DE69208622T2 - Halbleiterlaservorrichtung - Google Patents
HalbleiterlaservorrichtungInfo
- Publication number
- DE69208622T2 DE69208622T2 DE69208622T DE69208622T DE69208622T2 DE 69208622 T2 DE69208622 T2 DE 69208622T2 DE 69208622 T DE69208622 T DE 69208622T DE 69208622 T DE69208622 T DE 69208622T DE 69208622 T2 DE69208622 T2 DE 69208622T2
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor laser
- laser device
- semiconductor
- laser
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/2004—Confining in the direction perpendicular to the layer structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/2004—Confining in the direction perpendicular to the layer structure
- H01S5/2009—Confining in the direction perpendicular to the layer structure by using electron barrier layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
- H01S5/3201—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures incorporating bulkstrain effects, e.g. strain compensation, strain related to polarisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
- H01S5/3211—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures characterised by special cladding layers, e.g. details on band-discontinuities
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
- H01S5/323—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/32308—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm
- H01S5/32325—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm red laser based on InGaP
Landscapes
- Physics & Mathematics (AREA)
- Geometry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Semiconductor Lasers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP03338806A JP3135960B2 (ja) | 1991-12-20 | 1991-12-20 | 半導体レーザ装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69208622D1 DE69208622D1 (de) | 1996-04-04 |
DE69208622T2 true DE69208622T2 (de) | 1996-08-08 |
Family
ID=18321645
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69208622T Expired - Fee Related DE69208622T2 (de) | 1991-12-20 | 1992-09-29 | Halbleiterlaservorrichtung |
Country Status (4)
Country | Link |
---|---|
US (1) | US5337326A (de) |
EP (1) | EP0549103B1 (de) |
JP (1) | JP3135960B2 (de) |
DE (1) | DE69208622T2 (de) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5739543A (en) * | 1993-11-24 | 1998-04-14 | The Furukawa Electric Co., Ltd. | Optical semiconductive device with inplanar compressive strain |
JPH07335934A (ja) * | 1994-06-03 | 1995-12-22 | Mitsubishi Electric Corp | 光半導体素子,及びその製造方法 |
JPH07335981A (ja) * | 1994-06-07 | 1995-12-22 | Mitsubishi Electric Corp | 半導体発光素子,レーザアンプ,及び増幅機能を有する波長可変フィルタ |
JP3691544B2 (ja) * | 1995-04-28 | 2005-09-07 | アジレント・テクノロジーズ・インク | 面発光レーザの製造方法 |
WO1997000546A2 (en) * | 1995-06-16 | 1997-01-03 | Philips Electronics N.V. | Semiconductor diode laser and method of manufacturing same |
GB2344932A (en) * | 1998-12-15 | 2000-06-21 | Sharp Kk | Semiconductor Laser with gamma and X electron barriers |
GB2346735B (en) * | 1999-02-13 | 2004-03-31 | Sharp Kk | A semiconductor laser device |
US20170324219A1 (en) * | 2016-05-05 | 2017-11-09 | Macom Technology Solutions Holdings, Inc. | Semiconductor laser incorporating an electron barrier with low aluminum content |
US20180269658A1 (en) * | 2016-05-05 | 2018-09-20 | Macom Technology Solutions Holdings, Inc. | Semiconductor laser incorporating an electron barrier with low aluminum content |
US10141477B1 (en) | 2017-07-28 | 2018-11-27 | Lumileds Llc | Strained AlGaInP layers for efficient electron and hole blocking in light emitting devices |
US11322650B2 (en) | 2017-07-28 | 2022-05-03 | Lumileds Llc | Strained AlGaInP layers for efficient electron and hole blocking in light emitting devices |
CN111108614B (zh) * | 2017-07-28 | 2024-02-06 | 亮锐有限责任公司 | 用于发光器件中高效电子和空穴阻挡的应力algainp层 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2508244A1 (fr) * | 1981-06-19 | 1982-12-24 | Thomson Csf | Laser a semi-conducteur a courte longueur d'onde |
JPS617674A (ja) * | 1984-06-22 | 1986-01-14 | Nec Corp | 3/5族化合物半導体発光素子 |
US4804639A (en) * | 1986-04-18 | 1989-02-14 | Bell Communications Research, Inc. | Method of making a DH laser with strained layers by MBE |
JPS6348888A (ja) * | 1986-08-19 | 1988-03-01 | Mitsubishi Electric Corp | 半導体レ−ザ装置 |
JPS63197391A (ja) * | 1987-02-12 | 1988-08-16 | Hitachi Ltd | 半導体レ−ザ装置 |
JPH0248965U (de) * | 1988-09-30 | 1990-04-05 | ||
US4984242A (en) * | 1989-09-18 | 1991-01-08 | Spectra Diode Laboratories, Inc. | GaAs/AlGaAs heterostructure laser containing indium |
US5202895A (en) * | 1990-05-07 | 1993-04-13 | Kabushiki Kaisha Toshiba | Semiconductor device having an active layer made of ingaalp material |
US5276698A (en) * | 1990-09-20 | 1994-01-04 | Sumitomo Electric Ind., Ltd. | Semiconductor laser having an optical waveguide layer including an AlGaInP active layer |
JP2669139B2 (ja) * | 1990-10-24 | 1997-10-27 | 日本電気株式会社 | 半導体レーザ |
US5274656A (en) * | 1991-06-12 | 1993-12-28 | Sumitomo Electric Industries, Ltd. | Semiconductor laser |
JPH0513809A (ja) * | 1991-07-03 | 1993-01-22 | Nec Corp | 半導体発光素子 |
JP3129779B2 (ja) * | 1991-08-30 | 2001-01-31 | 株式会社東芝 | 半導体レーザ装置 |
JPH05243676A (ja) * | 1992-02-28 | 1993-09-21 | Mitsubishi Electric Corp | 半導体レーザ装置 |
-
1991
- 1991-12-20 JP JP03338806A patent/JP3135960B2/ja not_active Expired - Fee Related
-
1992
- 1992-09-29 DE DE69208622T patent/DE69208622T2/de not_active Expired - Fee Related
- 1992-09-29 EP EP92308875A patent/EP0549103B1/de not_active Expired - Lifetime
- 1992-09-29 US US07/953,458 patent/US5337326A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US5337326A (en) | 1994-08-09 |
EP0549103A1 (de) | 1993-06-30 |
DE69208622D1 (de) | 1996-04-04 |
JP3135960B2 (ja) | 2001-02-19 |
EP0549103B1 (de) | 1996-02-28 |
JPH05175594A (ja) | 1993-07-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8328 | Change in the person/name/address of the agent |
Free format text: PATENTANWAELTE MUELLER & HOFFMANN, 81667 MUENCHEN |
|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |