DE69213668D1 - Messprobe - Google Patents

Messprobe

Info

Publication number
DE69213668D1
DE69213668D1 DE69213668T DE69213668T DE69213668D1 DE 69213668 D1 DE69213668 D1 DE 69213668D1 DE 69213668 T DE69213668 T DE 69213668T DE 69213668 T DE69213668 T DE 69213668T DE 69213668 D1 DE69213668 D1 DE 69213668D1
Authority
DE
Germany
Prior art keywords
measurement sample
sample
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69213668T
Other languages
English (en)
Other versions
DE69213668T2 (de
Inventor
David Mcmurtry
David Wright
Stephen Lummes
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renishaw Metrology Ltd
Original Assignee
Renishaw Metrology Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renishaw Metrology Ltd filed Critical Renishaw Metrology Ltd
Application granted granted Critical
Publication of DE69213668D1 publication Critical patent/DE69213668D1/de
Publication of DE69213668T2 publication Critical patent/DE69213668T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/004—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
    • G01B5/008—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
    • G01B5/012—Contact-making feeler heads therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
    • G01B11/007—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines feeler heads therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B3/00—Measuring instruments characterised by the use of mechanical techniques
    • G01B3/002—Details
    • G01B3/008—Arrangements for controlling the measuring force

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
DE69213668T 1991-05-25 1992-05-22 Messprobe Expired - Fee Related DE69213668T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB919111382A GB9111382D0 (en) 1991-05-25 1991-05-25 Improvements in measuring probes
PCT/GB1992/000932 WO1992021932A1 (en) 1991-05-25 1992-05-22 Measuring probe

Publications (2)

Publication Number Publication Date
DE69213668D1 true DE69213668D1 (de) 1996-10-17
DE69213668T2 DE69213668T2 (de) 1997-01-23

Family

ID=10695647

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69213668T Expired - Fee Related DE69213668T2 (de) 1991-05-25 1992-05-22 Messprobe

Country Status (6)

Country Link
US (1) US5345689A (de)
EP (1) EP0544854B1 (de)
JP (1) JP3101322B2 (de)
DE (1) DE69213668T2 (de)
GB (1) GB9111382D0 (de)
WO (1) WO1992021932A1 (de)

Families Citing this family (50)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5505005A (en) * 1990-02-23 1996-04-09 Renishaw Plc Touch probe
IT1258132B (it) * 1992-12-24 1996-02-20 Dispositivo tastatore, particolarmente per macchine a copiare.
GB9423176D0 (en) * 1994-11-17 1995-01-04 Renishaw Plc Touch probe
DE69617148T3 (de) * 1995-09-25 2005-11-10 Mitutoyo Corp., Kawasaki Fühlerprobe
GB9907643D0 (en) 1999-04-06 1999-05-26 Renishaw Plc Measuring probe
EP1094294B1 (de) * 1999-10-22 2002-12-04 Brown & Sharpe Tesa S.A. Vorrichtung zur Messung der Linear- oder Winkelverschiebung
WO2001044751A1 (en) * 1999-12-15 2001-06-21 Peter Bryan Webster Position sensor
WO2001096809A1 (en) * 2000-06-16 2001-12-20 Renishaw Plc Force sensing probe
GB0102324D0 (en) * 2001-01-30 2001-03-14 Renishaw Plc Capacitance type displacement responsive device and a suspension system for a displacement responsive device
DE10122200A1 (de) † 2001-05-08 2002-11-14 Zeiss Carl Tastkopf für ein Koordinatenmeßgerät. Koordinatenmeßgerät, Kalibrierkörper für ein Koordinatenmeßgerät und Verfahren zum Kalibrieren eines Koordinatenmeßgerätes
US20030025412A1 (en) * 2001-07-31 2003-02-06 Hayfield John Frederick Magnetic sleeve assembly
JP2006504953A (ja) * 2002-10-29 2006-02-09 コーニンクレッカ　フィリップス　エレクトロニクス　エヌ　ヴィ 振動減衰システムを備えた座標測定装置
GB0228368D0 (en) * 2002-12-05 2003-01-08 Renishaw Plc Probe for high speed scanning
DE102004010566A1 (de) * 2004-02-26 2005-09-15 Carl Zeiss Industrielle Messtechnik Gmbh Tastkopf für ein Koordinatenmessgerät
DE102004011730A1 (de) * 2004-03-05 2005-09-22 Carl Zeiss Industrielle Messtechnik Gmbh Tastkopf für ein Koordinatenmessgerät
DE102004011729A1 (de) * 2004-03-05 2005-09-22 Carl Zeiss Industrielle Messtechnik Gmbh Tastkopf für ein Koordinatenmessgerät
DE102004016714B4 (de) * 2004-04-05 2008-11-20 Carl Zeiss Industrielle Messtechnik Gmbh Tastkopf mit Schutzvorrichtung für eine Koordinatenmessmaschine
GB0508388D0 (en) 2005-04-26 2005-06-01 Renishaw Plc Surface sensing device with optical sensor
WO2008031706A2 (de) * 2006-09-13 2008-03-20 Diamond Sa Vorrichtung und verfahren zum messen der konzentrizität eines in einem steckerstift gehaltenen lichtwellenleiters
DE102006058805B4 (de) * 2006-12-13 2011-12-22 Spacecontrol Gmbh Vorrichtung zur Eingabe von Bewegungen und/oder Erfassung von Kräften
JP4611403B2 (ja) 2008-06-03 2011-01-12 パナソニック株式会社 形状測定装置及び形状測定方法
CN101782380A (zh) * 2010-03-03 2010-07-21 孟庆周 一种磁复位式测头座
IT1402715B1 (it) * 2010-10-29 2013-09-18 Marposs Spa Sonda di tastaggio
JP6010046B2 (ja) 2011-01-19 2016-10-19 レニショウ パブリック リミテッド カンパニーＲｅｎｉｓｈａｗ Ｐｕｂｌｉｃ Ｌｉｍｉｔｅｄ Ｃｏｍｐａｎｙ 工作機械装置用のアナログ測定用プローブ
JP6063233B2 (ja) * 2012-12-05 2017-01-18 株式会社ミツトヨ 測定子支持機構及びプローブ
JP5838370B2 (ja) * 2013-01-18 2016-01-06 パナソニックＩｐマネジメント株式会社 三次元形状測定装置用プローブ
CN103216501A (zh) * 2013-03-26 2013-07-24 孟庆周 一种磁力复位端面接触式定位结构
CN104165571B (zh) * 2013-05-17 2017-05-24 深圳市壹兴佰测量设备有限公司 一种三维触发式测量头
JP6049786B2 (ja) * 2015-03-05 2016-12-21 株式会社ミツトヨ 測定プローブ
JP6049785B2 (ja) * 2015-03-05 2016-12-21 株式会社ミツトヨ 測定プローブ
JP6039718B2 (ja) * 2015-03-05 2016-12-07 株式会社ミツトヨ 測定プローブ
US9791262B2 (en) * 2015-12-17 2017-10-17 Mitutoyo Corporation Measurement device with multiplexed position signals
US9803972B2 (en) * 2015-12-17 2017-10-31 Mitutoyo Corporation Optical configuration for measurement device
JP6212148B2 (ja) * 2016-02-26 2017-10-11 株式会社ミツトヨ 測定プローブ
JP6216400B2 (ja) 2016-02-26 2017-10-18 株式会社ミツトヨ 測定プローブ
US10286556B2 (en) * 2016-10-16 2019-05-14 The Boeing Company Method and apparatus for compliant robotic end-effector
US10866080B2 (en) * 2018-11-01 2020-12-15 Mitutoyo Corporation Inductive position detection configuration for indicating a measurement device stylus position
CN107538275A (zh) * 2017-06-16 2018-01-05 孟庆周 一种消除复位间隙的测量头结构
CN107538274A (zh) * 2017-06-16 2018-01-05 孟庆周 一种分体式测量头结构
US11428589B2 (en) * 2017-10-16 2022-08-30 Saf-Holland, Inc. Displacement sensor utilizing ronchi grating interference
US11543899B2 (en) 2018-11-01 2023-01-03 Mitutoyo Corporation Inductive position detection configuration for indicating a measurement device stylus position and including coil misalignment compensation
US11644298B2 (en) 2018-11-01 2023-05-09 Mitutoyo Corporation Inductive position detection configuration for indicating a measurement device stylus position
US10914570B2 (en) * 2018-11-01 2021-02-09 Mitutoyo Corporation Inductive position detection configuration for indicating a measurement device stylus position
US11740064B2 (en) 2018-11-01 2023-08-29 Mitutoyo Corporation Inductive position detection configuration for indicating a measurement device stylus position
JP6898966B2 (ja) * 2019-06-07 2021-07-07 株式会社ミツトヨ 不具合判定ユニット
CN112757631B (zh) * 2020-12-21 2022-11-11 深圳市创想三维科技股份有限公司 一种3d打印机的自动调平装置及3d打印机
US11644299B2 (en) 2020-12-31 2023-05-09 Mitutoyo Corporation Inductive position sensor signal gain control for coordinate measuring machine probe
EP4148372A1 (de) * 2021-09-09 2023-03-15 Renishaw PLC Messsonde
US11733021B2 (en) 2021-12-22 2023-08-22 Mitutoyo Corporation Modular configuration for coordinate measuring machine probe
US11713956B2 (en) 2021-12-22 2023-08-01 Mitutoyo Corporation Shielding for sensor configuration and alignment of coordinate measuring machine probe

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3229992C2 (de) * 1982-08-12 1986-02-06 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Mehrkoordinaten-Tastkopf
DE8222757U1 (de) * 1982-08-12 1986-10-23 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Mehrkoordinaten-Tastkopf
DE3234471C1 (de) * 1982-09-17 1983-08-25 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Mehrkoordinaten-Tastkopf
DD255784A1 (de) * 1986-11-04 1988-04-13 Zeiss Jena Veb Carl Koordinatentastkopf mit einrichtung zur messkraftstabilisierung fuer koordinatenmessgeraete
CH674485A5 (de) * 1988-03-11 1990-06-15 Saphirwerk Ind Prod
US5209131A (en) * 1989-11-03 1993-05-11 Rank Taylor Hobson Metrology
GB9004117D0 (en) * 1990-02-23 1990-04-18 Renishaw Plc Touch probe

Also Published As

Publication number Publication date
DE69213668T2 (de) 1997-01-23
JPH05508476A (ja) 1993-11-25
EP0544854B1 (de) 1996-09-11
JP3101322B2 (ja) 2000-10-23
GB9111382D0 (en) 1991-07-17
US5345689A (en) 1994-09-13
WO1992021932A1 (en) 1992-12-10
EP0544854A1 (de) 1993-06-09

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee