DE4208622B4 - Licht-Schnitt-Mikroskop - Google Patents

Licht-Schnitt-Mikroskop Download PDF

Info

Publication number
DE4208622B4
DE4208622B4 DE19924208622 DE4208622A DE4208622B4 DE 4208622 B4 DE4208622 B4 DE 4208622B4 DE 19924208622 DE19924208622 DE 19924208622 DE 4208622 A DE4208622 A DE 4208622A DE 4208622 B4 DE4208622 B4 DE 4208622B4
Authority
DE
Germany
Prior art keywords
light
sectional microscope
microscope
sectional
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE19924208622
Other languages
English (en)
Other versions
DE4208622A1 (de
Inventor
Kazyo Yomoda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nissho Optical Co Ltd
Original Assignee
Nissho Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nissho Optical Co Ltd filed Critical Nissho Optical Co Ltd
Publication of DE4208622A1 publication Critical patent/DE4208622A1/de
Application granted granted Critical
Publication of DE4208622B4 publication Critical patent/DE4208622B4/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/04—Measuring microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Lenses (AREA)
DE19924208622 1991-04-20 1992-03-18 Licht-Schnitt-Mikroskop Expired - Fee Related DE4208622B4 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3117012A JP2689359B2 (ja) 1991-04-20 1991-04-20 光切断顕微鏡

Publications (2)

Publication Number Publication Date
DE4208622A1 DE4208622A1 (de) 1992-10-22
DE4208622B4 true DE4208622B4 (de) 2005-04-28

Family

ID=14701270

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19924208622 Expired - Fee Related DE4208622B4 (de) 1991-04-20 1992-03-18 Licht-Schnitt-Mikroskop

Country Status (2)

Country Link
JP (1) JP2689359B2 (de)
DE (1) DE4208622B4 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0643509U (ja) * 1992-11-13 1994-06-10 信越エンジニアリング株式会社 光切断式顕微鏡
JPH06258579A (ja) * 1993-03-03 1994-09-16 Nissho Seimitsu Kogaku Kk 顕微鏡の対物レンズ、ｉｔｖカメラ用レンズ等レンズ装置
JP5141103B2 (ja) * 2007-06-20 2013-02-13 株式会社ニコン 非接触三次元形状測定機
JP5252184B2 (ja) * 2008-03-13 2013-07-31 アイシン精機株式会社 凹凸表面検査装置
DE102016119268B3 (de) 2016-10-10 2017-12-21 Leica Microsystems Cms Gmbh Schiefebenenmikroskop
FR3068780B1 (fr) * 2017-07-06 2021-05-14 Centre Nat Etd Spatiales Spectrophotometre hyperspectral large bande

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3921956A1 (de) * 1989-06-06 1990-12-13 Eyetec Gmbh Verfahren zur beruehrungslosen dickenmessung von faserigen, koernigen oder poroesen materialien sowie vorrichtung zur durchfuehrung des verfahrens

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2544733B2 (ja) * 1987-02-24 1996-10-16 松下電工株式会社 光電スイツチ
JPS6463845A (en) * 1987-09-02 1989-03-09 Asahi Optical Co Ltd Method for inspecting surface to be inspected having linear defect

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3921956A1 (de) * 1989-06-06 1990-12-13 Eyetec Gmbh Verfahren zur beruehrungslosen dickenmessung von faserigen, koernigen oder poroesen materialien sowie vorrichtung zur durchfuehrung des verfahrens

Also Published As

Publication number Publication date
JP2689359B2 (ja) 1997-12-10
DE4208622A1 (de) 1992-10-22
JPH04320907A (ja) 1992-11-11

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8380 Miscellaneous part iii

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8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee