DE69226554D1 - Mikroskop bestehend aus Rastertunnelmikroskop kombiniert mit optischem Mikroskop - Google Patents
Mikroskop bestehend aus Rastertunnelmikroskop kombiniert mit optischem MikroskopInfo
- Publication number
- DE69226554D1 DE69226554D1 DE69226554T DE69226554T DE69226554D1 DE 69226554 D1 DE69226554 D1 DE 69226554D1 DE 69226554 T DE69226554 T DE 69226554T DE 69226554 T DE69226554 T DE 69226554T DE 69226554 D1 DE69226554 D1 DE 69226554D1
- Authority
- DE
- Germany
- Prior art keywords
- microscope
- combined
- scanning tunnel
- optical
- optical microscope
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/10—STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
- G01Q60/16—Probes, their manufacture, or their related instrumentation, e.g. holders
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
- G01Q30/02—Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
- G01Q30/025—Optical microscopes coupled with SPM
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
- G01Q70/02—Probe holders
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/86—Scanning probe structure
- Y10S977/868—Scanning probe structure with optical means
- Y10S977/869—Optical microscope
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7428891 | 1991-03-15 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69226554D1 true DE69226554D1 (de) | 1998-09-17 |
DE69226554T2 DE69226554T2 (de) | 1999-03-04 |
Family
ID=13542795
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69226554T Expired - Fee Related DE69226554T2 (de) | 1991-03-15 | 1992-03-13 | Mikroskop bestehend aus Rastertunnelmikroskop kombiniert mit optischem Mikroskop |
Country Status (3)
Country | Link |
---|---|
US (1) | US5508517A (de) |
EP (1) | EP0509856B1 (de) |
DE (1) | DE69226554T2 (de) |
Families Citing this family (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5448399A (en) * | 1992-03-13 | 1995-09-05 | Park Scientific Instruments | Optical system for scanning microscope |
US5811802A (en) * | 1995-08-18 | 1998-09-22 | Gamble; Ronald C. | Scanning probe microscope with hollow pivot assembly |
JPH09203864A (ja) * | 1996-01-25 | 1997-08-05 | Nikon Corp | Nfm一体型顕微鏡 |
JP2891923B2 (ja) * | 1996-03-01 | 1999-05-17 | 三鷹光器株式会社 | 顕微鏡の照明構造 |
US5726454A (en) * | 1996-05-03 | 1998-03-10 | Taiwan Semiconductor Manufacturing Company, Ltd. | Tripod for polishing a sample and for viewing the sample under a microscope |
US5854487A (en) * | 1997-02-28 | 1998-12-29 | Park Scientific Instruments | Scanning probe microscope providing unobstructed top down and bottom up views |
US5900729A (en) * | 1997-03-20 | 1999-05-04 | International Business Machines Corporation | Magnetic force microscopy probe with integrated coil |
JPH10293133A (ja) * | 1997-04-18 | 1998-11-04 | Olympus Optical Co Ltd | 走査型近接場光学顕微鏡 |
US5861624A (en) * | 1997-08-22 | 1999-01-19 | Park Scientific Instruments | Atomic force microscope for attachment to optical microscope |
US5952657A (en) * | 1997-08-22 | 1999-09-14 | Thermo Microscopes, Corp. | Atomic force microscope with integrated optics for attachment to optical microscope |
US6437343B1 (en) * | 1998-03-13 | 2002-08-20 | Olympus Optical Co., Ltd. | Scanner system and piezoelectric micro-inching mechansim used in scanning probe microscope |
DE19841931C2 (de) * | 1998-09-14 | 2002-06-20 | Zeiss Carl Jena Gmbh | Mikroskop für die optische Nahfeldmikroskopie |
US6455838B2 (en) | 1998-10-06 | 2002-09-24 | The Regents Of The University Of California | High sensitivity deflection sensing device |
US6369397B1 (en) * | 1999-01-04 | 2002-04-09 | International Business Machines Corporation | SPM base focal plane positioning |
US20020158197A1 (en) * | 1999-01-12 | 2002-10-31 | Applied Materials, Inc | AFM-based lithography metrology tool |
US6392229B1 (en) * | 1999-01-12 | 2002-05-21 | Applied Materials, Inc. | AFM-based lithography metrology tool |
US6657431B2 (en) * | 2000-06-06 | 2003-12-02 | Brown University Research Foundation | Scanning magnetic microscope having improved magnetic sensor |
DE10057292C2 (de) * | 2000-11-17 | 2003-02-13 | Leica Microsystems | Vorrichtung zum Aufnehmen von Mirodissektaten |
AU2002248163A1 (en) | 2000-12-01 | 2002-08-12 | Auburn University | High-resolution optical microscope |
US6992819B2 (en) * | 2000-12-01 | 2006-01-31 | Auburn University | High-resolution optical microscope for quick detection of pathogens |
US6756237B2 (en) * | 2002-03-25 | 2004-06-29 | Brown University Research Foundation | Reduction of noise, and optimization of magnetic field sensitivity and electrical properties in magnetic tunnel junction devices |
WO2004017102A2 (en) | 2002-08-16 | 2004-02-26 | Brown University Research Foundation | Scanning magnetic microscope having improved magnetic sensor |
CN100420934C (zh) * | 2002-11-14 | 2008-09-24 | 南开大学 | 一种近场扫描光学显微镜定位扫描成像方法 |
JP2005069972A (ja) * | 2003-08-27 | 2005-03-17 | Hitachi Kenki Fine Tech Co Ltd | 走査型プローブ顕微鏡の探針移動制御方法 |
US7966034B2 (en) * | 2003-09-30 | 2011-06-21 | Sony Ericsson Mobile Communications Ab | Method and apparatus of synchronizing complementary multi-media effects in a wireless communication device |
US7176450B2 (en) * | 2004-01-02 | 2007-02-13 | Itn Energy Systems, Inc. | Long travel near-field scanning optical microscope |
JP2006039260A (ja) * | 2004-07-28 | 2006-02-09 | Sii Nanotechnology Inc | 原子間力顕微鏡を用いたフォトマスクのパーティクル除去方法 |
DE112007001927B4 (de) * | 2006-08-18 | 2016-07-07 | Jpk Instruments Ag | Vorrichtung und Verfahren zum sondermikroskopischen Untersuchen einer Probe |
KR20080061889A (ko) * | 2006-12-28 | 2008-07-03 | 제일모직주식회사 | 플라스틱 수지의 내스크래치성 평가 방법 |
DE102008057093A1 (de) * | 2008-11-13 | 2010-05-27 | Carl Zeiss Ag | Objektivanordnung für Nahfeldmikroskopie |
US11506877B2 (en) | 2016-11-10 | 2022-11-22 | The Trustees Of Columbia University In The City Of New York | Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees |
CN112924511B (zh) * | 2019-12-05 | 2021-12-14 | 中国科学院大连化学物理研究所 | 一种基于原子力显微镜和扫描电化学显微镜的光电化学池 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS643502A (en) * | 1987-06-25 | 1989-01-09 | Seiko Instr & Electronics | Scanning type tunnel microscope |
US6127681A (en) * | 1987-08-12 | 2000-10-03 | Olympus Optical Co., Ltd. | Scanning tunnel microscope |
JPH0216403A (ja) * | 1988-03-04 | 1990-01-19 | Toshiba Corp | 顕微鏡装置 |
US4914293A (en) * | 1988-03-04 | 1990-04-03 | Kabushiki Kaisha Toshiba | Microscope apparatus |
US4999495A (en) * | 1988-08-31 | 1991-03-12 | Seiko Instruments Inc. | Scanning tunneling microscope |
JP2696106B2 (ja) * | 1988-12-19 | 1998-01-14 | セイコーインスツルメンツ株式会社 | 走査型トンネル顕微鏡 |
JP2696107B2 (ja) * | 1988-12-19 | 1998-01-14 | セイコーインスツルメンツ株式会社 | 走査型トンネル顕微鏡 |
US5041783A (en) * | 1989-02-13 | 1991-08-20 | Olympus Optical Co., Ltd. | Probe unit for an atomic probe microscope |
US4935634A (en) * | 1989-03-13 | 1990-06-19 | The Regents Of The University Of California | Atomic force microscope with optional replaceable fluid cell |
US5260824A (en) * | 1989-04-24 | 1993-11-09 | Olympus Optical Co., Ltd. | Atomic force microscope |
JPH0334250A (ja) * | 1989-06-29 | 1991-02-14 | Seiko Instr Inc | 光学顕微鏡複合走査型トンネル顕微鏡 |
JP2821005B2 (ja) * | 1989-10-02 | 1998-11-05 | オリンパス光学工業株式会社 | 微細表面形状計測装置 |
US5025658A (en) * | 1989-11-28 | 1991-06-25 | Digital Instruments, Inc. | Compact atomic force microscope |
JPH0540034A (ja) * | 1991-08-08 | 1993-02-19 | Nikon Corp | 複合型顕微鏡 |
JPH0540009A (ja) * | 1991-08-08 | 1993-02-19 | Nikon Corp | 走査型トンネル顕微鏡 |
US5317153A (en) * | 1991-08-08 | 1994-05-31 | Nikon Corporation | Scanning probe microscope |
-
1992
- 1992-03-13 EP EP92400673A patent/EP0509856B1/de not_active Expired - Lifetime
- 1992-03-13 DE DE69226554T patent/DE69226554T2/de not_active Expired - Fee Related
-
1995
- 1995-06-05 US US08/461,142 patent/US5508517A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0509856B1 (de) | 1998-08-12 |
DE69226554T2 (de) | 1999-03-04 |
US5508517A (en) | 1996-04-16 |
EP0509856A1 (de) | 1992-10-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |