE69327609T2 publication Critical patent/DE69327609T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
    • G01T1/40—Stabilisation of spectrometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
    • G01N2223/0568—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction spectro-diffractometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/304—Accessories, mechanical or electrical features electric circuits, signal processing

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE69327609T 1992-04-15 1993-04-07 Röntgenanalysegerät mit Impulsamplitudenverschiebungskorrektur Expired - Fee Related DE69327609T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP92201072 1992-04-15

Publications (2)

Publication Number Publication Date
DE69327609D1 true DE69327609D1 (de) 2000-02-24
DE69327609T2 DE69327609T2 (de) 2000-08-10

Family

ID=8210551

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69327609T Expired - Fee Related DE69327609T2 (de) 1992-04-15 1993-04-07 Röntgenanalysegerät mit Impulsamplitudenverschiebungskorrektur

Country Status (3)

Country Link
US (1) US5357551A (de)
JP (1) JP3272473B2 (de)
DE (1) DE69327609T2 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3367478B2 (ja) * 1999-07-29 2003-01-14 株式会社島津製作所 蛍光ｘ線分析装置
JP3318291B2 (ja) * 1999-08-31 2002-08-26 株式会社環境電磁技術研究所 擬似雑音発生装置
DE10048398B4 (de) * 1999-10-01 2006-09-21 Rigaku Industrial Corp., Takatsuki Kontinuierlich abtastender Röntgenanalysator mit verbesserter Verfügbarkeit und Genauigkeit
DE10050887A1 (de) * 2000-10-13 2002-05-02 Rados Technology Gmbh Verfahren und Vorrichtung zur Erkennung eines Gammastrahlung aussendenden Nuklids in Meßgütern
JP5320807B2 (ja) * 2008-04-25 2013-10-23 株式会社島津製作所 波長分散型ｘ線分光器
RU2598396C2 (ru) * 2012-07-26 2016-09-27 Университет Цинхуа Метод и система комбинированного радиационного неразрушающего контроля
JP2014209098A (ja) 2013-03-25 2014-11-06 株式会社リガク Ｘ線分析装置
JP6002890B2 (ja) 2014-09-18 2016-10-05 株式会社リガク Ｘ線分析装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5121358B2 (de) * 1971-09-10 1976-07-01
DE2703562A1 (de) * 1977-01-28 1978-08-03 Max Planck Gesellschaft Verfahren und einrichtung zur roentgenfluoreszenzanalyse
JPS5593048A (en) * 1979-01-08 1980-07-15 Hitachi Ltd Wavelength search unit of xxray analyzer
NL8201342A (nl) * 1982-03-31 1983-10-17 Philips Nv Roentgen analyse apparaat met pulsschiftcorrectie.

Also Published As

Publication number Publication date
DE69327609T2 (de) 2000-08-10
JPH06130155A (ja) 1994-05-13
US5357551A (en) 1994-10-18
JP3272473B2 (ja) 2002-04-08

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Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: PANALYTICAL B.V., ALMELO, NL

8339 Ceased/non-payment of the annual fee