DE69219183T2 - Herstellungsmethode für abgeschrägte Oberfläche mit vorbestimmter Neigung - Google Patents
Herstellungsmethode für abgeschrägte Oberfläche mit vorbestimmter NeigungInfo
- Publication number
- DE69219183T2 DE69219183T2 DE1992619183 DE69219183T DE69219183T2 DE 69219183 T2 DE69219183 T2 DE 69219183T2 DE 1992619183 DE1992619183 DE 1992619183 DE 69219183 T DE69219183 T DE 69219183T DE 69219183 T2 DE69219183 T2 DE 69219183T2
- Authority
- DE
- Germany
- Prior art keywords
- manufacturing
- beveled surface
- predetermined slope
- slope
- predetermined
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2002—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
- G03F7/201—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image characterised by an oblique exposure; characterised by the use of plural sources; characterised by the rotation of the optical device; characterised by a relative movement of the optical device, the light source, the sensitive system or the mask
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US65814591A | 1991-02-20 | 1991-02-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69219183D1 DE69219183D1 (de) | 1997-05-28 |
DE69219183T2 true DE69219183T2 (de) | 1998-01-08 |
Family
ID=24640086
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE1992619183 Expired - Fee Related DE69219183T2 (de) | 1991-02-20 | 1992-02-11 | Herstellungsmethode für abgeschrägte Oberfläche mit vorbestimmter Neigung |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0499944B1 (de) |
JP (1) | JPH0588335A (de) |
DE (1) | DE69219183T2 (de) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10351034A1 (de) * | 2003-10-31 | 2005-06-09 | Infineon Technologies Ag | Verfahren zum Ausbilden eines keilförmigen Werkstücks |
DE202004010922U1 (de) * | 2004-07-12 | 2005-11-24 | Leica Geosystems Ag | Neigungssensor |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4333620A1 (de) * | 1993-10-15 | 1995-04-20 | Jenoptik Technologie Gmbh | Anordnung und Verfahren zur Erzeugung von Dosisprofilen für die Herstellung von Oberflächenprofilen |
US6534425B1 (en) | 1999-12-02 | 2003-03-18 | Seagate Technology Llc | Mask design and method for controlled profile fabrication |
DE10038928A1 (de) * | 2000-08-09 | 2002-02-28 | Infineon Technologies Ag | Photolithographische Maske |
KR20060029412A (ko) * | 2004-10-01 | 2006-04-06 | 삼성전자주식회사 | 마스크 및 이를 이용한 액정 표시 장치용 표시판의 제조방법 |
KR100873275B1 (ko) * | 2007-03-19 | 2008-12-11 | 매그나칩 반도체 유한회사 | 이미지센서의 제조 방법 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07104590B2 (ja) * | 1986-12-06 | 1995-11-13 | 株式会社クラレ | 透過率変調型フォトマスク、その製法及びそれを用いる回折格子の製法 |
US4936665A (en) * | 1987-10-25 | 1990-06-26 | Whitney Theodore R | High resolution imagery systems and methods |
US4908656A (en) * | 1988-01-21 | 1990-03-13 | Nikon Corporation | Method of dimension measurement for a pattern formed by exposure apparatus, and method for setting exposure conditions and for inspecting exposure precision |
JPH02151862A (ja) * | 1988-12-05 | 1990-06-11 | Omron Tateisi Electron Co | フォトリソグラフィ用マスクおよびその作製方法 |
US4912022A (en) * | 1988-12-27 | 1990-03-27 | Motorola, Inc. | Method for sloping the profile of an opening in resist |
-
1992
- 1992-02-11 DE DE1992619183 patent/DE69219183T2/de not_active Expired - Fee Related
- 1992-02-11 EP EP19920102240 patent/EP0499944B1/de not_active Expired - Lifetime
- 1992-02-12 JP JP5725492A patent/JPH0588335A/ja active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10351034A1 (de) * | 2003-10-31 | 2005-06-09 | Infineon Technologies Ag | Verfahren zum Ausbilden eines keilförmigen Werkstücks |
DE202004010922U1 (de) * | 2004-07-12 | 2005-11-24 | Leica Geosystems Ag | Neigungssensor |
US7299557B2 (en) | 2004-07-12 | 2007-11-27 | Leica Geosystems Ag | Tilt sensor |
Also Published As
Publication number | Publication date |
---|---|
DE69219183D1 (de) | 1997-05-28 |
EP0499944A1 (de) | 1992-08-26 |
JPH0588335A (ja) | 1993-04-09 |
EP0499944B1 (de) | 1997-04-23 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de | ||
8370 | Indication of lapse of patent is to be deleted | ||
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |