DE69228537T2 - Methode und vorrichtung zur oberflächenanalyse - Google Patents
Methode und vorrichtung zur oberflächenanalyseInfo
- Publication number
- DE69228537T2 DE69228537T2 DE1992628537 DE69228537T DE69228537T2 DE 69228537 T2 DE69228537 T2 DE 69228537T2 DE 1992628537 DE1992628537 DE 1992628537 DE 69228537 T DE69228537 T DE 69228537T DE 69228537 T2 DE69228537 T2 DE 69228537T2
- Authority
- DE
- Germany
- Prior art keywords
- surface analysis
- analysis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
- G01N21/5907—Densitometers
- G01N21/5911—Densitometers of the scanning type
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Spectrometry And Color Measurement (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5475791A JPH1096691A (ja) | 1991-03-19 | 1991-03-19 | 面分析方法及び面分析装置 |
PCT/JP1992/000335 WO1992016827A1 (en) | 1991-03-19 | 1992-03-19 | Method and device for analyzing area |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69228537D1 DE69228537D1 (de) | 1999-04-08 |
DE69228537T2 true DE69228537T2 (de) | 1999-07-08 |
Family
ID=12979646
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE1992628537 Expired - Fee Related DE69228537T2 (de) | 1991-03-19 | 1992-03-19 | Methode und vorrichtung zur oberflächenanalyse |
Country Status (5)
Country | Link |
---|---|
US (1) | US5418367A (de) |
EP (1) | EP0577835B1 (de) |
JP (1) | JPH1096691A (de) |
DE (1) | DE69228537T2 (de) |
WO (1) | WO1992016827A1 (de) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5936233A (en) * | 1998-02-26 | 1999-08-10 | The Curators Of The University Of Missouri | Buried object detection and neutralization system |
US6389881B1 (en) | 1999-05-27 | 2002-05-21 | Acoustic Systems, Inc. | Method and apparatus for pattern match filtering for real time acoustic pipeline leak detection and location |
US6673554B1 (en) * | 1999-06-14 | 2004-01-06 | Trellie Bioinformatics, Inc. | Protein localization assays for toxicity and antidotes thereto |
US6734962B2 (en) * | 2000-10-13 | 2004-05-11 | Chemimage Corporation | Near infrared chemical imaging microscope |
JP5188001B2 (ja) * | 2001-05-24 | 2013-04-24 | エムイーエス メディカル エレクトロニック システムズ リミテッド | 精液分析 |
JP2006119076A (ja) * | 2004-10-25 | 2006-05-11 | Jasco Corp | マッピングデータ解析装置及び方法 |
JP4637643B2 (ja) * | 2005-05-18 | 2011-02-23 | 日本分光株式会社 | 分光分析装置 |
JP4856436B2 (ja) * | 2006-02-08 | 2012-01-18 | 日本分光株式会社 | マッピングデータ表示方法、プログラム、および装置 |
JP4709129B2 (ja) * | 2006-12-19 | 2011-06-22 | 株式会社堀場製作所 | 試料分析装置 |
WO2014076789A1 (ja) * | 2012-11-15 | 2014-05-22 | 株式会社島津製作所 | 分析対象領域設定装置 |
JP6324201B2 (ja) | 2013-06-20 | 2018-05-16 | キヤノン株式会社 | 分光データ処理装置、及び分光データ処理方法 |
CN109116391B (zh) * | 2018-07-23 | 2020-06-23 | 武汉大学 | 一种基于改进正交分解的区域划分方法 |
US10775530B1 (en) * | 2019-08-29 | 2020-09-15 | Peter Wilk | Apparatus and method of detecting a mineral in the ground |
CN111445964B (zh) * | 2020-03-27 | 2023-05-12 | 合肥金星智控科技股份有限公司 | 成分分析结果的可视化方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5352198A (en) * | 1976-10-22 | 1978-05-12 | Hitachi Ltd | Picture input apparatus of netlike red corpuscle |
JPS6147522A (ja) * | 1984-08-14 | 1986-03-08 | Tech Res & Dev Inst Of Japan Def Agency | 映像装置 |
JPH087331B2 (ja) * | 1988-03-12 | 1996-01-29 | 株式会社日立製作所 | 赤外吸収スペクトル測定顕微鏡装置 |
-
1991
- 1991-03-19 JP JP5475791A patent/JPH1096691A/ja active Pending
-
1992
- 1992-03-19 DE DE1992628537 patent/DE69228537T2/de not_active Expired - Fee Related
- 1992-03-19 US US08/108,744 patent/US5418367A/en not_active Expired - Fee Related
- 1992-03-19 EP EP92907117A patent/EP0577835B1/de not_active Expired - Lifetime
- 1992-03-19 WO PCT/JP1992/000335 patent/WO1992016827A1/ja active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
US5418367A (en) | 1995-05-23 |
WO1992016827A1 (en) | 1992-10-01 |
JPH1096691A (ja) | 1998-04-14 |
EP0577835A1 (de) | 1994-01-12 |
DE69228537D1 (de) | 1999-04-08 |
EP0577835B1 (de) | 1999-03-03 |
EP0577835A4 (de) | 1994-01-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |